WO2008069291A1 - 基準電圧発生回路 - Google Patents
基準電圧発生回路 Download PDFInfo
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- WO2008069291A1 WO2008069291A1 PCT/JP2007/073624 JP2007073624W WO2008069291A1 WO 2008069291 A1 WO2008069291 A1 WO 2008069291A1 JP 2007073624 W JP2007073624 W JP 2007073624W WO 2008069291 A1 WO2008069291 A1 WO 2008069291A1
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- Prior art keywords
- voltage
- output
- buffer amplifier
- reference voltage
- comparator
- Prior art date
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- 230000008859 change Effects 0.000 abstract description 2
- 238000007796 conventional method Methods 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 14
- 230000003321 amplification Effects 0.000 description 7
- 238000003199 nucleic acid amplification method Methods 0.000 description 7
- 239000003990 capacitor Substances 0.000 description 5
- 230000000694 effects Effects 0.000 description 3
- 239000000470 constituent Substances 0.000 description 2
- 230000010354 integration Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 241000282693 Cercopithecidae Species 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is DC
- G05F3/10—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/30—Regulators using the difference between the base-emitter voltages of two bipolar transistors operating at different current densities
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is DC
Definitions
- the present invention relates to a reference voltage generating circuit that generates a reference voltage widely used in various analog circuit circuits.
- the reference voltage is widely used in various analog circuits.
- a circuit for generating this reference voltage there is a node gap regulator that suppresses fluctuations in the output voltage due to fluctuations in the power supply voltage (for example,
- Patent Document 1 Japanese Patent Application Laid-Open No. 6-0130 052
- Figure 1 shows the configuration of a conventional reference voltage generation circuit using a band gap regulator. Node gap regulator 1 shown in Figure 1
- 0 is a current determining circuit including a positive feedback circuit 1 1, a power lent mirror circuit 1 2, and a current mirror circuit that generates a voltage in response to a current determined by the current determining circuit 1 1.
- 1 fee is charged through 1 2 and has a ⁇ pressure generation circuit 1 3.
- the current determination circuit 11 is composed of PNP ⁇ transistors Q 1 and Q 2, N ch transistors M l and M 2, P ch ⁇ transistors ⁇ 3 and ⁇ 4, and a resistor R 1.
- the collector and base of PNP ⁇ transistor Q 1 are connected to ground, and the emitter V is connected to the source of Nch transistor M 1.
- the gate of N ch ⁇ transistor M 1 is diode-connected to its own drain and the gate of N ch transistor M 2 It is connected to the
- N c h transistor M 1 is also connected to the drain of P c h transistor M 3 ⁇ .
- the drain of Nch transistor M2 is connected to the Krain of Pch transistor M4, and the source is connected to the emitter of PNP ⁇ transistor Q2 via resistor R1.
- the gate of P ch transistor M 4 is diode-connected to its own gate and line, and the current mirror circuit connected to the gate of P ch ⁇ transistor M 3 1 2 is configured by connecting the gates of P ch transistors M 3, M 4, and M 5 in common and connecting the gate of P ch ⁇ transistor M 4 to its own drain K Has been
- Voltage generator circuit 13 is composed of PNP transistor Q3, Pch ⁇ transistor
- the positive terminal of op amp 14 is connected between the drain of P ch transistor M 5 and resistor R 2. Reference voltage output terminal V on the output side of operational amplifier 14. In addition to providing ut, voltage dividing resistors R3 and R4 are also provided between this pin and ground, and the divided output voltage is negatively fed back to the negative terminal of operational amplifier 14.
- the 'pand gap regulator To amplify this small output current, the 'pand gap regulator
- the operational amplifier 14 is provided on the output side of the output 10, the operational amplifier 14 generates an input equivalent noise voltage.
- the noise on the output side of op amp 14 is the value obtained by multiplying the input equivalent noise voltage by the amplification factor of op amp 14, and the output noise (thermal noise) of op amp 14 cannot be ignored when the gain is large. Disclosure of the invention
- the large noise generated in Fig. 4 circulates in the circuit of the node gear regulator 10 and is one of the ways to solve the problem that causes SZN to deteriorate. It is conceivable to install a large-capacitance capacitor C between the power supply V DD and the ground of the band gap regulator 10. However, the large-capacitance capacitor C has the disadvantage that it is not suitable for IC.
