JP6083140B2 - 電子部品搬送装置および電子部品検査装置 - Google Patents

電子部品搬送装置および電子部品検査装置 Download PDF

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Publication number
JP6083140B2
JP6083140B2 JP2012161283A JP2012161283A JP6083140B2 JP 6083140 B2 JP6083140 B2 JP 6083140B2 JP 2012161283 A JP2012161283 A JP 2012161283A JP 2012161283 A JP2012161283 A JP 2012161283A JP 6083140 B2 JP6083140 B2 JP 6083140B2
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JP
Japan
Prior art keywords
electronic component
tray
inspection
unit
moving unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2012161283A
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English (en)
Japanese (ja)
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JP2014020985A (ja
Inventor
冬生 ▲高▼田
冬生 ▲高▼田
山崎　孝
孝 山崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP2012161283A priority Critical patent/JP6083140B2/ja
Priority to TW102125418A priority patent/TWI591353B/zh
Priority to TW105111892A priority patent/TWI622541B/zh
Priority to CN201310304651.5A priority patent/CN103569624B/zh
Priority to CN201610580246.XA priority patent/CN106185236A/zh
Priority to CN201610579222.2A priority patent/CN106185235A/zh
Priority to KR20130085391A priority patent/KR101491281B1/ko
Publication of JP2014020985A publication Critical patent/JP2014020985A/ja
Priority to KR1020140110558A priority patent/KR20140117319A/ko
Application granted granted Critical
Publication of JP6083140B2 publication Critical patent/JP6083140B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G43/00—Control devices, e.g. for safety, warning or fault-correcting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G37/00—Combinations of mechanical conveyors of the same kind, or of different kinds, of interest apart from their application in particular machines or use in particular manufacturing processes
    • B65G37/02—Flow-sheets for conveyor combinations in warehouses, magazines or workshops
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K19/00—Record carriers for use with machines and with at least a part designed to carry digital markings
    • G06K19/06—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
    • G06K19/06009—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code with optically detectable marking
    • G06K19/06018—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code with optically detectable marking one-dimensional coding
    • G06K19/06028—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code with optically detectable marking one-dimensional coding using bar codes
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K7/00—Methods or arrangements for sensing record carriers, e.g. for reading patterns
    • G06K7/10—Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation
    • G06K7/14—Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation using light without selection of wavelength, e.g. sensing reflected white light
    • G06K7/1404—Methods for optical code recognition
    • G06K7/1408—Methods for optical code recognition the method being specifically adapted for the type of code
    • G06K7/1413—1D bar codes
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K7/00—Methods or arrangements for sensing record carriers, e.g. for reading patterns
    • G06K7/10—Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation
    • G06K7/14—Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation using light without selection of wavelength, e.g. sensing reflected white light
    • G06K7/1404—Methods for optical code recognition
    • G06K7/1408—Methods for optical code recognition the method being specifically adapted for the type of code
    • G06K7/1417—2D bar codes
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G2201/00—Indexing codes relating to handling devices, e.g. conveyors, characterised by the type of product or load being conveyed or handled
    • B65G2201/02—Articles
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G2203/00—Indexing code relating to control or detection of the articles or the load carriers during conveying
    • B65G2203/02—Control or detection
    • B65G2203/0208—Control or detection relating to the transported articles
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G2203/00—Indexing code relating to control or detection of the articles or the load carriers during conveying
    • B65G2203/02—Control or detection
    • B65G2203/0208—Control or detection relating to the transported articles
    • B65G2203/0216—Codes or marks on the article
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G2203/00—Indexing code relating to control or detection of the articles or the load carriers during conveying
    • B65G2203/04—Detection means
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G2812/00—Indexing codes relating to the kind or type of conveyors
    • B65G2812/02—Belt or chain conveyors
    • B65G2812/02128—Belt conveyors

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Artificial Intelligence (AREA)
  • Health & Medical Sciences (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Toxicology (AREA)
  • General Health & Medical Sciences (AREA)
  • Electromagnetism (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Evolutionary Computation (AREA)
  • Mechanical Engineering (AREA)
  • Evolutionary Biology (AREA)
  • Data Mining & Analysis (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP2012161283A 2012-07-20 2012-07-20 電子部品搬送装置および電子部品検査装置 Expired - Fee Related JP6083140B2 (ja)

Priority Applications (8)

Application Number Priority Date Filing Date Title
JP2012161283A JP6083140B2 (ja) 2012-07-20 2012-07-20 電子部品搬送装置および電子部品検査装置
TW105111892A TWI622541B (zh) 2012-07-20 2013-07-16 電子零件搬送裝置及電子零件檢查裝置
TW102125418A TWI591353B (zh) 2012-07-20 2013-07-16 Electronic parts conveying apparatus and electronic parts inspection apparatus
CN201610580246.XA CN106185236A (zh) 2012-07-20 2013-07-18 电子部件搬运装置以及电子部件检查装置
CN201310304651.5A CN103569624B (zh) 2012-07-20 2013-07-18 电子部件搬运装置以及电子部件检查装置
CN201610579222.2A CN106185235A (zh) 2012-07-20 2013-07-18 电子部件搬运装置以及电子部件检查装置
KR20130085391A KR101491281B1 (ko) 2012-07-20 2013-07-19 전자 부품 반송 장치 및 전자 부품 검사 장치
KR1020140110558A KR20140117319A (ko) 2012-07-20 2014-08-25 전자 부품 반송 장치 및 전자 부품 검사 장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012161283A JP6083140B2 (ja) 2012-07-20 2012-07-20 電子部品搬送装置および電子部品検査装置

