KR100404159B1 - 반도체장치 - Google Patents

반도체장치 Download PDF

Info

Publication number
KR100404159B1
KR100404159B1 KR10-1998-0035871A KR19980035871A KR100404159B1 KR 100404159 B1 KR100404159 B1 KR 100404159B1 KR 19980035871 A KR19980035871 A KR 19980035871A KR 100404159 B1 KR100404159 B1 KR 100404159B1
Authority
KR
South Korea
Prior art keywords
substrate
semiconductor element
wiring
conductive
ground potential
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR10-1998-0035871A
Other languages
English (en)
Korean (ko)
Other versions
KR19990029419A (ko
Inventor
마꼬또 데루이
Original Assignee
오끼 덴끼 고오교 가부시끼가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 오끼 덴끼 고오교 가부시끼가이샤 filed Critical 오끼 덴끼 고오교 가부시끼가이샤
Publication of KR19990029419A publication Critical patent/KR19990029419A/ko
Application granted granted Critical
Publication of KR100404159B1 publication Critical patent/KR100404159B1/ko
Assigned to 라피스 세미컨덕터 가부시키가이샤 reassignment 라피스 세미컨덕터 가부시키가이샤 권리의 전부이전등록 Assignors: 오끼 덴끼 고오교 가부시끼가이샤
Assigned to 에이치피엘피 테크놀로지스 인크. reassignment 에이치피엘피 테크놀로지스 인크. 권리의 전부이전등록 Assignors: 라피스 세미컨덕터 가부시키가이샤
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W42/00Arrangements for protection of devices
    • H10W42/20Arrangements for protection of devices protecting against electromagnetic or particle radiation, e.g. light, X-rays, gamma-rays or electrons
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/62Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
    • H10W70/63Vias, e.g. via plugs
    • H10W70/635Through-vias
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/62Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
    • H10W70/65Shapes or dispositions of interconnections
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/62Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
    • H10W70/65Shapes or dispositions of interconnections
    • H10W70/654Top-view layouts
    • H10W70/655Fan-out layouts
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/851Dispositions of multiple connectors or interconnections
    • H10W72/874On different surfaces
    • H10W72/877Bump connectors and die-attach connectors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/90Bond pads, in general
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/90Bond pads, in general
    • H10W72/941Dispositions of bond pads
    • H10W72/9415Dispositions of bond pads relative to the surface, e.g. recessed, protruding
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • H10W74/10Encapsulations, e.g. protective coatings characterised by their shape or disposition
    • H10W74/15Encapsulations, e.g. protective coatings characterised by their shape or disposition on active surfaces of flip-chip devices, e.g. underfills
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/721Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
    • H10W90/724Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/731Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
    • H10W90/734Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/731Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
    • H10W90/736Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked lead frame, conducting package substrate or heat sink

Landscapes

  • Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Lead Frames For Integrated Circuits (AREA)
KR10-1998-0035871A 1997-09-02 1998-09-01 반도체장치 Expired - Fee Related KR100404159B1 (ko)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP97-236854 1997-09-02
JP23685497 1997-09-02
JP98-170071 1998-06-17
JP17007198A JP3834426B2 (ja) 1997-09-02 1998-06-17 半導体装置

Publications (2)

Publication Number Publication Date
KR19990029419A KR19990029419A (ko) 1999-04-26
KR100404159B1 true KR100404159B1 (ko) 2004-02-05

Family

ID=26493189

Family Applications (1)

Application Number Title Priority Date Filing Date
KR10-1998-0035871A Expired - Fee Related KR100404159B1 (ko) 1997-09-02 1998-09-01 반도체장치

Country Status (3)

Country Link
US (2) US6225694B1 (https=)
JP (1) JP3834426B2 (https=)
KR (1) KR100404159B1 (https=)

