KR100872621B1 - 섬광의 정량적 평가방법 - Google Patents
섬광의 정량적 평가방법 Download PDFInfo
- Publication number
- KR100872621B1 KR100872621B1 KR20000007497A KR20000007497A KR100872621B1 KR 100872621 B1 KR100872621 B1 KR 100872621B1 KR 20000007497 A KR20000007497 A KR 20000007497A KR 20000007497 A KR20000007497 A KR 20000007497A KR 100872621 B1 KR100872621 B1 KR 100872621B1
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- South Korea
- Prior art keywords
- glare
- value
- flash
- luminance
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/59—Transmissivity
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/57—Measuring gloss
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
- G02B1/10—Optical coatings produced by application to, or surface treatment of, optical elements
- G02B1/11—Anti-reflection coatings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N2021/558—Measuring reflectivity and transmission
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N2021/9513—Liquid crystal panels
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Optics & Photonics (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Optical Elements Other Than Lenses (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
Claims (13)
- 백색광원으로부터의 빛을 매트릭스필터를 통하여 대상물 표면으로 입사시키고, 대상물로부터의 반사광 또는 투과광을 촬영하여 데이터로서 받아들이고, 받아들인 빛의 휘도(輝度)분포의 화상처리를 행하여 휘도분포의 분산의 표준편차를 구하고, 구한 표준편차치를 대상물 표면의 섬광치로 하는 것을 특징으로 하는 섬광의 정량적 평가방법.
- 제1항에 있어서, 상기 대상물이 방현성 필름인 것을 특징으로 하는 정량적 평가방법.
- 제1항 또는 제2항에 있어서, 섬광치가 소정치 이하인지 아닌지에 따라 대상물의 성능을 평가하는 것을 특징으로 하는 정량적 평가방법.
- 제3항에 있어서, 저장화상의 평균휘도 145cd/㎡에서 측정하였을 때, 상기 섬광치의 소정치가 15인 것을 특징으로 하는 정량적 평가방법.
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Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4105199 | 1999-02-19 | ||
JP?11-41051 | 1999-02-19 | ||
JP2000017345A JP4484177B2 (ja) | 1999-02-19 | 2000-01-26 | 面ぎらの定量的評価方法及び防眩性フィルムの製造方法 |
JP?12-17345 | 2000-01-26 |
Related Child Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020060055158A Division KR20060079787A (ko) | 1999-02-19 | 2006-06-20 | 방현성 필름의 제조 방법 |
KR1020070015749A Division KR20070023809A (ko) | 1999-02-19 | 2007-02-15 | 방현성 필름 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20000058081A KR20000058081A (ko) | 2000-09-25 |
KR100872621B1 true KR100872621B1 (ko) | 2008-12-09 |
Family
ID=26380577
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR20000007497A KR100872621B1 (ko) | 1999-02-19 | 2000-02-17 | 섬광의 정량적 평가방법 |
KR1020060055158A KR20060079787A (ko) | 1999-02-19 | 2006-06-20 | 방현성 필름의 제조 방법 |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020060055158A KR20060079787A (ko) | 1999-02-19 | 2006-06-20 | 방현성 필름의 제조 방법 |
Country Status (4)
Country | Link |
---|---|
US (3) | US6577756B1 (ko) |
JP (1) | JP4484177B2 (ko) |
KR (2) | KR100872621B1 (ko) |
TW (1) | TW438965B (ko) |
Cited By (2)
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---|---|---|---|---|
US9411180B2 (en) | 2011-02-28 | 2016-08-09 | Corning Incorporated | Apparatus and method for determining sparkle |
US9588263B2 (en) | 2012-08-17 | 2017-03-07 | Corning Incorporated | Display element having buried scattering anti-glare layer |
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WO2000016040A1 (de) * | 1998-09-14 | 2000-03-23 | Betriebsforschungsinstitut Vdeh Institut Für Angewandte Forschung Gmbh | Messsystem für die oberflächengeometrie und planheit von flachprodukten |
JP4484177B2 (ja) * | 1999-02-19 | 2010-06-16 | 大日本印刷株式会社 | 面ぎらの定量的評価方法及び防眩性フィルムの製造方法 |
JP4592972B2 (ja) * | 2001-02-08 | 2010-12-08 | 大日本印刷株式会社 | 光拡散フィルム、光拡散フィルムを用いた面光源装置及び表示装置 |
ATE492786T1 (de) * | 2003-09-16 | 2011-01-15 | Paper Australia Pty Ltd | Blattoberflächen-analysator und verfahren zum analysieren einer blattoberfläche |
US7339664B2 (en) * | 2004-09-29 | 2008-03-04 | General Electric Company | System and method for inspecting a light-management film and method of making the light-management film |
JP2006234502A (ja) * | 2005-02-23 | 2006-09-07 | Fuji Photo Film Co Ltd | 防眩性フィルム評価支援装置 |
WO2006106757A1 (ja) * | 2005-03-30 | 2006-10-12 | Dai Nippon Printing Co., Ltd. | 防眩性光学積層体 |
