US20060111493A1 - Photopolymerizable resin composition for sandblast resist - Google Patents
Photopolymerizable resin composition for sandblast resist Download PDFInfo
- Publication number
- US20060111493A1 US20060111493A1 US10/526,696 US52669605A US2006111493A1 US 20060111493 A1 US20060111493 A1 US 20060111493A1 US 52669605 A US52669605 A US 52669605A US 2006111493 A1 US2006111493 A1 US 2006111493A1
- Authority
- US
- United States
- Prior art keywords
- integer
- resin composition
- compound
- photopolymerizable
- photopolymerizable resin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 239000011342 resin composition Substances 0.000 title claims abstract description 55
- 150000001875 compounds Chemical class 0.000 claims abstract description 67
- -1 acrylate compound Chemical class 0.000 claims abstract description 64
- NIXOWILDQLNWCW-UHFFFAOYSA-M acrylate group Chemical group C(C=C)(=O)[O-] NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 claims abstract description 27
- 229920000642 polymer Polymers 0.000 claims abstract description 26
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims abstract description 21
- 229920000728 polyester Polymers 0.000 claims abstract description 15
- 239000004721 Polyphenylene oxide Substances 0.000 claims abstract description 14
- 229920001515 polyalkylene glycol Polymers 0.000 claims abstract description 14
- 229920000570 polyether Polymers 0.000 claims abstract description 14
- 125000000217 alkyl group Chemical group 0.000 claims abstract description 10
- 150000003673 urethanes Chemical class 0.000 claims abstract description 4
- 239000004014 plasticizer Substances 0.000 claims description 22
- 239000000203 mixture Substances 0.000 claims description 10
- 239000011230 binding agent Substances 0.000 claims description 8
- 150000002009 diols Chemical class 0.000 claims description 8
- 229910052739 hydrogen Inorganic materials 0.000 claims description 8
- 239000001257 hydrogen Substances 0.000 claims description 8
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 claims description 8
- 239000000654 additive Substances 0.000 claims description 7
- IPRJXAGUEGOFGG-UHFFFAOYSA-N N-butylbenzenesulfonamide Chemical compound CCCCNS(=O)(=O)C1=CC=CC=C1 IPRJXAGUEGOFGG-UHFFFAOYSA-N 0.000 claims description 6
- ZFOZVQLOBQUTQQ-UHFFFAOYSA-N Tributyl citrate Chemical compound CCCCOC(=O)CC(O)(C(=O)OCCCC)CC(=O)OCCCC ZFOZVQLOBQUTQQ-UHFFFAOYSA-N 0.000 claims description 6
- DOIRQSBPFJWKBE-UHFFFAOYSA-N dibutyl phthalate Chemical compound CCCCOC(=O)C1=CC=CC=C1C(=O)OCCCC DOIRQSBPFJWKBE-UHFFFAOYSA-N 0.000 claims description 6
- JQCXWCOOWVGKMT-UHFFFAOYSA-N diheptyl phthalate Chemical compound CCCCCCCOC(=O)C1=CC=CC=C1C(=O)OCCCCCCC JQCXWCOOWVGKMT-UHFFFAOYSA-N 0.000 claims description 6
- 150000002148 esters Chemical class 0.000 claims description 6
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims description 6
- URAYPUMNDPQOKB-UHFFFAOYSA-N triacetin Chemical compound CC(=O)OCC(OC(C)=O)COC(C)=O URAYPUMNDPQOKB-UHFFFAOYSA-N 0.000 claims description 6
- 239000002253 acid Substances 0.000 claims description 5
- 125000001931 aliphatic group Chemical group 0.000 claims description 4
- OVOUKWFJRHALDD-UHFFFAOYSA-N 2-[2-(2-acetyloxyethoxy)ethoxy]ethyl acetate Chemical compound CC(=O)OCCOCCOCCOC(C)=O OVOUKWFJRHALDD-UHFFFAOYSA-N 0.000 claims description 3
- DXYGJDUJLDXFOD-UHFFFAOYSA-N 2-[2-[2-(2-acetyloxyethoxy)ethoxy]ethoxy]ethyl acetate Chemical compound CC(=O)OCCOCCOCCOCCOC(C)=O DXYGJDUJLDXFOD-UHFFFAOYSA-N 0.000 claims description 3
- KHBQMWCZKVMBLN-UHFFFAOYSA-N Benzenesulfonamide Chemical compound NS(=O)(=O)C1=CC=CC=C1 KHBQMWCZKVMBLN-UHFFFAOYSA-N 0.000 claims description 3
- MQIUGAXCHLFZKX-UHFFFAOYSA-N Di-n-octyl phthalate Natural products CCCCCCCCOC(=O)C1=CC=CC=C1C(=O)OCCCCCCCC MQIUGAXCHLFZKX-UHFFFAOYSA-N 0.000 claims description 3
- 239000004641 Diallyl-phthalate Substances 0.000 claims description 3
- 229910019142 PO4 Inorganic materials 0.000 claims description 3
- 230000000996 additive effect Effects 0.000 claims description 3
- 150000001408 amides Chemical class 0.000 claims description 3
- BJQHLKABXJIVAM-UHFFFAOYSA-N bis(2-ethylhexyl) phthalate Chemical compound CCCCC(CC)COC(=O)C1=CC=CC=C1C(=O)OCC(CC)CCCC BJQHLKABXJIVAM-UHFFFAOYSA-N 0.000 claims description 3
- QUDWYFHPNIMBFC-UHFFFAOYSA-N bis(prop-2-enyl) benzene-1,2-dicarboxylate Chemical compound C=CCOC(=O)C1=CC=CC=C1C(=O)OCC=C QUDWYFHPNIMBFC-UHFFFAOYSA-N 0.000 claims description 3
- 125000004432 carbon atom Chemical group C* 0.000 claims description 3
- JBSLOWBPDRZSMB-FPLPWBNLSA-N dibutyl (z)-but-2-enedioate Chemical compound CCCCOC(=O)\C=C/C(=O)OCCCC JBSLOWBPDRZSMB-FPLPWBNLSA-N 0.000 claims description 3
- XWVQUJDBOICHGH-UHFFFAOYSA-N dioctyl nonanedioate Chemical compound CCCCCCCCOC(=O)CCCCCCCC(=O)OCCCCCCCC XWVQUJDBOICHGH-UHFFFAOYSA-N 0.000 claims description 3
- 235000013773 glyceryl triacetate Nutrition 0.000 claims description 3
- 150000002334 glycols Chemical class 0.000 claims description 3
- 235000021317 phosphate Nutrition 0.000 claims description 3
- 150000003013 phosphoric acid derivatives Chemical class 0.000 claims description 3
- 239000007787 solid Substances 0.000 claims description 3
- LMYRWZFENFIFIT-UHFFFAOYSA-N toluene-4-sulfonamide Chemical compound CC1=CC=C(S(N)(=O)=O)C=C1 LMYRWZFENFIFIT-UHFFFAOYSA-N 0.000 claims description 3
- 229960002622 triacetin Drugs 0.000 claims description 3
- XZZNDPSIHUTMOC-UHFFFAOYSA-N triphenyl phosphate Chemical compound C=1C=CC=CC=1OP(OC=1C=CC=CC=1)(=O)OC1=CC=CC=C1 XZZNDPSIHUTMOC-UHFFFAOYSA-N 0.000 claims description 3
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 2
- 125000002947 alkylene group Chemical group 0.000 claims description 2
- 125000005442 diisocyanate group Chemical group 0.000 claims description 2
- RTZKZFJDLAIYFH-UHFFFAOYSA-N ether Substances CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 claims description 2
- IQPQWNKOIGAROB-UHFFFAOYSA-N isocyanate group Chemical group [N-]=C=O IQPQWNKOIGAROB-UHFFFAOYSA-N 0.000 claims description 2
- ZFFMLCVRJBZUDZ-UHFFFAOYSA-N 2,3-dimethylbutane Chemical group CC(C)C(C)C ZFFMLCVRJBZUDZ-UHFFFAOYSA-N 0.000 claims 2
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 abstract description 8
- 239000001913 cellulose Substances 0.000 abstract description 8
- 229920002678 cellulose Polymers 0.000 abstract description 8
- 230000009257 reactivity Effects 0.000 abstract description 8
- 150000001252 acrylic acid derivatives Chemical class 0.000 abstract description 2
- 230000006872 improvement Effects 0.000 abstract description 2
- 239000010408 film Substances 0.000 description 40
- 0 [1*]C(=C)C(=O)OCCOc1ccccc1.[2*]C Chemical compound [1*]C(=C)C(=O)OCCOc1ccccc1.[2*]C 0.000 description 25