Families Citing this family (150)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6117797A (en) * 1998-09-03 2000-09-12 Micron Technology, Inc. Attachment method for heat sinks and devices involving removal of misplaced encapsulant
US6965165B2 (en) * 1998-12-21 2005-11-15 Mou-Shiung Lin Top layers of metal for high performance IC's
US6711812B1 (en) * 1999-04-13 2004-03-30 Unicap Electronics Industrial Corporation Method of making metal core substrate printed circuit wiring board enabling thermally enhanced ball grid array (BGA) packages
JP2001053178A (ja) * 1999-06-02 2001-02-23 Japan Radio Co Ltd 電子回路装置が封止され回路基板に実装される電子部品及びその製造方法
JP2001127211A (ja) * 1999-10-26 2001-05-11 Nec Corp 電磁波ノイズの遮蔽部を備える半導体集積回路と該半導体集積回路の実装構造
JP3467454B2 (ja) * 2000-06-05 2003-11-17 Necエレクトロニクス株式会社 半導体装置の製造方法
JP3407025B2 (ja) 2000-06-08 2003-05-19 Necエレクトロニクス株式会社 半導体装置及びその製造方法
KR100600169B1 (ko) * 2000-07-18 2006-07-12 앰코 테크놀로지 코리아 주식회사 반도체패키지
GB2365007B (en) * 2000-07-21 2002-06-26 Murata Manufacturing Co Insulative ceramic compact
KR100645755B1 (ko) * 2000-11-07 2006-11-13 앰코 테크놀로지 코리아 주식회사 반도체 패키지 및 그 제조방법
US6518678B2 (en) * 2000-12-29 2003-02-11 Micron Technology, Inc. Apparatus and method for reducing interposer compression during molding process
KR100411206B1 (ko) * 2001-02-19 2003-12-18 삼성전자주식회사 반도체 패키지
US6686649B1 (en) * 2001-05-14 2004-02-03 Amkor Technology, Inc. Multi-chip semiconductor package with integral shield and antenna
US6844236B2 (en) * 2001-07-23 2005-01-18 Agere Systems Inc. Method and structure for DC and RF shielding of integrated circuits
US6856007B2 (en) * 2001-08-28 2005-02-15 Tessera, Inc. High-frequency chip packages
DE10142971A1 (de) * 2001-09-01 2003-03-27 Eupec Gmbh & Co Kg Leistungshalbleitermodul
DE10148120B4 (de) * 2001-09-28 2007-02-01 Infineon Technologies Ag Elektronische Bauteile mit Halbleiterchips und ein Systemträger mit Bauteilpositionen sowie Verfahren zur Herstellung eines Systemträgers
US6800944B2 (en) * 2001-12-19 2004-10-05 Texas Instruments Incorporated Power/ground ring substrate for integrated circuits
US7535093B1 (en) * 2002-03-08 2009-05-19 Raytheon Company Method and apparatus for packaging circuit devices
US7026223B2 (en) * 2002-03-28 2006-04-11 M/A-Com, Inc Hermetic electric component package
JP3923368B2 (ja) * 2002-05-22 2007-05-30 シャープ株式会社 半導体素子の製造方法
US6952046B2 (en) 2002-06-19 2005-10-04 Foster-Miller, Inc. Electronic and optoelectronic component packaging technique
US20040061213A1 (en) * 2002-09-17 2004-04-01 Chippac, Inc. Semiconductor multi-package module having package stacked over die-up flip chip ball grid array package and having wire bond interconnect between stacked packages
US7064426B2 (en) * 2002-09-17 2006-06-20 Chippac, Inc. Semiconductor multi-package module having wire bond interconnect between stacked packages
US6972481B2 (en) * 2002-09-17 2005-12-06 Chippac, Inc. Semiconductor multi-package module including stacked-die package and having wire bond interconnect between stacked packages
US6838761B2 (en) * 2002-09-17 2005-01-04 Chippac, Inc. Semiconductor multi-package module having wire bond interconnect between stacked packages and having electrical shield
US7205647B2 (en) * 2002-09-17 2007-04-17 Chippac, Inc. Semiconductor multi-package module having package stacked over ball grid array package and having wire bond interconnect between stacked packages
US7053476B2 (en) * 2002-09-17 2006-05-30 Chippac, Inc. Semiconductor multi-package module having package stacked over die-down flip chip ball grid array package and having wire bond interconnect between stacked packages
