TWI243084B - Apparatus and method for chemical-mechanical polishing (CMP) head having direct pneumatic wafer polishing pressure - Google Patents
Apparatus and method for chemical-mechanical polishing (CMP) head having direct pneumatic wafer polishing pressure Download PDFInfo
- Publication number
- TWI243084B TWI243084B TW089103613A TW89103613A TWI243084B TW I243084 B TWI243084 B TW I243084B TW 089103613 A TW089103613 A TW 089103613A TW 89103613 A TW89103613 A TW 89103613A TW I243084 B TWI243084 B TW I243084B
- Authority
- TW
- Taiwan
- Prior art keywords
- wafer
- polishing
- substrate
- pneumatic
- pressure
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
- B24B37/32—Retaining rings
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B41/00—Component parts such as frames, beds, carriages, headstocks
- B24B41/06—Work supports, e.g. adjustable steadies
- B24B41/061—Work supports, e.g. adjustable steadies axially supporting turning workpieces, e.g. magnetically, pneumatically
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/16—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation taking regard of the load
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Grinding Of Cylindrical And Plane Surfaces (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/261,112 US6231428B1 (en) | 1999-03-03 | 1999-03-03 | Chemical mechanical polishing head assembly having floating wafer carrier and retaining ring |
| US09/294,547 US6309290B1 (en) | 1999-03-03 | 1999-04-19 | Chemical mechanical polishing head having floating wafer retaining ring and wafer carrier with multi-zone polishing pressure control |
| US09/390,142 US6368189B1 (en) | 1999-03-03 | 1999-09-03 | Apparatus and method for chemical-mechanical polishing (CMP) head having direct pneumatic wafer polishing pressure |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TWI243084B true TWI243084B (en) | 2005-11-11 |
Family
ID=27401376
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW089103613A TWI243084B (en) | 1999-03-03 | 2000-03-01 | Apparatus and method for chemical-mechanical polishing (CMP) head having direct pneumatic wafer polishing pressure |
| TW089103841A TW534850B (en) | 1999-03-03 | 2000-03-03 | Chemical mechanical polishing head having floating wafer retaining ring and wafer carrier with multi-zone polishing pressure control |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW089103841A TW534850B (en) | 1999-03-03 | 2000-03-03 | Chemical mechanical polishing head having floating wafer retaining ring and wafer carrier with multi-zone polishing pressure control |
Country Status (7)
| Country | Link |
|---|---|
| US (3) | US6368189B1 (enExample) |
| EP (5) | EP1371449A3 (enExample) |
| JP (3) | JP4212776B2 (enExample) |
| AT (3) | ATE249909T1 (enExample) |
| DE (3) | DE60005270T2 (enExample) |
| TW (2) | TWI243084B (enExample) |
| WO (2) | WO2000054933A2 (enExample) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI505909B (zh) * | 2010-08-31 | 2015-11-01 | Fujikoshi Machinery Corp | 研磨裝置 |
| TWI609741B (zh) * | 2013-12-02 | 2018-01-01 | 荏原製作所股份有限公司 | 研磨裝置 |
| CN113752159A (zh) * | 2021-08-21 | 2021-12-07 | 浙江晶盛机电股份有限公司 | 一种可在线测厚的抛光载体 |
| CN115431169A (zh) * | 2022-08-24 | 2022-12-06 | 中国电子科技集团公司第十三研究所 | 真空连接转换装置、载片抛光方法及抛光机 |
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| US6368189B1 (en) * | 1999-03-03 | 2002-04-09 | Mitsubishi Materials Corporation | Apparatus and method for chemical-mechanical polishing (CMP) head having direct pneumatic wafer polishing pressure |
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| US6206768B1 (en) * | 1999-07-29 | 2001-03-27 | Chartered Semiconductor Manufacturing, Ltd. | Adjustable and extended guide rings |
| US7140956B1 (en) | 2000-03-31 | 2006-11-28 | Speedfam-Ipec Corporation | Work piece carrier with adjustable pressure zones and barriers and a method of planarizing a work piece |
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| TW579319B (en) * | 2000-05-12 | 2004-03-11 | Multi Planar Technologies Inc | System and method for CMP head having multi-pressure annular zone subcarrier material removal control |
| US6808443B2 (en) * | 2000-07-01 | 2004-10-26 | Lam Research Corporation | Projected gimbal point drive |
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1999
- 1999-09-03 US US09/390,142 patent/US6368189B1/en not_active Expired - Fee Related
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2000
- 2000-02-24 AT AT00919082T patent/ATE249909T1/de not_active IP Right Cessation
- 2000-02-24 DE DE60005270T patent/DE60005270T2/de not_active Expired - Fee Related
- 2000-02-24 EP EP03020525A patent/EP1371449A3/en not_active Ceased
- 2000-02-24 EP EP07011957A patent/EP1837122B1/en not_active Expired - Lifetime
- 2000-02-24 EP EP00919082A patent/EP1091829B1/en not_active Expired - Lifetime
- 2000-02-24 JP JP2000604992A patent/JP4212776B2/ja not_active Expired - Fee Related
- 2000-02-24 WO PCT/IB2000/000508 patent/WO2000054933A2/en not_active Ceased
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- 2000-03-01 WO PCT/IB2000/000513 patent/WO2000051782A1/en not_active Ceased
- 2000-03-01 AT AT00915318T patent/ATE268247T1/de not_active IP Right Cessation
- 2000-03-01 AT AT04007064T patent/ATE333342T1/de not_active IP Right Cessation
- 2000-03-01 TW TW089103613A patent/TWI243084B/zh not_active IP Right Cessation
- 2000-03-01 JP JP2000602435A patent/JP3595266B2/ja not_active Expired - Lifetime
- 2000-03-01 EP EP00915318A patent/EP1075351B1/en not_active Expired - Lifetime
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- 2000-03-03 TW TW089103841A patent/TW534850B/zh not_active IP Right Cessation
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2001
- 2001-12-20 US US10/027,935 patent/US7029382B2/en not_active Expired - Fee Related
-
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- 2003-11-10 JP JP2003380241A patent/JP2004048082A/ja active Pending
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI505909B (zh) * | 2010-08-31 | 2015-11-01 | Fujikoshi Machinery Corp | 研磨裝置 |
| TWI609741B (zh) * | 2013-12-02 | 2018-01-01 | 荏原製作所股份有限公司 | 研磨裝置 |
| CN113752159A (zh) * | 2021-08-21 | 2021-12-07 | 浙江晶盛机电股份有限公司 | 一种可在线测厚的抛光载体 |
| CN115431169A (zh) * | 2022-08-24 | 2022-12-06 | 中国电子科技集团公司第十三研究所 | 真空连接转换装置、载片抛光方法及抛光机 |
| CN115431169B (zh) * | 2022-08-24 | 2023-09-01 | 中国电子科技集团公司第十三研究所 | 真空连接转换装置、载片抛光方法及抛光机 |
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