KR850005163A - 전계효과형 트랜지스터의 제조방법 - Google Patents
전계효과형 트랜지스터의 제조방법 Download PDFInfo
- Publication number
- KR850005163A KR850005163A KR1019840008292A KR840008292A KR850005163A KR 850005163 A KR850005163 A KR 850005163A KR 1019840008292 A KR1019840008292 A KR 1019840008292A KR 840008292 A KR840008292 A KR 840008292A KR 850005163 A KR850005163 A KR 850005163A
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- KR
- South Korea
- Prior art keywords
- manufacturing
- field effect
- effect transistor
- active layer
- drain region
- Prior art date
Links
- 230000005669 field effect Effects 0.000 title claims description 3
- 238000004519 manufacturing process Methods 0.000 title claims description 3
- 229910052581 Si3N4 Inorganic materials 0.000 claims 1
- 238000000605 extraction Methods 0.000 claims 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78651—Silicon transistors
- H01L29/7866—Non-monocrystalline silicon transistors
- H01L29/78672—Polycrystalline or microcrystalline silicon transistor
- H01L29/78675—Polycrystalline or microcrystalline silicon transistor with normal-type structure, e.g. with top gate
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02123—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
- H01L21/0217—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material being a silicon nitride not containing oxygen, e.g. SixNy or SixByNz
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/3003—Hydrogenation or deuterisation, e.g. using atomic hydrogen from a plasma
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
- H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
- H01L21/84—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being other than a semiconductor body, e.g. being an insulating body
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
- H01L23/291—Oxides or nitrides or carbides, e.g. ceramics, glass
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/06—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
- H01L27/0688—Integrated circuits having a three-dimensional layout
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/04—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their crystalline structure, e.g. polycrystalline, cubic or particular orientation of crystalline planes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1306—Field-effect transistor [FET]
- H01L2924/13091—Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Ceramic Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Plasma & Fusion (AREA)
- Thin Film Transistor (AREA)
- Formation Of Insulating Films (AREA)
Abstract
내용 없음
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본원 발명에 관한 전계효과령 트랜지스터의 제조방법의 일실시예에 의해서 제조된 MOS TFT의 단면도.
제2도는 MOS TFT의 실효이동도 μeff와 활성층을 구성하는 다결정 실리콘 막의 막두께와의 사이의 관계를 나타낸 그래프.
Claims (1)
- 채널이 형성되는 활성층, 게이트 절연막, 게이트전극, 소오스영역, 드레인영역, 이들의 소오스영역 및 드레인영역의 인출전극을 각각 형성한 후 적어도 상기 활성층의 윗쪽에 프라즈마 질화 실리콘 막을 형성하고, 이어서 어닐을 행하는 것을 특징으로 하는 전계효과형 트랜지스터의 제조방법.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58-248972 | 1983-12-24 | ||
JP83-248972 | 1983-12-24 | ||
JP58248972A JPS60136259A (ja) | 1983-12-24 | 1983-12-24 | 電界効果型トランジスタの製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR850005163A true KR850005163A (ko) | 1985-08-21 |
KR920007786B1 KR920007786B1 (ko) | 1992-09-17 |
Family
ID=17186123
