US20180014408A1 - Method for manufacturing ceramic substrate, ceramic substrate, and silver-based conductor material - Google Patents

Method for manufacturing ceramic substrate, ceramic substrate, and silver-based conductor material Download PDF

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Publication number
US20180014408A1
US20180014408A1 US15/543,290 US201615543290A US2018014408A1 US 20180014408 A1 US20180014408 A1 US 20180014408A1 US 201615543290 A US201615543290 A US 201615543290A US 2018014408 A1 US2018014408 A1 US 2018014408A1
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Prior art keywords
silver
unfired
conductor material
based conductor
manufacturing
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Inventor
Tatsuya Katoh
Masanori Ito
Masaki Kutsuna
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Niterra Co Ltd
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NGK Spark Plug Co Ltd
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Assigned to NGK SPARK PLUG CO., LTD. reassignment NGK SPARK PLUG CO., LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: ITO, MASANORI, KATOH, TATSUYA, KUTSUNA, MASAKI
Publication of US20180014408A1 publication Critical patent/US20180014408A1/en
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/40Forming printed elements for providing electric connections to or between printed circuits
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B9/00Layered products comprising a layer of a particular substance not covered by groups B32B11/00 - B32B29/00
    • B32B9/005Layered products comprising a layer of a particular substance not covered by groups B32B11/00 - B32B29/00 comprising one layer of ceramic material, e.g. porcelain, ceramic tile
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C10/00Devitrified glass ceramics, i.e. glass ceramics having a crystalline phase dispersed in a glassy phase and constituting at least 50% by weight of the total composition
    • C03C10/0054Devitrified glass ceramics, i.e. glass ceramics having a crystalline phase dispersed in a glassy phase and constituting at least 50% by weight of the total composition containing PbO, SnO2, B2O3
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C4/00Compositions for glass with special properties
    • C03C4/14Compositions for glass with special properties for electro-conductive glass
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B35/00Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
    • C04B35/622Forming processes; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
    • C04B35/626Preparing or treating the powders individually or as batches ; preparing or treating macroscopic reinforcing agents for ceramic products, e.g. fibres; mechanical aspects section B
    • C04B35/63Preparing or treating the powders individually or as batches ; preparing or treating macroscopic reinforcing agents for ceramic products, e.g. fibres; mechanical aspects section B using additives specially adapted for forming the products, e.g.. binder binders
    • C04B35/6303Inorganic additives
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/12Mountings, e.g. non-detachable insulating substrates
    • H01L23/14Mountings, e.g. non-detachable insulating substrates characterised by the material or its electrical properties
    • H01L23/15Ceramic or glass substrates
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0296Conductive pattern lay-out details not covered by sub groups H05K1/02 - H05K1/0295
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/0306Inorganic insulating substrates, e.g. ceramic, glass
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/09Use of materials for the conductive, e.g. metallic pattern
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/09Use of materials for the conductive, e.g. metallic pattern
    • H05K1/092Dispersed materials, e.g. conductive pastes or inks
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/10Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
    • H05K3/12Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/10Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
    • H05K3/12Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns
    • H05K3/1283After-treatment of the printed patterns, e.g. sintering or curing methods
    • H05K3/1291Firing or sintering at relative high temperatures for patterns on inorganic boards, e.g. co-firing of circuits on green ceramic sheets
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/22Secondary treatment of printed circuits
    • H05K3/28Applying non-metallic protective coatings
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/22Secondary treatment of printed circuits
    • H05K3/28Applying non-metallic protective coatings
    • H05K3/285Permanent coating compositions
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/321Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/40Forming printed elements for providing electric connections to or between printed circuits
    • H05K3/4038Through-connections; Vertical interconnect access [VIA] connections
    • H05K3/4053Through-connections; Vertical interconnect access [VIA] connections by thick-film techniques
    • H05K3/4061Through-connections; Vertical interconnect access [VIA] connections by thick-film techniques for via connections in inorganic insulating substrates
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/46Manufacturing multilayer circuits
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/46Manufacturing multilayer circuits
    • H05K3/4644Manufacturing multilayer circuits by building the multilayer layer by layer, i.e. build-up multilayer circuits
    • H05K3/4664Adding a circuit layer by thick film methods, e.g. printing techniques or by other techniques for making conductive patterns by using pastes, inks or powders
