KR20140067079A - 가스들에 대해 향상된 불투과성을 제공하는 다층 구조 - Google Patents
가스들에 대해 향상된 불투과성을 제공하는 다층 구조 Download PDFInfo
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- KR20140067079A KR20140067079A KR1020147008430A KR20147008430A KR20140067079A KR 20140067079 A KR20140067079 A KR 20140067079A KR 1020147008430 A KR1020147008430 A KR 1020147008430A KR 20147008430 A KR20147008430 A KR 20147008430A KR 20140067079 A KR20140067079 A KR 20140067079A
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- 239000007789 gas Substances 0.000 title description 25
- 229910004298 SiO 2 Inorganic materials 0.000 claims abstract description 67
- 239000000463 material Substances 0.000 claims abstract description 65
- 239000000758 substrate Substances 0.000 claims abstract description 58
- 238000000034 method Methods 0.000 claims description 32
- 239000002243 precursor Substances 0.000 claims description 20
- 238000000151 deposition Methods 0.000 claims description 16
- 230000005855 radiation Effects 0.000 claims description 15
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 15
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 14
- 239000001301 oxygen Substances 0.000 claims description 14
- 229910052760 oxygen Inorganic materials 0.000 claims description 14
- 229920001709 polysilazane Polymers 0.000 claims description 13
- 238000006243 chemical reaction Methods 0.000 claims description 12
- 239000007788 liquid Substances 0.000 claims description 9
- 239000002861 polymer material Substances 0.000 claims description 9
- 238000002835 absorbance Methods 0.000 claims description 7
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 3
- 230000007423 decrease Effects 0.000 claims description 3
- 229910052710 silicon Inorganic materials 0.000 claims description 3
- 239000010703 silicon Substances 0.000 claims description 3
- 238000002834 transmittance Methods 0.000 claims description 3
- 238000004566 IR spectroscopy Methods 0.000 claims description 2
- 238000002129 infrared reflectance spectroscopy Methods 0.000 claims description 2
- 239000010410 layer Substances 0.000 description 177
- 230000004888 barrier function Effects 0.000 description 25
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 12
- 229920000139 polyethylene terephthalate Polymers 0.000 description 11
- 239000005020 polyethylene terephthalate Substances 0.000 description 11
- 229920000307 polymer substrate Polymers 0.000 description 8
- 238000005259 measurement Methods 0.000 description 6
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- 239000000377 silicon dioxide Substances 0.000 description 6
- 229920000642 polymer Polymers 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- 230000008021 deposition Effects 0.000 description 4
- 229910052681 coesite Inorganic materials 0.000 description 3
- 229910052906 cristobalite Inorganic materials 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 230000007062 hydrolysis Effects 0.000 description 3
- 238000006460 hydrolysis reaction Methods 0.000 description 3
- 230000006872 improvement Effects 0.000 description 3
- 235000012239 silicon dioxide Nutrition 0.000 description 3
- 230000006641 stabilisation Effects 0.000 description 3
- 238000011105 stabilization Methods 0.000 description 3
- 229910052682 stishovite Inorganic materials 0.000 description 3
- 229910052905 tridymite Inorganic materials 0.000 description 3
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 2
- 239000004698 Polyethylene Substances 0.000 description 2
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- 229910052739 hydrogen Inorganic materials 0.000 description 2
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- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 238000012623 in vivo measurement Methods 0.000 description 1
- 238000007373 indentation Methods 0.000 description 1
- 229910010272 inorganic material Inorganic materials 0.000 description 1
- 239000011147 inorganic material Substances 0.000 description 1
