KR20100063694A - 원료 가스의 공급 시스템 및 성막 장치 - Google Patents
원료 가스의 공급 시스템 및 성막 장치 Download PDFInfo
- Publication number
- KR20100063694A KR20100063694A KR1020107000890A KR20107000890A KR20100063694A KR 20100063694 A KR20100063694 A KR 20100063694A KR 1020107000890 A KR1020107000890 A KR 1020107000890A KR 20107000890 A KR20107000890 A KR 20107000890A KR 20100063694 A KR20100063694 A KR 20100063694A
- Authority
- KR
- South Korea
- Prior art keywords
- raw material
- gas
- valve
- supply system
- heater
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 239000002994 raw material Substances 0.000 claims abstract description 232
- 239000007789 gas Substances 0.000 claims abstract description 173
- 239000012159 carrier gas Substances 0.000 claims abstract description 38
- 238000010438 heat treatment Methods 0.000 claims abstract description 31
- 239000007787 solid Substances 0.000 claims abstract description 30
- 239000007769 metal material Substances 0.000 claims abstract description 21
- 239000007788 liquid Substances 0.000 claims abstract description 20
- 230000007246 mechanism Effects 0.000 claims abstract description 17
- 239000010408 film Substances 0.000 claims description 35
- 238000012545 processing Methods 0.000 claims description 30
- 238000000034 method Methods 0.000 claims description 25
- 230000008569 process Effects 0.000 claims description 16
- 229910052782 aluminium Inorganic materials 0.000 claims description 12
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 12
- 239000010949 copper Substances 0.000 claims description 6
- 238000000354 decomposition reaction Methods 0.000 claims description 6
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 5
- 229910052802 copper Inorganic materials 0.000 claims description 5
- 239000010409 thin film Substances 0.000 claims description 5
- 229910000838 Al alloy Inorganic materials 0.000 claims description 4
- 229910000881 Cu alloy Inorganic materials 0.000 claims description 3
- 238000005192 partition Methods 0.000 claims description 2
- 229910052707 ruthenium Inorganic materials 0.000 claims description 2
- 229910052751 metal Inorganic materials 0.000 description 18
- 239000002184 metal Substances 0.000 description 18
- 239000000463 material Substances 0.000 description 13
- 238000009826 distribution Methods 0.000 description 12
- 239000004065 semiconductor Substances 0.000 description 11
- 230000005587 bubbling Effects 0.000 description 8
- 238000005229 chemical vapour deposition Methods 0.000 description 5
- 230000001276 controlling effect Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 230000002349 favourable effect Effects 0.000 description 4
- 239000002245 particle Substances 0.000 description 4
- 239000010935 stainless steel Substances 0.000 description 4
- 229910001220 stainless steel Inorganic materials 0.000 description 4
- 239000010936 titanium Substances 0.000 description 4
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 4
- 230000004888 barrier function Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 229910004356 Ti Raw Inorganic materials 0.000 description 2
- 229910002091 carbon monoxide Inorganic materials 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 238000001704 evaporation Methods 0.000 description 2
- 238000007789 sealing Methods 0.000 description 2
- 229920002379 silicone rubber Polymers 0.000 description 2
- 239000004945 silicone rubber Substances 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- 229910052719 titanium Inorganic materials 0.000 description 2
- 229910052721 tungsten Inorganic materials 0.000 description 2
- 239000010937 tungsten Substances 0.000 description 2
- 238000011144 upstream manufacturing Methods 0.000 description 2