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2307/00Properties of the layers or laminate
    • B32B2307/20Properties of the layers or laminate having particular electrical or magnetic properties, e.g. piezoelectric
    • B32B2307/202Conductive
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C2204/00Glasses, glazes or enamels with special properties
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2237/00Aspects relating to ceramic laminates or to joining of ceramic articles with other articles by heating
    • C04B2237/30Composition of layers of ceramic laminates or of ceramic or metallic articles to be joined by heating, e.g. Si substrates
    • C04B2237/40Metallic
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2237/00Aspects relating to ceramic laminates or to joining of ceramic articles with other articles by heating
    • C04B2237/50Processing aspects relating to ceramic laminates or to the joining of ceramic articles with other articles by heating
    • C04B2237/70Forming laminates or joined articles comprising layers of a specific, unusual thickness
    • C04B2237/704Forming laminates or joined articles comprising layers of a specific, unusual thickness of one or more of the ceramic layers or articles
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/01Dielectrics
    • H05K2201/0137Materials
    • H05K2201/017Glass ceramic coating, e.g. formed on inorganic substrate
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/07Electric details
    • H05K2201/0753Insulation
    • H05K2201/0769Anti metal-migration, e.g. avoiding tin whisker growth
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/11Treatments characterised by their effect, e.g. heating, cooling, roughening
    • H05K2203/1126Firing, i.e. heating a powder or paste above the melting temperature of at least one of its constituents
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/46Manufacturing multilayer circuits
    • H05K3/4611Manufacturing multilayer circuits by laminating two or more circuit boards
    • H05K3/4626Manufacturing multilayer circuits by laminating two or more circuit boards characterised by the insulating layers or materials
    • H05K3/4629Manufacturing multilayer circuits by laminating two or more circuit boards characterised by the insulating layers or materials laminating inorganic sheets comprising printed circuits, e.g. green ceramic sheets
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00Metal working
    • Y10T29/49Method of mechanical manufacture
    • Y10T29/49002Electrical device making
    • Y10T29/49117Conductor or circuit manufacturing
    • Y10T29/49124On flat or curved insulated base, e.g., printed circuit, etc.
    • Y10T29/49155Manufacturing circuit on or in base
    • Y10T29/49163Manufacturing circuit on or in base with sintering of base
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/12All metal or with adjacent metals
    • Y10T428/12458All metal or with adjacent metals having composition, density, or hardness gradient

Definitions

  • the present invention relates to a method for manufacturing a ceramic substrate, a ceramic substrate, and a silver-based conductor material.
  • LTCC low temperature co-fired ceramic
  • Such an LTCC substrate is usually manufactured by laminating a plurality of green sheets, each having a wiring trace formed of an unfired conductor material, and firing the green sheets (for example, see the following Patent Documents 1 and 2, etc.).
  • Patent Document 1 Japanese Patent Application Laid-Open (kokai) No. H6-252524
  • Patent Document 2 Japanese Patent Application Laid-Open (kokai) No. 2007-234537
  • a process of manufacturing a ceramic substrate using a silver-based conductor material, not limited to the above-mentioned LTCC substrate, has a problem of diffusion of silver contained in the conductor material into the ceramic during firing. This may cause formation of voids in the substrate, deformation of the substrate, and change of the color of the substrate.
  • Patent Document 1 discloses a technique of coating the surfaces of the particles of a silver-based conductor powder with an antimony salt or an antimonate salt.
  • Patent Document 2 discloses a technique of adding a silicon (Si) powder to a conductor paste.
  • the present invention has been accomplished to solve at least the above-described problem by employing a method different from conventional ones.
  • the present invention can be realized as the following modes.
  • One mode of the present invention is a method for manufacturing a ceramic substrate containing glass.
  • the manufacturing method includes a firing step.
  • the firing step may be a step of firing an unfired ceramic layer and an unfired silver-based conductor material disposed on the unfired ceramic layer.
  • the unfired silver-based conductor material may contain at least one of a metal boride and a metal silicide.
  • the manufacturing method of this mode prevents diffusion of silver during firing because at least one of a metal boride and a metal silicide is added in the unfired silver-based conductor material.
  • the unfired silver-based conductor material may be disposed on a surface of an unfired ceramic layer, between unfired ceramic layers adjacent to each other, or in through holes formed in an unfired ceramic layer.
  • the metal boride may be at least one of lanthanum hexaboride, silicon hexaboride, titanium diboride, and tantalum diboride.
  • the manufacturing method of this mode prevents diffusion of silver during firing more effectively.
  • the metal silicide may be at least one of titanium disilicide, zirconium disilicide, tungsten disilicide, chromium disilicide, molybdenum disilicide, and tantalum disilicide.
  • the manufacturing method of this mode prevents diffusion of silver during firing more effectively.
