MX2010001536A - Montaje de contacto de rosorte. - Google Patents

Montaje de contacto de rosorte.

Info

Publication number
MX2010001536A
MX2010001536A MX2010001536A MX2010001536A MX2010001536A MX 2010001536 A MX2010001536 A MX 2010001536A MX 2010001536 A MX2010001536 A MX 2010001536A MX 2010001536 A MX2010001536 A MX 2010001536A MX 2010001536 A MX2010001536 A MX 2010001536A
Authority
MX
Mexico
Prior art keywords
spring contact
spring
flat
plunger
contact assemby
Prior art date
Application number
MX2010001536A
Other languages
English (en)
Inventor
Charles J Johnston
Scott Chabineau
Valts Treibergs
Sergey Yakushev
Mark Swart
Edward A Kottmeyer
Original Assignee
Capital Formation Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Capital Formation Inc filed Critical Capital Formation Inc
Publication of MX2010001536A publication Critical patent/MX2010001536A/es

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02Contact members
    • H01R13/22Contacts for co-operating by abutting
    • H01R13/24Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2421Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716Elastic
    • G01R1/06722Spring-loaded
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70Coupling devices
    • H01R12/71Coupling devices for rigid printing circuits or like structures
    • H01R12/712Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
    • H01R12/714Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit with contacts abutting directly the printed circuit; Button contacts therefore provided on the printed circuit
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S439/00Electrical connectors
    • Y10S439/908Contact having two contact surfaces for electrical connection on opposite sides of insulative body

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)

Abstract

Se describe un montaje de contacto de resorte que tiene un primer pist?n con una porci?n de cola que tiene una superficie de contacto plana y un segundo pist?n con una porci?n de cola que tiene una superficie de contacto plana en donde las superficies de contacto planas se traslapan y est?n rodeadas por un resorte de compresi?n externo de tal manera que el enganche deslizante de las superficies planas aumenta durante la compresi?n del resorte.
MX2010001536A 2007-09-18 2008-09-17 Montaje de contacto de rosorte. MX2010001536A (es)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US97337007P 2007-09-18 2007-09-18
US8060708P 2008-07-14 2008-07-14
US12/206,659 US7862391B2 (en) 2007-09-18 2008-09-08 Spring contact assembly
PCT/US2008/076720 WO2009039205A1 (en) 2007-09-18 2008-09-17 Spring contact assemby

Publications (1)

Publication Number Publication Date
MX2010001536A true MX2010001536A (es) 2010-04-21

Family

ID=40454978

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2010001536A MX2010001536A (es) 2007-09-18 2008-09-17 Montaje de contacto de rosorte.

Country Status (10)

Country Link
US (3) US7862391B2 (es)
EP (1) EP2191544B1 (es)
JP (1) JP4988927B2 (es)
KR (1) KR101145283B1 (es)
CN (2) CN102738627B (es)
HU (1) HUE037972T2 (es)
MX (1) MX2010001536A (es)
MY (1) MY153589A (es)
TW (1) TWI375362B (es)
WO (1) WO2009039205A1 (es)

