Classifications

• • B—PERFORMING OPERATIONS; TRANSPORTING
  • B82—NANOTECHNOLOGY
  • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
  • B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites
• • C—CHEMISTRY; METALLURGY
  • C07—ORGANIC CHEMISTRY
  • C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
  • C07F9/00—Compounds containing elements of Groups 5 or 15 of the Periodic Table
  • C07F9/02—Phosphorus compounds
  • C07F9/28—Phosphorus compounds with one or more P—C bonds
  • C07F9/38—Phosphonic acids [RP(=O)(OH)2]; Thiophosphonic acids ; [RP(=X1)(X2H)2(X1, X2 are each independently O, S or Se)]
• • B—PERFORMING OPERATIONS; TRANSPORTING
  • B82—NANOTECHNOLOGY
  • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
  • B82Y40/00—Manufacture or treatment of nanostructures
• • C—CHEMISTRY; METALLURGY
  • C07—ORGANIC CHEMISTRY
  • C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
  • C07F9/00—Compounds containing elements of Groups 5 or 15 of the Periodic Table
  • C07F9/02—Phosphorus compounds
  • C07F9/28—Phosphorus compounds with one or more P—C bonds
  • C07F9/38—Phosphonic acids [RP(=O)(OH)2]; Thiophosphonic acids ; [RP(=X1)(X2H)2(X1, X2 are each independently O, S or Se)]
  • C07F9/3804—Phosphonic acids [RP(=O)(OH)2]; Thiophosphonic acids ; [RP(=X1)(X2H)2(X1, X2 are each independently O, S or Se)] not used, see subgroups
  • C07F9/3808—Acyclic saturated acids which can have further substituents on alkyl
• • C—CHEMISTRY; METALLURGY
  • C07—ORGANIC CHEMISTRY
  • C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
  • C07F9/00—Compounds containing elements of Groups 5 or 15 of the Periodic Table
  • C07F9/02—Phosphorus compounds
  • C07F9/28—Phosphorus compounds with one or more P—C bonds
  • C07F9/38—Phosphonic acids [RP(=O)(OH)2]; Thiophosphonic acids ; [RP(=X1)(X2H)2(X1, X2 are each independently O, S or Se)]
  • C07F9/40—Esters thereof
• • C—CHEMISTRY; METALLURGY
  • C10—PETROLEUM, GAS OR COKE INDUSTRIES; TECHNICAL GASES CONTAINING CARBON MONOXIDE; FUELS; LUBRICANTS; PEAT
  • C10M—LUBRICATING COMPOSITIONS; USE OF CHEMICAL SUBSTANCES EITHER ALONE OR AS LUBRICATING INGREDIENTS IN A LUBRICATING COMPOSITION
  • C10M105/00—Lubricating compositions characterised by the base-material being a non-macromolecular organic compound
  • C10M105/74—Lubricating compositions characterised by the base-material being a non-macromolecular organic compound containing phosphorus
• • C—CHEMISTRY; METALLURGY
  • C10—PETROLEUM, GAS OR COKE INDUSTRIES; TECHNICAL GASES CONTAINING CARBON MONOXIDE; FUELS; LUBRICANTS; PEAT
  • C10M—LUBRICATING COMPOSITIONS; USE OF CHEMICAL SUBSTANCES EITHER ALONE OR AS LUBRICATING INGREDIENTS IN A LUBRICATING COMPOSITION
  • C10M2223/00—Organic non-macromolecular compounds containing phosphorus as ingredients in lubricant compositions
  • C10M2223/06—Organic non-macromolecular compounds containing phosphorus as ingredients in lubricant compositions having phosphorus-to-carbon bonds
• • C—CHEMISTRY; METALLURGY
  • C10—PETROLEUM, GAS OR COKE INDUSTRIES; TECHNICAL GASES CONTAINING CARBON MONOXIDE; FUELS; LUBRICANTS; PEAT
  • C10M—LUBRICATING COMPOSITIONS; USE OF CHEMICAL SUBSTANCES EITHER ALONE OR AS LUBRICATING INGREDIENTS IN A LUBRICATING COMPOSITION
  • C10M2223/00—Organic non-macromolecular compounds containing phosphorus as ingredients in lubricant compositions
  • C10M2223/06—Organic non-macromolecular compounds containing phosphorus as ingredients in lubricant compositions having phosphorus-to-carbon bonds
  • C10M2223/061—Metal salts
• • C—CHEMISTRY; METALLURGY
  • C10—PETROLEUM, GAS OR COKE INDUSTRIES; TECHNICAL GASES CONTAINING CARBON MONOXIDE; FUELS; LUBRICANTS; PEAT
  • C10N—INDEXING SCHEME ASSOCIATED WITH SUBCLASS C10M RELATING TO LUBRICATING COMPOSITIONS
  • C10N2030/00—Specified physical or chemical properties which is improved by the additive characterising the lubricating composition, e.g. multifunctional additives
  • C10N2030/06—Oiliness; Film-strength; Anti-wear; Resistance to extreme pressure
• • C—CHEMISTRY; METALLURGY
  • C10—PETROLEUM, GAS OR COKE INDUSTRIES; TECHNICAL GASES CONTAINING CARBON MONOXIDE; FUELS; LUBRICANTS; PEAT
  • C10N—INDEXING SCHEME ASSOCIATED WITH SUBCLASS C10M RELATING TO LUBRICATING COMPOSITIONS
  • C10N2050/00—Form in which the lubricant is applied to the material being lubricated