- 230000008016 vaporization Effects 0.000 description 2
- UGFAIRIUMAVXCW-UHFFFAOYSA-N Carbon monoxide Chemical compound [O+]#[C-] UGFAIRIUMAVXCW-UHFFFAOYSA-N 0.000 description 1
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- NRTOMJZYCJJWKI-UHFFFAOYSA-N Titanium nitride Chemical compound [Ti]#N NRTOMJZYCJJWKI-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 229910052756 noble gas Inorganic materials 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 238000000638 solvent extraction Methods 0.000 description 1
- 230000008022 sublimation Effects 0.000 description 1
- 238000000859 sublimation Methods 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- MZLGASXMSKOWSE-UHFFFAOYSA-N tantalum nitride Chemical compound [Ta]#N MZLGASXMSKOWSE-UHFFFAOYSA-N 0.000 description 1
- 238000009834 vaporization Methods 0.000 description 1
- 239000011364 vaporized material Substances 0.000 description 1
- 239000006200 vaporizer Substances 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
- C23C16/4481—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by evaporation using carrier gas in contact with the source material
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T137/00—Fluid handling
- Y10T137/8158—With indicator, register, recorder, alarm or inspection means
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T137/00—Fluid handling
- Y10T137/8376—Combined
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
- Electrodes Of Semiconductors (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007255059A JP2009084625A (ja) | 2007-09-28 | 2007-09-28 | 原料ガスの供給システム及び成膜装置 |
| JPJP-P-2007-255059 | 2007-09-28 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20100063694A true KR20100063694A (ko) | 2010-06-11 |
Family
ID=40511282
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020107000890A Ceased KR20100063694A (ko) | 2007-09-28 | 2008-09-22 | 원료 가스의 공급 시스템 및 성막 장치 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20100236480A1 (enExample) |
| JP (1) | JP2009084625A (enExample) |
| KR (1) | KR20100063694A (enExample) |
| CN (1) | CN101772590A (enExample) |
| TW (1) | TW200932943A (enExample) |
| WO (1) | WO2009041397A1 (enExample) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101412507B1 (ko) * | 2013-02-06 | 2014-06-26 | 공주대학교 산학협력단 | 유기금속화합물 가스 공급 장치 |
| KR20200010059A (ko) * | 2018-07-20 | 2020-01-30 | 도쿄엘렉트론가부시키가이샤 | 성막 장치, 원료 공급 장치 및 성막 방법 |
| KR20210153536A (ko) * | 2020-06-10 | 2021-12-17 | 도쿄엘렉트론가부시키가이샤 | 성막 장치 및 성막 방법 |
Families Citing this family (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5281148B2 (ja) * | 2009-04-03 | 2013-09-04 | 東京エレクトロン株式会社 | 蒸着ヘッドおよび成膜装置 |
| JP5659041B2 (ja) * | 2011-02-24 | 2015-01-28 | 東京エレクトロン株式会社 | 成膜方法および記憶媒体 |
| CN103415911B (zh) * | 2011-03-03 | 2016-08-17 | 松下知识产权经营株式会社 | 催化化学气相成膜装置、使用该装置的成膜方法和催化剂体的表面处理方法 |
| CN102312222A (zh) * | 2011-09-30 | 2012-01-11 | 上海宏力半导体制造有限公司 | 输气装置 |
| JP2013115208A (ja) * | 2011-11-28 | 2013-06-10 | Tokyo Electron Ltd | 気化原料供給装置、これを備える基板処理装置、及び気化原料供給方法 |
| JP5766647B2 (ja) * | 2012-03-28 | 2015-08-19 | 東京エレクトロン株式会社 | 熱処理システム、熱処理方法、及び、プログラム |
| US20130312663A1 (en) * | 2012-05-22 | 2013-11-28 | Applied Microstructures, Inc. | Vapor Delivery Apparatus |
| KR101214051B1 (ko) | 2012-08-24 | 2012-12-20 | 한국세라믹기술원 | 전계방출용 cnt-금속 혼합막 제조 방법 및 에어로졸 증착장치 |
| JP5837869B2 (ja) * | 2012-12-06 | 2015-12-24 | 株式会社フジキン | 原料気化供給装置 |
| JP2015160963A (ja) * | 2014-02-26 | 2015-09-07 | 東京エレクトロン株式会社 | ルテニウム膜の成膜方法および成膜装置、ならびに半導体装置の製造方法 |
| US9431238B2 (en) * | 2014-06-05 | 2016-08-30 | Asm Ip Holding B.V. | Reactive curing process for semiconductor substrates |
| JP6409021B2 (ja) * | 2016-05-20 | 2018-10-17 | 日本エア・リキード株式会社 | 昇華ガス供給システムおよび昇華ガス供給方法 |
| KR102344996B1 (ko) * | 2017-08-18 | 2021-12-30 | 삼성전자주식회사 | 전구체 공급 유닛, 기판 처리 장치 및 그를 이용한 반도체 소자의 제조방법 |