Families Citing this family (74)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20100123476A1 (en) * 2007-04-27 2010-05-20 Nhk Spring Co., Ltd. Conductive contact
CN102422726B (zh) * 2009-03-10 2015-07-01 约翰国际有限公司 用于微电路测试器的导电引脚
US8324919B2 (en) 2009-03-27 2012-12-04 Delaware Capital Formation, Inc. Scrub inducing compliant electrical contact
US20100267291A1 (en) * 2009-04-20 2010-10-21 Scott Chabineau-Lovgren Swaging process for improved compliant contact electrical test performance
US20130002285A1 (en) 2010-03-10 2013-01-03 Johnstech International Corporation Electrically Conductive Pins For Microcircuit Tester
JP5568563B2 (ja) * 2009-09-28 2014-08-06 株式会社日本マイクロニクス 接触子及び電気的接続装置
JP5750535B2 (ja) * 2009-09-28 2015-07-22 株式会社日本マイクロニクス 接触子及び電気的接続装置
US8690587B2 (en) 2009-12-25 2014-04-08 Nhk Spring Co., Ltd. Connection terminal
US8710856B2 (en) * 2010-01-15 2014-04-29 LTX Credence Corporation Terminal for flat test probe
KR101307365B1 (ko) * 2010-02-05 2013-09-11 가부시키가이샤 니혼 마이크로닉스 접촉자 및 전기적 접속장치
JP4998838B2 (ja) * 2010-04-09 2012-08-15 山一電機株式会社 プローブピン及びそれを備えるicソケット
US8118604B2 (en) * 2010-05-06 2012-02-21 Hon Hai Precision Ind. Co., Ltd. Socket connector having electrical element supported by insulated elastomer
KR101020025B1 (ko) * 2010-06-01 2011-03-09 주식회사 엔티에스 전자부품 검침 프로브
TWI534432B (zh) * 2010-09-07 2016-05-21 瓊斯科技國際公司 用於微電路測試器之電氣傳導針腳
US9007082B2 (en) 2010-09-07 2015-04-14 Johnstech International Corporation Electrically conductive pins for microcircuit tester
US8823406B2 (en) 2010-10-20 2014-09-02 Cascade Micotech, Inc. Systems and methods for simultaneous optical testing of a plurality of devices under test
US8970240B2 (en) 2010-11-04 2015-03-03 Cascade Microtech, Inc. Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same
JP5903049B2 (ja) * 2010-11-15 2016-04-13 日本発條株式会社 接続端子
WO2012067077A1 (ja) * 2010-11-15 2012-05-24 日本発條株式会社 接続端子
JP5597108B2 (ja) * 2010-11-29 2014-10-01 株式会社精研 接触検査用治具
US9244099B2 (en) 2011-05-09 2016-01-26 Cascade Microtech, Inc. Probe head assemblies, components thereof, test systems including the same, and methods of operating the same
JP5726651B2 (ja) * 2011-06-22 2015-06-03 タイコエレクトロニクスジャパン合同会社 コンタクトおよびソケット
JPWO2013018809A1 (ja) * 2011-08-02 2015-03-05 日本発條株式会社 プローブユニット
JP5858781B2 (ja) * 2011-12-29 2016-02-10 株式会社エンプラス プローブピン及び電気部品用ソケット
