JPWO2015166723A1 - 透明導電性フィルム - Google Patents
透明導電性フィルム Download PDFInfo
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Abstract
Description
図1の実施形態では、透明導電性フィルム1は、透明基材2と、第2光学調整層3と、第1光学調整層4と、無機物層5と、透明導電層6とを備えているが、例えば、図2に示すように、透明導電性フィルム1は、透明基材2と、第1光学調整層4と、無機物層5と、透明導電層6とから構成することもできる。
(透明基材)
透明基材として、ポリエチレンテレフタレート(PET)フィルム(三菱樹脂社製、商品名「ダイアホイル」、厚み50μm)を用いた。
紫外線硬化型アクリル樹脂と、酸化ジルコニウム(ZnO2)粒子(平均粒径20nm)とからなる紫外線硬化型樹脂組成物(第2樹脂組成物)を、固形分濃度が5質量%になるようにメチルイソブチルケトン(MIBK)で希釈して、紫外線硬化型樹脂組成物の第2希釈液を調製した。次いで、第2希釈液を、PETフィルムの上面に塗布し、乾燥させて、紫外線硬化型樹脂組成物をフィルム状に形成した。次いで、紫外線硬化型樹脂組成物に紫外線を照射して硬化させた。これにより、厚み200nmの第2光学調整層をPETフィルムの上面に形成した。
熱硬化型エポキシ樹脂100質量部と熱硬化型樹脂用硬化剤(エポキシ樹脂用硬化剤)1質量部とからなる熱硬化性樹脂組成物(第1樹脂組成物)を、固形分濃度が0.8質量%となるように、メチルイソブチルケトン(MIBK)で熱硬化性樹脂組成物を希釈して、熱硬化性樹脂組成物の第1希釈液を調製した。次いで、第1希釈液を第1光学調整層の上面に塗布し、195℃で1分間、加熱乾燥および硬化させた。これにより、厚み25nmの第1光学調整層を第2光学調整層の上面に形成した。
上記で得られた光学調整層形成PETフィルムを真空スパッタ装置へ装着し、加熱した成膜ロールに密着および走行させながら巻き取った。フィルムを走行させながら、クライオコイルとターボ分子ポンプとを備えた排気システムにより、雰囲気の真空度を1×10−4Paとした。
真空を維持したまま、DCマグネトロンスパッタリング法により、脱ガス処理した光学調整層形成PETフィルムの第1光学調整層の上面に、無機物層としてSiO2層を形成した。スパッタリング法では、Siをターゲット材として用い、ArおよびO2(O2流量比30%)を導入した減圧雰囲気(0.2Pa)に設定し、水平磁場を100mTに調整した。形成されたSiO2層は、厚みが1nmであった。
真空を維持したまま、DCマグネトロンスパッタリング法により、上記で得られたフィルム(SiO2層/第1光学調整層/第2光学調整層/PETフィルム)のSiO2層の上面に、インジウムスズ複合酸化物(ITO)層を形成した。スパッタリング法では、酸化スズ濃度10質量%のITOをターゲット材として用い、ArおよびO2(O2流量比0.5%)を導入した減圧雰囲気(0.4Pa)に設定し、水平磁場を100mTに調整した。形成されたITO層は、非晶質であり、厚みが26nmであった。
次いで、上記で得られた非晶質ITO層が形成されたフィルムを、スパッタ装置内から取り出して、150℃のオーブン内で120分加熱処理した。これにより、透明導電層として結晶質ITO層(厚み26nm)が形成された実施例1の透明導電性フィルムを製造した(図1参照)。
無機物層(SiO2層)の厚みを2nmとした以外は、実施例1と同様にして透明導電性フィルムを製造した。
無機物層(SiO2層)の厚みを3nmとした以外は、実施例1と同様にして透明導電性フィルムを製造した。
無機物層(SiO2層)の厚みを4nmとした以外は、実施例1と同様にして透明導電性フィルムを製造した。
無機物層(SiO2層)の厚みを6nmとした以外は、実施例1と同様にして透明導電性フィルムを製造した。
無機物層(SiO2層)の厚みを9nmとした以外は、実施例1と同様にして透明導電性フィルムを製造した。
第2光学調整層を形成しなかった以外は、実施例3と同様にして透明導電性フィルムを製造した。
第1光学調整層の厚みを100nmとした以外は、実施例7と同様にして透明導電性フィルムを製造した。
無機物層を形成しなかった以外は、実施例1と同様にして透明導電性フィルムを製造した。
無機物層の厚みを、それぞれ、11nm、15nm、20nmとした以外は、実施例1と同様にして透明導電性フィルムを製造した。
第1光学調整層を以下に記載するように形成した以外は、比較例1と同様にして透明導電性フィルムを得た。
