MX2011007730A - Sonda de prueba de barril redondo de embolo plano. - Google Patents

Sonda de prueba de barril redondo de embolo plano.

Info

Publication number
MX2011007730A
MX2011007730A MX2011007730A MX2011007730A MX2011007730A MX 2011007730 A MX2011007730 A MX 2011007730A MX 2011007730 A MX2011007730 A MX 2011007730A MX 2011007730 A MX2011007730 A MX 2011007730A MX 2011007730 A MX2011007730 A MX 2011007730A
Authority
MX
Mexico
Prior art keywords
test probe
round barrel
flat plunger
barrel test
plunger round
Prior art date
Application number
MX2011007730A
Other languages
English (en)
Inventor
Charles J Johnston
Mark A Swart
Steve B Sargeant
Original Assignee
Capital Formation Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Capital Formation Inc filed Critical Capital Formation Inc
Publication of MX2011007730A publication Critical patent/MX2011007730A/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/06738—Geometry aspects related to tip portion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/305—Contactless testing using electron beams
    • G01R31/307—Contactless testing using electron beams of integrated circuits

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Geometry (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

La presente invención se refiere a una sonda de resorte que utiliza un émbolo plano y un barril redondo que tiene un resorte de compresión posicionado dentro del barril y un limpiador para contacto interno entre el émbolo y el interior del barril.
MX2011007730A 2009-01-30 2010-01-15 Sonda de prueba de barril redondo de embolo plano. MX2011007730A (es)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14865709P 2009-01-30 2009-01-30
US12/683,346 US8105119B2 (en) 2009-01-30 2010-01-06 Flat plunger round barrel test probe
PCT/US2010/021252 WO2010088077A1 (en) 2009-01-30 2010-01-15 Flat plunger round barrel test probe

Publications (1)

Publication Number Publication Date
MX2011007730A true MX2011007730A (es) 2011-12-16

Family

ID=42395954

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2011007730A MX2011007730A (es) 2009-01-30 2010-01-15 Sonda de prueba de barril redondo de embolo plano.

Country Status (7)

Country Link
US (1) US8105119B2 (es)
EP (1) EP2384443A4 (es)
KR (1) KR20110105401A (es)
CN (1) CN102301250B (es)
MX (1) MX2011007730A (es)
TW (1) TWI444623B (es)
WO (1) WO2010088077A1 (es)

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US8166783B2 (en) 2007-02-23 2012-05-01 Master Lock Company Llc Anti-tampering arrangements for pin tumbler cylinder locks
US8710856B2 (en) * 2010-01-15 2014-04-29 LTX Credence Corporation Terminal for flat test probe
JP5597108B2 (ja) * 2010-11-29 2014-10-01 株式会社精研 接触検査用治具
US8668504B2 (en) 2011-07-05 2014-03-11 Dave Smith Chevrolet Oldsmobile Pontiac Cadillac, Inc. Threadless light bulb socket
MY176424A (en) * 2012-04-13 2020-08-07 Xcerra Corp Test probe assembly and related methods abstract
US9478929B2 (en) 2014-06-23 2016-10-25 Ken Smith Light bulb receptacles and light bulb sockets
JP2017015581A (ja) * 2015-07-01 2017-01-19 富士通コンポーネント株式会社 コンタクト
US9748680B1 (en) * 2016-06-28 2017-08-29 Intel Corporation Multiple contact pogo pin
US10782316B2 (en) 2017-01-09 2020-09-22 Delta Design, Inc. Socket side thermal system
HUP1700051A2 (hu) * 2017-02-02 2018-08-28 Equip Test Kft Kontaktáló eszköz, fejegység ahhoz, valamint eljárások kontaktáló eszköz és fejegység elõállítására
CN114223098B (zh) * 2019-10-04 2024-04-12 株式会社村田制作所 探头
CN117837278A (zh) 2021-06-30 2024-04-05 三角设计公司 包含接触器组合件的温度控制系统

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US5225773A (en) * 1992-02-26 1993-07-06 Interconnect Devices, Inc. Switch probe
US5744977A (en) 1994-12-21 1998-04-28 Delaware Capital Formation, Inc. High-force spring probe with improved axial alignment
JP3156957B2 (ja) * 1995-08-29 2001-04-16 矢崎総業株式会社 コネクタ
JP3414593B2 (ja) 1996-06-28 2003-06-09 日本発条株式会社 導電性接触子
US6271672B1 (en) 1997-11-17 2001-08-07 Delaware Capital Formation, Inc. Biased BGA contactor probe tip
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US6506082B1 (en) * 2001-12-21 2003-01-14 Interconnect Devices, Inc. Electrical contact interface
DE60208580T2 (de) * 2002-01-15 2006-11-09 Tribotek, Inc., Burlington Gewebter mehrfachkontaktsteckverbinder
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US6677772B1 (en) * 2002-08-21 2004-01-13 Micron Technology, Inc. Contactor with isolated spring tips
JP3768183B2 (ja) * 2002-10-28 2006-04-19 山一電機株式会社 狭ピッチｉｃパッケージ用ｉｃソケット
JP2004247170A (ja) * 2003-02-13 2004-09-02 Smk Corp 押圧式スプリングコネクタ
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US7362118B2 (en) * 2006-08-25 2008-04-22 Interconnect Devices, Inc. Probe with contact ring
US20080143367A1 (en) 2006-12-14 2008-06-19 Scott Chabineau-Lovgren Compliant electrical contact having maximized the internal spring volume
TWM317015U (en) * 2007-01-25 2007-08-11 Global Master Tech Co Ltd Test probe
KR20080073841A (ko) 2007-02-07 2008-08-12 (주)넴스프로브 프로브 헤드 및 그 제조방법
JPWO2008133089A1 (ja) * 2007-04-20 2010-07-22 日本発條株式会社 導電性接触子ユニット

Also Published As

Publication number Publication date
CN102301250A (zh) 2011-12-28
US20100197176A1 (en) 2010-08-05
CN102301250B (zh) 2016-02-10
EP2384443A4 (en) 2013-06-19
EP2384443A1 (en) 2011-11-09
WO2010088077A1 (en) 2010-08-05
TW201037319A (en) 2010-10-16
US8105119B2 (en) 2012-01-31
KR20110105401A (ko) 2011-09-26
TWI444623B (zh) 2014-07-11

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