KR20140115982A - 방사선 검출 장치 및 방사선 검출 시스템 - Google Patents

방사선 검출 장치 및 방사선 검출 시스템 Download PDF

Info

Publication number
KR20140115982A
KR20140115982A KR1020140029412A KR20140029412A KR20140115982A KR 20140115982 A KR20140115982 A KR 20140115982A KR 1020140029412 A KR1020140029412 A KR 1020140029412A KR 20140029412 A KR20140029412 A KR 20140029412A KR 20140115982 A KR20140115982 A KR 20140115982A
Authority
KR
South Korea
Prior art keywords
layer
scintillator
reflective layer
sensor panel
scintillator layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
KR1020140029412A
Other languages
English (en)
Korean (ko)
Inventor
사토루 사와다
마사토 이노우에
신이치 다케다
다카마사 이시이
다이키 다케이
고타 니시베
Original Assignee
캐논 가부시끼가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 캐논 가부시끼가이샤 filed Critical 캐논 가부시끼가이샤
Publication of KR20140115982A publication Critical patent/KR20140115982A/ko
Ceased legal-status Critical Current

Links

Images

Classifications

    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/52—Devices using data or image processing specially adapted for radiation diagnosis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2002—Optical details, e.g. reflecting or diffusing layers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/246—Measuring radiation intensity with semiconductor detectors utilizing latent read-out, e.g. charge stored and read-out later

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Measurement Of Radiation (AREA)
  • Medical Informatics (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Optics & Photonics (AREA)
  • Pathology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Biomedical Technology (AREA)
  • Biophysics (AREA)
  • Surgery (AREA)
  • Animal Behavior & Ethology (AREA)
  • General Health & Medical Sciences (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Computer Vision & Pattern Recognition (AREA)
KR1020140029412A 2013-03-21 2014-03-13 방사선 검출 장치 및 방사선 검출 시스템 Ceased KR20140115982A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2013059062A JP6200173B2 (ja) 2013-03-21 2013-03-21 放射線検出装置及び放射線検出システム
JPJP-P-2013-059062 2013-03-21

Publications (1)

Publication Number Publication Date
KR20140115982A true KR20140115982A (ko) 2014-10-01

Family

ID=51550473

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020140029412A Ceased KR20140115982A (ko) 2013-03-21 2014-03-13 방사선 검출 장치 및 방사선 검출 시스템

Country Status (4)

Country Link
US (1) US9081104B2 (cg-RX-API-DMAC7.html)
JP (1) JP6200173B2 (cg-RX-API-DMAC7.html)
KR (1) KR20140115982A (cg-RX-API-DMAC7.html)
CN (1) CN104062675B (cg-RX-API-DMAC7.html)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2017171387A1 (ko) * 2016-03-31 2017-10-05 주식회사 아비즈알 신틸레이터 패널 및 그 제조 방법
US11428824B2 (en) 2019-04-09 2022-08-30 Ymit Co., Ltd. Scintillator module, scintillator sensor unit, and manufacturing method
KR20230024441A (ko) * 2017-09-27 2023-02-20 하마마츠 포토닉스 가부시키가이샤 신틸레이터 패널 및 방사선 검출기