  • C10N2050/015—Dispersions of solid lubricants
  • C10N2050/02—Dispersions of solid lubricants dissolved or suspended in a carrier which subsequently evaporates to leave a lubricant coating
• • C—CHEMISTRY; METALLURGY
  • C10—PETROLEUM, GAS OR COKE INDUSTRIES; TECHNICAL GASES CONTAINING CARBON MONOXIDE; FUELS; LUBRICANTS; PEAT
  • C10N—INDEXING SCHEME ASSOCIATED WITH SUBCLASS C10M RELATING TO LUBRICATING COMPOSITIONS
  • C10N2060/00—Chemical after-treatment of the constituents of the lubricating composition
  • C10N2060/08—Halogenation
• • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
  • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
  • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
  • Y10T428/00—Stock material or miscellaneous articles
  • Y10T428/31504—Composite [nonstructural laminate]
  • Y10T428/3154—Of fluorinated addition polymer from unsaturated monomers
• • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
  • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
  • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
  • Y10T428/00—Stock material or miscellaneous articles
  • Y10T428/31504—Composite [nonstructural laminate]
  • Y10T428/31678—Of metal

Definitions

• the present invention relates to fluorinated organic compounds that self-assemble to form monolayers, and in particular to fluorinated phosphonic acids.
• Self-assembling materials spontaneously form a structure (for example, micelle or monolayer) when they contact another substance.
• Monolayer formation is particularly useful when it occurs on the surface of a solid substrate (for example, a piece of metal). If a monolayer is formed from a material that imparts a low surface energy to a surface of a substrate, then one or more useful properties such as water repellency, corrosion resistance, lubricity, and adhesive release may be imparted to that surface. If the surface energy is low enough, oil repellency and soil (that is, stain) resistance may be achieved. Generally, surface energies this low may be achieved through use of fluorocarbon materials.
• Fluorinated self-assembled monolayers have been employed in soil resistant coatings, anti-reflective glass coatings, and release coatings.
• Typical self-assembling materials consist of a polar head group attached to a hydrophobic tail.
• self-assembling materials having a fluorinated tail have gained wide acceptance in industry. This is because they typically substantially outperform alternative materials, such as those having a hydrocarbon or silicone tail, for example, in terms of adhesive release and soil resistance.
• Commercial products in this area have typically utilized materials bearing seven- and eight-carbon perfluoroalkyl groups. Recently, there has been a significant effort in industry to find alternative materials to such groups.
• the present invention provides a fluorinated phosphonic acid compound having the formula: O
• R! is a straight chain alkylene group having from 3 to 21 carbon atoms, an oxa-substituted straight chain alkylene group having from 2 to 20 carbon atoms, or a thia-substituted straight chain alkylene group having from 2 to 20 carbon atoms;
• R2 is a perfluoroalkyl group having from 4 to 10 carbon atoms
• R3 is hydrogen, an alkali metal cation, or an alkyl group having from 1 to 6 carbon atoms
• M is hydrogen or an alkali metal cation, with the proviso that if R! is an unsubstituted straight chain alkylene group, then the sum of carbon atoms in R! and R ⁇ combined is at least 10.
• the present invention provides a method of treating the surface of an article, the method comprising: providing a substrate having a surface; and applying a fluorinated phosphonic acid compound to the surface of the substrate, the compound having the formula:
• R! is a straight chain alkylene group having from 3 to 21 carbon atoms, an oxa-substituted straight chain alkylene group having from 2 to 20 carbon atoms, or a thia-substituted straight chain alkylene group having from 2 to 20 carbon atoms;
• R2 is a perfluoroalkyl group having from 4 to 10 carbon atoms
• R3 is hydrogen, an alkali metal cation, or an alkyl group having from 1 to 6 carbon atoms
• M is hydrogen or an alkali metal cation, with the proviso that if R! is an unsubstituted straight chain alkylene group, then the sum of carbon atoms in R ⁇ and R ⁇ combined is at least 10.