- FIG. 3 is a diagram showing a configuration example of the reference voltage generating circuit when such measures are taken.
- the voltage dividing resistors R a and R b provided on the input side of the operational amplifier 14 Reducing the resistance value can increase the noise reduction effect.
- the reference voltage generation circuit is configured as shown in Fig. 3, since the band gap regulator 10 is not used, the output voltage fluctuates greatly when the power supply voltage fluctuates, and a stable reference voltage is A fundamental problem arises that it can no longer occur. That is, the power supply voltage is V DD , the voltage input to the positive terminal of operational amplifier 14 is V R , the amplification factor of op-amp 14 is A, and the output voltage is V. If ut ,
- V nut-A 'VR R b Z iR a + R b)-V DD (where A l) and output voltage v. ut will be affected by fluctuations in the power supply voltage V DD .
- the present invention has been made to solve such problems, and can be easily integrated into an IC, has little influence of noise, and generates a reference voltage with little fluctuation in output voltage due to fluctuations in power supply voltage.
- the purpose is to provide a circuit.
- a buffer amplifier driven by a power supply voltage and a resistance for determining an input voltage of the buffer amplifier are provided.
- An element is provided.
- a band gap regulator and a dummy resistive element that simulates the input voltage, output voltage, or resistive element of the buffer amplifier are used.
- a comparator that compares the generated voltage with the output voltage of the band gear prepreg and a control circuit that variably controls the resistance value of the resistive element according to the comparison signal output from the comparator.
- the bandgear regulator since the bandgear regulator is not included as the basic configuration of the reference voltage generation circuit, the noise generated in the bandgear regulator enters the circuit of the basic configuration. Inconveniences that worsen SZN can be suppressed. Also, since the present invention uses a buffer amplifier with an amplification factor of 1 without using an operational amplifier, the output noise can be reduced. As a result, the effect of noise can be effectively reduced without using a large-capacitance capacitor that hinders IC integration.
- the input voltage or the output voltage of the buffer amplifier (that is, the reference voltage output from the reference voltage generation circuit) or a voltage substantially equivalent to these (by the dummy resistive element). Generated voltage) is monitored by the comparator, and the resistance value of the resistive element is variably controlled so that the output voltage of the buffer amplifier is stabilized within the desired voltage range. Even if the output voltage of the buffer amplifier may temporarily deviate from the desired voltage range due to fluctuations, the output voltage of the buffer amplifier returns to the desired voltage range and converges by variable resistance control. As a result, the output voltage of the reference voltage generating circuit can be maintained almost constant even when the power supply voltage fluctuates.
- FIG. 1 is a diagram showing a conventional reference voltage generation circuit.
- FIG. 2 is a diagram illustrating a configuration example in which noise is reduced in a conventional reference voltage generation circuit.
- FIG. 3 is a diagram showing another configuration example of the reference voltage generation circuit for reducing noise.
- FIG. 4 is a diagram illustrating a configuration example of the reference voltage generation circuit according to the present embodiment.
- FIG. 5 is a diagram illustrating an example of a comparison signal output from the comparator according to the present embodiment.
- FIG. 6 is a diagram illustrating an operation example of the reference voltage generation circuit according to the present embodiment.
- FIG. 7 is a diagram illustrating another configuration example of the reference voltage generation circuit according to the present embodiment.
- FIG. 8 is a diagram illustrating another configuration example of the reference voltage generation circuit according to the present embodiment.
- FIG. 9 is a diagram showing another configuration example of the counter used in the reference voltage generation circuit according to the present embodiment.
- FIG. 4 is a diagram illustrating a configuration example of the reference voltage generation circuit according to the present embodiment.
- the reference voltage generating circuit of the present embodiment is driven Ri by the power supply voltage V DD, a buffer amplifier 2 1 whose output voltage is Desa taken as the reference voltage, the power supply voltage V DD A resistive element 2 2 for determining the input voltage of the buffer amplifier 2 1, a bandgear regulator 10 driven by the power supply voltage V DD , and the voltage dividing resistors R 5 and R 6 2 3 and 2 4 and a control circuit 2 5.
- These configurations are integrated on a single semiconductor chip by, for example, a CMOS (Coraplementary Metal Oxide Semiconductor) process or a Bi CMOS (Bipolar-CMOS) process.