- 238000000034 method Methods 0.000 description 25
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 24
- 230000008569 process Effects 0.000 description 22
- 229920002120 photoresistant polymer Polymers 0.000 description 19
- RWCCWEUUXYIKHB-UHFFFAOYSA-N benzophenone Chemical compound C=1C=CC=CC=1C(=O)C1=CC=CC=C1 RWCCWEUUXYIKHB-UHFFFAOYSA-N 0.000 description 14
- 239000012965 benzophenone Substances 0.000 description 14
- 238000005192 partition Methods 0.000 description 12
- 239000000243 solution Substances 0.000 description 12
- 239000003513 alkali Substances 0.000 description 10
- 239000000758 substrate Substances 0.000 description 10
- 239000000463 material Substances 0.000 description 9
- 239000011248 coating agent Substances 0.000 description 7
- 238000000576 coating method Methods 0.000 description 7
- 229920001577 copolymer Polymers 0.000 description 7
- 239000000178 monomer Substances 0.000 description 7
- 238000005488 sandblasting Methods 0.000 description 7
- 239000000126 substance Substances 0.000 description 7
- ZIBGPFATKBEMQZ-UHFFFAOYSA-N triethylene glycol Chemical compound OCCOCCOCCO ZIBGPFATKBEMQZ-UHFFFAOYSA-N 0.000 description 7
- LBLYYCQCTBFVLH-UHFFFAOYSA-M 2-methylbenzenesulfonate Chemical compound CC1=CC=CC=C1S([O-])(=O)=O LBLYYCQCTBFVLH-UHFFFAOYSA-M 0.000 description 6
- NNBFNNNWANBMTI-UHFFFAOYSA-M brilliant green Chemical compound OS([O-])(=O)=O.C1=CC(N(CC)CC)=CC=C1C(C=1C=CC=CC=1)=C1C=CC(=[N+](CC)CC)C=C1 NNBFNNNWANBMTI-UHFFFAOYSA-M 0.000 description 6
- 230000000052 comparative effect Effects 0.000 description 6
- 239000013078 crystal Substances 0.000 description 6
- 239000002904 solvent Substances 0.000 description 6
- JOYRKODLDBILNP-UHFFFAOYSA-N Ethyl urethane Chemical compound CCOC(N)=O JOYRKODLDBILNP-UHFFFAOYSA-N 0.000 description 5
- 239000004698 Polyethylene Substances 0.000 description 5
- 239000011521 glass Substances 0.000 description 5
- 238000003475 lamination Methods 0.000 description 5
- 229920000573 polyethylene Polymers 0.000 description 5
- VGGSQFUCUMXWEO-UHFFFAOYSA-N Ethene Chemical compound C=C VGGSQFUCUMXWEO-UHFFFAOYSA-N 0.000 description 4
- 239000005977 Ethylene Substances 0.000 description 4
- CDBYLPFSWZWCQE-UHFFFAOYSA-L Sodium Carbonate Chemical compound [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 description 4
- 239000010410 layer Substances 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 238000005259 measurement Methods 0.000 description 4
- 239000004814 polyurethane Substances 0.000 description 4
- 229920002635 polyurethane Polymers 0.000 description 4
- VVBLNCFGVYUYGU-UHFFFAOYSA-N 4,4'-Bis(dimethylamino)benzophenone Chemical compound C1=CC(N(C)C)=CC=C1C(=O)C1=CC=C(N(C)C)C=C1 VVBLNCFGVYUYGU-UHFFFAOYSA-N 0.000 description 3
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 3
- IAYPIBMASNFSPL-UHFFFAOYSA-N Ethylene oxide Chemical compound C1CO1 IAYPIBMASNFSPL-UHFFFAOYSA-N 0.000 description 3
- GOOHAUXETOMSMM-UHFFFAOYSA-N Propylene oxide Chemical compound CC1CO1 GOOHAUXETOMSMM-UHFFFAOYSA-N 0.000 description 3
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 3
- 238000002679 ablation Methods 0.000 description 3
- ISAOCJYIOMOJEB-UHFFFAOYSA-N benzoin Chemical class C=1C=CC=CC=1C(O)C(=O)C1=CC=CC=C1 ISAOCJYIOMOJEB-UHFFFAOYSA-N 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 3
- 238000001723 curing Methods 0.000 description 3
- MTHSVFCYNBDYFN-UHFFFAOYSA-N diethylene glycol Chemical compound OCCOCCO MTHSVFCYNBDYFN-UHFFFAOYSA-N 0.000 description 3
- 238000004090 dissolution Methods 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 230000005855 radiation Effects 0.000 description 3
- SPEUIVXLLWOEMJ-UHFFFAOYSA-N 1,1-dimethoxyethane Chemical compound COC(C)OC SPEUIVXLLWOEMJ-UHFFFAOYSA-N 0.000 description 2
- YFKBXYGUSOXJGS-UHFFFAOYSA-N 1,3-Diphenyl-2-propanone Chemical compound C=1C=CC=CC=1CC(=O)CC1=CC=CC=C1 YFKBXYGUSOXJGS-UHFFFAOYSA-N 0.000 description 2
- NJWGQARXZDRHCD-UHFFFAOYSA-N 2-methylanthraquinone Chemical compound C1=CC=C2C(=O)C3=CC(C)=CC=C3C(=O)C2=C1 NJWGQARXZDRHCD-UHFFFAOYSA-N 0.000 description 2
- OZJPLYNZGCXSJM-UHFFFAOYSA-N 5-valerolactone Chemical compound O=C1CCCCO1 OZJPLYNZGCXSJM-UHFFFAOYSA-N 0.000 description 2
- 229920002799 BoPET Polymers 0.000 description 2
- SOGAXMICEFXMKE-UHFFFAOYSA-N Butylmethacrylate Chemical compound CCCCOC(=O)C(C)=C SOGAXMICEFXMKE-UHFFFAOYSA-N 0.000 description 2
- BAPJBEWLBFYGME-UHFFFAOYSA-N Methyl acrylate Chemical compound COC(=O)C=C BAPJBEWLBFYGME-UHFFFAOYSA-N 0.000 description 2
- VVQNEPGJFQJSBK-UHFFFAOYSA-N Methyl methacrylate Chemical compound COC(=O)C(C)=C VVQNEPGJFQJSBK-UHFFFAOYSA-N 0.000 description 2
- DNIAPMSPPWPWGF-UHFFFAOYSA-N Propylene glycol Chemical compound CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 description 2
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 description 2
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 2
- 150000001412 amines Chemical class 0.000 description 2
- 239000007864 aqueous solution Substances 0.000 description 2
- 239000012461 cellulose resin Substances 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 2
- 230000009477 glass transition Effects 0.000 description 2
- 238000000227 grinding Methods 0.000 description 2
- NIMLQBUJDJZYEJ-UHFFFAOYSA-N isophorone diisocyanate Chemical compound CC1(C)CC(N=C=O)CC(C)(CN=C=O)C1 NIMLQBUJDJZYEJ-UHFFFAOYSA-N 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 238000000059 patterning Methods 0.000 description 2
- YNPNZTXNASCQKK-UHFFFAOYSA-N phenanthrene Chemical compound C1=CC=C2C3=CC=CC=C3C=CC2=C1 YNPNZTXNASCQKK-UHFFFAOYSA-N 0.000 description 2
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 2
- 229920000058 polyacrylate Polymers 0.000 description 2
- 229920000139 polyethylene terephthalate Polymers 0.000 description 2
- 239000005020 polyethylene terephthalate Substances 0.000 description 2
- 238000006116 polymerization reaction Methods 0.000 description 2
- BWHMMNNQKKPAPP-UHFFFAOYSA-L potassium carbonate Chemical compound [K+].[K+].[O-]C([O-])=O BWHMMNNQKKPAPP-UHFFFAOYSA-L 0.000 description 2
- 229960000380 propiolactone Drugs 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 229910000029 sodium carbonate Inorganic materials 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- KFJJYOKMAAQFHC-UHFFFAOYSA-N (4-methoxy-5,5-dimethylcyclohexa-1,3-dien-1-yl)-phenylmethanone Chemical compound C1C(C)(C)C(OC)=CC=C1C(=O)C1=CC=CC=C1 KFJJYOKMAAQFHC-UHFFFAOYSA-N 0.000 description 1
- ZTNJGMFHJYGMDR-UHFFFAOYSA-N 1,2-diisocyanatoethane Chemical compound O=C=NCCN=C=O ZTNJGMFHJYGMDR-UHFFFAOYSA-N 0.000 description 1
- IKYNWXNXXHWHLL-UHFFFAOYSA-N 1,3-diisocyanatopropane Chemical compound O=C=NCCCN=C=O IKYNWXNXXHWHLL-UHFFFAOYSA-N 0.000 description 1
