JP7073606B2 - 離間装置および離間方法 - Google Patents

離間装置および離間方法 Download PDF

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Publication number
JP7073606B2
JP7073606B2 JP2017078140A JP2017078140A JP7073606B2 JP 7073606 B2 JP7073606 B2 JP 7073606B2 JP 2017078140 A JP2017078140 A JP 2017078140A JP 2017078140 A JP2017078140 A JP 2017078140A JP 7073606 B2 JP7073606 B2 JP 7073606B2
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JP
Japan
Prior art keywords
adhesive sheet
holding
adherends
widened
mutual spacing
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Active
Application number
JP2017078140A
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English (en)
Japanese (ja)
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JP2018182017A (ja
Inventor
芳昭 杉下
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Lintec Corp
Original Assignee
Lintec Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lintec Corp filed Critical Lintec Corp
Priority to JP2017078140A priority Critical patent/JP7073606B2/ja
Priority to TW107106097A priority patent/TWI778024B/zh
Priority to KR1020180027908A priority patent/KR102506718B1/ko
Priority to CN201810193530.0A priority patent/CN108695195B/zh
Publication of JP2018182017A publication Critical patent/JP2018182017A/ja
Application granted granted Critical
Publication of JP7073606B2 publication Critical patent/JP7073606B2/ja
Active legal-status Critical Current
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67132Apparatus for placing on an insulating substrate, e.g. tape
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67092Apparatus for mechanical treatment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Dicing (AREA)
  • Transition And Organic Metals Composition Catalysts For Addition Polymerization (AREA)
  • Input Circuits Of Receivers And Coupling Of Receivers And Audio Equipment (AREA)
  • Liquid Crystal Substances (AREA)
  • Adhesives Or Adhesive Processes (AREA)
  • Adhesive Tapes (AREA)
JP2017078140A 2017-04-11 2017-04-11 離間装置および離間方法 Active JP7073606B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2017078140A JP7073606B2 (ja) 2017-04-11 2017-04-11 離間装置および離間方法
TW107106097A TWI778024B (zh) 2017-04-11 2018-02-23 分離裝置及分離方法
KR1020180027908A KR102506718B1 (ko) 2017-04-11 2018-03-09 이간 장치 및 이간 방법
CN201810193530.0A CN108695195B (zh) 2017-04-11 2018-03-09 分离装置及分离方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2017078140A JP7073606B2 (ja) 2017-04-11 2017-04-11 離間装置および離間方法

Publications (2)

Publication Number Publication Date
JP2018182017A JP2018182017A (ja) 2018-11-15
JP7073606B2 true JP7073606B2 (ja) 2022-05-24

Family

ID=63844499

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2017078140A Active JP7073606B2 (ja) 2017-04-11 2017-04-11 離間装置および離間方法

Country Status (4)

Country Link
JP (1) JP7073606B2 (zh)
KR (1) KR102506718B1 (zh)
CN (1) CN108695195B (zh)
TW (1) TWI778024B (zh)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7108516B2 (ja) * 2018-10-25 2022-07-28 リンテック株式会社 シート貼付方法
JP6831035B1 (ja) * 2020-09-11 2021-02-17 リンテック株式会社 個片体製造方法および個片体製造装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016111188A (ja) 2014-12-05 2016-06-20 リンテック株式会社 離間装置および離間方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005209829A (ja) * 2004-01-22 2005-08-04 Taiyo Yuden Co Ltd 半導体ウェハ固定方法及び装置、並びに半導体ウェハが固定された構造体
JP2006054246A (ja) * 2004-08-10 2006-02-23 Disco Abrasive Syst Ltd ウエーハの分離方法
JP2006294731A (ja) * 2005-04-07 2006-10-26 Matsushita Electric Ind Co Ltd 半導体製造装置
JP2008140874A (ja) * 2006-11-30 2008-06-19 Disco Abrasive Syst Ltd テープ拡張装置
JP2010192510A (ja) * 2009-02-16 2010-09-02 Disco Abrasive Syst Ltd ワークの移載方法および移載装置
JP4630377B2 (ja) * 2009-03-11 2011-02-09 古河電気工業株式会社 半導体装置の製造方法
JP2011211054A (ja) * 2010-03-30 2011-10-20 Lintec Corp エキスパンド装置及びこれを用いたチップの取扱方法
JP2013191718A (ja) * 2012-03-14 2013-09-26 Disco Abrasive Syst Ltd 被加工物の分割装置及び分割方法
JP5961047B2 (ja) * 2012-06-22 2016-08-02 株式会社ディスコ ウエーハの加工方法
JP2014107292A (ja) * 2012-11-22 2014-06-09 Disco Abrasive Syst Ltd チップ間隔維持装置
JP6420623B2 (ja) * 2014-10-10 2018-11-07 リンテック株式会社 離間装置および離間方法
JP2016092207A (ja) * 2014-11-05 2016-05-23 株式会社ディスコ フレームユニットの製造方法
JP6363947B2 (ja) 2014-12-26 2018-07-25 リンテック株式会社 離間装置および離間方法
JP6417236B2 (ja) * 2015-02-26 2018-10-31 株式会社ディスコ ウエーハの分割方法及びチャックテーブル

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016111188A (ja) 2014-12-05 2016-06-20 リンテック株式会社 離間装置および離間方法

Also Published As

Publication number Publication date
KR20180114831A (ko) 2018-10-19
KR102506718B1 (ko) 2023-03-06
JP2018182017A (ja) 2018-11-15
TW201838002A (zh) 2018-10-16
CN108695195B (zh) 2023-06-13
TWI778024B (zh) 2022-09-21
CN108695195A (zh) 2018-10-23

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