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 1
- 229910052753 mercury Inorganic materials 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
- 239000012044 organic layer Substances 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 150000001282 organosilanes Chemical class 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 238000005240 physical vapour deposition Methods 0.000 description 1
- 229920002647 polyamide Polymers 0.000 description 1
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- 230000008569 process Effects 0.000 description 1
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- 238000012360 testing method Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
- 238000002235 transmission spectroscopy Methods 0.000 description 1
- 238000009281 ultraviolet germicidal irradiation Methods 0.000 description 1
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
- C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
- C23C18/1204—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material inorganic material, e.g. non-oxide and non-metallic such as sulfides, nitrides based compounds
- C23C18/122—Inorganic polymers, e.g. silanes, polysilazanes, polysiloxanes
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
- C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
- C23C18/1204—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material inorganic material, e.g. non-oxide and non-metallic such as sulfides, nitrides based compounds
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
- C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
- C23C18/1204—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material inorganic material, e.g. non-oxide and non-metallic such as sulfides, nitrides based compounds
- C23C18/1208—Oxides, e.g. ceramics
- C23C18/1212—Zeolites, glasses
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
- C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
- C23C18/1225—Deposition of multilayers of inorganic material
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/14—Decomposition by irradiation, e.g. photolysis, particle radiation or by mixed irradiation sources
- C23C18/143—Radiation by light, e.g. photolysis or pyrolysis
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02205—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition
- H01L21/02208—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si
- H01L21/02219—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si the compound comprising silicon and nitrogen
- H01L21/02222—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si the compound comprising silicon and nitrogen the compound being a silazane
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F19/00—Integrated devices, or assemblies of multiple devices, comprising at least one photovoltaic cell covered by group H10F10/00, e.g. photovoltaic modules
- H10F19/80—Encapsulations or containers for integrated devices, or assemblies of multiple devices, having photovoltaic cells
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/16—Material structures, e.g. crystalline structures, film structures or crystal plane orientations
- H10F77/169—Thin semiconductor films on metallic or insulating substrates
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/16—Material structures, e.g. crystalline structures, film structures or crystal plane orientations
- H10F77/169—Thin semiconductor films on metallic or insulating substrates
- H10F77/1694—Thin semiconductor films on metallic or insulating substrates the films including Group I-III-VI materials, e.g. CIS or CIGS
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
- H10K10/80—Constructional details
- H10K10/88—Passivation; Containers; Encapsulations
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/84—Passivation; Containers; Encapsulations
- H10K50/844—Encapsulations
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/84—Passivation; Containers; Encapsulations
- H10K50/844—Encapsulations