- ALQLPWJFHRMHIU-UHFFFAOYSA-N 1,4-diisocyanatobenzene Chemical compound O=C=NC1=CC=C(N=C=O)C=C1 ALQLPWJFHRMHIU-UHFFFAOYSA-N 0.000 description 1
- OVBFMUAFNIIQAL-UHFFFAOYSA-N 1,4-diisocyanatobutane Chemical compound O=C=NCCCCN=C=O OVBFMUAFNIIQAL-UHFFFAOYSA-N 0.000 description 1
- SBJCUZQNHOLYMD-UHFFFAOYSA-N 1,5-Naphthalene diisocyanate Chemical compound C1=CC=C2C(N=C=O)=CC=CC2=C1N=C=O SBJCUZQNHOLYMD-UHFFFAOYSA-N 0.000 description 1
- KCMMASHQZUIAOW-UHFFFAOYSA-N 1,5-diisocyanato-2,2,4-trimethylpentane Chemical compound O=C=NCC(C)CC(C)(C)CN=C=O KCMMASHQZUIAOW-UHFFFAOYSA-N 0.000 description 1
- OUJCKESIGPLCRN-UHFFFAOYSA-N 1,5-diisocyanato-2,2-dimethylpentane Chemical compound O=C=NCC(C)(C)CCCN=C=O OUJCKESIGPLCRN-UHFFFAOYSA-N 0.000 description 1
- DFPJRUKWEPYFJT-UHFFFAOYSA-N 1,5-diisocyanatopentane Chemical compound O=C=NCCCCCN=C=O DFPJRUKWEPYFJT-UHFFFAOYSA-N 0.000 description 1
- ATOUXIOKEJWULN-UHFFFAOYSA-N 1,6-diisocyanato-2,2,4-trimethylhexane Chemical compound O=C=NCCC(C)CC(C)(C)CN=C=O ATOUXIOKEJWULN-UHFFFAOYSA-N 0.000 description 1
- QGLRLXLDMZCFBP-UHFFFAOYSA-N 1,6-diisocyanato-2,4,4-trimethylhexane Chemical compound O=C=NCC(C)CC(C)(C)CCN=C=O QGLRLXLDMZCFBP-UHFFFAOYSA-N 0.000 description 1
- UTFSEWQOIIZLRH-UHFFFAOYSA-N 1,7-diisocyanatoheptane Chemical compound O=C=NCCCCCCCN=C=O UTFSEWQOIIZLRH-UHFFFAOYSA-N 0.000 description 1
- QUPKOUOXSNGVLB-UHFFFAOYSA-N 1,8-diisocyanatooctane Chemical compound O=C=NCCCCCCCCN=C=O QUPKOUOXSNGVLB-UHFFFAOYSA-N 0.000 description 1
- GHSZVIPKVOEXNX-UHFFFAOYSA-N 1,9-diisocyanatononane Chemical compound O=C=NCCCCCCCCCN=C=O GHSZVIPKVOEXNX-UHFFFAOYSA-N 0.000 description 1
- DLUPHJKQEIIYAM-UHFFFAOYSA-N 1-(2-ethoxyphenyl)-2-hydroxy-2-phenylethanone Chemical compound CCOC1=CC=CC=C1C(=O)C(O)C1=CC=CC=C1 DLUPHJKQEIIYAM-UHFFFAOYSA-N 0.000 description 1
- MLKIVXXYTZKNMI-UHFFFAOYSA-N 1-(4-dodecylphenyl)-2-hydroxy-2-methylpropan-1-one Chemical compound CCCCCCCCCCCCC1=CC=C(C(=O)C(C)(C)O)C=C1 MLKIVXXYTZKNMI-UHFFFAOYSA-N 0.000 description 1
- IMDHDEPPVWETOI-UHFFFAOYSA-N 1-(4-tert-butylphenyl)-2,2,2-trichloroethanone Chemical compound CC(C)(C)C1=CC=C(C(=O)C(Cl)(Cl)Cl)C=C1 IMDHDEPPVWETOI-UHFFFAOYSA-N 0.000 description 1
- VMCRQYHCDSXNLW-UHFFFAOYSA-N 1-(4-tert-butylphenyl)-2,2-dichloroethanone Chemical compound CC(C)(C)C1=CC=C(C(=O)C(Cl)Cl)C=C1 VMCRQYHCDSXNLW-UHFFFAOYSA-N 0.000 description 1
- HUDYANRNMZDQGA-UHFFFAOYSA-N 1-[4-(dimethylamino)phenyl]ethanone Chemical compound CN(C)C1=CC=C(C(C)=O)C=C1 HUDYANRNMZDQGA-UHFFFAOYSA-N 0.000 description 1
- 239000012956 1-hydroxycyclohexylphenyl-ketone Substances 0.000 description 1
- JIABEENURMZTTI-UHFFFAOYSA-N 1-isocyanato-2-[(2-isocyanatophenyl)methyl]benzene Chemical compound O=C=NC1=CC=CC=C1CC1=CC=CC=C1N=C=O JIABEENURMZTTI-UHFFFAOYSA-N 0.000 description 1
- LFSYUSUFCBOHGU-UHFFFAOYSA-N 1-isocyanato-2-[(4-isocyanatophenyl)methyl]benzene Chemical compound C1=CC(N=C=O)=CC=C1CC1=CC=CC=C1N=C=O LFSYUSUFCBOHGU-UHFFFAOYSA-N 0.000 description 1
- PIZHFBODNLEQBL-UHFFFAOYSA-N 2,2-diethoxy-1-phenylethanone Chemical compound CCOC(OCC)C(=O)C1=CC=CC=C1 PIZHFBODNLEQBL-UHFFFAOYSA-N 0.000 description 1
- KWVGIHKZDCUPEU-UHFFFAOYSA-N 2,2-dimethoxy-2-phenylacetophenone Chemical compound C=1C=CC=CC=1C(OC)(OC)C(=O)C1=CC=CC=C1 KWVGIHKZDCUPEU-UHFFFAOYSA-N 0.000 description 1
- ASUQXIDYMVXFKU-UHFFFAOYSA-N 2,6-dibromo-9,9-dimethylfluorene Chemical compound C1=C(Br)C=C2C(C)(C)C3=CC=C(Br)C=C3C2=C1 ASUQXIDYMVXFKU-UHFFFAOYSA-N 0.000 description 1
- SMZOUWXMTYCWNB-UHFFFAOYSA-N 2-(2-methoxy-5-methylphenyl)ethanamine Chemical compound COC1=CC=C(C)C=C1CCN SMZOUWXMTYCWNB-UHFFFAOYSA-N 0.000 description 1
- NIXOWILDQLNWCW-UHFFFAOYSA-N 2-Propenoic acid Natural products OC(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 1
- SJEBAWHUJDUKQK-UHFFFAOYSA-N 2-ethylanthraquinone Chemical compound C1=CC=C2C(=O)C3=CC(CC)=CC=C3C(=O)C2=C1 SJEBAWHUJDUKQK-UHFFFAOYSA-N 0.000 description 1
- QDPMVUZZMXVFJO-UHFFFAOYSA-N 2-hydroxy-1-(2-methoxyphenyl)-2-phenylethanone Chemical compound COC1=CC=CC=C1C(=O)C(O)C1=CC=CC=C1 QDPMVUZZMXVFJO-UHFFFAOYSA-N 0.000 description 1
- KFZANTDNOBVWKZ-UHFFFAOYSA-N 2-hydroxy-1-[2-(2-methylpropoxy)phenyl]-2-phenylethanone Chemical compound CC(C)COC1=CC=CC=C1C(=O)C(O)C1=CC=CC=C1 KFZANTDNOBVWKZ-UHFFFAOYSA-N 0.000 description 1
- SYKBMHCHADIPDP-UHFFFAOYSA-N 2-hydroxy-1-[2-[(2-methylpropan-2-yl)oxy]phenyl]-2-phenylethanone Chemical compound CC(C)(C)OC1=CC=CC=C1C(=O)C(O)C1=CC=CC=C1 SYKBMHCHADIPDP-UHFFFAOYSA-N 0.000 description 1
- QPXVRLXJHPTCPW-UHFFFAOYSA-N 2-hydroxy-2-methyl-1-(4-propan-2-ylphenyl)propan-1-one Chemical compound CC(C)C1=CC=C(C(=O)C(C)(C)O)C=C1 QPXVRLXJHPTCPW-UHFFFAOYSA-N 0.000 description 1
- XMLYCEVDHLAQEL-UHFFFAOYSA-N 2-hydroxy-2-methyl-1-phenylpropan-1-one Chemical compound CC(C)(O)C(=O)C1=CC=CC=C1 XMLYCEVDHLAQEL-UHFFFAOYSA-N 0.000 description 1
- RTFWHSONHLXREP-UHFFFAOYSA-N 2-hydroxy-2-phenyl-1-(2-propan-2-yloxyphenyl)ethanone Chemical compound CC(C)OC1=CC=CC=C1C(=O)C(O)C1=CC=CC=C1 RTFWHSONHLXREP-UHFFFAOYSA-N 0.000 description 1
- OMIGHNLMNHATMP-UHFFFAOYSA-N 2-hydroxyethyl prop-2-enoate Chemical compound OCCOC(=O)C=C OMIGHNLMNHATMP-UHFFFAOYSA-N 0.000 description 1
- VHSHLMUCYSAUQU-UHFFFAOYSA-N 2-hydroxypropyl methacrylate Chemical compound CC(O)COC(=O)C(C)=C VHSHLMUCYSAUQU-UHFFFAOYSA-N 0.000 description 1
- GWZMWHWAWHPNHN-UHFFFAOYSA-N 2-hydroxypropyl prop-2-enoate Chemical compound CC(O)COC(=O)C=C GWZMWHWAWHPNHN-UHFFFAOYSA-N 0.000 description 1
- BQZJOQXSCSZQPS-UHFFFAOYSA-N 2-methoxy-1,2-diphenylethanone Chemical compound C=1C=CC=CC=1C(OC)C(=O)C1=CC=CC=C1 BQZJOQXSCSZQPS-UHFFFAOYSA-N 0.000 description 1
- ULKFLOVGORAZDI-UHFFFAOYSA-N 3,3-dimethyloxetan-2-one Chemical compound CC1(C)COC1=O ULKFLOVGORAZDI-UHFFFAOYSA-N 0.000 description 1
- NYBXFCLDEATPCM-UHFFFAOYSA-N 3-methyloxetan-2-one Chemical compound CC1COC1=O NYBXFCLDEATPCM-UHFFFAOYSA-N 0.000 description 1
- OKISUZLXOYGIFP-UHFFFAOYSA-N 4,4'-dichlorobenzophenone Chemical compound C1=CC(Cl)=CC=C1C(=O)C1=CC=C(Cl)C=C1 OKISUZLXOYGIFP-UHFFFAOYSA-N 0.000 description 1
- YDIYEOMDOWUDTJ-UHFFFAOYSA-N 4-(dimethylamino)benzoic acid Chemical compound CN(C)C1=CC=C(C(O)=O)C=C1 YDIYEOMDOWUDTJ-UHFFFAOYSA-N 0.000 description 1
- HBTAOSGHCXUEKI-UHFFFAOYSA-N 4-chloro-n,n-dimethyl-3-nitrobenzenesulfonamide Chemical compound CN(C)S(=O)(=O)C1=CC=C(Cl)C([N+]([O-])=O)=C1 HBTAOSGHCXUEKI-UHFFFAOYSA-N 0.000 description 1
- BMVWCPGVLSILMU-UHFFFAOYSA-N 5,6-dihydrodibenzo[2,1-b:2',1'-f][7]annulen-11-one Chemical compound C1CC2=CC=CC=C2C(=O)C2=CC=CC=C21 BMVWCPGVLSILMU-UHFFFAOYSA-N 0.000 description 1
- HRPVXLWXLXDGHG-UHFFFAOYSA-N Acrylamide Chemical compound NC(=O)C=C HRPVXLWXLXDGHG-UHFFFAOYSA-N 0.000 description 1
- STVZJERGLQHEKB-UHFFFAOYSA-N C=C(C)C(=O)OCCOC(=O)C(=C)C Chemical compound C=C(C)C(=O)OCCOC(=O)C(=C)C STVZJERGLQHEKB-UHFFFAOYSA-N 0.000 description 1