  • the unfired silver-based conductor material contains the metal boride or the metal silicide.
  • the amount of the metal boride or the metal silicide with respect to the amount of the inorganic components of the unfired silver-based conductor material may be greater than 3 vol. % and less than 20 vol. %.
  • the manufacturing method of this mode prevents diffusion of silver during firing more effectively and also prevents impurities from remaining in the conductor of the substrate.
  • the unfired silver-based conductor material contains a silver powder and at least one of the metal boride and the metal silicide may be attached to surfaces of particles of the silver powder in the silver-based conductor material.
  • the manufacturing method of this mode prevents oxidation of silver during firing more effectively. As a result, the effect of preventing diffusion of silver into a ceramic layer improves.
  • a second mode of the present invention is a ceramic substrate.
  • the ceramic substrate may include a ceramic layer and a wiring layer of a sliver-based conductor which are formed by the firing step according to any one of the manufacturing methods of the above-mentioned mode.
  • the ceramic substrate of this mode prevents problems such as formation of voids in the ceramic substrate, warpage of the ceramic substrate, change of the color of the ceramic substrate, etc.
  • a third mode of the present invention is a silver-based conductor material which is unfired and fired together with an unfired ceramic layer to form a wiring layer in a ceramic substrate.
  • the silver-based conductor material of this mode may contain at least one of a metal boride and a metal silicide.
  • the silver-based conductor material of this mode prevents diffusion of silver in a process of manufacturing a ceramic substrate.
  • the metal boride may be at least one of lanthanum hexaboride, silicon hexaboride, titanium diboride, and tantalum diboride.
  • the metal silicide may be at least one of titanium disilicide, zirconium disilicide, tungsten disilicide, chromium disilicide, molybdenum disilicide, and tantalum disilicide.
  • All the plurality of constituent elements of each mode of the present invention are not essential.
  • a part of the elements may be properly modified, deleted, or replaced with another new element, or the limitation thereof may be partially removed.
  • a portion or all of the above-described technical features contained in one mode of the present invention may be combined with a portion or all of the above-described technical features contained in other modes of the present invention to thereby attain an independent mode of the present invention.
  • the present invention can be realized as various modes other than a method for manufacturing a ceramic substrate, a ceramic substrate, or a silver-based conductor material.
  • the present invention can be realized as a method for firing a ceramic substrate, a method for manufacturing a silver-based conductor material, an apparatus for implementing those methods, etc.
  • FIG. 1 Schematic view showing a structure of an LTCC substrate.
  • FIG. 2 Flowchart showing steps of a process of manufacturing the LTCC substrate.
  • FIG. 3 Explanatory view showing the results of an experiment for checking an effect of preventing diffusion of silver by adding an additive to a conductor paste.
  • FIG. 4 Explanatory views showing scanning electron microscope (SEM) images of LTCC substrates and images showing the silver concentration distribution profile in each of the LTCC substrates.
  • FIG. 1 is a schematic view showing the structure of an LTCC substrate 10 according to one embodiment of the present invention.
  • the LTCC substrate 10 which is a ceramic substrate is used, for example, for electronic components, high-frequency modules, IC packages, or printed wiring boards used in computers, communication devices, etc.
  • the LTCC substrate 10 has a multi-layer structure formed by laminating a plurality of ceramic insulating layers 11 . Each of the ceramic insulating layers 11 is formed by low temperature firing whose firing temperature is 1000° C. or lower.
  • Each of the ceramic insulating layers 11 has vias which are through holes for disposing via electrodes 12 .
  • the LTCC substrate 10 has wiring layers including internal electrodes 13 and external electrodes 14 , each formed between ceramic insulating layers 11 adjacent to each other. The wiring layers are electrically connected to one another through the via electrodes 12 formed in the ceramic insulating layers 11 .
  • each of the electrodes 12 to 14 is formed of a silver-based conductor material whose main component is silver.
  • a “main component” means a material component which accounts for at least 50 mass % of the mixture.
  • passive elements resistor, etc.
  • active elements ICs, etc.
  • FIG. 2 is a flowchart showing steps of a process of manufacturing the LTCC substrate 10 .
  • the LTCC substrate 10 is manufactured by firing an unfired ceramic material (green sheet) and an unfired silver-based conductor material together at low temperature.
  • a green sheet which constitutes an unfired ceramic layer containing ceramic particles and glass particles is prepared.
  • the green sheet is made by preparing a ceramic slurry by mixing together inorganic components (including a glass powder and an inorganic filler), a binder component, a plasticizer, and a solvent, and forming the ceramic slurry into the shape of a sheet using the doctor blade method or the like.