- H10K50/8445—Encapsulations multilayered coatings having a repetitive structure, e.g. having multiple organic-inorganic bilayers
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2307/00—Properties of the layers or laminate
- B32B2307/70—Other properties
- B32B2307/724—Permeability to gases, adsorption
- B32B2307/7242—Non-permeable
- B32B2307/7244—Oxygen barrier
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/541—CuInSe2 material PV cells
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
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- Y10T428/24967—Absolute thicknesses specified
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Thermal Sciences (AREA)
- Ceramic Engineering (AREA)
- Health & Medical Sciences (AREA)
- Optics & Photonics (AREA)
- Toxicology (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Laminated Bodies (AREA)
- Silicon Compounds (AREA)
- Chemically Coating (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR1158570A FR2980394B1 (fr) | 2011-09-26 | 2011-09-26 | Structure multicouche offrant une etancheite aux gaz amelioree |
| FR1158570 | 2011-09-26 | ||
| PCT/EP2012/068766 WO2013045393A1 (fr) | 2011-09-26 | 2012-09-24 | Structure multicouche offrant une etancheite aux gaz amelioree |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20140067079A true KR20140067079A (ko) | 2014-06-03 |
Family
ID=46880737
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020147008430A Ceased KR20140067079A (ko) | 2011-09-26 | 2012-09-24 | 가스들에 대해 향상된 불투과성을 제공하는 다층 구조 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US9771654B2 (enExample) |
| EP (1) | EP2761055B1 (enExample) |
| JP (1) | JP6124896B2 (enExample) |
| KR (1) | KR20140067079A (enExample) |
| CN (1) | CN103958734B (enExample) |
| BR (1) | BR112014007133A2 (enExample) |
| FR (1) | FR2980394B1 (enExample) |
| WO (1) | WO2013045393A1 (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2988520B1 (fr) * | 2012-03-23 | 2014-03-14 | Arkema France | Utilisation d'une structure multicouche a base de polymere halogene comme feuille de protection de module photovoltaique |
| FR2997763B1 (fr) | 2012-11-06 | 2015-01-16 | Commissariat Energie Atomique | Dispositif et procede d'estimation d'un flux de gaz dans une enceinte maintenue en depression vis-a-vis du gaz |
| WO2017155808A1 (en) * | 2016-03-07 | 2017-09-14 | Sunedison Semiconductor Limited | Semiconductor on insulator structure comprising a plasma nitride layer and method of manufacture thereof |
| JP6849083B2 (ja) * | 2017-09-11 | 2021-03-24 | 東京エレクトロン株式会社 | 絶縁膜の成膜方法、基板処理装置及び基板処理システム |
| CN109821485B (zh) * | 2019-04-11 | 2021-12-10 | 湖北科技学院 | 用于动力锂电池热调控的相变储热胶囊的制备方法 |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5051308A (en) * | 1987-08-24 | 1991-09-24 | General Electric Company | Abrasion-resistant plastic articles |
| US5472827A (en) * | 1991-12-30 | 1995-12-05 | Sony Corporation | Method of forming a resist pattern using an anti-reflective layer |
| JP2526766B2 (ja) | 1992-06-15 | 1996-08-21 | 東洋製罐株式会社 | ガス遮断性積層プラスチックス材 |
| JPH0792337A (ja) * | 1993-09-27 | 1995-04-07 | Hitachi Cable Ltd | ポリマコア光導波路およびその製造方法 |
| JPH07206410A (ja) | 1994-01-17 | 1995-08-08 | Toshiba Corp | シリコン窒化膜の形成方法 |
| US5846649A (en) * | 1994-03-03 | 1998-12-08 | Monsanto Company | Highly durable and abrasion-resistant dielectric coatings for lenses |
| US5508368A (en) * | 1994-03-03 | 1996-04-16 | Diamonex, Incorporated | Ion beam process for deposition of highly abrasion-resistant coatings |
| JP3414107B2 (ja) | 1995-02-20 | 2003-06-09 | 株式会社日立製作所 | 半導体装置の製造方法 |
| US6379014B1 (en) * | 2000-04-27 | 2002-04-30 | N & K Technology, Inc. | Graded anti-reflective coatings for photolithography |
| JP5291275B2 (ja) * | 2000-07-27 | 2013-09-18 | 有限会社コンタミネーション・コントロール・サービス | コーティング膜が施された部材及びコーティング膜の製造方法 |
| US6614977B2 (en) * | 2001-07-12 | 2003-09-02 | Little Optics, Inc. | Use of deuterated gases for the vapor deposition of thin films for low-loss optical devices and waveguides |