- VIYWVRIBDZTTMH-UHFFFAOYSA-N C=C(C)C(=O)OCCOC1=CC=C(C(C)(C)C2=CC=C(OCCOC(=O)C(=C)C)C=C2)C=C1 Chemical compound C=C(C)C(=O)OCCOC1=CC=C(C(C)(C)C2=CC=C(OCCOC(=O)C(=C)C)C=C2)C=C1 VIYWVRIBDZTTMH-UHFFFAOYSA-N 0.000 description 1
- JIGUQPWFLRLWPJ-UHFFFAOYSA-N Ethyl acrylate Chemical compound CCOC(=O)C=C JIGUQPWFLRLWPJ-UHFFFAOYSA-N 0.000 description 1
- 239000005057 Hexamethylene diisocyanate Substances 0.000 description 1
- WOBHKFSMXKNTIM-UHFFFAOYSA-N Hydroxyethyl methacrylate Chemical compound CC(=C)C(=O)OCCO WOBHKFSMXKNTIM-UHFFFAOYSA-N 0.000 description 1
- 239000005058 Isophorone diisocyanate Substances 0.000 description 1
- CERQOIWHTDAKMF-UHFFFAOYSA-N Methacrylic acid Chemical compound CC(=C)C(O)=O CERQOIWHTDAKMF-UHFFFAOYSA-N 0.000 description 1
- NQSMEZJWJJVYOI-UHFFFAOYSA-N Methyl 2-benzoylbenzoate Chemical compound COC(=O)C1=CC=CC=C1C(=O)C1=CC=CC=C1 NQSMEZJWJJVYOI-UHFFFAOYSA-N 0.000 description 1
- WYWZRNAHINYAEF-UHFFFAOYSA-N Padimate O Chemical compound CCCCC(CC)COC(=O)C1=CC=C(N(C)C)C=C1 WYWZRNAHINYAEF-UHFFFAOYSA-N 0.000 description 1
- 239000004372 Polyvinyl alcohol Substances 0.000 description 1
- 244000028419 Styrax benzoin Species 0.000 description 1
- 235000000126 Styrax benzoin Nutrition 0.000 description 1
- 235000008411 Sumatra benzointree Nutrition 0.000 description 1
- 238000003848 UV Light-Curing Methods 0.000 description 1
- WNLRTRBMVRJNCN-UHFFFAOYSA-L adipate(2-) Chemical compound [O-]C(=O)CCCCC([O-])=O WNLRTRBMVRJNCN-UHFFFAOYSA-L 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- XYLMUPLGERFSHI-UHFFFAOYSA-N alpha-Methylstyrene Chemical compound CC(=C)C1=CC=CC=C1 XYLMUPLGERFSHI-UHFFFAOYSA-N 0.000 description 1
- PYKYMHQGRFAEBM-UHFFFAOYSA-N anthraquinone Natural products CCC(=O)c1c(O)c2C(=O)C3C(C=CC=C3O)C(=O)c2cc1CC(=O)OC PYKYMHQGRFAEBM-UHFFFAOYSA-N 0.000 description 1
- 150000004056 anthraquinones Chemical class 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 229960002130 benzoin Drugs 0.000 description 1
- 125000001797 benzyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C([H])([H])* 0.000 description 1
- GSCLMSFRWBPUSK-UHFFFAOYSA-N beta-Butyrolactone Chemical compound CC1CC(=O)O1 GSCLMSFRWBPUSK-UHFFFAOYSA-N 0.000 description 1
- VEZXCJBBBCKRPI-UHFFFAOYSA-N beta-propiolactone Chemical compound O=C1CCO1 VEZXCJBBBCKRPI-UHFFFAOYSA-N 0.000 description 1
- MQDJYUACMFCOFT-UHFFFAOYSA-N bis[2-(1-hydroxycyclohexyl)phenyl]methanone Chemical compound C=1C=CC=C(C(=O)C=2C(=CC=CC=2)C2(O)CCCCC2)C=1C1(O)CCCCC1 MQDJYUACMFCOFT-UHFFFAOYSA-N 0.000 description 1
- VYHBFRJRBHMIQZ-UHFFFAOYSA-N bis[4-(diethylamino)phenyl]methanone Chemical compound C1=CC(N(CC)CC)=CC=C1C(=O)C1=CC=C(N(CC)CC)C=C1 VYHBFRJRBHMIQZ-UHFFFAOYSA-N 0.000 description 1
- FOYJYXHISWUSDL-UHFFFAOYSA-N butyl 4-(dimethylamino)benzoate Chemical compound CCCCOC(=O)C1=CC=C(N(C)C)C=C1 FOYJYXHISWUSDL-UHFFFAOYSA-N 0.000 description 1
- CQEYYJKEWSMYFG-UHFFFAOYSA-N butyl acrylate Chemical compound CCCCOC(=O)C=C CQEYYJKEWSMYFG-UHFFFAOYSA-N 0.000 description 1
- 150000007942 carboxylates Chemical class 0.000 description 1
- 150000001732 carboxylic acid derivatives Chemical class 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000007334 copolymerization reaction Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 125000000664 diazo group Chemical group [N-]=[N+]=[*] 0.000 description 1
- 229940031578 diisopropyl adipate Drugs 0.000 description 1
- VFHVQBAGLAREND-UHFFFAOYSA-N diphenylphosphoryl-(2,4,6-trimethylphenyl)methanone Chemical compound CC1=CC(C)=CC(C)=C1C(=O)P(=O)(C=1C=CC=CC=1)C1=CC=CC=C1 VFHVQBAGLAREND-UHFFFAOYSA-N 0.000 description 1
- SZXQTJUDPRGNJN-UHFFFAOYSA-N dipropylene glycol Chemical compound OCCCOCCCO SZXQTJUDPRGNJN-UHFFFAOYSA-N 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 239000000975 dye Substances 0.000 description 1
- 239000003623 enhancer Substances 0.000 description 1
- 238000010304 firing Methods 0.000 description 1
- 230000004927 fusion Effects 0.000 description 1
- 235000019382 gum benzoic Nutrition 0.000 description 1
- RRAMGCGOFNQTLD-UHFFFAOYSA-N hexamethylene diisocyanate Chemical compound O=C=NCCCCCCN=C=O RRAMGCGOFNQTLD-UHFFFAOYSA-N 0.000 description 1
- 229940031704 hydroxypropyl methylcellulose phthalate Drugs 0.000 description 1
- 229920003132 hydroxypropyl methylcellulose phthalate Polymers 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 239000003112 inhibitor Substances 0.000 description 1
- 230000000977 initiatory effect Effects 0.000 description 1
- 150000002596 lactones Chemical class 0.000 description 1
- 239000005355 lead glass Substances 0.000 description 1
- FQPSGWSUVKBHSU-UHFFFAOYSA-N methacrylamide Chemical compound CC(=C)C(N)=O FQPSGWSUVKBHSU-UHFFFAOYSA-N 0.000 description 1
- 239000011259 mixed solution Substances 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- LXTZRIBXKVRLOA-UHFFFAOYSA-N padimate a Chemical compound CCCCCOC(=O)C1=CC=C(N(C)C)C=C1 LXTZRIBXKVRLOA-UHFFFAOYSA-N 0.000 description 1
- FZUGPQWGEGAKET-UHFFFAOYSA-N parbenate Chemical compound CCOC(=O)C1=CC=C(N(C)C)C=C1 FZUGPQWGEGAKET-UHFFFAOYSA-N 0.000 description 1
- PNJWIWWMYCMZRO-UHFFFAOYSA-N pent‐4‐en‐2‐one Natural products CC(=O)CC=C PNJWIWWMYCMZRO-UHFFFAOYSA-N 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- XNGIFLGASWRNHJ-UHFFFAOYSA-L phthalate(2-) Chemical compound [O-]C(=O)C1=CC=CC=C1C([O-])=O XNGIFLGASWRNHJ-UHFFFAOYSA-L 0.000 description 1
- 239000002952 polymeric resin Substances 0.000 description 1
- 229920002451 polyvinyl alcohol Polymers 0.000 description 1
- 229910000027 potassium carbonate Inorganic materials 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 239000011241 protective layer Substances 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 238000007151 ring opening polymerisation reaction Methods 0.000 description 1
- 238000007142 ring opening reaction Methods 0.000 description 1
- 238000007127 saponification reaction Methods 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- 230000008961 swelling Effects 0.000 description 1
- 229920003002 synthetic resin Polymers 0.000 description 1
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 1
- 238000012719 thermal polymerization Methods 0.000 description 1
- DVKJHBMWWAPEIU-UHFFFAOYSA-N toluene 2,4-diisocyanate Chemical compound CC1=CC=C(N=C=O)C=C1N=C=O DVKJHBMWWAPEIU-UHFFFAOYSA-N 0.000 description 1
- RUELTTOHQODFPA-UHFFFAOYSA-N toluene 2,6-diisocyanate Chemical compound CC1=C(N=C=O)C=CC=C1N=C=O RUELTTOHQODFPA-UHFFFAOYSA-N 0.000 description 1
- 229920006305 unsaturated polyester Polymers 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K5/00—Use of organic ingredients
- C08K5/04—Oxygen-containing compounds
- C08K5/10—Esters; Ether-esters
- C08K5/101—Esters; Ether-esters of monocarboxylic acids
