JP7017949B2 - 加工装置 - Google Patents
加工装置 Download PDFInfo
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- JP7017949B2 JP7017949B2 JP2018037255A JP2018037255A JP7017949B2 JP 7017949 B2 JP7017949 B2 JP 7017949B2 JP 2018037255 A JP2018037255 A JP 2018037255A JP 2018037255 A JP2018037255 A JP 2018037255A JP 7017949 B2 JP7017949 B2 JP 7017949B2
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/18—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form
- G05B19/402—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form characterised by control arrangements for positioning, e.g. centring a tool relative to a hole in the workpiece, additional detection means to correct position
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS], computer integrated manufacturing [CIM]
- G05B19/41875—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS], computer integrated manufacturing [CIM] characterised by quality surveillance of production
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/048—Interaction techniques based on graphical user interfaces [GUI]
- G06F3/0481—Interaction techniques based on graphical user interfaces [GUI] based on specific properties of the displayed interaction object or a metaphor-based environment, e.g. interaction with desktop elements like windows or icons, or assisted by a cursor's changing behaviour or appearance
- G06F3/0482—Interaction with lists of selectable items, e.g. menus
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/048—Interaction techniques based on graphical user interfaces [GUI]
- G06F3/0484—Interaction techniques based on graphical user interfaces [GUI] for the control of specific functions or operations, e.g. selecting or manipulating an object, an image or a displayed text element, setting a parameter value or selecting a range
- G06F3/04847—Interaction techniques to control parameter settings, e.g. interaction with sliders or dials
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/048—Interaction techniques based on graphical user interfaces [GUI]
- G06F3/0487—Interaction techniques based on graphical user interfaces [GUI] using specific features provided by the input device, e.g. functions controlled by the rotation of a mouse with dual sensing arrangements, or of the nature of the input device, e.g. tap gestures based on pressure sensed by a digitiser
- G06F3/0488—Interaction techniques based on graphical user interfaces [GUI] using specific features provided by the input device, e.g. functions controlled by the rotation of a mouse with dual sensing arrangements, or of the nature of the input device, e.g. tap gestures based on pressure sensed by a digitiser using a touch-screen or digitiser, e.g. input of commands through traced gestures
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/048—Interaction techniques based on graphical user interfaces [GUI]
- G06F3/0487—Interaction techniques based on graphical user interfaces [GUI] using specific features provided by the input device, e.g. functions controlled by the rotation of a mouse with dual sensing arrangements, or of the nature of the input device, e.g. tap gestures based on pressure sensed by a digitiser
- G06F3/0488—Interaction techniques based on graphical user interfaces [GUI] using specific features provided by the input device, e.g. functions controlled by the rotation of a mouse with dual sensing arrangements, or of the nature of the input device, e.g. tap gestures based on pressure sensed by a digitiser using a touch-screen or digitiser, e.g. input of commands through traced gestures
- G06F3/04886—Interaction techniques based on graphical user interfaces [GUI] using specific features provided by the input device, e.g. functions controlled by the rotation of a mouse with dual sensing arrangements, or of the nature of the input device, e.g. tap gestures based on pressure sensed by a digitiser using a touch-screen or digitiser, e.g. input of commands through traced gestures by partitioning the display area of the touch-screen or the surface of the digitising tablet into independently controllable areas, e.g. virtual keyboards or menus
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67253—Process monitoring, e.g. flow or thickness monitoring
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67259—Position monitoring, e.g. misposition detection or presence detection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
- H01L22/24—Optical enhancement of defects or not directly visible states, e.g. selective electrolytic deposition, bubbles in liquids, light emission, colour change
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/30—Nc systems
- G05B2219/32—Operator till task planning
- G05B2219/32073—If inspection needed, stop machining, execute separate inspection program
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/30—Nc systems
- G05B2219/32—Operator till task planning
- G05B2219/32186—Teaching inspection data, pictures and criteria and apply them for inspection
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/30—Nc systems
- G05B2219/36—Nc in input of data, input key till input tape
- G05B2219/36168—Touchscreen
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/30—Nc systems
- G05B2219/50—Machine tool, machine tool null till machine tool work handling