- CMOS Common Metal Oxide Semiconductor
- Bi CMOS Bipolar-CMOS
- Resistive element 22 includes voltage dividing resistors R a and R b of power supply voltage V DD connected to the input side of buffer amplifier 21 and one or more resistors R connected in parallel to resistor R b bl, R b 2, ⁇ , R bn (n is an integer greater than 1) and each resistor R b 1, R b 2, ⁇ , R bn and ground connected in series It is composed of one or more switches SI, S 2,. Yes.
- the resistor R bi When the switch S i (i is any one of 1 to n) is turned on, the resistor R bi connected in series to the turned on switch S i is connected in parallel to the resistor R b.
- the voltage division ratio of the power supply voltage V DD changes. That is, the partial pressure ratio is R a: (R b + R bi).
- the resistance values of the resistors R bl, R b 2,..., R bn are all made different, and any one of the switches S i is selectively turned on to separate the resistors.
- the pressure ratio can be changed in various ways.
- the resistance values of the resistors R bl, R b 2,..., R bn can be the same, and the voltage division ratio can be changed variously by changing the number of switches to be turned on.
- the input voltage V R of the buffer amplifier 21 can be made variable by changing the voltage dividing ratio of the power supply voltage V DD in this way. How to change the input voltage V R of the buffer amplifier 21 will be described later.
- the band gap regulator 10 is configured, for example, in the same manner as shown in FIG. 1, and can obtain a substantially stable output voltage regardless of fluctuations in the power supply voltage V DD .
- An operational amplifier may be connected to the output of the band gap regulator 10.
- the voltage dividing resistors R 5 and R 6 divide the output voltage of the band gap regulator 10.
- the comparators 2 3 and 2 4 compare the input voltage V R of the buffer amplifier 21 and the output voltage of the band gap regulator 10 and output a comparison signal.
- the first comparator 23 has a first output voltage V B1 generated by the voltage dividing resistors R 5 and R 6 (for example, the output of the band gap regulator 10 before voltage division). Voltage) as one input (comparison reference), the input voltage V B of the buffer amplifier 21 as the other input, the values of these two inputs are compared, and the first comparison according to the comparison result Outputs signal V.
- the first comparison signal is low level when V K ⁇ V B1 and V R ⁇ V B1 In this case, it is a high level signal.
- the second comparator 24 has the second output voltage V B2 generated by the voltage dividing resistors R 5 and R 6 as one input and the input voltage V R of the buffer amplifier 21 as the other.
- the input compare standard
- the values of these two inputs are compared, and the second comparison signal V 2 corresponding to the comparison result is output.
- the second comparison signal V 2 becomes a high level signal when V R ⁇ V B2, and a full signal when V R ⁇ V B2. .
- the control circuit 25 requires the output voltage of the buffer amplifier 21 (the output voltage of the reference voltage generation circuit) according to the two comparison signals V,, V 2 output from the comparators 2 3, 2 4. By turning on one of the switches S 1 ′ S 2,..., Sn so that it falls within the voltage range of V B2 to V B1 , the buffer amplifier 2 1 Variable control is performed on the resistance value of resistive element 22 on the input side (voltage division ratio of power supply voltage V DD ).
- the control circuit 25 includes two undgates 2 6 and 2 7 and an up / down counter 2 8.
- the first AND gate 26 is a clock that repeats the first comparison signal V t output from the first comparator 23 and a high level and a low level at a predetermined time interval. ANDs the signal CK and outputs the result to the down terminal D of the up / down counter 28.
- the second AND gate 27 takes the logical product of the second comparison signal V 2 output from the second comparator 24 and the clock signal CK and outputs the logical product. Output to up terminal U of up / down counter 2 8.
- the up / down counter 28 is based on the first comparison signal output from the first comparator 2 3 and the signal output from the first AND gate 26 and the second comparator 24. Ri counts Tor Tsu to up or count down down in response to the signal outputted from the second en Doge DOO 2 7 based on the second comparison signal V 2 output. That is, up / down counter 2 8 is the first comparison When signal V t is high, down count is performed in the cycle of the clock signal CK. The second comparison signal V 2 is at the high level, performs up counting in a cycle of black Kkushin No. CK. Based on the count value, one of the switches S 1, S 2,..., Sn is turned on to variably control the resistance value of the resistive element 22.