US7803449B2 (en) | 2005-08-02 | 2010-09-28 | Fujifilm Corporation | Optical film and process for production the same, antireflection film and process for production the same, polarizing plate including the film, liquid crystal display device including the polarizing plate, and liquid crystal display device |
JP4581927B2 (ja) * | 2005-09-07 | 2010-11-17 | セイコーエプソン株式会社 | 表示装置のぎらつき測定方法およびぎらつき測定装置 |
KR100780948B1 (ko) * | 2006-02-28 | 2007-12-03 | 삼성전자주식회사 | 색 잡음을 제거하는 영상 신호 처리 장치 |
ES2318994B1 (es) * | 2006-10-09 | 2010-02-03 | Construcciones Mecanicas Jose Lazpiur S.A. | Equipo de control dimensional. |
JP2008170378A (ja) * | 2007-01-15 | 2008-07-24 | Seiko Epson Corp | シンチレーション評価方法およびシンチレーション評価装置 |
JP2010519516A (ja) * | 2007-02-16 | 2010-06-03 | スリーエム イノベイティブ プロパティズ カンパニー | 自動検査用にフィルムを照明するための方法及び装置 |
JP5167095B2 (ja) * | 2007-12-28 | 2013-03-21 | 三洋電機株式会社 | 照明装置及び投写型映像表示装置 |
JP5948763B2 (ja) | 2011-08-29 | 2016-07-06 | 大日本印刷株式会社 | 防眩性フィルム、偏光板及び画像表示装置 |
JP5867649B2 (ja) | 2013-02-19 | 2016-02-24 | 旭硝子株式会社 | 光学装置 |
US8736685B1 (en) * | 2013-12-11 | 2014-05-27 | Anritsu Company | Systems and methods for measuring brightness response of a camera operating in automatic exposure mode |
CN106461502B (zh) * | 2014-05-14 | 2020-01-24 | Agc株式会社 | 评价透明基体的光学特性的方法及透明基体 |
JP6471435B2 (ja) * | 2014-09-11 | 2019-02-20 | 大日本印刷株式会社 | ギラツキ定量的評価方法 |
JP6706088B2 (ja) * | 2015-03-02 | 2020-06-03 | 株式会社きもと | 表示装置、それに用いられる保護フィルム、表示装置の作製方法、および保護フィルムを使用する方法 |
JP6938943B2 (ja) * | 2017-02-17 | 2021-09-22 | 日本電気硝子株式会社 | 透明物品の評価方法 |
CN109115783A (zh) * | 2018-06-26 | 2019-01-01 | 南京理工大学 | 一种闪点强弱测量装置及方法 |
CN109633489B (zh) * | 2018-12-21 | 2021-06-04 | 常州工学院 | Led蓝光危害亮度测试和蓝光泄漏预测的方法及其装置 |
KR102614845B1 (ko) * | 2019-04-05 | 2023-12-15 | 제이에프이 스틸 가부시키가이샤 | 분율 측정 방법 및 장치 |
JP7432134B2 (ja) * | 2019-04-22 | 2024-02-16 | 大日本印刷株式会社 | 光学測定装置および光学測定方法 |
JP7413907B2 (ja) * | 2020-04-20 | 2024-01-16 | 大日本印刷株式会社 | 光学測定装置および光学測定方法 |
CN114061907A (zh) * | 2020-07-29 | 2022-02-18 | 合肥维信诺科技有限公司 | 光晕量化系统及方法 |
US20240027357A1 (en) | 2020-10-02 | 2024-01-25 | Dai Nippon Printing Co., Ltd. | Sparkle contrast correcting method, comparing method, comparing apparatus, electronic display manufacturing method, and anti-glare layer manufacturing method |
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JP2007000953A (ja) * | 2005-06-22 | 2007-01-11 | Canon Chemicals Inc | ゴムロールの製造方法およびゴムロール |
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2000
- 2000-01-26 JP JP2000017345A patent/JP4484177B2/ja not_active Expired - Lifetime
- 2000-02-17 KR KR20000007497A patent/KR100872621B1/ko active IP Right Grant
- 2000-02-18 TW TW89102794A patent/TW438965B/zh not_active IP Right Cessation
- 2000-02-22 US US09/510,506 patent/US6577756B1/en not_active Expired - Lifetime
-
2003
- 2003-03-27 US US10/397,737 patent/US6697515B2/en not_active Expired - Lifetime
- 2003-12-22 US US10/740,446 patent/US7079676B2/en not_active Expired - Lifetime
-
2006
- 2006-06-20 KR KR1020060055158A patent/KR20060079787A/ko not_active Application Discontinuation
Patent Citations (4)
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EP0726456A1 (en) * | 1993-10-26 | 1996-08-14 | Asahi Kasei Kogyo Kabushiki Kaisha | Method of and apparatus for measuring nonuniformity of glossiness and thickness of printed image |
KR950031498A (ko) * | 1994-02-15 | 1995-12-18 | 기타지아 요시토시 | 광학 기능성 재료 및 그의 제조 방법 |
KR19990009051A (ko) * | 1997-07-07 | 1999-02-05 | 차근식 | 많은 수의 시료를 동시에 정량분석할 수 있는 광센서 측정장치 및 방법 |
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Non-Patent Citations (1)
Title |
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한국공개특허1995-31498호 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9411180B2 (en) | 2011-02-28 | 2016-08-09 | Corning Incorporated | Apparatus and method for determining sparkle |
US9588263B2 (en) | 2012-08-17 | 2017-03-07 | Corning Incorporated | Display element having buried scattering anti-glare layer |
Also Published As
Publication number | Publication date |
---|---|
US20030185429A1 (en) | 2003-10-02 |
TW438965B (en) | 2001-06-07 |
US7079676B2 (en) | 2006-07-18 |
US20040131245A1 (en) | 2004-07-08 |
KR20000058081A (ko) | 2000-09-25 |
US6577756B1 (en) | 2003-06-10 |
US6697515B2 (en) | 2004-02-24 |
KR20060079787A (ko) | 2006-07-06 |
JP2000304648A (ja) | 2000-11-02 |
JP4484177B2 (ja) | 2010-06-16 |
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