- G05B2219/50122—Workpiece holder, chuck jaws, fixture setup
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20092—Interactive image processing based on input by user
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30148—Semiconductor; IC; Wafer
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30164—Workpiece; Machine component
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
Description
14 :チャックテーブル
70 :切削手段(加工手段)
73 :撮像手段
75 :タッチパネル
83 :加工溝
84 :入力欄
87 :入力カーソル
90 :制御手段
91 :カーソル検知部
92 :撮像制御部
93 :表示制御部
94 :チェック部
W :被加工物
Claims (3)
- 被加工物を保持するチャックテーブルと、該チャックテーブルに保持された被加工物に加工溝を形成する加工手段と、加工すべき領域を検出する撮像手段と、該撮像手段で撮像された画像を表示すると共にチェック条件のパラメータを入力するタッチパネルと、を備える加工装置であって、
該加工溝を形成している途中に、該加工手段の加工動作を中断して該加工溝を該撮像手段で撮像して該加工溝のチェックを実施し、
パラメータを調整して最適化を実施する際、操作者が該タッチパネルに表示された入力欄へパラメータを入力し該入力欄から入力カーソルを移動させると、該入力欄のパラメータで該加工溝のチェックを実行する制御手段を備える加工装置。 - パラメータが光量を含むことを特徴とする請求項1に記載の加工装置。
- パラメータが撮像位置を含むことを特徴とする請求項1又は請求項2に記載の加工装置。
Priority Applications (8)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018037255A JP7017949B2 (ja) | 2018-03-02 | 2018-03-02 | 加工装置 |
MYPI2019000917A MY194176A (en) | 2018-03-02 | 2019-02-20 | Control method for processing apparatus |
TW108106528A TWI786272B (zh) | 2018-03-02 | 2019-02-26 | 加工裝置的控制方法及半導體加工系統 |
US16/287,560 US10816952B2 (en) | 2018-03-02 | 2019-02-27 | Control method for processing apparatus |
KR1020190023428A KR102655559B1 (ko) | 2018-03-02 | 2019-02-27 | 가공 장치의 제어 방법 |
SG10201901727S SG10201901727SA (en) | 2018-03-02 | 2019-02-27 | Control method for processing apparatus |
CN201910148239.6A CN110223936B (zh) | 2018-03-02 | 2019-02-28 | 加工装置的控制方法 |
DE102019202712.1A DE102019202712A1 (de) | 2018-03-02 | 2019-02-28 | Steuerungsverfahren für eine Bearbeitungsvorrichtung |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018037255A JP7017949B2 (ja) | 2018-03-02 | 2018-03-02 | 加工装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2019153667A JP2019153667A (ja) | 2019-09-12 |
JP7017949B2 true JP7017949B2 (ja) | 2022-02-09 |
Family
ID=67622946
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2018037255A Active JP7017949B2 (ja) | 2018-03-02 | 2018-03-02 | 加工装置 |
Country Status (8)
Country | Link |
---|---|
US (1) | US10816952B2 (ja) |
JP (1) | JP7017949B2 (ja) |
KR (1) | KR102655559B1 (ja) |
CN (1) | CN110223936B (ja) |
DE (1) | DE102019202712A1 (ja) |
MY (1) | MY194176A (ja) |
SG (1) | SG10201901727SA (ja) |
TW (1) | TWI786272B (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101193655B1 (ko) * | 2010-04-16 | 2012-10-22 | 현대제철 주식회사 | 고강도 및 고연성을 갖는 고망간 규소 함유 강판 및 그 제조방법 |
KR101797319B1 (ko) * | 2015-12-23 | 2017-11-14 | 주식회사 포스코 | 용접성 및 연신율이 우수한 파이프용 열연강판 및 그 제조방법 |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102018126059A1 (de) * | 2018-10-19 | 2020-04-23 | Trumpf Werkzeugmaschinen Gmbh + Co. Kg | Verfahren zum visualisieren von prozessinformationen bei der fertigung von blechbauteilen |
JP6651275B1 (ja) * | 2019-08-01 | 2020-02-19 | 株式会社ディスコ | 加工装置 |
JP7300938B2 (ja) * | 2019-09-02 | 2023-06-30 | 株式会社ディスコ | カーフの認識方法 |
JP7330636B2 (ja) * | 2020-01-27 | 2023-08-22 | 株式会社ディスコ | 加工装置における照明器の明るさの調整方法 |
JP7370265B2 (ja) * | 2020-01-30 | 2023-10-27 | 株式会社ディスコ | 加工方法及び加工装置 |
US11516406B2 (en) * | 2020-10-28 | 2022-11-29 | Baker Hughes Oilfield Operations Llc | Adaptive borescope inspection |
JP2023538198A (ja) | 2021-03-05 | 2023-09-07 | アプライド マテリアルズ インコーポレイテッド | コスト関数または予想される将来のパラメータ変化を使用した、基板研磨中の処理パラメータの制御 |
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JP2009194326A (ja) | 2008-02-18 | 2009-08-27 | Disco Abrasive Syst Ltd | 加工装置 |
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2018
- 2018-03-02 JP JP2018037255A patent/JP7017949B2/ja active Active
-
2019
- 2019-02-20 MY MYPI2019000917A patent/MY194176A/en unknown
- 2019-02-26 TW TW108106528A patent/TWI786272B/zh active
- 2019-02-27 US US16/287,560 patent/US10816952B2/en active Active
- 2019-02-27 KR KR1020190023428A patent/KR102655559B1/ko active IP Right Grant
- 2019-02-27 SG SG10201901727S patent/SG10201901727SA/en unknown
- 2019-02-28 DE DE102019202712.1A patent/DE102019202712A1/de active Pending
- 2019-02-28 CN CN201910148239.6A patent/CN110223936B/zh active Active
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JP2009194326A (ja) | 2008-02-18 | 2009-08-27 | Disco Abrasive Syst Ltd | 加工装置 |
JP2012103780A (ja) | 2010-11-08 | 2012-05-31 | Nec System Technologies Ltd | 文字入力装置及び方法 |
JP2013191618A (ja) | 2012-03-12 | 2013-09-26 | Disco Abrasive Syst Ltd | 加工装置 |
JP5937278B1 (ja) | 2014-09-04 | 2016-06-22 | ヤマザキマザック株式会社 | メニュー表示機能を有する装置 |
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KR101193655B1 (ko) * | 2010-04-16 | 2012-10-22 | 현대제철 주식회사 | 고강도 및 고연성을 갖는 고망간 규소 함유 강판 및 그 제조방법 |
KR101797319B1 (ko) * | 2015-12-23 | 2017-11-14 | 주식회사 포스코 | 용접성 및 연신율이 우수한 파이프용 열연강판 및 그 제조방법 |
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US10816952B2 (en) | 2020-10-27 |
SG10201901727SA (en) | 2019-10-30 |
KR20190104907A (ko) | 2019-09-11 |
CN110223936B (zh) | 2024-02-02 |
MY194176A (en) | 2022-11-17 |
TWI786272B (zh) | 2022-12-11 |
TW201939594A (zh) | 2019-10-01 |
CN110223936A (zh) | 2019-09-10 |
US20190271962A1 (en) | 2019-09-05 |
JP2019153667A (ja) | 2019-09-12 |
KR102655559B1 (ko) | 2024-04-05 |
DE102019202712A1 (de) | 2019-09-05 |
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