US8758066B2 (en) * 2012-02-03 2014-06-24 Interconnect Devices, Inc. Electrical connector with insulation member
DE102012202113B3 (de) * 2012-02-13 2013-05-29 Robert Bosch Gmbh Elektrische Kontaktieranordnung
MY176424A (en) * 2012-04-13 2020-08-07 Xcerra Corp Test probe assembly and related methods abstract
US9059545B2 (en) 2012-07-11 2015-06-16 Tyco Electronics Corporations Socket connectors and methods of assembling socket connectors
JP6011103B2 (ja) * 2012-07-23 2016-10-19 山一電機株式会社 コンタクトプローブ及びそれを備えた半導体素子用ソケット
US9379465B2 (en) * 2012-09-14 2016-06-28 Nhk Spring Co., Ltd. Connection terminal having a press-fitting part inserted into a hollow part of a holding member
TWI514686B (zh) * 2013-01-28 2015-12-21 Hon Hai Prec Ind Co Ltd 電連接器及電連接器端子
KR101439342B1 (ko) * 2013-04-18 2014-09-16 주식회사 아이에스시 포고핀용 탐침부재
KR101457168B1 (ko) 2013-07-19 2014-11-04 황동원 스프링 콘택트
JP5985447B2 (ja) * 2013-08-21 2016-09-06 オムロン株式会社 プローブピン、および、これを用いた電子デバイス
JP6297288B2 (ja) * 2013-09-18 2018-03-20 株式会社ヨコオ スプリングコネクタ
JP6193719B2 (ja) * 2013-10-22 2017-09-06 日本電子材料株式会社 コンタクトプローブ
KR200473045Y1 (ko) * 2014-01-17 2014-06-27 (주)에스피에스 이중접점스위치 및 이중접점스위치를 갖는 마그네틱 커넥터
JP6361174B2 (ja) * 2014-03-06 2018-07-25 オムロン株式会社 プローブピン、および、これを用いた電子デバイス
JP2016009541A (ja) * 2014-06-23 2016-01-18 京セラコネクタプロダクツ株式会社 バッテリ用コネクタ
US9568388B2 (en) * 2014-08-05 2017-02-14 Sensata Technologies, Inc. Small form factor pressure sensor
MY186248A (en) * 2014-08-08 2021-06-30 Nhk Spring Co Ltd Connection terminal
DE202014105151U1 (de) * 2014-10-28 2016-01-29 Ptr Messtechnik Gmbh & Co. Kommanditgesellschaft Federkontaktvorrichtung
US10161963B2 (en) 2015-08-17 2018-12-25 Chaojiong Zhang Electrical contact and testing apparatus
US9673539B2 (en) * 2015-09-23 2017-06-06 Texas Instruments Incorporated Spring biased contact pin assembly
JP6637742B2 (ja) * 2015-11-25 2020-01-29 株式会社日本マイクロニクス 電気的接触子及び電気的接続装置
JP6610322B2 (ja) * 2016-02-15 2019-11-27 オムロン株式会社 プローブピンおよびそれを用いた検査装置
JP6740630B2 (ja) * 2016-02-15 2020-08-19 オムロン株式会社 プローブピンおよびこれを用いた検査装置
CN107290099B (zh) 2016-04-11 2021-06-08 森萨塔科技公司 压力传感器、用于压力传感器的插塞件和制造插塞件的方法
EP3236226B1 (en) 2016-04-20 2019-07-24 Sensata Technologies, Inc. Method of manufacturing a pressure sensor
CN106129665B (zh) * 2016-08-17 2018-10-23 东莞市盈之宝电子科技有限公司 一种探针