• the present invention provides an article comprising a substrate having a surface, the surface intimately contacting at least a partial monolayer of a fluorinated phosphonic acid compound having the formula:
• R! is a straight chain alkylene group having from 3 to 21 carbon atoms, an oxa-substituted straight chain alkylene group having from 2 to 20 carbon atoms, or a thia-substituted straight chain alkylene group having from 2 to 20 carbon atoms;
• R2 is a perfluoroalkyl group having from 4 to 10 carbon atoms
• R3 is hydrogen, an alkali metal cation, or an alkyl group having from 1 to 6 carbon atoms;
• the present invention provides an article prepared by a process, the process comprising: providing a substrate having a surface; and applying a fluorinated phosphonic acid compound to the surface of the substrate, the compound having the formula:
• R! is a straight chain alkylene group having from 3 to 21 carbon atoms, an oxa-substituted straight chain alkylene group having from 2 to 20 carbon atoms, or a thia-substituted straight chain alkylene group having from 2 to 20 carbon atoms;
• R2 is a perfluoroalkyl group having from 4 to 10 carbon atoms;
• R3 is hydrogen, an alkali metal cation, or an alkyl group having from 1 to 6 carbon atoms
• M is hydrogen or an alkali metal cation, with the proviso that if R! is an unsubstituted straight chain alkylene group, then the sum of carbon atoms in R ⁇ and R ⁇ combined is at least 10.
• Fluorinated phosphonic acids of the present invention self-assemble (for example, forming monolayer films) when applied to a wide variety of substrates, resulting in coatings on the substrates that exhibit at least one of low surface energy, adhesive release, lubricity, water repellency, and/or soil resistance.
• perfluoro refers to the exhaustive substitution of hydrogen by fluorine in the group or molecule to which it refers.
• Fluorinated phosphonic acids of the present invention have the formula
• R s a straight chain alkylene group having from 3 to 21 carbon atoms, an oxa- substituted straight chain alkylene group having from 2 to 20 carbon atoms, or a thia- substituted straight chain alkylene group having from 2 to 20 carbon atoms.
• R! is a straight chain alkylene group having from 5 to 21 carbon atoms, more desirably R! is a straight chain alkylene group having from 10 to 21 carbon atoms.
• Two useful straight chain alkylene groups are decane-l,10-diyl and heneicosane-l,21-diyl.
• oxygen atoms and/or sulfur atoms being of similar steric size to methylene (that is, -CH2-), may be substituted for methylene groups of the alkylene chain without significantly disrupting the self-assembling nature and/or performance characteristics of fluorinated phosphonic acids according to the present invention.
• oxa-or thia-substitution that is, replacement of a methylene by an O or S atom
• R2 is a perfluoroalkyl group having from 4 to 10 carbon atoms with the proviso that if R! is an unsubstituted straight chain alkylene group, then the sum of carbon atoms in R! and R ⁇ combined is at least 10.
• exemplary perfluoroalkyl groups include isomers of perfluorobutyl, perfluoropentyl, perfluorohexyl, and mixtures thereof.
• R ⁇ is a perfluoro-n-butyl group.
• R3 is hydrogen, an alkali metal cation (for example, lithium, sodium, potassium), or an alkyl group having from 1 to 6 carbon atoms (for example, methyl, ethyl, butyl, hexyl). Desirably, R ⁇ is hydrogen or an alkali metal.
• M is hydrogen or an alkali metal cation.
• Fluorinated phosphonic acids of the present invention can be prepared by a variety of well known procedures (for example, by a Michaelis-Arbuzov reaction on the corresponding alkyl chlorides, bromides, or iodides followed by hydrolysis, as described, for example, by Bhatacharya et al. in Chemical Reviews (1981), vol. 81, pp.
• Fluorinated phosphonic acids of the present invention may be advantageously applied to a wide variety of substrates, whereby they may form a monolayer covering at least a portion of surface of the substrate. Such a monolayer is typically oriented such that the phosphono group contacts the substrate surface with the perfluoroalkyl group extending away from the substrate surface.
• Fluorinated phosphonic acids of the present invention may be advantageously applied to the native oxide surface layer of a variety of metallic substrates, although other substrates are also useful.