US7034387B2 (en) 2003-04-04 2006-04-25 Chippac, Inc. Semiconductor multipackage module including processor and memory package assemblies
US7045887B2 (en) * 2002-10-08 2006-05-16 Chippac, Inc. Semiconductor multi-package module having inverted second package stacked over die-up flip-chip ball grid array (BGA) package
CA2409912C (en) 2002-10-25 2008-04-01 Ibm Canada Limited-Ibm Canada Limitee Improvements in grounding and thermal dissipation for integrated circuit packages
JP3908148B2 (ja) * 2002-10-28 2007-04-25 シャープ株式会社 積層型半導体装置
US20040150097A1 (en) * 2003-01-30 2004-08-05 International Business Machines Corporation Optimized conductive lid mounting for integrated circuit chip carriers
US7754537B2 (en) * 2003-02-25 2010-07-13 Tessera, Inc. Manufacture of mountable capped chips
US7489914B2 (en) * 2003-03-28 2009-02-10 Georgia Tech Research Corporation Multi-band RF transceiver with passive reuse in organic substrates
US6747350B1 (en) * 2003-06-06 2004-06-08 Silicon Integrated Systems Corp. Flip chip package structure
TWI236118B (en) * 2003-06-18 2005-07-11 Advanced Semiconductor Eng Package structure with a heat spreader and manufacturing method thereof
JP2007528120A (ja) 2003-07-03 2007-10-04 テッセラ テクノロジーズ ハンガリー コルラートルト フェレロェセーギュー タールシャシャーグ 集積回路装置をパッケージングする方法及び装置
US7144640B2 (en) * 2003-08-01 2006-12-05 Agency For Science, Technology And Research Tilted media for hard disk drives and magnetic data storage devices
US7012326B1 (en) 2003-08-25 2006-03-14 Xilinx, Inc. Lid and method of employing a lid on an integrated circuit
US20050095835A1 (en) * 2003-09-26 2005-05-05 Tessera, Inc. Structure and method of making capped chips having vertical interconnects
US6982481B1 (en) * 2003-10-08 2006-01-03 Nortel Networks Limited System for dissipating heat and shielding electromagnetic radiation produced by an electronic device
US8970049B2 (en) * 2003-12-17 2015-03-03 Chippac, Inc. Multiple chip package module having inverted package stacked over die
DE102004012818B3 (de) 2004-03-16 2005-10-27 Infineon Technologies Ag Verfahren zum Herstellen eines Leistungshalbleiterbauelements
US20050269692A1 (en) * 2004-05-24 2005-12-08 Chippac, Inc Stacked semiconductor package having adhesive/spacer structure and insulation
US8552551B2 (en) 2004-05-24 2013-10-08 Chippac, Inc. Adhesive/spacer island structure for stacking over wire bonded die
US20050258527A1 (en) * 2004-05-24 2005-11-24 Chippac, Inc. Adhesive/spacer island structure for multiple die package
US7253511B2 (en) * 2004-07-13 2007-08-07 Chippac, Inc. Semiconductor multipackage module including die and inverted land grid array package stacked over ball grid array package
DE102004036909B4 (de) * 2004-07-29 2007-04-05 Infineon Technologies Ag Halbleiterbasisbauteil mit Verdrahtungssubstrat und Zwischenverdrahtungsplatte für einen Halbleiterbauteilstapel sowie Verfahren zu deren Herstellung
JP4593616B2 (ja) * 2005-01-25 2010-12-08 富士通株式会社 半導体装置
JP4555119B2 (ja) * 2005-02-22 2010-09-29 アルプス電気株式会社 面実装型電子回路ユニット
US8143095B2 (en) 2005-03-22 2012-03-27 Tessera, Inc. Sequential fabrication of vertical conductive interconnects in capped chips
US7364945B2 (en) * 2005-03-31 2008-04-29 Stats Chippac Ltd. Method of mounting an integrated circuit package in an encapsulant cavity
KR101213661B1 (ko) * 2005-03-31 2012-12-17 스태츠 칩팩, 엘티디. 칩 스케일 패키지 및 제 2 기판을 포함하고 있으며 상부면및 하부면에서 노출된 기판 표면들을 갖는 반도체 어셈블리
US7372141B2 (en) * 2005-03-31 2008-05-13 Stats Chippac Ltd. Semiconductor stacked package assembly having exposed substrate surfaces on upper and lower sides
US7354800B2 (en) 2005-04-29 2008-04-08 Stats Chippac Ltd. Method of fabricating a stacked integrated circuit package system