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019840008292A KR920007786B1 (ko) | 1983-12-24 | 1984-12-24 | 전계효과형 트랜지스터의 제조방법 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JPS60136259A (ko) |
KR (1) | KR920007786B1 (ko) |
Families Citing this family (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6284562A (ja) * | 1985-10-08 | 1987-04-18 | Seiko Epson Corp | 半導体装置とその製造方法 |
JPS62204575A (ja) * | 1986-03-05 | 1987-09-09 | Matsushita Electric Ind Co Ltd | 薄膜半導体装置およびその製造方法 |
JP2865284B2 (ja) * | 1986-03-10 | 1999-03-08 | 松下電器産業株式会社 | 薄膜半導体デバイス |
JPH0750737B2 (ja) * | 1987-03-02 | 1995-05-31 | 日本電気株式会社 | 半導体装置の製造方法 |
JP2802618B2 (ja) * | 1987-03-26 | 1998-09-24 | セイコーエプソン株式会社 | 薄膜トランジスタの製造方法 |
JP2764395B2 (ja) * | 1987-04-20 | 1998-06-11 | セイコーエプソン株式会社 | 薄膜トランジスタの製造方法 |
JPS6432678A (en) * | 1987-07-28 | 1989-02-02 | Ricoh Kk | Thin-film transistor |
JP2589327B2 (ja) * | 1987-11-14 | 1997-03-12 | 株式会社リコー | 薄膜トランジスタの製造方法 |
JP2712433B2 (ja) * | 1988-12-07 | 1998-02-10 | 富士ゼロックス株式会社 | 逆スタガード型薄膜トランジスタの製造方法 |
JP2894391B2 (ja) * | 1991-09-20 | 1999-05-24 | 三菱電機株式会社 | 薄膜トランジスタおよびその製造方法 |
JPH05218430A (ja) * | 1992-02-07 | 1993-08-27 | G T C:Kk | 多結晶シリコン薄膜トランジスタおよびその製造方法 |
US5440168A (en) * | 1993-02-22 | 1995-08-08 | Ryoden Semiconductor System Engineering Corporation | Thin-film transistor with suppressed off-current and Vth |
US5719065A (en) | 1993-10-01 | 1998-02-17 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device with removable spacers |
JP2899960B2 (ja) * | 1996-12-09 | 1999-06-02 | セイコーエプソン株式会社 | 薄膜トランジスタの製造方法 |
JP2899959B2 (ja) * | 1996-12-09 | 1999-06-02 | セイコーエプソン株式会社 | 薄膜トランジスタの製造方法 |
JP5057605B2 (ja) * | 1999-03-17 | 2012-10-24 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
US7038239B2 (en) | 2002-04-09 | 2006-05-02 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor element and display device using the same |
JP3989761B2 (ja) | 2002-04-09 | 2007-10-10 | 株式会社半導体エネルギー研究所 | 半導体表示装置 |
US7256421B2 (en) | 2002-05-17 | 2007-08-14 | Semiconductor Energy Laboratory, Co., Ltd. | Display device having a structure for preventing the deterioration of a light emitting device |
WO2006025820A1 (en) * | 2004-08-26 | 2006-03-09 | Midwest Research Institute | Method for passivating crystal silicon surfaces |
JP2007242895A (ja) | 2006-03-08 | 2007-09-20 | Mitsubishi Electric Corp | 薄膜トランジスタ装置及びその製造方法 |
JP5172178B2 (ja) | 2007-03-15 | 2013-03-27 | 三菱電機株式会社 | 薄膜トランジスタ、それを用いた表示装置、及びそれらの製造方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5550663A (en) * | 1978-10-07 | 1980-04-12 | Shunpei Yamazaki | Semiconductor device and method of fabricating the same |
JPS57169248A (en) * | 1981-04-13 | 1982-10-18 | Oki Electric Ind Co Ltd | Manufacture of semiconductor integrated circuit device |
JPS5884466A (ja) * | 1981-11-13 | 1983-05-20 | Canon Inc | 半導体素子 |
JPS59136926A (ja) * | 1983-01-25 | 1984-08-06 | Seiko Epson Corp | 半導体装置の製法 |
JPH0338755A (ja) * | 1989-07-05 | 1991-02-19 | Nec Corp | ファイル転送システム |
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1983
- 1983-12-24 JP JP58248972A patent/JPS60136259A/ja active Granted
-
1984
- 1984-12-24 KR KR1019840008292A patent/KR920007786B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
JPS60136259A (ja) | 1985-07-19 |
JPH0457098B2 (ko) | 1992-09-10 |
KR920007786B1 (ko) | 1992-09-17 |
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