  • a conductor paste which forms electrodes 12 to 14 and which is an unfired silver-based conductor material is prepared.
  • the conductor paste is made by mixing together a powder of the silver-based material and a glass powder which are inorganic components, and an organic solvent and a resin which is a varnish component.
  • the inventor of the present invention has found that adding at least one of a metal boride and a metal silicide into the conductor paste as an inorganic component prevents diffusion of silver contained in the conductor paste, or a silver component of the conductor paste, into the ceramic insulating layer during a firing step described later. It is considered that oxygen present near the conductor paste is consumed by oxidation of the metal boride or the metal silicide during the firing step, whereby oxidation of the silver contained in the conductor paste is prevented.
  • an additive including at least one of a metal boride and a metal silicide is added to the conductor paste.
  • the following substances can be used as an additive to be added to the conductor paste.
  • metal boride examples include lanthanum hexaboride (LaB 6 ), silicon hexaboride (SiB 6 ), titanium diboride (TiB 2 ), tantalum diboride (TaB 2 ), niobium diboride (NbB 2 ), chromium diboride (CrB 2 ), molybdenum boride (MoB), zirconium diboride (ZrB 2 ), tungsten boride (WB), vanadium diboride (VB 2 ), and hafnium diboride (HfB 2 ).
  • LaB 6 lanthanum hexaboride
  • SiB 6 silicon hexaboride
  • TiB 2 titanium diboride
  • TaB 2 tantalum diboride
  • NbB 2 niobium diboride
  • CrB 2 chromium diboride
  • MoB molybdenum boride
  • ZrB 2 zirconium diboride
  • metal silicide examples include zirconium disilicide (ZrSi 2 ), titanium disilicide (TiSi 2 ), tungsten disilicide (WSi 2 ), molybdenum disilicide (MoSi 2 ), tantalum disilicide (TaSi 2 ), chromium disilicide (CrSi 2 ), niobium disilicide (NbSi 2 ), iron disilicide (FeSi 2 ), and hafnium disilicide (HfSi 2 ).
  • ZrSi 2 zirconium disilicide
  • TiSi 2 titanium disilicide
  • WSi 2 tungsten disilicide
  • MoSi 2 molybdenum disilicide
  • TaSi 2 tantalum disilicide
  • CrSi 2 chromium disilicide
  • NbSi 2 niobium disilicide
  • FeSi 2 iron disilicide
  • hafnium disilicide hafnium disilicide
  • the metal borides and the metal silicides described above are just examples.
  • the additive may be a metal boride or a metal silicide other than those described above.
  • the metal boride or the metal silicide used as an additive is preferably a one which initiates a reaction with oxygen during the firing step described later.
  • the metal boride or the metal silicide preferably has an oxidation temperature which is lower than the firing temperature during the firing step 4 described later.
  • the “oxidation temperature” is a peak temperature at which oxidation occurs, and is a value measured through thermogravimetric-differential thermal analysis (TG-DTA).
  • TG-DTA thermogravimetric-differential thermal analysis
  • the oxidation temperature of the metal boride or the metal silicide as an additive is preferably 800° C.
  • the oxidation temperature of the metal boride or the metal silicide as an additive is preferably 400° C. or higher, and more preferably 500° C. or higher. Diffusion of silver is prevented if the oxidized silver is not wetted by the glass material contained in the green sheet when the glass material softens during the firing step. For this reason, the oxidation temperature of the metal boride or the metal silicide as an additive is preferably lower than the glass-transition temperature of the glass material contained in the green sheet prepared in step 1 .
  • the additive may be added in the form of powder, for example, concurrently with or after the step of mixing the inorganic components and the varnish components.
  • the additive may be added before mixing the inorganic components and the varnish components.
  • the additive is added in such a manner that the surfaces of the particles of the silver-based material contained in the inorganic components are coated with the additive.
  • the silver-based material can be coated with the additive by the following method. First, the additive is dissolved or dispersed in an organic solvent (toluene, xylene, or alcohol). Then, a powder of the silver-based material is dispersed or suspended in the solution or dispersion of the additive.
  • the solvent is kept still for a predetermined time or stirred so as to cause the additive to adhere to the surfaces of the particles of the silver-based material. Coating the silver-based material with the additive as described prevents oxidation of silver to a greater degree, and improves the effect for suppressing silver diffusion.
  • the additive may be added to the conductor paste using a method other than that described above.