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6478538B2 (ja) 2014-09-10 2019-03-06 キヤノン株式会社 放射線撮像装置および放射線撮像システム
JP6671839B2 (ja) 2014-10-07 2020-03-25 キヤノン株式会社 放射線撮像装置及び撮像システム
JP2016128779A (ja) * 2015-01-09 2016-07-14 株式会社東芝 放射線検出器及びその製造方法
JP6512830B2 (ja) * 2015-01-09 2019-05-15 キヤノン株式会社 放射線撮像装置、その製造方法及び放射線検査装置
JP6487263B2 (ja) * 2015-04-20 2019-03-20 浜松ホトニクス株式会社 放射線検出器及びその製造方法
JP6573377B2 (ja) 2015-07-08 2019-09-11 キヤノン株式会社 放射線撮像装置、その制御方法及びプログラム
JP6573378B2 (ja) 2015-07-10 2019-09-11 キヤノン株式会社 放射線撮像装置、その制御方法及びプログラム
JP6663210B2 (ja) 2015-12-01 2020-03-11 キヤノン株式会社 放射線撮像装置及びその制御方法
EP3391089A4 (en) * 2015-12-15 2019-07-10 Saint-Gobain Ceramics&Plastics, Inc. SCREENING DEVICE WITH MOISTURIZING BARRIER
CN107300712B (zh) * 2016-04-14 2021-08-17 中国辐射防护研究院 一种可同时测量β、γ能谱的层叠型闪烁体探测器的测量方法
JP6706963B2 (ja) 2016-04-18 2020-06-10 キヤノン株式会社 放射線撮像装置、放射線撮像システム、及び、放射線撮像装置の制御方法
KR102653420B1 (ko) 2016-06-01 2024-03-29 주식회사 엘지화학 엑스레이 검출 장치 및 그를 이용한 엑스레이 영상 시스템
JPWO2018020555A1 (ja) * 2016-07-25 2018-12-06 野洲メディカルイメージングテクノロジー株式会社 シンチレータセンサ基板及びシンチレータセンサ基板の製造方法
WO2018124133A1 (ja) * 2016-12-26 2018-07-05 富士フイルム株式会社 放射線検出器及び放射線画像撮影装置
JP6778118B2 (ja) 2017-01-13 2020-10-28 キヤノン株式会社 放射線撮像装置及び放射線撮像システム
JP6877289B2 (ja) 2017-07-31 2021-05-26 キヤノン株式会社 放射線検出装置、放射線検出システム、及び放射線出装置の製造方法
CN109659385A (zh) * 2017-10-10 2019-04-19 群创光电股份有限公司 感测装置
JP7030478B2 (ja) 2017-11-09 2022-03-07 キヤノン株式会社 撮影台および放射線撮影システム
EP3770640B1 (en) * 2018-03-19 2024-10-30 FUJIFILM Corporation Radiation detector, radiological imaging device, and production method
JP7048722B2 (ja) * 2018-03-27 2022-04-05 富士フイルム株式会社 放射線検出器及び放射線画像撮影装置
JP2019174365A (ja) * 2018-03-29 2019-10-10 シャープ株式会社 撮像パネル
CN110323235A (zh) * 2018-03-29 2019-10-11 夏普株式会社 摄像面板
JP6659182B2 (ja) 2018-07-23 2020-03-04 キヤノン株式会社 放射線撮像装置、その製造方法及び放射線撮像システム
US11047993B2 (en) * 2018-10-23 2021-06-29 Thermo Fisher Scientific Messtechnik Gmbh Radiation detector
JP7325295B2 (ja) * 2019-10-24 2023-08-14 浜松ホトニクス株式会社 シンチレータパネル、放射線検出器、シンチレータパネルの製造方法、及び、放射線検出器の製造方法
JP2023117956A (ja) 2022-02-14 2023-08-24 キヤノン株式会社 センサ基板、放射線撮像装置、放射線撮像システム、および、センサ基板の製造方法

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4720426A (en) * 1986-06-30 1988-01-19 General Electric Company Reflective coating for solid-state scintillator bar
JPS63151886A (ja) * 1986-12-17 1988-06-24 Hitachi Medical Corp 放射線検出器
JPH06160538A (ja) * 1992-11-16 1994-06-07 Toshiba Corp Ｃｔセンサーの形成方法及びそのｃｔセンサー
US6657201B2 (en) * 2001-06-29 2003-12-02 General Electric Company Cover plate having spacer lip with hermetic barrier for radiation imager and method of manufacturing same
US7126130B2 (en) * 2001-12-06 2006-10-24 General Electric Company Direct scintillator coating for radiation detector assembly longevity
JP4208790B2 (ja) 2004-08-10 2009-01-14 キヤノン株式会社 放射線検出装置の製造方法
JP2006052980A (ja) * 2004-08-10 2006-02-23 Canon Inc 放射線検出装置
US7557355B2 (en) 2004-09-30 2009-07-07 Canon Kabushiki Kaisha Image pickup apparatus and radiation image pickup apparatus
JP4579894B2 (ja) 2005-12-20 2010-11-10 キヤノン株式会社 放射線検出装置及び放射線検出システム
JP4921180B2 (ja) 2006-01-25 2012-04-25 キヤノン株式会社 放射線検出装置及び放射線撮像システム
JP2008215951A (ja) * 2007-03-01 2008-09-18 Toshiba Corp 放射線検出器
JP5004848B2 (ja) 2007-04-18 2012-08-22 キヤノン株式会社 放射線検出装置及び放射線検出システム
JP4764407B2 (ja) * 2007-11-20 2011-09-07 東芝電子管デバイス株式会社 放射線検出器及びその製造方法
JP2010101640A (ja) * 2008-10-21 2010-05-06 Toshiba Corp 放射線検出器
JP2010112741A (ja) * 2008-11-04 2010-05-20 Toshiba Corp 放射線検出器およびその製造方法
JP5305996B2 (ja) * 2009-03-12 2013-10-02 株式会社東芝 放射線検出器およびその製造方法
JP5561277B2 (ja) * 2009-06-02 2014-07-30 コニカミノルタ株式会社 シンチレータパネルの製造方法及びシンチレータパネル並びに放射線画像検出器
JP2012037454A (ja) 2010-08-10 2012-02-23 Toshiba Corp 放射線検出器及びその製造方法
JP5473835B2 (ja) * 2010-08-31 2014-04-16 富士フイルム株式会社 放射線検出器、放射線画像撮影装置及び放射線検出器の製造方法
JP5680943B2 (ja) 2010-11-16 2015-03-04 キヤノン株式会社 シンチレータ、放射線検出装置および放射線撮影装置
JP2013002887A (ja) 2011-06-14 2013-01-07 Canon Inc 放射線検出パネルおよび放射線撮影装置
JP5911274B2 (ja) 2011-11-28 2016-04-27 キヤノン株式会社 放射線検出装置及び放射線撮像システム
JP2013174465A (ja) 2012-02-23 2013-09-05 Canon Inc 放射線検出装置
JP6200171B2 (ja) 2012-06-04 2017-09-20 キヤノン株式会社 放射線検出装置及び撮像システム
JP6092568B2 (ja) 2012-10-11 2017-03-08 キヤノン株式会社 放射線検出装置及び放射線検出システム

