JP5617941B2 - 感光性樹脂組成物、感光性エレメント、レジストパターンの形成方法、及び、プリント配線板の製造方法 - Google Patents
感光性樹脂組成物、感光性エレメント、レジストパターンの形成方法、及び、プリント配線板の製造方法 Download PDFInfo
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- JP5617941B2 JP5617941B2 JP2013001955A JP2013001955A JP5617941B2 JP 5617941 B2 JP5617941 B2 JP 5617941B2 JP 2013001955 A JP2013001955 A JP 2013001955A JP 2013001955 A JP2013001955 A JP 2013001955A JP 5617941 B2 JP5617941 B2 JP 5617941B2
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- KERTUBUCQCSNJU-UHFFFAOYSA-L nickel(2+);disulfamate Chemical compound [Ni+2].NS([O-])(=O)=O.NS([O-])(=O)=O KERTUBUCQCSNJU-UHFFFAOYSA-L 0.000 description 1
- 125000001400 nonyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- MDYPDLBFDATSCF-UHFFFAOYSA-N nonyl prop-2-enoate Chemical compound CCCCCCCCCOC(=O)C=C MDYPDLBFDATSCF-UHFFFAOYSA-N 0.000 description 1
- 125000002347 octyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 150000002916 oxazoles Chemical class 0.000 description 1
- 125000001147 pentyl group Chemical group C(CCCC)* 0.000 description 1
- PNJWIWWMYCMZRO-UHFFFAOYSA-N pent‐4‐en‐2‐one Natural products CC(=O)CC=C PNJWIWWMYCMZRO-UHFFFAOYSA-N 0.000 description 1
- 239000005011 phenolic resin Substances 0.000 description 1
- 239000000049 pigment Substances 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 239000004014 plasticizer Substances 0.000 description 1
- 229920000728 polyester Polymers 0.000 description 1
- 229920001223 polyethylene glycol Polymers 0.000 description 1
- 229920013716 polyethylene resin Polymers 0.000 description 1
- 229920005990 polystyrene resin Polymers 0.000 description 1
- 239000004800 polyvinyl chloride Substances 0.000 description 1
- 229920000915 polyvinyl chloride Polymers 0.000 description 1
- 229910000027 potassium carbonate Inorganic materials 0.000 description 1
- 229910000160 potassium phosphate Inorganic materials 0.000 description 1
- 235000011009 potassium phosphates Nutrition 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- HJWLCRVIBGQPNF-UHFFFAOYSA-N prop-2-enylbenzene Chemical compound C=CCC1=CC=CC=C1 HJWLCRVIBGQPNF-UHFFFAOYSA-N 0.000 description 1
- 125000002572 propoxy group Chemical group [*]OC([H])([H])C(C([H])([H])[H])([H])[H] 0.000 description 1
- 125000001436 propyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- UORVCLMRJXCDCP-UHFFFAOYSA-N propynoic acid Chemical compound OC(=O)C#C UORVCLMRJXCDCP-UHFFFAOYSA-N 0.000 description 1
- 238000010992 reflux Methods 0.000 description 1
- 238000007790 scraping Methods 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 239000011734 sodium Substances 0.000 description 1
- 235000011182 sodium carbonates Nutrition 0.000 description 1
- FQENQNTWSFEDLI-UHFFFAOYSA-J sodium diphosphate Chemical compound [Na+].[Na+].[Na+].[Na+].[O-]P([O-])(=O)OP([O-])([O-])=O FQENQNTWSFEDLI-UHFFFAOYSA-J 0.000 description 1