第1光学調整層を、上記比較例5に記載の第1光学調整層(厚み25nm、粒子含有光学調整層)とした以外は、実施例3と同様にして透明導電性フィルムを製造した。
DCマグネトロンスパッタリング法により、第2光学調整層として、厚み20nmのNb2O5層を形成し、第1光学調整層として、厚み25nmのAl2O3層を形成した以外は、実施例3と同様にして透明導電性フィルムを製造した。
透明導電性フィルムの断面を透過型電子顕微鏡(TEM)により測定することにより、無機物層、第1光学調整層および第2光学調整層の厚さを測定した。
第1光学調整層および第2光学調整層を形成した後に、それぞれ、アタゴ社製のアッベ屈折率計を用い、25.0℃の条件下、測定面に対して測定光(波長:589.3nm)を入射させるようにして、屈折計に示される規定の測定方法により測定を実施した。結果を表1に示す。
透明導電層(ITO層)の厚みは、X線反射率法を測定原理とし、以下の測定条件にて粉末X線回折装置(リガク社製、「RINT−2000」)にてX線反射率を測定し、取得した測定データを解析ソフト(リガク社製、「GXRR3」)で解析することで算出した。解析条件は以下の条件とし、PETフィルムと密度7.1g/cm3のITO層との2層モデルを採用し、ITO層の厚みと表面粗さを変数として、最小自乗フィッティングを実施し、透明導電層の厚みを解析した。結果を表1に示す。
光源: Cu−Kα線(波長:1,5418Å)、40kV、40mA
光学系: 平行ビーム光学系
発散スリット: 0.05mm
受光スリット: 0.05mm
単色化・平行化: 多層ゲーベルミラー使用
測定モード: θ/2θスキャンモード
測定範囲(2θ): 0.3〜2.0°
[解析条件]
解析手法: 最小自乗フィッティング
解析範囲(2θ): 2θ=0.3〜2.0°
(表面粗さの測定)
第1光学調整層、透明導電層および無機物層の表面粗さ(nm)は、原子間力顕微鏡(Digital Instruments社製、「Dimension 3100」、以下AFMとする。)を用い、常温下でTapping AFMモードにおける形状像を1μm平方で測定した。そのとき得られた形状像から装置付属のソフトのオフラインモードで自動計算される面内の算術平均粗さRaを求めた。結果を表1に示す。
透明導電層の表面抵抗(Ω/□)を、JIS K 7194(1994年)に準じて四端子法により測定した。この測定により得られた表面抵抗、および、上記で算出した透明導電層の厚みから、透明導電層の比抵抗を算出した。結果を表1に示す。
2 透明基材
3 第2光学調整層
4 第1光学調整層
5 無機物層
6 透明導電層
第2光学調整層を形成しなかった以外は、実施例3と同様にして透明導電性フィルムを製造した。
第1光学調整層の厚みを100nmとした以外は、参考例7と同様にして透明導電性フィルムを製造した。
Claims (8)
- 透明基材と、
前記透明基材の厚み方向一方側に配置され、樹脂層からなる第1光学調整層と、
前記第1光学調整層の厚み方向一方側に、前記第1光学調整層と接触するように、配置される無機物層と、
前記無機物層の厚み方向一方側に配置される透明導電層と
を備え、
前記無機物層の厚みが、10nm以下であり、
前記透明導電層の厚み方向一方側の表面の表面粗さが、1.40nm以下であることを特徴とする、透明導電性フィルム。 - 前記第1光学調整層の厚みが、200nm未満であることを特徴とする、請求項1に記載の透明導電性フィルム。
- 前記第1光学調整層は、粒子を実質的に含有していないことを特徴とする、請求項1に記載の透明導電性フィルム。
- 前記無機物層の厚み方向一方側の表面の表面粗さが、0.20nm以上0.70nm以下であることを特徴とする、請求項1に記載の透明導電性フィルム。
- 前記透明基材の厚み方向一方側かつ前記第1光学調整層の厚み方向他方側に配置され、前記第1光学調整層の屈折率と異なる第2光学調整層をさらに備えることを特徴とする、請求項1に記載の透明導電性フィルム。
- 前記第1光学調整層の屈折率が、前記第2光学調整層の屈折率よりも低いことを特徴とする、請求項5に記載の透明導電性フィルム。
- 前記透明導電層の厚みが、25nm以上40nm以下であることを特徴とする、請求項1に記載の透明導電性フィルム。
- 前記透明導電層の比抵抗が、1.1×10−4Ω・cm以上2.5×10−4Ω・cm以下であることを特徴とする、請求項1に記載の透明導電性フィルム。
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