- C08K5/103—Esters; Ether-esters of monocarboxylic acids with polyalcohols
Definitions
- the present invention relates to a photopolymerizable resin composition for sandblast resist and, more particularly, to a photopolymerizable resin composition that includes, as a photopolymerizable oligomer, a (meth)acrylate compound including a copolymer of urethane-based (meth)acrylate and nonurethane-based ethylene oxide and propylene oxide, thereby satisfying the required properties of a dry film resist such as high resolution and high adhesion in accordance with the recent tendency of plasma display panels (PDPs) to maintain high resolution.
- a dry film resist such as high resolution and high adhesion in accordance with the recent tendency of plasma display panels (PDPs) to maintain high resolution.
- the dry film resist which is widely used as a fundamental material for circuit patterning in the fabrication of printed circuit boards, has been variously expanded in its applications in recent years.
- the dry film resist is now widely used in the IC packaging, or lead frame or BGA (Ball Grid Array) process.
- the dry film photoresist is much used in the patterning process of ITO (Indium Tin Oxide) used as a transparent electrode, or the PDP barrier rib process in the fabrication of PDPs.
- the partition forming process on the rear glass substrate of the PDP using a dry film resist (DFR) involves lamination of the dry film resist on a PDP material printed with partitions by a heating roller.
- a laminator is used to laminate the photoresist layer of the DFR on the partition material while removing the protective film of the DFR.
- the lamination is carried out at a lamination speed of 0.5 to 3.5 m/min, a temperature of 100 to 130° C., and a heating roller pressure of 10 to 90 psi.
- the resultant glass substrate is kept for 15 minutes or more for the purpose of substrate stabilization and then an exposure is carried out on the photoresist of the DFR using a photomask on which a desired circuit pattern is formed.
- a UV radiation on the photomask causes polymerization on the exposed regions of the photoresist by a photoinitiator contained in the photoresist. More specifically, oxygen contained in the photoresist is used up, and then, the activated monomers are polymerized to cause crosslinkage, after which the monomers are more used to cause a polymerization reaction. The unexposed regions of the photoresist are remained without the generation of crosslinkage.
- a development process is carried out to remove the unexposed regions of the photoresist.
- an aqueous solution of potassium carbonate or sodium carbonate (0.2 to 1.2 wt. %) is used as a developing solution.
- the unexposed regions of the photoresist are washed away by the saponification reaction between the developing solution and the carboxylic acid of the binder polymer in the developing solution, and the cured photoresist regions of the photoresist remain on the surface of the partition material.
- the glass substrate on which the dry film resist is patterned as above is subjected to a sandblasting process to form a partition pattern.
- the dry film pattern formed on the partition pattern functions as a protective layer for preventing ablation of the underlying partition material
- the stripping process for removing the pattern of the dry film resist and the firing process for curing the partition material are sequentially performed to complete the partition formation.
- the partition not fired may collapse during the ablation process when using a NaOH or KOH aqueous solution that is primarily used for the printed circuit boards.
- This problem can be solved by the use of an amine-based dedicated ablating solution or by the modification of the process.
- an amine-based dedicated ablating solution such a small sample of the dry film resist may get in the surface of the partition due to the use of a grinding material, which problem functions as a serious defective.
- the surface is so rough as to cause an adhesion problem of the dry film resist by a low conformability, thereby causing a damage of the partition.
- the examples of the prior art concerning the resin composition for sandblast resist include Japanese Laid-Open Patent Sho 60-10242 that discloses a resin composition for sandblast resist comprising a urethane compound having a terminal (meta)acrylate group, a monofunctional ethylene-based unsaturated compound, and a photoinitiator; Japanese Laid-Open Patent Sho 55-103554 that discloses a resin composition for sandblast resist comprising an unsaturated polyester, an unsaturated monomer, and a photoinitiator; and Japanese Laid-Open Patent Pyung 2-69754 that discloses a resin composition for sandblast resist comprising a polyvinyl alcohol, and a diazo resin.
- Japanese Laid-Open Patent Pyung 6-161097 and Pyung 6-161098 describe a photopolymerizable resin composition that comprises a urethane oligomer having ethylene-based unsaturated double bonds at its molecular terminal group, a cellulose derivative or a compound containing ethylene-based unsaturated double bonds, and a photoinitiator.
- Korean Patent No. 198725, U.S. Pat. Nos. 6200733, 5924912 and 6322947, and Japanese Patent Laid-Open Pyung 8-54734, Pyung 11-119430 and 2000-66391 disclose methods for fabricating a sandblast resist comprising a photoinitiator; an alkali-soluble polymer compound; and a urethane compound having a terminal (meta)acrylate group as derived from a polyether or polyester compound having a terminal hydroxyl group, a diisocyanate compound and a (meta)acrylate compound having a hydroxyl group.
- the alkali developability is good with high elasticity and flexibility, but the use of the urethane compound having a terminal (meta)acrylate group as a reactive oligomer results in a low reactivity and hence a poor alkali-resistant developability and a low strength of the coating. Accordingly, there is the difficulty in applying the methods to the high-resolution PDPs using the sandblast process.
- the conventional resin composition for sandblast resist comprises a photoinitiator, an alkali-soluble polymer compound, and a urethane compound having a terminal (meta) acrylate group as derived from a polyether or polyester compound having a terminal hydroxyl group, a diisocyanate compound and a (meta)acrylate compound having a hydroxyl group and, if using the urethane compound having a terminal (meta)acrylate group as a reactive oligomer, exhibits a low reactivity and a poor alkali-resistant developability to deteriorate the adherence of the dry film resist and increase the swelling of the dry film resist pattern after development, thereby adversely affecting the resolution.