US7429786B2 (en) * 2005-04-29 2008-09-30 Stats Chippac Ltd. Semiconductor package including second substrate and having exposed substrate surfaces on upper and lower sides
US7582960B2 (en) * 2005-05-05 2009-09-01 Stats Chippac Ltd. Multiple chip package module including die stacked over encapsulated package
US7394148B2 (en) * 2005-06-20 2008-07-01 Stats Chippac Ltd. Module having stacked chip scale semiconductor packages
US7388284B1 (en) * 2005-10-14 2008-06-17 Xilinx, Inc. Integrated circuit package and method of attaching a lid to a substrate of an integrated circuit
JP4860994B2 (ja) * 2005-12-06 2012-01-25 ルネサスエレクトロニクス株式会社 半導体装置
KR100868593B1 (ko) * 2005-12-06 2008-11-13 야마하 가부시키가이샤 반도체 장치 및 그 제조 방법과 반도체 장치에 사용되는 덮개 부재와 반도체 장치를 제조하기 위한 반도체 유닛
US7768125B2 (en) 2006-01-04 2010-08-03 Stats Chippac Ltd. Multi-chip package system
US7456088B2 (en) 2006-01-04 2008-11-25 Stats Chippac Ltd. Integrated circuit package system including stacked die
US7936062B2 (en) 2006-01-23 2011-05-03 Tessera Technologies Ireland Limited Wafer level chip packaging
US7750482B2 (en) 2006-02-09 2010-07-06 Stats Chippac Ltd. Integrated circuit package system including zero fillet resin
JP4703424B2 (ja) * 2006-02-10 2011-06-15 大日本印刷株式会社 複合センサーパッケージ
US8704349B2 (en) 2006-02-14 2014-04-22 Stats Chippac Ltd. Integrated circuit package system with exposed interconnects
JP2007227778A (ja) * 2006-02-24 2007-09-06 Alps Electric Co Ltd 面実装型電子回路モジュール
US20080002460A1 (en) * 2006-03-01 2008-01-03 Tessera, Inc. Structure and method of making lidded chips
US20080128890A1 (en) * 2006-11-30 2008-06-05 Advanced Semiconductor Engineering, Inc. Chip package and fabricating process thereof
US8604605B2 (en) 2007-01-05 2013-12-10 Invensas Corp. Microelectronic assembly with multi-layer support structure
WO2008103752A1 (en) * 2007-02-21 2008-08-28 Rambus Inc. High-speed memory package
US20080266806A1 (en) * 2007-04-27 2008-10-30 Lakin Eric D Electronic assembly that includes a heat sink which cools multiple electronic components
US20080266807A1 (en) * 2007-04-27 2008-10-30 Cray Inc. Electronic assembly with emi shielding heat sink
US20080272468A1 (en) * 2007-05-02 2008-11-06 Farshad Ghaghahi Grounded shield for blocking electromagnetic interference in an integrated circuit package
JP2009010118A (ja) * 2007-06-27 2009-01-15 Elpida Memory Inc 半導体パッケージ
CN100555628C (zh) * 2007-10-30 2009-10-28 日月光半导体制造股份有限公司 具有电磁屏蔽功能的半导体封装结构
JP2009117767A (ja) * 2007-11-09 2009-05-28 Shinko Electric Ind Co Ltd 半導体装置の製造方法及びそれにより製造した半導体装置
US7989928B2 (en) 2008-02-05 2011-08-02 Advanced Semiconductor Engineering Inc. Semiconductor device packages with electromagnetic interference shielding
US8350367B2 (en) * 2008-02-05 2013-01-08 Advanced Semiconductor Engineering, Inc. Semiconductor device packages with electromagnetic interference shielding
US8022511B2 (en) * 2008-02-05 2011-09-20 Advanced Semiconductor Engineering, Inc. Semiconductor device packages with electromagnetic interference shielding
US8212339B2 (en) 2008-02-05 2012-07-03 Advanced Semiconductor Engineering, Inc. Semiconductor device packages with electromagnetic interference shielding
US7906857B1 (en) 2008-03-13 2011-03-15 Xilinx, Inc. Molded integrated circuit package and method of forming a molded integrated circuit package
US7709915B2 (en) * 2008-05-07 2010-05-04 Aptina Imaging Corporation Microelectronic devices having an EMI shield and associated systems and methods
US7906376B2 (en) * 2008-06-30 2011-03-15 Intel Corporation Magnetic particle-based composite materials for semiconductor packages
JP5277755B2 (ja) * 2008-07-01 2013-08-28 オムロン株式会社 電子部品