  • the amount of additive with respect to the amount of the inorganic components of the conductor paste is preferably more than 3 vol. %, more preferably more than 5 vol. %. This condition allows the effect for suppressing silver diffusion to be attained more reliably.
  • the amount of additive with respect to the amount of inorganic components of the conductor paste is preferably less than 20 vol. %, more preferably less than 18 vol. %. This condition prevents impurities originating from the additive in the conductor paste from remaining in the LTCC substrate 10 after firing.
  • step 3 the above-described conductor paste is disposed on the green sheet. Specifically, vias are formed in the green sheet by a hole-making operation such as punching, and the vias are filled with the conductor paste. A wiring trace is printed on each surface of the green sheet by applying the conductor paste thereto by means of screen printing or the like. After the wiring trace is formed, a plurality of such green sheets are laminated to form an unfired laminate.
  • step 4 the unfired laminate is fired at a low temperature.
  • the firing temperature in step 4 may be a temperature preset in accordance with the glass-transition temperature of the material component of the green sheet prepared in step 1 . Specifically, the firing temperature in step 4 may be, for example, approximately 750° C. to 950° C.
  • the LTCC substrate 10 is completed. Passive elements and active elements to be connected to the electrodes 14 are disposed on the completed LTCC substrate 10 .
  • addition of the metal boride or the metal silicide to the conductor paste in step 2 prevents diffusion of silver from the silver-based conductor material to the ceramic insulating layer 11 .
  • Local change of the color of the ceramic caused by a change in the composition of the ceramic near the wiring trace as well as local deterioration of the strength of the ceramic insulating layer 11 are also prevented.
  • acceleration of firing-caused contraction only near the conductor paste is prevented, and formation of voids between the electrodes 12 to 14 and the ceramic insulating layers 11 are prevented.
  • FIG. 3 is an explanatory view showing the results of an experiment for checking an effect of preventing diffusion of silver by adding the additive to the conductor paste.
  • This experiment checked diffusion of silver into the ceramic insulating layers using samples S01 to S18 (missing numbers: S04 and S16) of LTCC substrates manufactured through use of a conductor paste containing an additive and samples T01 to T03 of the LTCC substrates manufactured through use of a conductor paste containing no additive.
  • the specific conditions for manufacturing samples S01 to S18 (missing numbers: S04 and S16) and T01 to T03 are as follows.
  • a powder of borosilicate-based glass whose main components are silica (SiO 2 ), alumina (Al 2 O 3 ), and boric acid (H 3 BO 3 ) and a powder of alumina were put into a pot formed of alumina such that their volume ratio became 60:40 and the total weight became 1 kg.
  • a green sheet with a thickness of 0.15 mm was made from the ceramic slurry using the doctor blade method.
  • Inorganic components a silver powder and a borosilicate glass powder
  • Varnish components ethyl cellulose resin and terpineol solvent
  • Additive any one of LaB 6 , SiB 6 , TiB 2 , TaB 2 , ZrSi 2 , TiSi 2 , WSi 2 , CrSi 2 , MoSi 2 , and TaSi 2
  • the amount of additive with respect to the amount of the inorganic components of the conductor paste was set to 15 vol. % for samples S01 to S03, S05 to S10, and S13 to S15, 9 vol. % for samples S11 and S17, and 3 vol. % for sample S12.
  • the oxidation temperatures shown in the table were measured through the TG-DTA method.
  • the mixture of the above-described inorganic components and varnish components was kneaded with a triple roll mill, whereby the conductor paste for sample S18 was prepared.
  • the amount of additive with respect to the amount of the conductor paste were 15 vol. %.
  • the conductor pastes for samples T01 and T02 were prepared by the same method as that for samples S01 to S17 (missing numbers: S04 and S16) except that no additive was added.
  • the conductor paste for sample T03 was prepared by the same method as that for samples S01 to S17 (missing numbers: S04 and S16) except that in place of the metal boride or the metal silicide, SiO 2 was added as an additive.
  • Vias were formed in the green sheet and filled with the conductor paste.
  • a wiring trace was formed on a surface of the green sheet by applying the conductor paste thereto.
  • a plurality of such green sheets with the wiring trace formed thereon were laminated to form an unfired laminate.
  • each of sections (A) to (G) of FIG. 4 shows a scanning electron microscope (SEM) image of a cross section of the LTCC substrate parallel to a direction of lamination of the LTCC substrate and an image of the same cross section as the SEM image captured by an electron probe micro analyzer (EPMA).
  • SEM scanning electron microscope
  • EPMA electron probe micro analyzer
  • the SEM image is shown on the upper side and the image captured by EPMA is shown on the lower side.