| EP1329946A3 (en) * | 2001-12-11 | 2005-04-06 | Sel Semiconductor Energy Laboratory Co., Ltd. | Manufacturing method of semiconductor device including a laser crystallization step |
| JP4097947B2 (ja) * | 2002-01-24 | 2008-06-11 | 住友ベークライト株式会社 | 透明水蒸気バリアフィルム |
| CN1195315C (zh) | 2002-03-15 | 2005-03-30 | 台湾积体电路制造股份有限公司 | 多层式电介质抗反射层及其形成方法 |
| US20030203210A1 (en) | 2002-04-30 | 2003-10-30 | Vitex Systems, Inc. | Barrier coatings and methods of making same |
| US20070147766A1 (en) * | 2003-11-12 | 2007-06-28 | Mattsson Kent E | Low loss silicon oxynitride optical waveguide, a method of its manufacture and an optical device |
| US8652625B2 (en) * | 2004-09-21 | 2014-02-18 | Konica Minolta Holdings, Inc. | Transparent gas barrier film |
| JP2006133525A (ja) * | 2004-11-05 | 2006-05-25 | Canon Inc | 電子写真感光体及びこれを用いた電子写真装置 |
| DE112005002995B4 (de) * | 2004-12-17 | 2010-03-04 | The University Of Tokushima | Verfahren zur Herstellung eines Substrats mit einer modifizierten Oberfläche und Substrat mit modifizierter Oberfläche |
| US8216684B2 (en) * | 2005-02-01 | 2012-07-10 | Mitsu Chemicals, Inc. | Method for bonding members, composite film and use thereof |
| US20090029056A1 (en) * | 2005-04-11 | 2009-01-29 | Manfred Hoffmann | Method for Improving the Barrier Characteristics of Ceramic Barrier Layers |
| JP4698310B2 (ja) * | 2005-07-11 | 2011-06-08 | 富士フイルム株式会社 | ガスバリア性フィルム、基材フィルムおよび有機エレクトロルミネッセンス素子 |
| DE102005034817A1 (de) * | 2005-07-26 | 2007-02-01 | Clariant International Limited | Verfahren zur Herstellung einer dünnen glasartigen Beschichtung auf Substraten zur Verringerung der Gaspermeation |
| JPWO2007018144A1 (ja) * | 2005-08-10 | 2009-02-19 | 株式会社シンク・ラボラトリー | ドクターブレード |
| JP2007237588A (ja) * | 2006-03-09 | 2007-09-20 | Kyodo Printing Co Ltd | ガスバリア性フィルム及びその製造方法 |
| US8586189B2 (en) * | 2007-09-19 | 2013-11-19 | Fujifilm Corporation | Gas-barrier film and organic device comprising same |
| TWI493609B (zh) * | 2007-10-23 | 2015-07-21 | 半導體能源研究所股份有限公司 | 半導體基板、顯示面板及顯示裝置的製造方法 |
| JP2009133000A (ja) * | 2007-10-30 | 2009-06-18 | Fujifilm Corp | シリコン窒化物膜及びそれを用いたガスバリア膜、薄膜素子 |
| JP5405031B2 (ja) * | 2008-03-06 | 2014-02-05 | AzエレクトロニックマテリアルズIp株式会社 | シリカ質膜の製造に用いる浸漬用溶液およびそれを用いたシリカ質膜の製造法 |
| JP2009255040A (ja) * | 2008-03-25 | 2009-11-05 | Kyodo Printing Co Ltd | フレキシブルガスバリアフィルムおよびその製造方法 |
| US8673070B2 (en) * | 2008-08-29 | 2014-03-18 | National Institute Of Advanced Industrial Science And Technology | Process for producing silicon oxide thin film or silicon oxynitride compound thin film and thin film obtained by the process |
| KR101040175B1 (ko) * | 2008-12-11 | 2011-06-16 | 한국전자통신연구원 | 연성 기판 및 그의 제조 방법 |
| EP2626378B1 (en) * | 2009-03-17 | 2019-02-27 | LINTEC Corporation | Molded article, process for producing the molded article, member for electronic device, and electronic device |
| DE102009013904A1 (de) * | 2009-03-19 | 2010-09-23 | Clariant International Limited | Solarzellen mit einer Verkapselungsschicht auf Basis von Polysilazan |
| CN102470637B (zh) * | 2009-07-17 | 2016-04-06 | 三井化学株式会社 | 层合体及其制造方法 |
| JP2011044453A (ja) * | 2009-08-19 | 2011-03-03 | Konica Minolta Holdings Inc | 太陽電池用バックシート及び太陽電池モジュール |
| JP5585267B2 (ja) | 2009-08-26 | 2014-09-10 | コニカミノルタ株式会社 | ガスバリア性フィルム、その製造方法、及びそれを用いた有機光電変換素子 |
| JP5410207B2 (ja) * | 2009-09-04 | 2014-02-05 | AzエレクトロニックマテリアルズIp株式会社 | シリカ質膜製造方法およびそれに用いるポリシラザン塗膜処理液 |
| FR2949775B1 (fr) * | 2009-09-10 | 2013-08-09 | Saint Gobain Performance Plast | Substrat de protection pour dispositif collecteur ou emetteur de rayonnement |
| JP5394867B2 (ja) * | 2009-09-17 | 2014-01-22 | 富士フイルム株式会社 | ガスバリア膜およびガスバリアフィルム |
| WO2011043315A1 (ja) * | 2009-10-05 | 2011-04-14 | コニカミノルタホールディングス株式会社 | ガスバリア性フィルム、ガスバリア性フィルムの製造方法、該ガスバリア性フィルムを有する有機光電変換素子及び該有機光電変換素子を有する太陽電池 |
| JP5849703B2 (ja) * | 2009-11-19 | 2016-02-03 | コニカミノルタ株式会社 | ガスバリア性フィルムの製造方法、有機光電変換素子の製造方法及び有機エレクトロルミネッセンス素子の製造方法 |
| JP5736644B2 (ja) * | 2009-12-11 | 2015-06-17 | コニカミノルタ株式会社 | ガスバリア性フィルム、その製造方法及びそれを用いた有機光電変換素子 |