US8410584B2 (en) * 2008-08-08 2013-04-02 Advanced Semiconductor Engineering, Inc. Semiconductor device packages with electromagnetic interference shielding
US20100110656A1 (en) 2008-10-31 2010-05-06 Advanced Semiconductor Engineering, Inc. Chip package and manufacturing method thereof
JP5169800B2 (ja) * 2008-12-22 2013-03-27 株式会社デンソー 電子装置
WO2010087856A1 (en) * 2009-01-30 2010-08-05 Hewlett-Packard Development Company, L.P. Integrated-circuit attachment structure with solder balls and pins
US20100207257A1 (en) * 2009-02-17 2010-08-19 Advanced Semiconductor Engineering, Inc. Semiconductor package and manufacturing method thereof
US8110902B2 (en) * 2009-02-19 2012-02-07 Advanced Semiconductor Engineering, Inc. Chip package and manufacturing method thereof
US8916958B2 (en) * 2009-04-24 2014-12-23 Infineon Technologies Ag Semiconductor package with multiple chips and substrate in metal cap
JP5561460B2 (ja) 2009-06-03 2014-07-30 新光電気工業株式会社 配線基板および配線基板の製造方法
US20110001230A1 (en) * 2009-07-02 2011-01-06 Conexant Systems, Inc. Systems and Methods of Improved Heat Dissipation with Variable Pitch Grid Array Packaging
US8212340B2 (en) * 2009-07-13 2012-07-03 Advanced Semiconductor Engineering, Inc. Chip package and manufacturing method thereof
US8362609B1 (en) 2009-10-27 2013-01-29 Xilinx, Inc. Integrated circuit package and method of forming an integrated circuit package
US8378466B2 (en) 2009-11-19 2013-02-19 Advanced Semiconductor Engineering, Inc. Wafer-level semiconductor device packages with electromagnetic interference shielding
US8368185B2 (en) * 2009-11-19 2013-02-05 Advanced Semiconductor Engineering, Inc. Semiconductor device packages with electromagnetic interference shielding
US8030750B2 (en) * 2009-11-19 2011-10-04 Advanced Semiconductor Engineering, Inc. Semiconductor device packages with electromagnetic interference shielding
TWI497679B (zh) * 2009-11-27 2015-08-21 日月光半導體製造股份有限公司 半導體封裝件及其製造方法
CN102714195B (zh) * 2009-12-14 2015-05-06 松下电器产业株式会社 半导体装置
US9254532B2 (en) * 2009-12-30 2016-02-09 Intel Corporation Methods of fabricating low melting point solder reinforced sealant and structures formed thereby
US8569894B2 (en) 2010-01-13 2013-10-29 Advanced Semiconductor Engineering, Inc. Semiconductor package with single sided substrate design and manufacturing methods thereof
CN102576706B (zh) * 2010-03-16 2015-07-22 富士电机株式会社 半导体器件
TWI411075B (zh) 2010-03-22 2013-10-01 日月光半導體製造股份有限公司 半導體封裝件及其製造方法
CA2704683A1 (en) * 2010-05-28 2010-08-12 Ibm Canada Limited - Ibm Canada Limitee Grounded lid for micro-electronic assemblies
JP5572890B2 (ja) * 2010-06-08 2014-08-20 ミヨシ電子株式会社 半導体モジュールおよび半導体装置
JP2011258757A (ja) * 2010-06-09 2011-12-22 Toshiba Corp 半導体装置
US8810028B1 (en) 2010-06-30 2014-08-19 Xilinx, Inc. Integrated circuit packaging devices and methods
TWI540698B (zh) 2010-08-02 2016-07-01 日月光半導體製造股份有限公司 半導體封裝件與其製造方法
TWI421957B (zh) * 2010-08-04 2014-01-01 環旭電子股份有限公司 系統封裝模組的製造方法及其封裝結構
US9007273B2 (en) 2010-09-09 2015-04-14 Advances Semiconductor Engineering, Inc. Semiconductor package integrated with conformal shield and antenna
US20120074559A1 (en) * 2010-09-24 2012-03-29 International Business Machines Corporation Integrated circuit package using through substrate vias to ground lid
KR20120045893A (ko) * 2010-11-01 2012-05-09 삼성전기주식회사 반도체 패키지 모듈
US8941222B2 (en) 2010-11-11 2015-01-27 Advanced Semiconductor Engineering Inc. Wafer level semiconductor package and manufacturing methods thereof
US9406658B2 (en) 2010-12-17 2016-08-02 Advanced Semiconductor Engineering, Inc. Embedded component device and manufacturing methods thereof