  • the image captured by an EPMA (hereinafter, simply referred to as the “EPMA image”) shows the silver concentration distribution profile of the LTCC substrate in colors in response to the level of silver concentration.
  • Section (G) of FIG. 4 has the SEM image and the EPMA image of sample T 01 which was manufactured through use of a conductor paste containing no additive.
  • the internal electrode formed of the silver-based conductor extends in the horizontal direction of the images.
  • the inventors of the present invention acquired the SEM images and the EPMA images of predetermined polished cross sections of samples S01 to S18 (missing numbers: S04 and S1 6 ), and T01 to T03.
  • the inventor determined a “silver diffusion distance” for each sample from the EPMA image of each sample. Specifically, the inventor used the concentration of Ag at an electrode interface through which the internal electrode is in contact with the ceramic insulating layer as a reference concentration, and measured, at five points, the distance from the electrode interface to a region in which the concentration of Ag in the ceramic insulating layer becomes equal to or less than half the reference concentration. The average of the measured distances was used as the “silver diffusion distance.”
  • the silver diffusion distances were 30 ⁇ m or less in all samples S01 to S18 (missing numbers: S04 and S16) which were manufactured through use of the conductor paste containing the metal silicide or the metal boride as an additive.
  • the silver diffusion distances were greater than 30 ⁇ m in samples T01 to T03 which were manufactured without use of the conductor paste containing the metal silicide or the metal boride as an additive.
  • the silver diffusion distance was restrained to a value smaller than 5 ⁇ m in any of samples S01 to S03, S05, S10 to S15, S17, and S18 in which one of LaB 6 , SiB 6 , TiB 2 , TaSi 2 , and ZrSi 2 was added to the conductor paste as an additive in an amount greater than 3 vol. %.
  • SiB 6 is used as an additive, SiO 2 generated by oxidation during firing remains in the ceramic insulating layer. That is, in the case where SiB 6 is used as an additive as in sample S02, only a compound of the same composition as the compound contained in the ceramic insulating layer remains in the ceramic insulating layer. As a result, migration of impurities into the ceramic insulating layer is prevented.
  • the metal boride or the metal silicide added to the conductor paste prevents diffusion of silver from the conductor material during the firing step. Accordingly, the LTCC substrate 10 manufactured according to the manufacturing process can prevent various types of problems caused by diffusion of silver from the conductor material during the firing step such as formation of voids in the ceramic substrate, deterioration of the ceramic substrate, etc.
  • a single type of metal boride or a single type of metal silicide is added to the conductor paste as an additive.
  • both a metal boride and a metal silicide may be added to the conductor paste as additives.
  • a plurality of types of metal borides may be added in combination as additives.
  • a plurality of types of metal silicides may be added in combination as additives.
  • one or more types of metal borides may be added together with one or more types of metal silicides as additives.
  • the additive described above may be added to a silver-based conductor material.
  • the additive described above may be added in a process of manufacturing a ceramic substrate whose firing temperature is 1000° C. or higher.
  • the silver-based conductor material containing at least one of a metal boride and a metal silicide added thereto is not required be in the form of paste, but may be, for example, in the form of powder.
  • alumina is used as an inorganic filler.
  • an inorganic filler used for preparation of the green sheet a material other than alumina may be used.
  • mullite can be used as an inorganic filler.

