TWI281987B - A system for burn-in testing of electronic devices - Google Patents

A system for burn-in testing of electronic devices Download PDF

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Publication number
TWI281987B
TWI281987B TW092117365A TW92117365A TWI281987B TW I281987 B TWI281987 B TW I281987B TW 092117365 A TW092117365 A TW 092117365A TW 92117365 A TW92117365 A TW 92117365A TW I281987 B TWI281987 B TW I281987B
Authority
TW
Taiwan
Prior art keywords
board
burner
drive
connector
power
Prior art date
Application number
TW092117365A
Other languages
English (en)
Chinese (zh)
Other versions
TW200400361A (en
Inventor
Bradley R Gunn
Alberto J Calderon
Jovan Jovanovic
David S Hendrickson
Original Assignee
Aehr Test Systems
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Aehr Test Systems filed Critical Aehr Test Systems
Publication of TW200400361A publication Critical patent/TW200400361A/zh
Application granted granted Critical
Publication of TWI281987B publication Critical patent/TWI281987B/zh

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/24—Marginal checking or other specified testing methods not covered by G06F11/26, e.g. race tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Environmental & Geological Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
TW092117365A 2002-06-27 2003-06-26 A system for burn-in testing of electronic devices TWI281987B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/184,525 US6815966B1 (en) 2002-06-27 2002-06-27 System for burn-in testing of electronic devices

Publications (2)

Publication Number Publication Date
TW200400361A TW200400361A (en) 2004-01-01
TWI281987B true TWI281987B (en) 2007-06-01

Family

ID=29999239

Family Applications (1)

Application Number Title Priority Date Filing Date
TW092117365A TWI281987B (en) 2002-06-27 2003-06-26 A system for burn-in testing of electronic devices

Country Status (7)

Country Link
US (2) US6815966B1 (enExample)
EP (1) EP1540360A1 (enExample)
JP (1) JP2005531010A (enExample)
CN (1) CN100395556C (enExample)
AU (1) AU2003247750A1 (enExample)
TW (1) TWI281987B (enExample)
WO (1) WO2004003581A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI715101B (zh) * 2018-12-27 2021-01-01 廣達電腦股份有限公司 電路裝置及轉接卡

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KR100621104B1 (ko) * 2004-08-25 2006-09-19 삼성전자주식회사 전자장치
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JP4957395B2 (ja) * 2007-06-05 2012-06-20 横河電機株式会社 半導体試験装置用テストヘッド
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BRPI0801325A2 (pt) 2008-04-30 2010-01-12 Thomson Multimidia Ltda método automatizado para controlar e testar produtos
JP5563207B2 (ja) * 2008-08-01 2014-07-30 スリーエム イノベイティブ プロパティズ カンパニー 終端コネクタ
CN101644741B (zh) * 2008-08-04 2011-11-09 京元电子股份有限公司 具有电源塔的多层预烧板结构
US8030957B2 (en) 2009-03-25 2011-10-04 Aehr Test Systems System for testing an integrated circuit of a device and its method of use
US7969175B2 (en) * 2009-05-07 2011-06-28 Aehr Test Systems Separate test electronics and blower modules in an apparatus for testing an integrated circuit
JP2012117881A (ja) * 2010-11-30 2012-06-21 Nippon Eng Kk バーンインボード及びバーンインシステム
KR101309081B1 (ko) * 2012-02-29 2013-09-17 주식회사 유니테스트 번인 테스터
CN103364740A (zh) * 2012-04-10 2013-10-23 鸿富锦精密工业（深圳）有限公司 转接板及具有该转接板的直流电源测试系统
TWI465737B (zh) * 2012-08-14 2014-12-21 Accton Technology Corp 老化測試系統
CN103884928B (zh) * 2012-12-21 2017-06-23 中国科学院金属研究所 力电热多场耦合作用下微电子产品可靠性测试平台
TWI490516B (zh) * 2013-03-28 2015-07-01 Chroma Ate Inc Measurement device and method for automatic test equipment
JP2014215062A (ja) * 2013-04-23 2014-11-17 セイコーエプソン株式会社 ハンドラーおよび検査装置
TWI570419B (zh) * 2015-07-31 2017-02-11 陽榮科技股份有限公司 Ic升溫裝置及方法
TWI550287B (zh) * 2015-10-30 2016-09-21 Hon Tech Inc Electronic components preheating unit and its application test classification equipment
KR102789332B1 (ko) 2016-01-08 2025-03-31 에어 테스트 시스템즈 일렉트로닉스 테스터 내의 디바이스들의 열 제어를 위한 방법 및 시스템
WO2018017402A1 (en) * 2016-07-21 2018-01-25 Canary Connect, Inc. Reversible power and data connector assembly
KR102495427B1 (ko) 2017-03-03 2023-02-02 에어 테스트 시스템즈 일렉트로닉스 테스터
JP6961632B2 (ja) * 2019-01-21 2021-11-05 株式会社アドバンテスト バーンインボード及びバーンイン装置
DE102019002350B3 (de) * 2019-03-29 2020-06-10 Sinn Power Gmbh Modulares elektronikgehäusekonzept
CN110737221B (zh) * 2019-10-23 2021-08-10 苏州腾伟电子有限公司 三十二通道矩阵开关板
TWI749690B (zh) * 2020-08-10 2021-12-11 京元電子股份有限公司 半導體元件預燒測試模組及其預燒測試裝置
CN114078718B (zh) * 2020-08-13 2025-02-28 京元电子股份有限公司 半导体元件预烧测试模块及其预烧测试装置
TWI759833B (zh) * 2020-08-25 2022-04-01 伊士博國際商業股份有限公司 具有功能測試之處理器燒機裝置
US11835575B2 (en) 2020-10-07 2023-12-05 Aehr Test Systems Electronics tester
TWI741917B (zh) * 2020-12-18 2021-10-01 鴻勁精密股份有限公司 輸送裝置及其應用之測試設備
JP7623204B2 (ja) * 2021-04-19 2025-01-28 株式会社アドバンテスト バーンインボード、及び、バーンイン装置
CN116381365A (zh) * 2021-12-29 2023-07-04 中国航天科工飞航技术研究院（中国航天海鹰机电技术研究院） 适用于高压连接器的老化试验工装及试验装置
TWI860799B (zh) * 2023-07-28 2024-11-01 周宗貴 積體電路燒機系統的電源板結構
CN118330421B (zh) * 2024-06-17 2024-09-10 浙江杭可仪器有限公司 一种高集成性电子元器件老化测试装置

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US6815966B1 (en) * 2002-06-27 2004-11-09 Aehr Test Systems System for burn-in testing of electronic devices

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI715101B (zh) * 2018-12-27 2021-01-01 廣達電腦股份有限公司 電路裝置及轉接卡

Also Published As

Publication number Publication date
TW200400361A (en) 2004-01-01
AU2003247750A1 (en) 2004-01-19
JP2005531010A (ja) 2005-10-13
US20050007137A1 (en) 2005-01-13
US7063544B2 (en) 2006-06-20
CN100395556C (zh) 2008-06-18
EP1540360A1 (en) 2005-06-15
US6815966B1 (en) 2004-11-09
CN1662822A (zh) 2005-08-31
WO2004003581A1 (en) 2004-01-08

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