| JP6425850B1 (ja) * | 2017-11-22 | 2018-11-21 | 日本エア・リキード株式会社 | 固体材料容器およびその固体材料容器に固体材料が充填されている固体材料製品 |
| JP7080115B2 (ja) * | 2018-06-28 | 2022-06-03 | 信越化学工業株式会社 | 成膜装置及び成膜方法 |
| JP6875336B2 (ja) * | 2018-08-27 | 2021-05-26 | 信越化学工業株式会社 | 成膜方法 |
| US11162174B2 (en) * | 2018-09-20 | 2021-11-02 | Taiwan Semiconductor Manufacturing Co, Ltd. | Liquid delivery and vaporization apparatus and method |
| JP6887688B2 (ja) * | 2019-02-07 | 2021-06-16 | 株式会社高純度化学研究所 | 蒸発原料用容器、及びその蒸発原料用容器を用いた固体気化供給システム |
| JP6901153B2 (ja) * | 2019-02-07 | 2021-07-14 | 株式会社高純度化学研究所 | 薄膜形成用金属ハロゲン化合物の固体気化供給システム。 |
| JP7691439B2 (ja) * | 2020-04-30 | 2025-06-11 | ラム リサーチ コーポレーション | 化学物質送達システム用のヒーター設計ソリューション |
| JP2022002246A (ja) * | 2020-06-19 | 2022-01-06 | 東京エレクトロン株式会社 | 成膜方法およびプラズマ処理装置 |
| KR20230129187A (ko) * | 2021-01-15 | 2023-09-06 | 어플라이드 머티어리얼스, 인코포레이티드 | 액화된 재료를 제공하기 위한 장치, 액화된 재료를투입하기 위한 투입 시스템 및 방법 |
| WO2022269659A1 (ja) * | 2021-06-21 | 2022-12-29 | 株式会社日立ハイテク | プラズマ処理装置 |
| TWI877569B (zh) * | 2022-04-28 | 2025-03-21 | 日商國際電氣股份有限公司 | 氣體供給系統,基板處理裝置及半導體裝置的製造方法 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09298171A (ja) * | 1996-05-08 | 1997-11-18 | Tokyo Electron Ltd | 処理ガスの供給方法及びその装置 |
| JPH11125344A (ja) * | 1997-10-20 | 1999-05-11 | Ebara Corp | 弁装置 |
| US6039809A (en) * | 1998-01-27 | 2000-03-21 | Mitsubishi Materials Silicon Corporation | Method and apparatus for feeding a gas for epitaxial growth |
| JP2000226667A (ja) * | 1998-11-30 | 2000-08-15 | Anelva Corp | Cvd装置 |
| US6331483B1 (en) * | 1998-12-18 | 2001-12-18 | Tokyo Electron Limited | Method of film-forming of tungsten |
| KR100767762B1 (ko) * | 2000-01-18 | 2007-10-17 | 에이에스엠 저펜 가부시기가이샤 | 자가 세정을 위한 원격 플라즈마 소스를 구비한 cvd 반도체 공정장치 |
| WO2004007797A1 (ja) * | 2002-07-10 | 2004-01-22 | Tokyo Electron Limited | 成膜装置 |
| WO2004111297A1 (ja) * | 2003-06-10 | 2004-12-23 | Tokyo Electron Limited | 処理ガス供給機構、成膜装置および成膜方法 |
| WO2005060602A2 (en) * | 2003-12-12 | 2005-07-07 | Semequip, Inc. | Controlling the flow of vapors sublimated from solids |
| JP2005307233A (ja) * | 2004-04-19 | 2005-11-04 | Tokyo Electron Ltd | 成膜装置及び成膜方法及びプロセスガスの供給方法 |
| JP4502189B2 (ja) * | 2004-06-02 | 2010-07-14 | ルネサスエレクトロニクス株式会社 | 薄膜の形成方法および半導体装置の製造方法 |
| US7651570B2 (en) * | 2005-03-31 | 2010-01-26 | Tokyo Electron Limited | Solid precursor vaporization system for use in chemical vapor deposition |
-
2007
- 2007-09-28 JP JP2007255059A patent/JP2009084625A/ja active Pending
-
2008
- 2008-09-22 KR KR1020107000890A patent/KR20100063694A/ko not_active Ceased
- 2008-09-22 CN CN200880100433A patent/CN101772590A/zh active Pending
- 2008-09-22 WO PCT/JP2008/067118 patent/WO2009041397A1/ja not_active Ceased
- 2008-09-22 US US12/680,041 patent/US20100236480A1/en not_active Abandoned
- 2008-09-26 TW TW97137043A patent/TW200932943A/zh unknown
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101412507B1 (ko) * | 2013-02-06 | 2014-06-26 | 공주대학교 산학협력단 | 유기금속화합물 가스 공급 장치 |
| KR20200010059A (ko) * | 2018-07-20 | 2020-01-30 | 도쿄엘렉트론가부시키가이샤 | 성막 장치, 원료 공급 장치 및 성막 방법 |
| US11753720B2 (en) | 2018-07-20 | 2023-09-12 | Tokyo Electron Limited | Film forming apparatus, source supply apparatus, and film forming method |
| KR20210153536A (ko) * | 2020-06-10 | 2021-12-17 | 도쿄엘렉트론가부시키가이샤 | 성막 장치 및 성막 방법 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2009084625A (ja) | 2009-04-23 |
| CN101772590A (zh) | 2010-07-07 |
| US20100236480A1 (en) | 2010-09-23 |
| WO2009041397A1 (ja) | 2009-04-02 |
| TW200932943A (en) | 2009-08-01 |
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Patent event date: 20100114 Patent event code: PA01051R01D Comment text: International Patent Application |
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