- the above-mentioned alkali-soluble polymer compound included in the resin composition is selected from the group consisting of copolymers of (meta)acrylate and (meta)acrylate ester, and cellulose compounds having carboxyl groups.
- the use of the cellulose compound having carboxyl groups causes an extreme deterioration of chemical resistance to aqueous alkali solutions and results in a serious damage on the patterns formed in the development process, thereby making it difficult to realize the formation of a high-resolution and high-adherence pattern.
- the inventors of this invention have studied to solve the problems of the above composition in regard to the remarkable deterioration of the alkali chemical resistance when using both the cellulose compound as a binder polymer and the urethane compound having terminal (meta)acrylate groups as a reactive oligomer, and found out that the use of a specific mono- or multi-functional reactive unsaturated (meta)acrylate in addition to a plasticizer can remarkably increase resolution and alkali chemical resistance, thereby dramatically improving the adhesion of the dryfilm photoresist to complete the present invention.
- a photopolymerizable resin composition for sandblast resist that includes an aqueous alkali-soluble binder polymer, photopolymerizable oligomer, a photoinitiator, and an additive.
- the photopolymerizable oligomer includes at least one selected from a polyalkylene glycol mono(meta)acrylate compound having a terminal alkyl group as selected from the group consisting of compounds represented by the following formulas I to IV, and a polyalkylene glycol di(meta)acrylate compound as selected from the group consisting of compounds represented by the following formulas V to VIII.
- R 1 is hydrogen or methyl; R 2 is an alkyl group having 1 to 30 carbon atoms; and m is an integer from 1 to 30, In the above formula, R 1 , R 2 and m are as defined in the formula I; and n is an integer from 1 to 30, where n+m is equal to an integer from 2 to 50, In the above formula, R 1 , R 2 , m and n are as defined in the formula II, In the above formula, R 1 , R 2 , m and n are as defined in the formula II; and x is an integer from 1 to 30, where m+n+x is equal to an integer from 6 to 30, In the above formula, R 1 is hydrogen or methyl; m is an integer from 1 to 30; and n is an integer from 1 to 30, where m+n is equal to an integer from 3 to 30, In the above formula, R 1 , m and n are as defined in the formula V, In the above formula, R 1 , m and n are as defined in the formula V, In the above
- the photopolymerizable resin composition for sandblast resist according to the present invention includes a mixture of the above-stated photopolymerizable oligomer and at least one selected from urethane compounds having a terminal (meta)acrylate group as represented by the following formula IX and derived from a polyether or polyester compound having a terminal hydroxyl group, a diisocyanate compound and a (meta)acrylate compound having a hydroxyl group.
- R 1 and R are the same or different and include hydrogen or methyl;
- R 3 is alkylene or alkylene ether;
- R 4 is a divalent residual group derived by removing a diisocyanate derivative of two isocyanate groups;
- R 5 is a divalent residual group derived by removing a diol derivative of a hydroxyl group, the diol derivative having a terminal hydroxyl group and polyether or polyester as the structure of its main chain; and
- q is an integer from 1 to 10.
- the present invention is directed to a photopolymerizable resin composition for sandblast resist excellent in alkali developability and, more particularly, to a photopolymerizable resin composition for sandblast resist excellent in alkali chemical resistance to provide a very high adherence of the resist after the development process. Additionally, the sandblast resist is excellent in flexibility and elasticity and capable of forming fine patterns.
- the reason why the content of the photopolymerizable monomers (mono- or multi-functional monomers) used as an optional material is specifically limited to less than 20 parts by weight with respect to 100 parts by weight of the polyurethane compound having a terminal (meta)acrylate group is because the use of the excess of these photopolymerizable monomers may result in a brittle resist after the UV-curing process to deteriorate the sandblast resistance.
- the present invention uses a photopolymerizable compound having specific ethylene-based unsaturated groups as well as a polyurethane compound having at least one (meta)acrylate group as a photopolymerizable oligomer, and adds a plasticizer to improve elasticity and flexibility of the dry film photoresist after the exposure process and increase reactivity and chemical resistance to the developing solution, thereby achieving high adherence and high resolution.
- photopolymerizable resin composition refers to a photoresist layer interposed between a polyethylene terephthalate (PET) film and a polyethylene (PE) film.
- the photoresist layer includes (a) a photoinitiator, (b) an alkali-developable binder polymer, (c) a photopolymerizable oligomer, and (d) different additives.
- the photopolymerizable resin composition is required to be excellent in adherence to the substrate especially during the sandblasting process and to have good elasticity and flexibility for mechanical impact resistance to sandblasting.
- the individual components of the photopolymerizable resin composition are as follows.
- photoinitiator refers to a material initiating the chain reaction of the photopolymerizable oligomer by UV or other radiations.
- the photoinitiator is a compound that plays an important role in curing the dry film resist.
- the specific examples of the compound that can be used as the photoinitiator may include anthraquinone derivatives such as 2-methyl anthraquinone, or 2-ethyl anthraquinone; or benzoin derivatives such as benzoin methyl ether, benzophenone, phenanthrene, or 4,4′-bis-(dimethylamino)benzophenone.
- anthraquinone derivatives such as 2-methyl anthraquinone, or 2-ethyl anthraquinone
- benzoin derivatives such as benzoin methyl ether, benzophenone, phenanthrene, or 4,4′-bis-(dimethylamino)benzophenone.
- the photoinitiator can be any one compound selected from 1-hydroxycyclohexylphenyl ketone, 2,2-dimethoxy-1,2-diphenylethane-1-one, 2,-mthyl-1-[4-(methylthio)phenyl]-2-morpolynopropane-1-one, 2-benzyl-2-dimethylamino-1-[4-morpolynophenyl]butane-1-one, 2-hydroxy-2-methyl-1-phenylpropane-1-one, 2,4,6-trimethylbenzoyldiphenylphosphine oxide, 1-[4(2-hydroxymethoxy)phenyl]-2-hydroxy-2-methylpropane-1-one, 2,4-diethylthioxanetone, 2-chlorothioxanetone, 2,4-dimethylthioxanetone, 3,3-dimethyl-4-methoxybenzophenone, benzophenone, 1-chloro-4-propoxythioxanetone,
- the aqueous alkali-soluble polymer compound is an alkali-soluble polymer resin selected from the group consisting of a copolymer of (meta)acrylate and (meta)acrylate ester, and a cellulose resin containing carboxyl groups.
- the copolymer of (meta)acrylate and (meta)acrylate ester is a copolymerized acrylate polymer obtained by copolymerization of at least two monomers selected from the group consisting of: methyl acrylate, methyl methacrylate, ethylacrylate, methyl methacrylate, butyl acrylate, butyl methacrylate, acrylic acid, methacrylic acid, 2-hydroxy ethyl acrylate, 2-hydroxy ethyl methacrylate, 2-hydroxy propyl acrylate, 2-hydroxy propyl methacrylate, acrylamide, methacrylamide, styrene, or a-methyl styrene.
- the linear acrylate polymer has an average molecular weight of 20,000 to 150,000 and a glass transition temperature of 20 to 150 ° C in consideration of the coatability, and conformability of the dry film resist, and the mechanical strength of the resist itself after circuit formation.
- the content of the carboxylate binder polymer is 20 to 80 wt. % with respect to the total weight of the photopolymerizable resin composition.
- the preferred copolymers of (meta)acrylate and (meta)acrylate ester are Hi-pearl M-0619 and M-0919 having a relatively low glass transition temperature as supplied by Negami chemical industrial co., LTD.
- the preferred examples of the cellulose resin containing carboxyl groups may include hydroxyethylcarboxymethylcellulose, celluloseacetatehydrogenphthalate, or hydroxypropylmethylcellulosephthalate. Hydroxymethylcellulosephthalate is most preferred in the aspect of stability, high quality of dry films, high coatability, and good alkali-developability and ablativeness.
- the binder polymers as used in the examples are as follows: Hi-pearl M-0619 (molecular weight 60,200; Mw/Mn 1.93; acid value 124.5 mgKOH/g); KOLON BP-120 (molecular weight 75,400; Mw/Mn 1.93; acid value 124.5 mgKOH/g); Celluloseacetatehydrogenphthalate (CAP); ALDRICH (catalog. No. 32,807-3); hydroypropylmethylcellulosephthalate (HPMCP); and ALDRICH (catalog. No. 43,519-8).
- the photopolymerizable oligomer includes at least one of (c-1) a polyalkylene glycol mono(meta)acrylate compound having a terminal alkyl group as selected from the group consisting of compounds represented by the formulas I to VI; (c-2) a polyalkylene glycol di(meta)acrylate compound selected from the group consisting of compounds represented by the formulas V to VIII; and (c-3) a urethane compound having a terminal (meta)acrylate group as represented by the formula IX and derived from a polyether or polyester compound having a terminal hydroxyl group, a diisocyanate compound and a (meta)acrylate compound having a hydroxyl group.