TWI525782B (zh) * 2011-01-05 2016-03-11 矽品精密工業股份有限公司 半導體封裝件及其製法
JP5512566B2 (ja) * 2011-01-31 2014-06-04 株式会社東芝 半導体装置
KR101740878B1 (ko) * 2011-03-22 2017-05-26 르네사스 일렉트로닉스 가부시키가이샤 반도체 장치
US8748233B2 (en) 2011-06-21 2014-06-10 Stats Chippac Ltd. Integrated circuit packaging system with underfill and method of manufacture thereof
FR2977975A1 (fr) * 2011-07-13 2013-01-18 St Microelectronics Grenoble 2 Boitier electronique a via thermique et procede de fabrication
KR101829392B1 (ko) * 2011-08-23 2018-02-20 삼성전자주식회사 반도체 패키지 및 그 제조 방법
US9155188B2 (en) * 2011-11-04 2015-10-06 Apple Inc. Electromagnetic interference shielding techniques
US8541883B2 (en) 2011-11-29 2013-09-24 Advanced Semiconductor Engineering, Inc. Semiconductor device having shielded conductive vias
CN103219295B (zh) * 2012-01-20 2015-12-16 环旭电子股份有限公司 适形掩模封装结构及检测方法
JP5703245B2 (ja) 2012-02-28 2015-04-15 株式会社東芝 無線装置、それを備えた情報処理装置および記憶装置
US8937376B2 (en) 2012-04-16 2015-01-20 Advanced Semiconductor Engineering, Inc. Semiconductor packages with heat dissipation structures and related methods
US8786060B2 (en) 2012-05-04 2014-07-22 Advanced Semiconductor Engineering, Inc. Semiconductor package integrated with conformal shield and antenna
US8704341B2 (en) 2012-05-15 2014-04-22 Advanced Semiconductor Engineering, Inc. Semiconductor packages with thermal dissipation structures and EMI shielding
US8653634B2 (en) 2012-06-11 2014-02-18 Advanced Semiconductor Engineering, Inc. EMI-shielded semiconductor devices and methods of making
US9153542B2 (en) 2012-08-01 2015-10-06 Advanced Semiconductor Engineering, Inc. Semiconductor package having an antenna and manufacturing method thereof
JP5710558B2 (ja) 2012-08-24 2015-04-30 株式会社東芝 無線装置、それを備えた情報処理装置及び記憶装置
US9978688B2 (en) 2013-02-28 2018-05-22 Advanced Semiconductor Engineering, Inc. Semiconductor package having a waveguide antenna and manufacturing method thereof
US9837701B2 (en) 2013-03-04 2017-12-05 Advanced Semiconductor Engineering, Inc. Semiconductor package including antenna substrate and manufacturing method thereof
US9129954B2 (en) 2013-03-07 2015-09-08 Advanced Semiconductor Engineering, Inc. Semiconductor package including antenna layer and manufacturing method thereof
US9172131B2 (en) 2013-03-15 2015-10-27 Advanced Semiconductor Engineering, Inc. Semiconductor structure having aperture antenna
CN103400825B (zh) 2013-07-31 2016-05-18 日月光半导体制造股份有限公司 半导体封装件及其制造方法
JP6157998B2 (ja) * 2013-09-03 2017-07-05 ルネサスエレクトロニクス株式会社 半導体装置
US8912641B1 (en) * 2013-09-09 2014-12-16 Harris Corporation Low profile electronic package and associated methods
US9232686B2 (en) * 2014-03-27 2016-01-05 Intel Corporation Thin film based electromagnetic interference shielding with BBUL/coreless packages
KR102210332B1 (ko) 2014-09-05 2021-02-01 삼성전자주식회사 반도체 패키지
WO2016044042A1 (en) * 2014-09-16 2016-03-24 Fci Asia Pte. Ltd Hermetically sealed electrical connector assembly
US9666539B1 (en) * 2015-12-03 2017-05-30 International Business Machines Corporation Packaging for high speed chip to chip communication
WO2019092938A1 (ja) * 2017-11-13 2019-05-16 オリンパス株式会社 半導体基板、半導体基板積層体および内視鏡
US12381160B2 (en) 2020-03-19 2025-08-05 Intel Corporation Memory device package with noise shielding
US11616000B2 (en) * 2021-06-25 2023-03-28 Intel Corporation Methods and apparatus to provide electrical shielding for integrated circuit packages using a thermal interface material
US12575434B2 (en) * 2022-08-18 2026-03-10 Bridge Semiconductor Corp. Semiconductor assembly having dual conduction channels for electricity and heat passage
WO2024172068A1 (ja) * 2023-02-17 2024-08-22 京セラ株式会社 配線基板