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  • Manufacturing & Machinery (AREA)
  • Ceramic Engineering (AREA)
  • Inorganic Chemistry (AREA)
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  • Organic Chemistry (AREA)
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  • Manufacturing Of Printed Wiring (AREA)
  • Parts Printed On Printed Circuit Boards (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)
  • Compositions Of Oxide Ceramics (AREA)
  • Non-Metallic Protective Coatings For Printed Circuits (AREA)
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US15/543,290 2015-01-13 2016-01-08 Method for manufacturing ceramic substrate, ceramic substrate, and silver-based conductor material Abandoned US20180014408A1 (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20180027653A1 (en) * 2015-01-13 2018-01-25 Ngk Spark Plug Co., Ltd. Ceramic substrate
US20220367363A1 (en) * 2021-05-17 2022-11-17 Onano Industrial Corp. Ltcc electronic device unit structure

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110255912A (zh) * 2019-07-03 2019-09-20 东北大学秦皇岛分校 一种微晶玻璃工艺品的制作方法
CN111312427B (zh) * 2020-04-17 2021-08-31 洛阳理工学院 一种用于低温共烧低介电常数介质陶瓷的多层布线用银浆
CN112225547B (zh) * 2020-10-19 2022-04-19 上海晶材新材料科技有限公司 Ltcc材料、基板及制备方法
CN112235959A (zh) * 2020-10-28 2021-01-15 上海读家电子科技有限公司 可加强铂钯银导体抗银迁移能力的陶瓷电路板制造方法
CN113690033A (zh) * 2021-07-23 2021-11-23 东莞市优琥电子科技有限公司 变压器和电源适配器

Family Cites Families (54)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6029240B2 (ja) * 1977-12-02 1985-07-09 富士通株式会社 セラミック回路基板の製法
JPS5491790A (en) * 1977-12-29 1979-07-20 Junkosha Co Ltd Flat cable
US4279654A (en) * 1979-05-14 1981-07-21 The Foundation: The Research Institute For Special Inorganic Materials Process for production of crystallized glass and process for producing composite article using said crystallized glass
JPS61168564A (ja) * 1985-01-18 1986-07-30 株式会社日立製作所 セラミツク絶縁基板
US4639391A (en) * 1985-03-14 1987-01-27 Cts Corporation Thick film resistive paint and resistors made therefrom
DE3621667A1 (de) * 1985-06-29 1987-01-08 Toshiba Kawasaki Kk Mit einer mehrzahl von dickfilmen beschichtetes substrat, verfahren zu seiner herstellung und dieses enthaltende vorrichtung
US4777014A (en) * 1986-03-07 1988-10-11 Lanxide Technology Company, Lp Process for preparing self-supporting bodies and products made thereby
JPH0619926B2 (ja) * 1987-11-11 1994-03-16 株式会社日立製作所 回路基板とその製法
DE3935471A1 (de) * 1989-10-25 1991-05-02 Hoechst Ag Keramische stoffzusammensetzung und ihre verwendung
JPH03233831A (ja) * 1990-02-07 1991-10-17 Dai Ichi Kogyo Seiyaku Co Ltd 6ホウ化ランタン含有ペースト
JPH0719964B2 (ja) * 1990-08-08 1995-03-06 日本電気株式会社 銀系配線セラミック基板
JPH04314394A (ja) * 1991-04-12 1992-11-05 Fujitsu Ltd ガラスセラミック回路基板とその製造方法
JPH0793228B2 (ja) * 1991-04-24 1995-10-09 太陽誘電株式会社 希土類入り銀導電ペーストおよびこれを用いた電子部品
JP2985503B2 (ja) 1992-04-22 1999-12-06 株式会社村田製作所 導電ペースト組成物
JPH0595071U (ja) * 1992-05-28 1993-12-24 京セラ株式会社 厚膜回路基板
EP0575813B1 (en) * 1992-06-08 1996-12-27 NEC Corporation Multilayer glass ceramic substrate and process for producing the same
JP3448747B2 (ja) * 1992-08-25 2003-09-22 松下電器産業株式会社 多層セラミック基板の製造方法
DE4345586B4 (de) * 1992-12-22 2009-04-23 Denso Corp., Kariya-shi Verfahren zum Erzeugen von Vielfach-Dickschichtsubstraten
JPH06204511A (ja) * 1993-01-07 1994-07-22 Dai Ichi Kogyo Seiyaku Co Ltd 半導体基板用電極ペースト
JPH06252524A (ja) * 1993-02-26 1994-09-09 Asahi Glass Co Ltd 導体付きセラミックス基板の製造方法
JPH07135394A (ja) * 1993-11-09 1995-05-23 Ngk Spark Plug Co Ltd 厚膜コンデンサ付きセラミック配線基板及びその製造方法