- the component (c-1) or (c-2) is preferably used in an amount of 5 to 70 parts by weight with respect to 100 parts by weight of the compound (c-3).
- the content of the component (c-1) or (c-2) exceeding 70 parts by weight with respect to 100 parts by weight of the component (c-3) decreases the elasticity of the dry film resist and reduces the sandblast resistance.
- the dry film becomes hard after being cured by UV radiation and loses flexibility that is the driving force of the resistance to the mechanical impact of sandblasting.
- an appropriate plasticizer is preferably added.
- the compounds used in the preparation of the oligomer represented by the formula IX are as follows:
- the specific examples of the preferred diisocyanate compound reactive to the diol derivative including the polyester or polyether compound group may include aliphatic or aliphatic cyclic diisocyanate compounds and their aromatic cyclic diisocyanate compounds, such as dimethylenediisocyanate, trimethylenediisocyanate, tetramethylenediisocyanate, pentamethylenediisocyanate, hexamethylenediisocyanate, heptamethylenediisocyanate, 1,5-diisocyanato-2,2-dimethylpentane, octamethylenediisocyanate, 1,6-diisocyanato-2,5-dimnethylhexane, 1,5-diisocyanato-2,2,4-trimethylpentane, nonamethylenediisocyanate, 1,6-diisocyanato-2,2,4
- polyether as used in the diol derivative including a polyester or polyether group reactive to the diisocyanate compound refers to homo- or copolymers derived by the ring-opening reaction of ethylene oxide, propylene oxide, and tetrahydrofuran.
- polyester as used in the diol derivative refers to polyester compounds derived by the ring-opening polymerization of lactone, such as ⁇ -valerolactone, ⁇ -carprolactone, ⁇ -propiolactone, ⁇ -methyl- ⁇ -propiolactone, ⁇ -methyl- ⁇ -propiolactone, ⁇ , ⁇ -dimethyl- ⁇ -propiolactone, or ⁇ , ⁇ -dimethyl- ⁇ -propiolactone.
- diol derivative having a terminal hydroxyl group and polyether or polyester as the structure of its main chain as used herein refers to diol compounds such as ethylene glycol, diethylene glycol, triethylene glycol, 1,2-propylene glycol, or dipropylene glycol; and dicarboxylate derivative compounds such as adipate, or phthalate.
- the photopolymerizable resin composition which is prepared as described above by using, as a photopolymerizable oligomer, at least one of (c-1) the polyalkylene glycol mono(meta)acrylate compound having a terminal alkyl group, (c-2) the polyalkylene glycol di(meta)acrylate compound, and (c-3) the urethane compound having a terminal (meta)acrylate group as derived from a polyether or polyester compound having a terminal hydroxyl group, a diisocyanate compound and a (meta)acrylate compound having a hydroxyl group, exhibits remarkably improved reactivity relative to the resin composition using a urethane compound having a terminal (meta)acrylate group alone as a photopolymerizable oligomer.
- the surface damage of the photopolymerizable resin composition after development for the UV-cured regions can be greatly improved relative to the resin composition using a cellulose compound having a carboxyl group as an aqueous alkali-soluble polymer compound, thereby realizing high resolution and the fabrication of high-resolution PDPs.
- the weight ratio of the aqueous alkali-soluble polymer compound to the photopolymerizable oligomer is preferably in the range of 70:30 to 5:95. If it deviates from the above range, then the coating characteristic of the dry film may deteriorate abruptly, or edge fusion called “cold flow” may occur.
- the use of the components (c-1) and (c-2) as a photopolymerizable oligomer may have the above-mentioned strong points, but deteriorate the flexibility of the dry film and hence the resistance to the mechanical impact of sandblasting.
- a plasticizer is additionally used.
- the plasticizer available in the present invention is as follows.
- the plasticizer is used for the photopolymerizable resin composition.
- the primarily used plasticizer may include phthalic esters such as dibutyl phthalate, diheptyl phthalate, dioctyl phthalate, or diallyl phthalate; glycol esters such as triethylene glycol diacetate, or tetraethylene glycol diacetate; acid amides such as p-toluenesulfonamide, benzenesulfonamide, or N-n-butyl-benzenesulfonamide; aliphatic dibasic acid esters such as diisopropyl adipate, dioctyl azelate, or dibutyl maleate; phosphates such as triphenyl phosphate; and tributyl citrate, glycerol triacetate, or dioctyl butyl lauryl 4,5-diepoxycyclohexan
- the content of the plasticizer is, based on the solid weight of the photopolymerizable resin composition, suitably about 0.01 to 50 wt. %, more preferably 0.01 to 20 wt. %.
- the plasticizer is not specifically limited to the above-mentioned compounds.
- the additives as used herein may include a thermal polymerization inhibitor, dyes, a discoloring agent, an adherence enhancer, and a plasticizer.
- a thermal polymerization inhibitor for polymerization
- dyes for polymerization
- discoloring agent for polymerization
- adherence enhancer for polyurethane
- plasticizer for polyurethane resin
- the specific examples of the additives are disclosed in U.S. Pat. No. 5,300,401.
- photopolymerizable oligomers used in the following examples and comparative examples are as follows:
- PU-280, PU-210 Compounds represented by the formula (IX);
- the Examples of the present invention exemplify the resin composition suggested in the present invention
- the Comparative Example 1 employs the polyurethane compound having a terminal unsaturated (meta)acrylate group and an unsaturated (meta)acrylate compound diverting from the category of the specific reactive oligomer suggested in the present invention
- the Comparative Example 2 employs, as a reactive oligomer, an unsaturated (meta)acrylate compound diverting from the category of the specific reactive oligomer suggested in the present invention.
- the mixed solution of each photopolymerizable resin composition was prepared according to the Tables 1 to 6, coated in a uniform thickness (40 ⁇ m) on the PET film of 20 ⁇ m with a coating bar, and dried at 80° C. in a hot air oven for about 5 minutes. Then, the PE film was laminated on the dried coating to complete a sandblast resist.
- the sandblast resist thus completed was removed of the PE film on glass substrate and laminated by using a heating pressure roller.
- a photomask 10 to 200 ⁇ m which is divided in 5 ⁇ m, the adherence and resolution of the resist were measured.
- the sensitivity used as the measurement of reactivity was measured for the resist using the 21-step tablet (Stouffer Graphic Arts Equipment Co.,).
- a grinding agent was sprayed with a pressure of 1.5 kg/cm 2 by a sandblast nozzle and the time taken for complete removal of the coating of the dry film was measured.
- the distance between the sandblast nozzle and the substrate was 1 cm.
- the surface of the cured region was rubbed manually without drying out the rinse solution after development and the dissolution degree of the resist was measured. In this case the measurement was appraised as “small” for the slight dissolution of the surface of the cured region, “large” for the complete dissolution, and “middle” for the meddle degree between “small” and “large”.