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0653355A (ja) * 1992-07-30 1994-02-25 Kyocera Corp 電子部品収納用パッケージ
JPH06132424A (ja) * 1992-10-16 1994-05-13 Fuji Electric Co Ltd スイッチング半導体装置
JPH08222652A (ja) * 1995-02-16 1996-08-30 Hitachi Ltd 半導体装置及びその製造方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4410905A (en) * 1981-08-14 1983-10-18 Amp Incorporated Power, ground and decoupling structure for chip carriers
JPS63175450A (ja) * 1987-01-16 1988-07-19 Hitachi Ltd 気密封止型半導体装置
JPH01313969A (ja) * 1988-06-13 1989-12-19 Hitachi Ltd 半導体装置
US5490324A (en) * 1993-09-15 1996-02-13 Lsi Logic Corporation Method of making integrated circuit package having multiple bonding tiers
GB2288286A (en) * 1994-03-30 1995-10-11 Plessey Semiconductors Ltd Ball grid array arrangement
US5741729A (en) * 1994-07-11 1998-04-21 Sun Microsystems, Inc. Ball grid array package for an integrated circuit
JP2780649B2 (ja) * 1994-09-30 1998-07-30 日本電気株式会社 半導体装置
US5572070A (en) * 1995-02-06 1996-11-05 Rjr Polymers, Inc. Integrated circuit packages with heat dissipation for high current load
US5789810A (en) * 1995-12-21 1998-08-04 International Business Machines Corporation Semiconductor cap
US5898219A (en) * 1997-04-02 1999-04-27 Intel Corporation Custom corner attach heat sink design for a plastic ball grid array integrated circuit package