- 235000019795 sodium metasilicate Nutrition 0.000 description 1
- 239000001488 sodium phosphate Substances 0.000 description 1
- 229910000162 sodium phosphate Inorganic materials 0.000 description 1
- 229940048086 sodium pyrophosphate Drugs 0.000 description 1
- NTHWMYGWWRZVTN-UHFFFAOYSA-N sodium silicate Chemical compound [Na+].[Na+].[O-][Si]([O-])=O NTHWMYGWWRZVTN-UHFFFAOYSA-N 0.000 description 1
- 229910052911 sodium silicate Inorganic materials 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 125000001424 substituent group Chemical group 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 1
- RYCLIXPGLDDLTM-UHFFFAOYSA-J tetrapotassium;phosphonato phosphate Chemical compound [K+].[K+].[K+].[K+].[O-]P([O-])(=O)OP([O-])([O-])=O RYCLIXPGLDDLTM-UHFFFAOYSA-J 0.000 description 1
- 235000019818 tetrasodium diphosphate Nutrition 0.000 description 1
- 239000001577 tetrasodium phosphonato phosphate Substances 0.000 description 1
- YRHRIQCWCFGUEQ-UHFFFAOYSA-N thioxanthen-9-one Chemical class C1=CC=C2C(=O)C3=CC=CC=C3SC2=C1 YRHRIQCWCFGUEQ-UHFFFAOYSA-N 0.000 description 1
- DVKJHBMWWAPEIU-UHFFFAOYSA-N toluene 2,4-diisocyanate Chemical compound CC1=CC=C(N=C=O)C=C1N=C=O DVKJHBMWWAPEIU-UHFFFAOYSA-N 0.000 description 1
- RUELTTOHQODFPA-UHFFFAOYSA-N toluene 2,6-diisocyanate Chemical compound CC1=C(N=C=O)C=CC=C1N=C=O RUELTTOHQODFPA-UHFFFAOYSA-N 0.000 description 1
- LMYRWZFENFIFIT-UHFFFAOYSA-N toluene-4-sulfonamide Chemical compound CC1=CC=C(S(N)(=O)=O)C=C1 LMYRWZFENFIFIT-UHFFFAOYSA-N 0.000 description 1
- LDHQCZJRKDOVOX-UHFFFAOYSA-N trans-crotonic acid Natural products CC=CC(O)=O LDHQCZJRKDOVOX-UHFFFAOYSA-N 0.000 description 1
- LENZDBCJOHFCAS-UHFFFAOYSA-N tris Chemical compound OCC(N)(CO)CO LENZDBCJOHFCAS-UHFFFAOYSA-N 0.000 description 1
- RYFMWSXOAZQYPI-UHFFFAOYSA-K trisodium phosphate Chemical compound [Na+].[Na+].[Na+].[O-]P([O-])([O-])=O RYFMWSXOAZQYPI-UHFFFAOYSA-K 0.000 description 1
- 125000002948 undecyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- ROVRRJSRRSGUOL-UHFFFAOYSA-N victoria blue bo Chemical compound [Cl-].C12=CC=CC=C2C(NCC)=CC=C1C(C=1C=CC(=CC=1)N(CC)CC)=C1C=CC(=[N+](CC)CC)C=C1 ROVRRJSRRSGUOL-UHFFFAOYSA-N 0.000 description 1
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
- G03F7/032—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders
- G03F7/033—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders the binders being polymers obtained by reactions only involving carbon-to-carbon unsaturated bonds, e.g. vinyl polymers
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0045—Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
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- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials For Photolithography (AREA)