• Exemplary metals include chromium, aluminum, copper, nickel, titanium, silver, and alloys and mixtures thereof.
• Exemplary other materials include metal oxides and mixed metal oxides and nitrides including alumina, titania, titanium nitride, and indium tin oxide.
• the substrate comprises chromium, aluminum, copper, and/or nickel.
• Exemplary methods for applying the fluorinated phosphonic acids of the present invention to a substrate include, for example, spraying, dip coating, wiping, and spin coating of a dilute (for example, an 0.1 weight percent) solution of the acid in an organic solvent such as ethanol or isopropyl alcohol. Depending on exact coating conditions used, some of these methods may apply an amount of fluorinated phosphonic acid in excess of one monolayer. In such cases, the excess material is at most only weakly bound and typically can be removed easily by rinsing with an appropriate solvent.
• fluorinated phosphonic acids of the present invention are applied as a layer to at least a portion, desirably all, of the substrate surface to be treated.
• the fluorinated phosphonic acid forms a monolayer (for example, a self-assembled monolayer) on the surface of the substrate.
• the layer of fluorinated phosphonic acid may be of any thickness, but after rinsing away any excess unbound material and drying, the thickness is typically in the range of from 0.5 to 10 nanometers (nm), desirably in the range of from 1 to 5 nm, more desirably in the range of from 1 to 2.5 nm.
• Fluorinated phosphonic acids of the present invention have applicability, for example, as mold release agents, soil resistant coatings, lubricity coatings, water-repellent coatings, and/or in fabrication of microfluidic and/or microelectromechanical devices.
• Objects and advantages of this invention are further illustrated by the following examples, but the particular materials and amounts thereof recited in these examples, as well as other conditions and details should not be construed to unduly limit this invention.
• Root temperature in the following preparations and examples means approximately 20 °C - 24 °C.
• a mixture of 37.4 g of l-iodo-lH,lH,2H,2H-perfluorohexane and 50.0 g of triethyl phosphite was heated at 150 °C. After 16 hr, an additional 50.0 g of triethyl phosphite was added, and heating was continued. After 2 hr, an additional 50.0 g of triethyl phosphite was again added, and heating was continued for another 24 hr. Diethyl ethylphosphonate and other volatiles were removed by distillation through a 12-inch (30 cm) vacuum- jacketed packed column, b.p. 34-38 °C at 0.05 torr (7 Pa).
• NMR analysis that is, ⁇ H nuclear magnetic resonance spectroscopy
• the concentrate was combined with 100 mL of ethyl acetate, 100.0 g of perfluorobutyl iodide, and 0.82 g of 2,2'-azobisisobutyronitrile, and the resultant solution was degassed and heated at 70 °C.
• EXAMPLE 1 This example describes the preparation of CF3(CF2)3(CH2)gPO3H2. To a solution of 190.70 g of perfluorobutyl iodide and 38.47 g of 7-octen-l-ol in a mixture of 480 mL of acetonitrile and 180 mL of water was added a mixture of 29.40 g of sodium bicarbonate and 58.33 g of sodium dithionite in portions with stirring. The reaction mixture was stirred at room temperature overnight and acidified with 1 N hydrochloric acid. The mixture was diluted with 400 mL of water and extracted with 3 x 200 mL portions of diethyl ether, and the combined organic phases were washed with 2 x
• EXAMPLE 2 The example describes the preparation of CF3(CF2)3(CH2)i 1PO3H2. To a solution of 199.7 g of perfluorobutyl iodide and 93.7 g of 10-undecen-l-ol in a mixture of 700 mL of acetonitrile and 300 mL of water, was added a mixture of 53.8 g of sodium bicarbonate and 106.2 g of sodium dithionite in small portions with stirring. The reaction mixture was stirred at room temperature overnight and acidified with IN hydrochloric acid.
• the reaction mixture was heated at 100 °C for 24 hr and poured into 1 liter of water.
• the mixture was extracted with hexanes, and the combined organic phases were washed with saturated aqueous sodium bicarbonate and dried over anhydrous magnesium sulfate.
• the solution was concentrated to an amber liquid, which was eluted through 3 inches of silica with hexanes. Concentration of the eluent yielded a light amber liquid, and bulb-to-bulb distillation gave 19.82 g of 1-bromo-l l-(nonafluorobutyl)undecane as a clear, colorless liquid, b.p. 120-170 °C at 0.06 torr (8 Pa).