US5474619A (en) * 1994-05-04 1995-12-12 The United States Of America As Represented By The Secretary Of Commerce Thin film high temperature silicide thermocouples
JPH08259331A (ja) * 1995-03-22 1996-10-08 Agency Of Ind Science & Technol 可塑成形用窒化ケイ素−水系組成物の調製法
JPH08298382A (ja) * 1995-04-26 1996-11-12 Tdk Corp セラミックス多層基板
JP3927250B2 (ja) * 1995-08-16 2007-06-06 イー・アイ・デュポン・ドウ・ヌムール・アンド・カンパニー 窒化アルミニウム基板用厚膜導体ペースト組成物
JPH09246722A (ja) 1996-03-08 1997-09-19 Sumitomo Metal Ind Ltd ガラスセラミックス多層配線基板とその製造方法
US5857253A (en) * 1996-03-20 1999-01-12 Ppg Industries, Inc. System and methods for forming bushing plates
JP4099837B2 (ja) 1997-08-27 2008-06-11 株式会社村田製作所 低温焼成セラミック多層基板の製造方法
JPH11339560A (ja) * 1998-05-29 1999-12-10 Murata Mfg Co Ltd 銀ペースト
JP2001278657A (ja) * 2000-01-24 2001-10-10 Ngk Spark Plug Co Ltd 低温焼成磁器組成物及びその製造方法並びにその低温焼成磁器組成物を用いた低温焼成配線基板
ATE370920T1 (de) * 2001-03-09 2007-09-15 Datec Coating Corp Im sol-gel-verfahren hergestellte widerstands- und leitfähige beschichtung
JP3636123B2 (ja) * 2001-09-20 2005-04-06 株式会社村田製作所 積層セラミック電子部品の製造方法、および積層セラミック電子部品
JP2003268567A (ja) * 2002-03-19 2003-09-25 Hitachi Cable Ltd 導電材被覆耐食性金属材料
JP3988533B2 (ja) * 2002-05-23 2007-10-10 株式会社村田製作所 ガラスセラミック組成物、ガラスセラミック、およびセラミック多層基板
US7323805B2 (en) * 2004-01-28 2008-01-29 Kabushiki Kaisha Toshiba Piezoelectric thin film device and method for manufacturing the same
US7218506B2 (en) * 2004-03-31 2007-05-15 Tdk Corporation Electrolytic capacitor and method of manufacturing the same
JP2006073280A (ja) 2004-08-31 2006-03-16 Ngk Spark Plug Co Ltd メタライズ組成物及びセラミック配線基板
JP4548050B2 (ja) * 2004-09-03 2010-09-22 株式会社村田製作所 セラミック多層基板
JP2006253600A (ja) * 2005-03-14 2006-09-21 Ngk Spark Plug Co Ltd 配線基板の製造方法
KR100657321B1 (ko) * 2005-06-30 2006-12-14 삼성전자주식회사 인쇄데이터 관리방법 및 장치
US20070023388A1 (en) * 2005-07-28 2007-02-01 Nair Kumaran M Conductor composition for use in LTCC photosensitive tape on substrate applications
TW200710882A (en) * 2005-07-28 2007-03-16 Du Pont Conductor composition for use in LTCC photosensitive tape on substrate applications
JP4797534B2 (ja) 2005-09-16 2011-10-19 Tdk株式会社 多層セラミックス基板
US7666328B2 (en) * 2005-11-22 2010-02-23 E. I. Du Pont De Nemours And Company Thick film conductor composition(s) and processing technology thereof for use in multilayer electronic circuits and devices
JP4867399B2 (ja) 2006-03-03 2012-02-01 旭硝子株式会社 導体ペーストおよびセラミック多層基板製造方法
JP4967388B2 (ja) * 2006-03-15 2012-07-04 パナソニック株式会社 セラミック積層デバイスの製造方法およびセラミック積層デバイス
KR100956219B1 (ko) * 2008-02-25 2010-05-04 삼성전기주식회사 확산 방지층을 갖는 저온동시소성 세라믹 기판 및 그 제조방법
TW201130093A (en) * 2010-02-19 2011-09-01 Asahi Glass Co Ltd Substrate for mounting element, and method for manufacturing the substrate
JP5488282B2 (ja) * 2010-07-13 2014-05-14 昭栄化学工業株式会社 導電性ペースト
KR20140057258A (ko) * 2011-08-09 2014-05-12 아사히 가라스 가부시키가이샤 유리 세라믹스체, 발광 소자 탑재용 기판, 및 발광 장치
JP2013153051A (ja) * 2012-01-25 2013-08-08 Tokuyama Corp メタライズドセラミックスビア基板及びその製造方法
GB2504957A (en) * 2012-08-14 2014-02-19 Henkel Ag & Co Kgaa Curable compositions comprising composite particles
JP2014179473A (ja) 2013-03-15 2014-09-25 Ngk Spark Plug Co Ltd セラミック基板の製造方法および導体材料
US10524365B2 (en) * 2015-01-13 2019-12-31 Ngk Spark Plug Co., Ltd. Ceramic substrate

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20180027653A1 (en) * 2015-01-13 2018-01-25 Ngk Spark Plug Co., Ltd. Ceramic substrate
US10524365B2 (en) * 2015-01-13 2019-12-31 Ngk Spark Plug Co., Ltd. Ceramic substrate
US20220367363A1 (en) * 2021-05-17 2022-11-17 Onano Industrial Corp. Ltcc electronic device unit structure

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