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2017171387A1 (ko) * 2016-03-31 2017-10-05 주식회사 아비즈알 신틸레이터 패널 및 그 제조 방법
KR20230024441A (ko) * 2017-09-27 2023-02-20 하마마츠 포토닉스 가부시키가이샤 신틸레이터 패널 및 방사선 검출기
US11428824B2 (en) 2019-04-09 2022-08-30 Ymit Co., Ltd. Scintillator module, scintillator sensor unit, and manufacturing method

Also Published As

Publication number Publication date
JP2014185857A (ja) 2014-10-02
US20140284487A1 (en) 2014-09-25
CN104062675A (zh) 2014-09-24
CN104062675B (zh) 2016-08-17
US9081104B2 (en) 2015-07-14
JP6200173B2 (ja) 2017-09-20

Similar Documents

Publication Publication Date Title
KR20140115982A (ko) 방사선 검출 장치 및 방사선 검출 시스템
CN103293548B (zh) 放射线检测设备
JP6092568B2 (ja) 放射線検出装置及び放射線検出システム
US8653465B2 (en) Radiation detection apparatus and radiation imaging system
US6774481B2 (en) Solid-state image pickup device
CN114093252B (zh) 显示装置
US10156641B2 (en) Radiation image sensing apparatus and radiation image sensing system
US6891194B2 (en) Active matrix substrate, electromagnetic detector, and liquid crystal display apparatus
US6600158B1 (en) Semiconductor device and radiation image pickup system having the device
TW201835605A (zh) 放射線檢測器及放射線圖像攝影裝置
KR102535035B1 (ko) 방사선 검출 모듈, 방사선 검출기 및 방사선 검출 모듈의 제조 방법
KR20190020636A (ko) 방열 및 전자파 차폐 기능이 개선된 그라파이트 라미네이트 칩온필름형 반도체 패키지
JP5908212B2 (ja) 放射線検出器及びその製造方法
WO2015093134A1 (ja) 放射線検出装置及び放射線検出システム
US20120133860A1 (en) Active matrix substrate, liquid crystal display panel, liquid crystal display device, and method for manufacturing active matrix substrate
WO2020100809A1 (ja) 放射線検出モジュール、放射線検出器、及び放射線検出モジュールの製造方法
JP2020169892A (ja) 放射線撮影装置
WO2023188849A1 (ja) 半導体装置
JPWO2018124134A1 (ja) 放射線検出器及び放射線画像撮影装置
KR20230091955A (ko) 방사선 검출 패널
EP3324213B1 (en) Scintillator sealing for solid state x-ray detector
KR20230124044A (ko) 방사선 검출기
JP6643098B2 (ja) 放射線検出装置、放射線検出システム、及び、放射線検出装置の製造方法
JPH02151789A (ja) 多素子放射線検出器およびその製造方法ならびにｘ線ｃｔ装置
KR20250021535A (ko) 방사선 검출기

Legal Events

Date Code Title Description
PA0109 Patent application

Patent event code: PA01091R01D

Comment text: Patent Application

Patent event date: 20140313

PG1501 Laying open of application
A201 Request for examination
PA0201 Request for examination

Patent event code: PA02012R01D

Patent event date: 20150313

Comment text: Request for Examination of Application

Patent event code: PA02011R01I

Patent event date: 20140313

Comment text: Patent Application

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

Comment text: Notification of reason for refusal

Patent event date: 20160718

Patent event code: PE09021S01D

E601 Decision to refuse application
PE0601 Decision on rejection of patent

Patent event date: 20161129

Comment text: Decision to Refuse Application

Patent event code: PE06012S01D

Patent event date: 20160718

Comment text: Notification of reason for refusal

Patent event code: PE06011S01I