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0653355A (ja) * 1992-07-30 1994-02-25 Kyocera Corp 電子部品収納用パッケージ
JPH06132424A (ja) * 1992-10-16 1994-05-13 Fuji Electric Co Ltd スイッチング半導体装置
JPH08222652A (ja) * 1995-02-16 1996-08-30 Hitachi Ltd 半導体装置及びその製造方法

Also Published As

Publication number Publication date
JPH11145333A (ja) 1999-05-28
US20010008301A1 (en) 2001-07-19
US6225694B1 (en) 2001-05-01
JP3834426B2 (ja) 2006-10-18
US6538319B2 (en) 2003-03-25
KR19990029419A (ko) 1999-04-26

Similar Documents

Publication Publication Date Title
KR100404159B1 (ko) 반도체장치
JP2565300B2 (ja) 半導体装置
US6084295A (en) Semiconductor device and circuit board used therein
US5866942A (en) Metal base package for a semiconductor device
US6184133B1 (en) Method of forming an assembly board with insulator filled through holes
US5972734A (en) Interposer for ball grid array (BGA) package
US5825628A (en) Electronic package with enhanced pad design
US9171791B2 (en) Semiconductor device
US20040183187A1 (en) Semiconductor device, semiconductor device substrate, and manufacturing method thereof that can increase reliability in mounting a semiconductor element
KR20100021899A (ko) 테이프 배선 기판, 칩-온-필름 패키지 및 장치 어셈블리
US6201298B1 (en) Semiconductor device using wiring tape
KR20000011282A (ko) 반도체장치및그제조방법
KR20140083084A (ko) 전자파 차폐층을 갖는 반도체 패키지 및 그 제조방법
JP4190111B2 (ja) 高周波モジュール
JP2001044305A (ja) 半導体装置
US20020195721A1 (en) Cavity down ball grid array packaging structure
JP3090115B2 (ja) 半導体装置およびその製造方法
JP3065288B2 (ja) 半導体ベアチップの封止方法、半導体集積回路装置、および半導体集積回路装置の製造方法
KR100337455B1 (ko) 반도체패키지
JP3149836B2 (ja) 半導体装置
JP3033541B2 (ja) Tabテープ、半導体装置及び半導体装置の製造方法
JP3508739B2 (ja) インターポーザ基板
JP2002198467A (ja) 半導体装置
JP3147165B2 (ja) 回路装置、その製造方法
TWI571990B (zh) 半導體封裝

Legal Events

Date Code Title Description
PA0109 Patent application

St.27 status event code: A-0-1-A10-A12-nap-PA0109

R17-X000 Change to representative recorded

St.27 status event code: A-3-3-R10-R17-oth-X000

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

A201 Request for examination
P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

R17-X000 Change to representative recorded

St.27 status event code: A-3-3-R10-R17-oth-X000

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U11-oth-PR1002

Fee payment year number: 1

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 4

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 5

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 6

PN2301 Change of applicant

St.27 status event code: A-5-5-R10-R11-asn-PN2301

PN2301 Change of applicant

St.27 status event code: A-5-5-R10-R14-asn-PN2301

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 7

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 8

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 9

PN2301 Change of applicant

St.27 status event code: A-5-5-R10-R13-asn-PN2301

St.27 status event code: A-5-5-R10-R11-asn-PN2301

FPAY Annual fee payment

Payment date: 20121022

Year of fee payment: 10

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 10

FPAY Annual fee payment

Payment date: 20131001

Year of fee payment: 11

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 11

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

FPAY Annual fee payment

Payment date: 20141007

Year of fee payment: 12

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 12

PN2301 Change of applicant

St.27 status event code: A-5-5-R10-R11-asn-PN2301

PN2301 Change of applicant

St.27 status event code: A-5-5-R10-R14-asn-PN2301

R17-X000 Change to representative recorded

St.27 status event code: A-5-5-R10-R17-oth-X000

FPAY Annual fee payment

Payment date: 20150918

Year of fee payment: 13

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 13

FPAY Annual fee payment

Payment date: 20160921

Year of fee payment: 14

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 14

LAPS Lapse due to unpaid annual fee
PC1903 Unpaid annual fee

St.27 status event code: A-4-4-U10-U13-oth-PC1903

Not in force date: 20171023

Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

PC1903 Unpaid annual fee

St.27 status event code: N-4-6-H10-H13-oth-PC1903

Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

Not in force date: 20171023

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000