- the buffer amplifier 2 1 By sequentially switching one of the switches S 1, S 2,..., Sn according to the count value of the up / down counter 28, the buffer amplifier 2 1 The value of the input voltage V ⁇ gradually changes. Since the amplification factor of the notch amplifier 2 1 is 1, the output voltage V of the noffer amplifier 2 1. ut , that is, the reference voltage output from the reference voltage generation circuit However, it also changes in the same way as the input voltage V R of the notch amplifier 21.
- FIG. 6 is a diagram showing an operation example of the reference voltage generation circuit according to the present embodiment, and the reference voltage V that changes as described above. It shows the state of ut .
- the input voltage V R of the buffer amplifier 21 ie, the reference voltage V output from the buffer amplifier 21. ut
- V DD the power supply voltage
- the up / down counter 28 counts down, and switches S 1, S 2,..., Sn are sequentially switched on according to the force count value.
- Reference voltage V. ut gradually gets smaller.
- the counting operation of the up / down counter 28 stops and the switching is performed.
- H Switching of S1, S2,..., Sn also stops.
- the reference voltage V output from the buffer amplifier 2 1. ut stabilizes again within the range of V B2 to V B1 .
- a buffer amplifier 2 1 to a resistive element 2 2 for determining the input voltage V R of the buffer amplifier 2 1
- This forms the basic configuration of the reference voltage generation circuit.
- the buffer amplifier 2 1 having an amplification factor of 1 is used instead of the operational amplifier having an amplification function, the output noise can be reduced.
- the influence of noise can be effectively reduced without using a large-capacitance capacitor that impedes IC integration.
- the output voltage V of the buffer amplifier 21 Stabilization
- a node gap regulator 10 voltage dividing resistors R 5 and R 6, comparators 2 3 and 2 4, and a control circuit 2 5 are provided.
- V B2 to V B1 the desired voltage range
- u t can be maintained almost constant within the desired voltage range (within V B2 to V B1 ). Therefore, it can be easily integrated into an IC, is less affected by noise, and has an output voltage V due to fluctuations in the power supply voltage V DD . It is possible to provide a reference voltage generating circuit with little fluctuation of ut .
- the distance between the basic configuration 2 1 and 2 2 of the reference voltage generation circuit and the band gap regulator 10 is increased on the chip layout. Also good.
- a guarding may be provided between the basic configurations 2 1 and 2 2 and the band gap regulator 10.
- the noise of the buffer amplifier 21 can be further reduced by increasing the value of WZL.
- WZL the channel length L of the input transistor
- the thermal noise of the buffer amplifier 21 can be reduced.
- W / L it is preferable to increase the value of W / L by setting both the channel width W and the channel length L of the input transistor to large values and W >> L.
- the present invention is not limited to this.
- the amplification factor of the noffer amplifier 21 is 1, and the input voltage V R of the noffer amplifier 21 is the output voltage V. Since it is ut , the output voltage V of the buffer amplifier 2 1. It is also possible to use ut as one input of comparators 2 3 and 2 4. In addition, as shown in FIG.
- dummy voltage dividing resistors R a, R b simulating the voltage dividing resistors R a, R b of the resistive element 22 (corresponding to the dummy resistive element of the present invention)
- the voltage generated by the dummy voltage dividing resistors R a ′ and R b ′ may be used as one input of the comparators 2 3 and 2 4.
- the input voltage V R own buffer Aanpu 2 1 monitors-ring variably controls the input voltage V R, less the risk of oscillation
- a plurality of resistors are used as the example of the resistive element 22
- the present invention is not limited to this. That is, any element other than a resistor may be used as long as the resistance value can be varied.
- the configuration for making the resistance value variable is not limited to the configuration shown in FIG. For example, by connecting a plurality of resistors and a plurality of switches in a ladder shape and selecting one of the switches, the combined resistance value of one or more resistors can be made variable.
- the resistance values of the plurality of resistors may be different or the same.
- FIG. 8 is a diagram showing a resistive element 2 2 ′ according to another configuration example.
- constituent elements having the same functions as the constituent elements shown in FIG. 4 are denoted by the same reference numerals.
- the resistive element 2 2 ′ shown in FIG. 8 includes one or more resistors R bl, R b 2,..., R bn and one or more switches SI, S 2 configured in the same manner as in FIG. ,..., Sn, N ch transistors M il and M l 2, and P ch transistors M l 3 and M 1 4
- N channel transistor M 1 1 has a source connected to ground and a gate connected to a common node of resistors R bl, R b 2,. In is connected to the drain of P ch ⁇ transistor M l 3 via resistor R 1 1.