| US8754407B2 (en) * | 2009-12-14 | 2014-06-17 | Konica Minolta Holdings, Inc. | Gas barrier film, method of manufacturing gas barrier film, and organic photoelectric conversion element |
| FR2953990B1 (fr) | 2009-12-14 | 2013-01-11 | Commissariat Energie Atomique | Dispositif d'encapsulation a etancheite amelioree |
| JP5381734B2 (ja) * | 2010-01-14 | 2014-01-08 | コニカミノルタ株式会社 | バリア性フィルム及び有機電子デバイス |
| JP5445179B2 (ja) * | 2010-02-01 | 2014-03-19 | コニカミノルタ株式会社 | ガスバリア性フィルム、ガスバリア性フィルムの製造方法、有機電子デバイス |
| JP5515847B2 (ja) * | 2010-02-24 | 2014-06-11 | コニカミノルタ株式会社 | ガスバリアフィルムの製造方法 |
| JP5447022B2 (ja) * | 2010-03-11 | 2014-03-19 | コニカミノルタ株式会社 | ガスバリア性フィルム、その製造方法及びそのガスバリア性フィルムを用いた有機光電変換素子 |
| JP2012004349A (ja) * | 2010-06-17 | 2012-01-05 | Az Electronic Materials Kk | シリコンオキシナイトライド膜の形成方法およびそれにより製造されたシリコンオキシナイトライド膜付き基板 |
| JP5540949B2 (ja) * | 2010-07-07 | 2014-07-02 | コニカミノルタ株式会社 | ガスバリア性フィルム、及び有機光電変換素子、有機エレクトロルミネッセンス素子 |
| JP5692230B2 (ja) * | 2010-07-14 | 2015-04-01 | コニカミノルタ株式会社 | ガスバリアフィルムの製造方法 |
| KR20120008360A (ko) * | 2010-07-16 | 2012-01-30 | 삼성모바일디스플레이주식회사 | 플렉서블 디스플레이용 기판 및 그 제조 방법 |
| JP5747915B2 (ja) * | 2010-07-22 | 2015-07-15 | コニカミノルタ株式会社 | ガスバリアフィルムの製造方法 |
| US9359505B2 (en) * | 2010-07-27 | 2016-06-07 | Konica Minolta Holdings, Inc. | Gas barrier film, process for production of gas barrier film, and electronic device |
| WO2012026362A1 (ja) * | 2010-08-25 | 2012-03-01 | コニカミノルタホールディングス株式会社 | ガスバリア性フィルムの製造方法及び有機光電変換素子 |
| TWI457235B (zh) * | 2010-09-21 | 2014-10-21 | Lintec Corp | A gas barrier film, a manufacturing method thereof, an electronic device element, and an electronic device |
| CN103237657A (zh) * | 2010-12-06 | 2013-08-07 | 柯尼卡美能达株式会社 | 气体阻隔性膜、气体阻隔性膜的制造方法及电子器件 |
| CN103269851B (zh) * | 2010-12-27 | 2015-04-01 | 柯尼卡美能达株式会社 | 气体阻隔性膜及电子器件 |
| EP2660042B1 (en) * | 2010-12-27 | 2015-04-29 | Konica Minolta, Inc. | Method for manufacturing gas-barrier film, gas-barrier film, and electronic device |
| US20140127630A1 (en) * | 2011-06-22 | 2014-05-08 | Az Electronic Materials Usa Corp. | Silicon oxynitride film formation method and substrate equipped with silicon oxynitride film formed thereby |
| JP5888329B2 (ja) * | 2011-06-27 | 2016-03-22 | コニカミノルタ株式会社 | ガスバリア性フィルム、ガスバリア性フィルムの製造方法、および電子デバイス |
| WO2013035432A1 (ja) * | 2011-09-08 | 2013-03-14 | リンテック株式会社 | 変性ポリシラザンフィルム、および、ガスバリアフィルムの製造方法 |
| WO2013077255A1 (ja) * | 2011-11-24 | 2013-05-30 | コニカミノルタ株式会社 | ガスバリアーフィルム及び電子機器 |
| JP5970197B2 (ja) * | 2012-02-08 | 2016-08-17 | メルクパフォーマンスマテリアルズマニュファクチャリング合同会社 | 無機ポリシラザン樹脂 |
| JP6017256B2 (ja) * | 2012-10-11 | 2016-10-26 | メルクパフォーマンスマテリアルズマニュファクチャリング合同会社 | ケイ素質緻密膜の形成方法 |
| US20140117511A1 (en) * | 2012-10-30 | 2014-05-01 | Infineon Technologies Ag | Passivation Layer and Method of Making a Passivation Layer |
-
2011
- 2011-09-26 FR FR1158570A patent/FR2980394B1/fr not_active Expired - Fee Related
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2012
- 2012-09-24 WO PCT/EP2012/068766 patent/WO2013045393A1/fr not_active Ceased
- 2012-09-24 EP EP12761635.7A patent/EP2761055B1/fr not_active Not-in-force
- 2012-09-24 KR KR1020147008430A patent/KR20140067079A/ko not_active Ceased
- 2012-09-24 JP JP2014531264A patent/JP6124896B2/ja active Active
- 2012-09-24 US US14/346,890 patent/US9771654B2/en not_active Expired - Fee Related
- 2012-09-24 BR BR112014007133A patent/BR112014007133A2/pt not_active IP Right Cessation
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Also Published As
| Publication number | Publication date |
|---|---|
| CN103958734B (zh) | 2016-12-21 |
| JP2014528857A (ja) | 2014-10-30 |
| FR2980394B1 (fr) | 2013-10-18 |
| EP2761055B1 (fr) | 2016-10-05 |
| CN103958734A (zh) | 2014-07-30 |
| EP2761055A1 (fr) | 2014-08-06 |
| US9771654B2 (en) | 2017-09-26 |
| FR2980394A1 (fr) | 2013-03-29 |
| WO2013045393A1 (fr) | 2013-04-04 |
| JP6124896B2 (ja) | 2017-05-10 |
| US20140234602A1 (en) | 2014-08-21 |
| BR112014007133A2 (pt) | 2017-04-11 |
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