• EXAMPLE 3 The example describes the preparation of CF3(CF2)7(CH2) ⁇ 1PO3H2. To a solution of 41.10 g of perfluorooctyl iodide and 11.92 g of 10-undecen- 1 -ol in a mixture of 100 mL of acetonitrile and 40 mL of water was added a mixture of 6.89 g of sodium bicarbonate and 13.58 g of sodium dithionite in small portions with stirring. The reaction mixture was stirred at room temperature overnight and acidified with 1 N hydrochloric acid.
• a mixture of 5.23 g of 1-bromo-l l-(heptadecafluorooctyl)undecane and 4.2 g of triethyl phosphite was heated at 150 °C. After 18 hr, diethyl ethylphosphonate and other volatiles were distilled from the reaction mixture, b.p. 30-50 °C at 0.05 torr (7 Pa). The concentrate was combined with an additional 2.0 g of triethyl phosphite, and the mixture was heated at 150 °C.
• the precipitated salts were extracted with two 50 mL portions of diethyl ether, and the combined organic solutions were washed with 100 mL of water.
• the cloudy aqueous phase was acidified with 1 N aqueous hydrochloric acid and extracted with two 50 mL portions of diethyl ether.
• the combined organic phases were washed with brine and dried over anhydrous magnesium sulfate. Filtration and concentration provided 4.40 g of 21-docosen-l-ol as a white solid, m.p. 62-64 °C, which was used without further purification.
• the product was dissolved in a 1:1 mixture of hexanes and ethanol, 100 mg of 5 weight percent palladium on carbon was added, and this mixture was maintained at a pressure of 50 psi (350 kPa) of hydrogen on a Parr hydrogenator for 18 hr. Filtration and concentration left 1.69 g of 22-(nonafluorobutyl)-l-docosanol as a white solid, which was used without further purification.
• EXAMPLE 5 This example describes the preparation and evaluation of self-assembled films on a substrate.
• Four-inch diameter silicon wafers coated with vacuum-deposited 500 nanometer thickness films of chromium, aluminum, copper, and nickel were obtained from WaferNet, San Jose, California. These were cut into quarters, and the pieces were subjected for 5 minutes to ultraviolet light and ozone in an apparatus in which an ultraviolet lamp (5 inch by 5 inch square (12.5 cm by 12.5 cm) ultraviolet lamp obtained under the trade designation "UV GRID LAMP" from BHK, Claremont, California, model 88-9102-02) was encased in a small sheet metal box (13 cm wide x 14 cm deep x 15 cm high) such that the lamp was suspended 8 cm above the bottom of the box.
• an ultraviolet lamp 5 inch by 5 inch square (12.5 cm by 12.5 cm
• UV GRID LAMP ultraviolet lamp obtained under the trade designation "UV GRID LAMP" from BHK, Claremont, California, model 88-9102-02
• a small lab jack was used to position silicon wafer pieces to be cleaned as close as possible to the ultraviolet lamp without physically contacting the lamp.
• the front of the box was a door, hinged at the top, that allowed samples to be inserted and removed.
• a small hole in one side of the box was attached to a source of oxygen that flowed into the box at a rate of approximately 1 to 5 standard liters per minute.
• Quarter-wafer pieces of ultraviolet light /ozone cleaned copper-, nickel-, and aluminum-coated silicon wafers were coated by immersion in a 0.1 weight percent solution of the indicated fluorinated phosphonic acid in denatured ethanol for 1 hr, followed by rinsing in fresh absolute ethanol and drying under a nitrogen stream. Static, advancing, and receding contact angles were measured for water and hexadecane on the metal-coated side of the coated wafer samples using a video contact angle analyzer having the trade designation "VCA-2500XE" obtained from AST Products, Billerica, Massachusetts.
• Quarter-wafer pieces of ultraviolet light /ozone cleaned chromium-coated silicon wafers were coated by spin coating (that is, 5 sec at 300 revolutions per second, then 15 seconds at 2000 revolutions per minute) the wafer with a 0.1 weight percent solution of the indicated fluorinated phosphonic acid in denatured ethanol, heating the coated wafer at 150 °C for 3 min on a vacuum hotplate, then rinsing in fresh absolute ethanol, and drying under a nitrogen stream. Water static angles were measured using 5 microliter drops, while advancing and receding angles were measured using 1-2 microliter drops. Reported contact angle measurements in Tables 1-4 (below) represent the average of measurements on opposite sides of at least three drops.
• Table 2 reports measured contact angles for water and hexadecane on aluminum- coated silicon wafers.
• Table 3 reports measured contact angles for water and hexadecane on copper- coated silicon wafers.
• Table 4 reports measured contact angles for water and hexadecane on nickel- coated silicon wafers.

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