- N ch transistor M 1 2 has source resistance R bl, R b
- the gate is diode connected to its own drain, and the drain and drain are connected to the drain of P ch transistor M l 4.
- the gate of P ch transistor M 14 is diode-connected to its own drain and is also connected to the gate of P ch ⁇ transistor M l 3.
- the sources of P ch transistors M 1 3 and M 1 4 are connected to the power supply V DD and become low.
- the input terminal of the sofa amplifier 21 is connected between the drain of Ml4. Also, the input voltage V R of the amplifier 2 1 is taken out from here ⁇ 0
- the divided voltage determined by turning on one of the switches S 1, S 2 • • •, and sn is amplified by the N ch transistor M 1 1 and input to the buffer amplifier 2 1. At this time, the source side of the N c h transistor M 1 2
- the switching noise generated on the resistors R b 1 and R b 2 ⁇ • • •, R bn common side is the signal whose phase is inverted by NC h ⁇ transistor M 1 1, Returned to N ch transistor M 1 2
- the ripple generated in the input voltage V R of the buffer 21 can be effectively suppressed by the variable control of the resistance value using the switches S 1, S 2,..., Sn.
- FIG. 9 is a diagram showing a control circuit 2 5 ′ according to another configuration example including the counter 3 3.
- the control circuit 2 5 ′ is similar to the control circuit 2 5 in that the comparators 2 3, 2 4 Depending on the two comparison signals VV2 output from the switch, any one of the switches S1, S2, ⁇ , Sn can be used so that the output voltage of the buffer amplifier 21 falls within the desired voltage range. By turning on, the resistance value of the resistive element 22 is variably controlled.
- the control circuit 2 5 ′ shown in FIG. 9 includes an OR gate 3 1, an AND gate 3 2, and an up counter 3 3.
- Oage DOO 3 1 includes a first comparison signal V t output Ri good first ratio ⁇ 2 3, the second and the comparison signal V 2 that are output Ri good second comparator 2 4 The logical sum is taken and the result is output to the AND 32.
- gate 3 2 is a clock signal that is output from the first OR gate 31 and repeats a high level and a low level at predetermined time intervals. And the result is output to the clock terminal of up-counter 33.
- the up counter 33 is based on the first comparison signal V output from the first comparator 23 and the second comparison signal V 2 output from the second comparator 24. Counts up according to the signal output from the 3rd. In other words, the up-counter 3 3 counts up with the period of the clock signal CK when at least one of the first comparison signal V i or the second comparison signal V 2 is high. Do. After counting up to the maximum value of the counter, return to zero and count up. Then, the up-counter 33 turns on one of the switches S 1, S 2,..., Sn based on the count value, and thereby the resistance value of the resistive element 22 Is variably controlled.
- the present invention is useful for a reference voltage generation circuit that generates a reference voltage widely used in various analog circuits.
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Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
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US12/518,050 US8058862B2 (en) | 2006-12-08 | 2007-11-30 | Reference voltage generation circuit |
CN2007800452242A CN101611360B (zh) | 2006-12-08 | 2007-11-30 | 基准电压发生电路 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006-331391 | 2006-12-08 | ||
JP2006331391A JP5068522B2 (ja) | 2006-12-08 | 2006-12-08 | 基準電圧発生回路 |