TWI616030B (zh) 2016-09-09 2018-02-21 金峰精密工業股份有限公司 大電流連接器及其母座連接器
US10782316B2 (en) 2017-01-09 2020-09-22 Delta Design, Inc. Socket side thermal system
US10545064B2 (en) 2017-05-04 2020-01-28 Sensata Technologies, Inc. Integrated pressure and temperature sensor
US10323998B2 (en) 2017-06-30 2019-06-18 Sensata Technologies, Inc. Fluid pressure sensor
US10724907B2 (en) 2017-07-12 2020-07-28 Sensata Technologies, Inc. Pressure sensor element with glass barrier material configured for increased capacitive response
US10557770B2 (en) 2017-09-14 2020-02-11 Sensata Technologies, Inc. Pressure sensor with improved strain gauge
KR101865367B1 (ko) * 2017-12-05 2018-06-07 주식회사 오킨스전자 레일 타입 pion 핀
KR101865375B1 (ko) * 2017-12-05 2018-06-07 주식회사 오킨스전자 트위스트 타입 pion 핀 및 그 조립 방법
US10476191B2 (en) * 2018-02-28 2019-11-12 Ohio Associated Enterprises, Llc Forked electrical contact pair with elastic tail
KR102121754B1 (ko) * 2018-12-19 2020-06-11 주식회사 오킨스전자 상하 2개의 영역으로 구분되는 단일 코일 스프링을 포함하는 테스트 소켓
CN110071386B (zh) 2019-03-29 2020-09-25 番禺得意精密电子工业有限公司 电连接器
KR102080832B1 (ko) * 2019-10-02 2020-02-24 황동원 스프링 콘택트 및 스프링 콘택트 내장형 테스트 소켓
KR102304874B1 (ko) * 2020-06-08 2021-09-24 주식회사 유니마이크로 반도체 검사용 프로브 핀
KR102456449B1 (ko) * 2020-08-11 2022-10-20 리노공업주식회사 검사 프로브
MX2023003926A (es) 2020-10-06 2023-05-09 Johnstech Int Corporation Bloque de tierra ajustable y sistema de prueba con bloque de tierra ajustable.
US11802909B2 (en) 2020-10-06 2023-10-31 Johnstech International Corporation Compliant ground block and testing system having compliant ground block
KR102414615B1 (ko) * 2020-10-16 2022-06-30 (주)아이윈솔루션 전기적 특성이 안정화된 연결핀
KR102235344B1 (ko) * 2020-12-31 2021-04-05 황동원 고속 시그널의 반도체 소자 테스트용 콘택트 핀과, 이를 포함하는 스프링 콘택트 및 소켓장치
US11387587B1 (en) * 2021-03-13 2022-07-12 Plastronics Socket Partners, Ltd. Self-retained slider contact pin
US11906576B1 (en) 2021-05-04 2024-02-20 Johnstech International Corporation Contact assembly array and testing system having contact assembly array
US11867752B1 (en) 2021-05-13 2024-01-09 Johnstech International Corporation Contact assembly and kelvin testing system having contact assembly
CN117837278A (zh) 2021-06-30 2024-04-05 三角设计公司 包含接触器组合件的温度控制系统
KR102587652B1 (ko) * 2021-08-04 2023-10-11 주식회사 아이에스시 탐침장치
CN114252665B (zh) * 2021-11-19 2022-12-13 深圳市顺天祥电子有限公司 一种电路板微型连接器测试探针模组

