TWI725003B - 基板洗淨裝置 - Google Patents

基板洗淨裝置 Download PDF

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Publication number
TWI725003B
TWI725003B TW104137139A TW104137139A TWI725003B TW I725003 B TWI725003 B TW I725003B TW 104137139 A TW104137139 A TW 104137139A TW 104137139 A TW104137139 A TW 104137139A TW I725003 B TWI725003 B TW I725003B
Authority
TW
Taiwan
Prior art keywords
substrate
cleaning device
gas
protective cover
cleaning
Prior art date
Application number
TW104137139A
Other languages
English (en)
Chinese (zh)
Other versions
TW201628727A (zh
Inventor
深谷孝一
前田幸次
石橋知淳
中野央二郎
Original Assignee
日商荏原製作所股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商荏原製作所股份有限公司 filed Critical 日商荏原製作所股份有限公司
Publication of TW201628727A publication Critical patent/TW201628727A/zh
Application granted granted Critical
Publication of TWI725003B publication Critical patent/TWI725003B/zh

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67011—Apparatus for manufacture or treatment
    • H01L21/67017—Apparatus for fluid treatment
    • H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/04—Cleaning involving contact with liquid
    • B08B3/10—Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration
    • B08B3/12—Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration by sonic or ultrasonic vibrations
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68764—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a movable susceptor, stage or support, others than those only rotating on their own vertical axis, e.g. susceptors on a rotating caroussel

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
TW104137139A 2014-11-11 2015-11-11 基板洗淨裝置 TWI725003B (zh)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2014-229313 2014-11-11
JP2014229313 2014-11-11
JP2015-218517 2015-11-06
JP2015218517A JP6797526B2 (ja) 2014-11-11 2015-11-06 基板洗浄装置

Publications (2)

Publication Number Publication Date
TW201628727A TW201628727A (zh) 2016-08-16
TWI725003B true TWI725003B (zh) 2021-04-21

Family

ID=56071339

Family Applications (1)

Application Number Title Priority Date Filing Date
TW104137139A TWI725003B (zh) 2014-11-11 2015-11-11 基板洗淨裝置

Country Status (4)

Country Link
JP (3) JP6797526B2 (ja)
KR (2) KR102461262B1 (ja)
CN (1) CN107004593B (ja)
TW (1) TWI725003B (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7161415B2 (ja) * 2019-01-21 2022-10-26 株式会社ディスコ 加工装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0795540B2 (ja) * 1988-04-11 1995-10-11 株式会社日立製作所 超音波洗浄スプレイノズルを用いた基板両面の洗浄方法及び洗浄装置
JP2006114884A (ja) * 2004-09-17 2006-04-27 Ebara Corp 基板洗浄処理装置及び基板処理ユニット
JP2009117794A (ja) * 2007-10-17 2009-05-28 Ebara Corp 基板洗浄装置

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1070100A (ja) * 1996-08-27 1998-03-10 Matsushita Electric Ind Co Ltd 基板処理装置
JPH11283948A (ja) * 1998-03-27 1999-10-15 Dainippon Screen Mfg Co Ltd 基板回転処理装置
JP2000153210A (ja) 1998-11-19 2000-06-06 Hitachi Ltd 回転基板処理装置
JP3973196B2 (ja) * 2001-12-17 2007-09-12 東京エレクトロン株式会社 液処理方法及び液処理装置
JP4040906B2 (ja) * 2002-05-20 2008-01-30 芝浦メカトロニクス株式会社 スピン処理装置
JP2004349470A (ja) * 2003-05-22 2004-12-09 Dainippon Screen Mfg Co Ltd 基板処理装置およびその方法
KR100790273B1 (ko) * 2003-12-12 2007-12-31 동부일렉트로닉스 주식회사 펜슬 스펀지 클리닝 장치 및 그 방법
JP4464850B2 (ja) 2004-03-09 2010-05-19 株式会社ルネサステクノロジ 基板洗浄用２流体ノズル及び基板洗浄装置
JP2006286665A (ja) * 2005-03-31 2006-10-19 Toshiba Corp 電子デバイス洗浄方法及び電子デバイス洗浄装置
JP2006286947A (ja) * 2005-03-31 2006-10-19 Toshiba Corp 電子デバイス洗浄方法及び電子デバイス洗浄装置
JP4753757B2 (ja) * 2006-03-15 2011-08-24 大日本スクリーン製造株式会社 基板処理装置および基板処理方法
EP1848025B1 (en) * 2006-04-18 2009-12-02 Tokyo Electron Limited Liquid processing apparatus
TW200802563A (en) * 2006-04-18 2008-01-01 Tokyo Electron Ltd Liquid processing apparatus
JP4638402B2 (ja) * 2006-10-30 2011-02-23 大日本スクリーン製造株式会社 二流体ノズル、ならびにそれを用いた基板処理装置および基板処理方法
JP2008153322A (ja) * 2006-12-15 2008-07-03 Dainippon Screen Mfg Co Ltd 二流体ノズル、基板処理装置および基板処理方法
JP2009016752A (ja) * 2007-07-09 2009-01-22 Dainippon Screen Mfg Co Ltd 基板処理装置および基板処理方法
JP4929144B2 (ja) * 2007-12-10 2012-05-09 東京エレクトロン株式会社 基板処理装置、基板処理方法及び記憶媒体
JP5031671B2 (ja) * 2008-06-03 2012-09-19 東京エレクトロン株式会社 液処理装置、液処理方法および記憶媒体
JP5712061B2 (ja) * 2011-06-16 2015-05-07 株式会社荏原製作所 基板処理方法及び基板処理ユニット
JP5667545B2 (ja) * 2011-10-24 2015-02-12 東京エレクトロン株式会社 液処理装置および液処理方法
JP5932330B2 (ja) * 2011-12-28 2016-06-08 株式会社荏原製作所 液飛散防止カップ及び該カップを備えた基板処理装置
JP5866227B2 (ja) * 2012-02-23 2016-02-17 株式会社荏原製作所 基板洗浄方法
JP2013214737A (ja) * 2012-03-09 2013-10-17 Ebara Corp 基板処理方法及び基板処理装置
JP5955601B2 (ja) * 2012-03-27 2016-07-20 株式会社Ｓｃｒｅｅｎホールディングス 基板処理装置および基板処理方法
JP6093569B2 (ja) * 2012-12-28 2017-03-08 株式会社荏原製作所 基板洗浄装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0795540B2 (ja) * 1988-04-11 1995-10-11 株式会社日立製作所 超音波洗浄スプレイノズルを用いた基板両面の洗浄方法及び洗浄装置
JP2006114884A (ja) * 2004-09-17 2006-04-27 Ebara Corp 基板洗浄処理装置及び基板処理ユニット
TWI373799B (en) * 2004-09-17 2012-10-01 Ebara Corp Processing apparatus for cleaning substrate and substrate processing unit
JP2009117794A (ja) * 2007-10-17 2009-05-28 Ebara Corp 基板洗浄装置

Also Published As

Publication number Publication date
JP6775638B2 (ja) 2020-10-28
KR20210137232A (ko) 2021-11-17
KR102461262B1 (ko) 2022-10-28
JP6797526B2 (ja) 2020-12-09
JP7050875B2 (ja) 2022-04-08
TW201628727A (zh) 2016-08-16
JP2019169731A (ja) 2019-10-03
CN107004593A (zh) 2017-08-01
JP2016096337A (ja) 2016-05-26
CN107004593B (zh) 2021-06-11
KR20170084073A (ko) 2017-07-19
KR102324564B1 (ko) 2021-11-09
JP2021002686A (ja) 2021-01-07

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