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WO2008069291A1 true WO2008069291A1 (ja) | 2008-06-12 |
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PCT/JP2007/073624 WO2008069291A1 (ja) | 2006-12-08 | 2007-11-30 | 基準電圧発生回路 |
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US (1) | US8058862B2 (ja) |
JP (1) | JP5068522B2 (ja) |
CN (1) | CN101611360B (ja) |
WO (1) | WO2008069291A1 (ja) |
Families Citing this family (12)
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JP5156268B2 (ja) * | 2007-06-04 | 2013-03-06 | ラピスセミコンダクタ株式会社 | トリミング電圧発生回路 |
CN101533285B (zh) * | 2009-03-31 | 2011-10-19 | 炬力集成电路设计有限公司 | 一种基准电压缓冲电路 |
CN102289242A (zh) * | 2011-02-23 | 2011-12-21 | 李仲秋 | Npn型晶体管基准电压产生电路 |
CN102955492B (zh) * | 2011-08-18 | 2014-12-10 | 祥硕科技股份有限公司 | 参考电流产生电路 |
CN103488229B (zh) * | 2013-09-17 | 2015-07-29 | 电子科技大学 | 一种用于带隙基准的自动微调电路 |
KR101610869B1 (ko) | 2014-05-07 | 2016-04-08 | 주식회사 에스원 | 전원 공급 장치, 그 구동 방법 및 이를 포함하는 방범 시스템 |
CN105807833B (zh) * | 2014-12-30 | 2017-08-08 | 华润矽威科技(上海)有限公司 | 芯片参数设定模块及方法、锂电池充电芯片的充电电路 |
CN107390756B (zh) * | 2016-05-16 | 2018-12-14 | 瑞昱半导体股份有限公司 | 参考电压缓冲电路 |
CN108399933B (zh) * | 2017-02-07 | 2021-05-11 | 群联电子股份有限公司 | 参考电压产生电路、存储器储存装置及参考电压产生方法 |
US10401942B2 (en) * | 2017-02-22 | 2019-09-03 | Ambiq Micro Inc. | Reference voltage sub-system allowing fast power up from extended periods of ultra-low power standby mode |
CN111290459B (zh) * | 2020-02-11 | 2021-10-22 | 杭州未名信科科技有限公司 | 电压基准源电路 |
CN115185328B (zh) * | 2022-07-25 | 2024-09-13 | 深圳市恒运昌真空技术有限公司 | 调压电路、电信号检测电路与电子设备 |
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JPH0659751A (ja) * | 1992-08-13 | 1994-03-04 | Matsushita Electric Works Ltd | バンドギャップ基準電圧調整回路 |
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JP2985815B2 (ja) * | 1997-01-28 | 1999-12-06 | 日本電気株式会社 | 定電圧回路及びそれを利用したda変換回路 |
JP2000188374A (ja) * | 1998-12-22 | 2000-07-04 | Pioneer Electronic Corp | 昇圧電源回路及び半導体集積回路装置 |
JP2002312044A (ja) * | 2001-04-16 | 2002-10-25 | Denso Corp | 電源回路 |
JP2004085384A (ja) * | 2002-08-27 | 2004-03-18 | Seiko Epson Corp | 温度センサ回路、半導体集積回路及びその調整方法 |
WO2004099892A1 (en) * | 2003-04-18 | 2004-11-18 | Semiconductor Components Industries L.L.C. | Method of forming a reference voltage and structure therefor |
JP4768426B2 (ja) * | 2005-12-12 | 2011-09-07 | 株式会社リコー | フィルタの自動調整装置 |
CN1987710B (zh) * | 2005-12-23 | 2010-05-05 | 深圳市芯海科技有限公司 | 一种电压调整装置 |
JP4996203B2 (ja) * | 2006-11-07 | 2012-08-08 | ルネサスエレクトロニクス株式会社 | 電源電圧回路 |
JP5151332B2 (ja) * | 2007-09-11 | 2013-02-27 | 株式会社リコー | 同期整流型スイッチングレギュレータ |
JP4937078B2 (ja) * | 2007-10-22 | 2012-05-23 | 株式会社東芝 | 定電圧電源回路 |
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2006
- 2006-12-08 JP JP2006331391A patent/JP5068522B2/ja not_active Expired - Fee Related
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2007
- 2007-11-30 WO PCT/JP2007/073624 patent/WO2008069291A1/ja active Application Filing
- 2007-11-30 US US12/518,050 patent/US8058862B2/en not_active Expired - Fee Related
- 2007-11-30 CN CN2007800452242A patent/CN101611360B/zh active Active
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JPH0659751A (ja) * | 1992-08-13 | 1994-03-04 | Matsushita Electric Works Ltd | バンドギャップ基準電圧調整回路 |
JPH06214665A (ja) * | 1993-01-20 | 1994-08-05 | Hitachi Ltd | 定電流回路と液晶駆動回路 |
JP2004110750A (ja) * | 2002-09-20 | 2004-04-08 | Toshiba Microelectronics Corp | レギュレータ回路及び半導体集積回路 |
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JP2008146275A (ja) | 2008-06-26 |
CN101611360B (zh) | 2012-07-18 |
JP5068522B2 (ja) | 2012-11-07 |
US20100315060A1 (en) | 2010-12-16 |
CN101611360A (zh) | 2009-12-23 |
US8058862B2 (en) | 2011-11-15 |
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