- the photopolymerizable resin composition of the present invention which comprises, as a photopolymerizable oligomer, a polyalkylene glycol mono(meta)acrylate compound having a terminal alkyl group, a compound selected from polyalkylene glycol di(meta)acrylate compounds, and a compound selected from urethane compounds having a terminal (meta)acrylate group as derived from a polyether or polyester compound having a terminal hydroxyl group, a diisocyanate compound and a (meta)acrylate compound having a hydroxyl group, and further a plasticizer, exhibits much improved reactivity relative to the resin composition using an urethane compound having a terminal (meta)acrylate group alone or in combination with an unsaturated (meta)acrylate compound conventionally used for dry films, and particularly guarantees remarkable improvement in the damage on the surface of the resin composition after development for the cured regions, which damage is much serious for the resin composition using a cellulose compound having a carboxyl group
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- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
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Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2002-0052692A KR100521999B1 (ko) | 2002-09-03 | 2002-09-03 | 샌드블래스트 레지스트용 감광성수지 조성물 |
| KR10-2002-0052692 | 2002-09-03 | ||
| PCT/KR2003/001791 WO2004023212A1 (en) | 2002-09-03 | 2003-09-02 | Photopolymerizable resin composition for sandblast resist |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| US20060111493A1 true US20060111493A1 (en) | 2006-05-25 |
Family
ID=36461777
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US10/526,696 Abandoned US20060111493A1 (en) | 2002-09-03 | 2003-09-02 | Photopolymerizable resin composition for sandblast resist |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US20060111493A1 (https=) |
| EP (1) | EP1546808A4 (https=) |
| JP (1) | JP2005537514A (https=) |
| KR (1) | KR100521999B1 (https=) |
| CN (1) | CN1678957A (https=) |
| AU (1) | AU2003261622A1 (https=) |
| TW (1) | TWI258057B (https=) |
| WO (1) | WO2004023212A1 (https=) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20110294076A1 (en) * | 2010-05-26 | 2011-12-01 | Hon Hai Precision Industry Co., Ltd. | Method for making patterned roller |
| US9200138B2 (en) | 2013-06-14 | 2015-12-01 | Lg Chem, Ltd. | Method for preparing ester plasticizer and ester plasticizer prepared by the same |
| US20180278003A1 (en) * | 2017-03-27 | 2018-09-27 | Delphi Technologies, Inc. | Method for sealing electric terminal assembly |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
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| KR101073620B1 (ko) * | 2004-05-07 | 2011-10-14 | 주식회사 동진쎄미켐 | 감광성 수지 조성물 |
| JP2007101863A (ja) * | 2005-10-04 | 2007-04-19 | Hitachi Chem Co Ltd | 感光性樹脂組成物、感光性エレメント、レジストパターンの製造法及びプリント配線板の製造法 |
| KR101369268B1 (ko) * | 2006-04-24 | 2014-03-04 | 코오롱인더스트리 주식회사 | 내화학성이 우수한 감광성 수지 조성물 |
| JP2007316298A (ja) * | 2006-05-25 | 2007-12-06 | Asahi Kasei Electronics Co Ltd | 感光性樹脂組成物 |
| KR101356573B1 (ko) * | 2007-01-16 | 2014-01-29 | 코오롱인더스트리 주식회사 | 감광성 수지 조성물 |
| KR100814407B1 (ko) * | 2007-02-08 | 2008-03-18 | 삼성전자주식회사 | 미세 패턴 형성용 조성물 및 이를 이용한 패턴의 형성 방법 |
| DE102008024214A1 (de) * | 2008-05-19 | 2009-11-26 | Flint Group Germany Gmbh | Fotopolymerisierbare Flexodruckelemente für den Druck mit UV-Farben |
| CN102262355A (zh) * | 2010-05-28 | 2011-11-30 | 鸿富锦精密工业(深圳)有限公司 | 具预定图案的滚轮的制作方法 |
| CN102964761A (zh) * | 2011-09-02 | 2013-03-13 | 田菱精细化工(昆山)有限公司 | 喷砂加工立体保护膜用树脂组合物 |
| KR20130073509A (ko) * | 2011-12-23 | 2013-07-03 | 코오롱인더스트리 주식회사 | 드라이 필름 포토 레지스트용 감광성 수지 조성물 |
| JP6273690B2 (ja) * | 2013-04-08 | 2018-02-07 | 日立化成株式会社 | 感光性樹脂組成物及びこれを用いた感光性フィルム |
| KR101675822B1 (ko) * | 2013-08-07 | 2016-11-15 | 코오롱인더스트리 주식회사 | 드라이 필름 포토 레지스트용 감광성 수지 조성물 |
| TWI687769B (zh) | 2015-05-12 | 2020-03-11 | 日商三菱製紙股份有限公司 | 噴砂用感光性樹脂組成物及噴砂處理方法 |
| TWI874662B (zh) | 2020-06-05 | 2025-03-01 | 日商三菱製紙股份有限公司 | 噴砂用感光性樹脂組成物及噴砂用感光性薄膜 |
| WO2022030014A1 (ja) * | 2020-08-07 | 2022-02-10 | 株式会社ダイセル | セルロースアセテート樹脂組成物 |
| KR102825901B1 (ko) * | 2021-04-09 | 2025-06-25 | 코오롱인더스트리 주식회사 | 감광성 수지 조성물 및 이를 이용한 드라이 필름 포토레지스트, 감광성 엘리먼트, 레지스터 패턴, 회로기판, 및 디스플레이 장치 |
| CN120215209A (zh) * | 2025-05-28 | 2025-06-27 | 杭州福斯特电子材料有限公司 | 感光性树脂组合物、层压体和应用 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4248958A (en) * | 1979-05-23 | 1981-02-03 | Hoechst Aktiengesellschaft | Photopolymerizable mixture containing polyurethanes |
| US4822705A (en) * | 1987-02-24 | 1989-04-18 | Ricoh Company, Ltd. | Electrophotographic photoconductor with layer preventing charge injection |
| US5919569A (en) * | 1995-10-27 | 1999-07-06 | Tokyo Ohka Kogyo Co., Ltd. | Photosensitive resin composition and photosensitive resin laminated film containing the same |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3638660B2 (ja) * | 1995-05-01 | 2005-04-13 | 松下電器産業株式会社 | 感光性樹脂組成物、それを用いたサンドブラスト用感光性ドライフィルム及びそれを用いた食刻方法 |
| JP3468959B2 (ja) * | 1995-11-30 | 2003-11-25 | 東京応化工業株式会社 | 感光性樹脂組成物及びそれを用いた感光性樹脂積層フィルム |
| JPH09204044A (ja) * | 1996-01-25 | 1997-08-05 | Asahi Chem Ind Co Ltd | 光硬化性樹脂積層体 |
| KR100504313B1 (ko) * | 1997-09-09 | 2005-11-25 | 제이에스알 가부시끼가이샤 | 감방사선성조성물 |
| JPH11174667A (ja) * | 1997-12-09 | 1999-07-02 | Asahi Chem Ind Co Ltd | 光重合性樹脂組成物及び積層体 |
| JP2000066391A (ja) * | 1998-08-17 | 2000-03-03 | Tokyo Ohka Kogyo Co Ltd | サンドブラスト用感光性組成物及びそれを用いた感光性フィルム |
| JP3473696B2 (ja) * | 1999-03-03 | 2003-12-08 | 日立化成工業株式会社 | 感光性樹脂組成物、これを用いた感光性エレメント、レジストパターンの製造法及びプリント配線板の製造法 |
| JP4108243B2 (ja) * | 1999-04-14 | 2008-06-25 | 旭化成エレクトロニクス株式会社 | 感光性樹脂積層体 |
| WO2001098832A1 (fr) * | 2000-06-22 | 2001-12-27 | Hitachi Chemical Co., Ltd. | Composition de resine photosensible, element photosensible la contenant, procede de production d'un motif de resist et procede de production d'une carte a circuit imprime |
| JP2002148802A (ja) * | 2000-11-07 | 2002-05-22 | Tokyo Ohka Kogyo Co Ltd | サンドブラスト用感光性組成物及びそれを用いた感光性フィルム |
| JP2002148796A (ja) * | 2001-08-06 | 2002-05-22 | Hitachi Chem Co Ltd | 印刷回路板およびそれに用いる感光性樹脂組成物、感光性フィルム |
| EP1324139A3 (en) * | 2001-12-06 | 2003-10-22 | Ricoh Company, Ltd. | Electrophotographic photoconductor, process cartridge, image forming apparatus and image forming method |
-
2002
- 2002-09-03 KR KR10-2002-0052692A patent/KR100521999B1/ko not_active Expired - Fee Related
-
2003
- 2003-09-01 TW TW092124076A patent/TWI258057B/zh not_active IP Right Cessation
- 2003-09-02 US US10/526,696 patent/US20060111493A1/en not_active Abandoned
- 2003-09-02 CN CNA03820942XA patent/CN1678957A/zh active Pending
- 2003-09-02 JP JP2004533842A patent/JP2005537514A/ja active Pending
- 2003-09-02 EP EP03794316A patent/EP1546808A4/en not_active Withdrawn
- 2003-09-02 WO PCT/KR2003/001791 patent/WO2004023212A1/en not_active Ceased
- 2003-09-02 AU AU2003261622A patent/AU2003261622A1/en not_active Abandoned
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4248958A (en) * | 1979-05-23 | 1981-02-03 | Hoechst Aktiengesellschaft | Photopolymerizable mixture containing polyurethanes |
| US4822705A (en) * | 1987-02-24 | 1989-04-18 | Ricoh Company, Ltd. | Electrophotographic photoconductor with layer preventing charge injection |
| US5919569A (en) * | 1995-10-27 | 1999-07-06 | Tokyo Ohka Kogyo Co., Ltd. | Photosensitive resin composition and photosensitive resin laminated film containing the same |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20110294076A1 (en) * | 2010-05-26 | 2011-12-01 | Hon Hai Precision Industry Co., Ltd. | Method for making patterned roller |
| US9200138B2 (en) | 2013-06-14 | 2015-12-01 | Lg Chem, Ltd. | Method for preparing ester plasticizer and ester plasticizer prepared by the same |
| US20180278003A1 (en) * | 2017-03-27 | 2018-09-27 | Delphi Technologies, Inc. | Method for sealing electric terminal assembly |
| US10574014B2 (en) * | 2017-03-27 | 2020-02-25 | Aptiv Technologies Limited | Method for sealing electric terminal assembly |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20040021185A (ko) | 2004-03-10 |
| WO2004023212A1 (en) | 2004-03-18 |
| AU2003261622A1 (en) | 2004-03-29 |
| TWI258057B (en) | 2006-07-11 |
| CN1678957A (zh) | 2005-10-05 |
| JP2005537514A (ja) | 2005-12-08 |
| EP1546808A1 (en) | 2005-06-29 |
| TW200421021A (en) | 2004-10-16 |
| KR100521999B1 (ko) | 2005-10-18 |
| EP1546808A4 (en) | 2007-07-25 |
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