Family Cites Families (38)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4029375A (en) * 1976-06-14 1977-06-14 Electronic Engineering Company Of California Miniature electrical connector
US4636026A (en) 1985-12-20 1987-01-13 Augat Inc. Electrical test probe
US5174763A (en) * 1990-06-11 1992-12-29 Itt Corporation Contact assembly
JPH05182729A (ja) * 1991-12-26 1993-07-23 Yamaichi Electron Co Ltd 電気部品用接触子
US5227718A (en) * 1992-03-10 1993-07-13 Virginia Panel Corporation Double-headed spring contact probe assembly
JP3659662B2 (ja) * 1993-12-24 2005-06-15 株式会社デンソー プローブコンタクト
US5391995A (en) * 1994-02-01 1995-02-21 Everett Charles Technologies, Inc. Twisting electrical test probe with controlled pointing accuracy
GB2291544B (en) * 1994-07-12 1996-10-02 Everett Charles Tech Electrical connectors
US5942906A (en) * 1994-11-18 1999-08-24 Virginia Panel Corporation Interface system utilizing engagement mechanism
EP0838878B1 (fr) 1997-02-04 1999-02-24 Durtal SA Pièce de contact à ressort
JP4388610B2 (ja) 1998-07-10 2009-12-24 日本発條株式会社 導電性接触子
JP2002530841A (ja) * 1998-11-25 2002-09-17 リカ エレクトロニクス インターナショナル インコーポレイテッド 電気的接触装置
US6396293B1 (en) * 1999-02-18 2002-05-28 Delaware Capital Formation, Inc. Self-closing spring probe
US6462567B1 (en) * 1999-02-18 2002-10-08 Delaware Capital Formation, Inc. Self-retained spring probe
JP2002015804A (ja) 2000-06-30 2002-01-18 Tyco Electronics Amp Kk スプリングコンタクト
JP3673153B2 (ja) 2000-08-10 2005-07-20 タイコエレクトロニクスアンプ株式会社 スプリングコンタクト
JP3767810B2 (ja) * 2001-04-27 2006-04-19 株式会社ヨコオ スプリングコネクタ
JPWO2003005042A1 (ja) * 2001-07-02 2004-10-28 日本発条株式会社 導電性接触子
JP2003043065A (ja) 2001-07-27 2003-02-13 Ricoh Co Ltd プローブピン及び電気的特性試験部材
US6506082B1 (en) * 2001-12-21 2003-01-14 Interconnect Devices, Inc. Electrical contact interface
EP1488245B1 (en) * 2002-03-05 2007-08-22 Rika Denshi America, Inc. Apparatus for interfacing electronic packages and test equipment
EP1496367B1 (en) * 2002-04-16 2015-09-16 NHK SPRING Co., Ltd. Holder for conductive contact
US6769919B2 (en) * 2002-09-04 2004-08-03 Itt Manufacturing Enterprises, Inc. Low profile and low resistance connector
JP3768183B2 (ja) 2002-10-28 2006-04-19 山一電機株式会社 狭ピッチicパッケージ用icソケット
JP4299184B2 (ja) * 2004-04-23 2009-07-22 矢崎総業株式会社 基板接続用板端子
WO2006007440A1 (en) * 2004-06-16 2006-01-19 Rika Denshi America, Inc. Electrical test probes, methods of making, and methods of using
JP2006071343A (ja) 2004-08-31 2006-03-16 Sharp Corp コンタクトプローブおよびソケット
KR100584225B1 (ko) * 2004-10-06 2006-05-29 황동원 전자장치용 콘택트
JP2006292456A (ja) 2005-04-07 2006-10-26 Matsushita Electric Ind Co Ltd 半導体装置の検査装置および検査方法
JP4683993B2 (ja) 2005-04-27 2011-05-18 株式会社秩父富士 Icソケット用接触装置
JP4585024B2 (ja) * 2005-06-10 2010-11-24 デラウェア キャピタル フォーメーション インコーポレイテッド 可撓性のある内部相互接続部を備えた電気コンタクトプローブ
US7154286B1 (en) * 2005-06-30 2006-12-26 Interconnect Devices, Inc. Dual tapered spring probe
SG131790A1 (en) * 2005-10-14 2007-05-28 Tan Yin Leong Probe for testing integrated circuit devices
US7148713B1 (en) * 2005-10-28 2006-12-12 Interconnect Devices, Inc. Algoristic spring as probe
JP2008069805A (ja) 2006-09-12 2008-03-27 Ntn Corp 動圧軸受装置
CN200959404Y (zh) * 2006-09-13 2007-10-10 富士康(昆山)电脑接插件有限公司 电连接器端子
US20100123476A1 (en) * 2007-04-27 2010-05-20 Nhk Spring Co., Ltd. Conductive contact
JP5291585B2 (ja) * 2008-11-07 2013-09-18 株式会社日本マイクロニクス 接触子及び電気的接続装置

Also Published As

Publication number Publication date
CN101803128A (zh) 2010-08-11
CN102738627B (zh) 2015-04-22
EP2191544A4 (en) 2011-03-23
US7862391B2 (en) 2011-01-04
WO2009039205A1 (en) 2009-03-26
EP2191544A1 (en) 2010-06-02
JP4988927B2 (ja) 2012-08-01
TW200924315A (en) 2009-06-01
CN102738627A (zh) 2012-10-17
US8523579B2 (en) 2013-09-03
CN101803128B (zh) 2012-12-12
US8231416B2 (en) 2012-07-31
JP2010539672A (ja) 2010-12-16
KR20100047279A (ko) 2010-05-07
EP2191544B1 (en) 2017-11-08
HUE037972T2 (hu) 2018-09-28
MY153589A (en) 2015-02-27
TWI375362B (en) 2012-10-21
US20120282821A1 (en) 2012-11-08
KR101145283B1 (ko) 2012-05-14
US20110039457A1 (en) 2011-02-17
US20090075529A1 (en) 2009-03-19

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Legal Events

Date Code Title Description
FA Abandonment or withdrawal