Publications (2)

Publication Number Publication Date
JP2014020985A JP2014020985A (ja) 2014-02-03
JP6083140B2 true JP6083140B2 (ja) 2017-02-22

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JP2012161283A Expired - Fee Related JP6083140B2 (ja) 2012-07-20 2012-07-20 電子部品搬送装置および電子部品検査装置

Country Status (4)

Country Link
JP (1) JP6083140B2 (zh)
KR (2) KR101491281B1 (zh)
CN (3) CN103569624B (zh)
TW (2) TWI591353B (zh)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
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JP6083140B2 (ja) * 2012-07-20 2017-02-22 セイコーエプソン株式会社 電子部品搬送装置および電子部品検査装置
KR101430965B1 (ko) 2014-05-20 2014-08-20 테크밸리 주식회사 반도체 테이프릴의 칩 카운팅방법 및 그 디스플레이시스템
JP6331809B2 (ja) * 2014-07-17 2018-05-30 セイコーエプソン株式会社 電子部品搬送装置および電子部品検査装置
JP2016102685A (ja) * 2014-11-27 2016-06-02 セイコーエプソン株式会社 電子部品搬送装置、電子部品検査装置および電子部品押圧装置
CN106405368A (zh) * 2015-07-31 2017-02-15 精工爱普生株式会社 电子部件搬送装置以及电子部件检查装置
KR101594563B1 (ko) * 2015-08-31 2016-02-16 위드시스템 주식회사 검사시스템용 소켓 이송장치
TW201830041A (zh) * 2015-08-31 2018-08-16 日商精工愛普生股份有限公司 電子零件搬送裝置及電子零件檢查裝置
CN106829359A (zh) * 2015-09-30 2017-06-13 精工爱普生株式会社 电子部件输送装置以及电子部件检查装置
CN106959409A (zh) * 2015-10-30 2017-07-18 精工爱普生株式会社 电子部件搬运装置以及电子部件检查装置
KR102483359B1 (ko) * 2015-12-09 2023-01-02 (주)테크윙 반도체소자 테스트용 핸들러 및 그의 정보처리 방법
KR102656451B1 (ko) * 2016-03-18 2024-04-12 (주)테크윙 전자부품 테스트용 핸들러
JP6759809B2 (ja) * 2016-07-28 2020-09-23 セイコーエプソン株式会社 電子部品搬送装置及び電子部品検査装置
JP2018054464A (ja) * 2016-09-29 2018-04-05 セイコーエプソン株式会社 電子部品搬送装置及び電子部品検査装置
CN106629042A (zh) * 2016-12-28 2017-05-10 苏州富强科技有限公司 全自动上料流水线的上料方法
JP2018136239A (ja) * 2017-02-23 2018-08-30 セイコーエプソン株式会社 電子部品搬送装置及び電子部品検査装置
US10297043B2 (en) * 2017-04-07 2019-05-21 Advantest Corporation Detector for detecting position of IC device and method for the same
TWM554094U (zh) * 2017-06-29 2018-01-11 盟立自動化股份有限公司 檢測系統
JP2019027924A (ja) * 2017-07-31 2019-02-21 セイコーエプソン株式会社 電子部品搬送装置、電子部品検査装置、位置決め装置、部品搬送装置および位置決め方法
CN107336970A (zh) * 2017-08-15 2017-11-10 上海微松工业自动化有限公司 一种基于交替放置tray盘的OLED显示屏分选机构
TWI632101B (zh) * 2017-12-01 2018-08-11 鴻勁精密股份有限公司 Electronic component variable pitch carrier and test equipment for its application
TWI636270B (zh) * 2017-12-08 2018-09-21 昀業科技有限公司 Continuous automatic detection equipment
KR102422649B1 (ko) * 2017-12-19 2022-07-19 (주)테크윙 전자부품 테스트용 핸들러
KR102663462B1 (ko) * 2018-11-07 2024-05-09 (주)테크윙 핸들러
CN110095707A (zh) * 2019-04-09 2019-08-06 深圳市贝优通新能源技术开发有限公司 一种具有调整功能的便捷型芯片检测设备
CN110388960B (zh) * 2019-07-05 2021-12-14 燕山大学 用低速相机实现高速运动产品质量检测装置

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JP6083140B2 (ja) * 2012-07-20 2017-02-22 セイコーエプソン株式会社 電子部品搬送装置および電子部品検査装置

Also Published As

Publication number Publication date
TW201404697A (zh) 2014-02-01
TW201641397A (zh) 2016-12-01
KR101491281B1 (ko) 2015-02-06
KR20140117319A (ko) 2014-10-07
CN106185236A (zh) 2016-12-07
TWI622541B (zh) 2018-05-01
CN106185235A (zh) 2016-12-07
CN103569624A (zh) 2014-02-12
TWI591353B (zh) 2017-07-11
KR20140012600A (ko) 2014-02-03
CN103569624B (zh) 2016-08-10
JP2014020985A (ja) 2014-02-03

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