- Polymerisation Methods In General (AREA)
- Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
- Macromonomer-Based Addition Polymer (AREA)
- Manufacturing Of Printed Circuit Boards (AREA)
- Manufacturing Of Printed Wiring (AREA)
Description
[式中、R1は水素原子又はメチル基を示し、R2は水素原子、メチル基、又はハロゲン化メチル基を示し、R3は炭素数1〜6のアルキル基、ハロゲン原子、又は水酸基を示し、kは0〜4の整数を示す。Aはエチレン基を示し、aは1〜4の整数を示す。なお、kが2以上の場合、複数存在するR3は同一でも異なっていてもよい。]
ここで、一般式(3)中、R6は水素原子又はメチル基を示す。また、R7は炭素数1〜12のアルキル基を示し、炭素数1〜8のアルキル基であることが好ましく、炭素数1〜4のアルキル基であることがより好ましい。
[式中、R1は水素原子又はメチル基を示し、R2は水素原子、メチル基、又はハロゲン化メチル基を示し、R3は炭素数1〜6のアルキル基、ハロゲン原子、又は水酸基を示し、kは0〜4の整数を示す。Aはエチレン基を示し、aは1〜4の整数を示す。なお、kが2以上の場合、複数存在するR3は同一でも異なっていてもよい。]
[式中、R4及びR5はそれぞれ独立に水素原子又はメチル基を示し、X及びYはそれぞれ独立に炭素数1〜6のアルキレン基を示し、m1、m2、n1及びn2は、m1+m2+n1+n2が0〜40の整数となるように選ばれる0〜20の整数を示す。]
まず、表1に示す組成のバインダーポリマーを合成例1に従って合成した。
撹拌機、還流冷却器、温度計、滴下ロート及び窒素ガス導入管を備えたフラスコに、質量比6:4であるメチルセロソルブ及びトルエンの配合物400gを加え、窒素ガスを吹き込みながら撹拌して、80℃まで加熱した。一方、共重合単量体としてメタクリル酸100g、メタクリル酸メチル250g、アクリル酸エチル100g及びスチレン50gと、アゾビスイソブチロニトリル0.8gとを混合した溶液(以下、「溶液a」という)を用意し、80℃に加熱された質量比6:4であるメチルセロソルブ及びトルエンの上記配合物に溶液aを4時間かけて滴下した後、80℃で撹拌しながら2時間保温した。さらに、質量比6:4であるメチルセロソルブ及びトルエンの配合物100gにアゾビスイソブチロニトリル1.2gを溶解した溶液を、10分かけてフラスコ内に滴下した。滴下後の溶液を撹拌しながら80℃で3時間保温した後、30分間かけて90℃に加温した。90℃で2時間保温した後、冷却して(A)成分であるバインダーポリマー溶液を得た。このバインダーポリマー溶液に、アセトンを加えて不揮発成分濃度(固形分濃度)が50質量%になるように調製した。バインダーポリマーの重量平均分子量は80,000であった。なお、重量平均分子量は、ゲルパーミエーションクロマトグラフィー法によって測定し、標準ポリスチレンの検量線を用いて換算することにより導出した。GPCの条件は、以下に示す。
ポンプ:日立 L−6000型[(株)日立製作所製]
カラム:Gelpack GL−R420+Gelpack GL−R430+Gelpack GL−R440(計3本)[以上、日立化成工業(株)製、製品名]
溶離液:テトラヒドロフラン
測定温度:25℃
流量:2.05mL/分
検出器:日立 L−3300型R1[(株)日立製作所製、製品名]
*1:p−メトキシフェノールを、固形分全量を基準として70質量ppm含む、下記式(4)で表される化合物[日立化成工業(株)製、製品名]
*2:p−メトキシフェノールを、固形分全量を基準として150質量ppm含む、下記式(4)で表される化合物[日立化成工業(株)製、製品名]
*3:p−メトキシフェノールを、固形分全量を基準として220質量ppm含む、下記式(4)で表される化合物[日立化成工業(株)製、製品名]
*5:p−メトキシフェノールを、固形分全量を基準として200質量ppm含む、γ−クロロ−β−ヒドロキシプロピル−β’−メタクリロイルオキシエチル−o−フタレート[日立化成工業(株)製、製品名]
*6:p−メトキシフェノールを、固形分全量を基準として500質量ppm含む、γ−クロロ−β−ヒドロキシプロピル−β’−メタクリロイルオキシエチル−o−フタレート[日立化成工業(株)製、製品名]
*8:p−メトキシフェノールを、固形分全量を基準として220質量ppm含む、下記式(5)で表される化合物[日立化成工業(株)製、製品名]
上記試験基板の感光性樹脂組成物層上に日立41段ステップタブレットを置いて、半導体レーザを光源とした波長405nmのDLP露光機(日立ビアメカニクス(株)製、製品名「DE−1AH」)を用いて、露光量20mJ/cm2で露光した。次いでポリエチレンテレフタレートフィルムを剥離し、30℃で1.0質量%炭酸ナトリウム水溶液を60秒間スプレーし、未露光部分を除去した後、銅張積層板上に形成された光硬化膜のステップタブレットの段数を測定することにより、感光性樹脂組成物の光感度を評価した。光感度は、ステップタブレットの段数で示され、このステップタブレットの段数が高いほど、光感度が高いことを示す。
上記ラミネート後の試験基板の感光性樹脂組成物層上に、日立41段ステップタブレットを置き、密着性評価用パターンとしてライン幅/スペース幅が5/400〜47/400(単位:μm)の配線パターンを有する描画データを使用し、半導体レーザを光源とした波長405nmのDLP露光機(日立ビアメカニクス(株)製、製品名「DE−1AH」)を用いて、日立41段ステップタブレットの現像後の残存ステップ段数が17.0となる露光量で露光を行った。上記光感度の評価と同様の条件で現像処理を行った後、光学顕微鏡を用いてレジストパターンを観察し、剥がれ及びよれがなく残った最も小さいライン幅の値により密着性(μm)を評価した。この数値が小さいほど密着性が良好であることを示す。
上記ラミネート後の試験基板の感光性樹脂組成物層上に、日立41段ステップタブレットを置き、解像度評価用パターンとしてライン幅/スペース幅が400/5〜500/47(単位:μm)の配線パターンを有する描画データを使用し、半導体レーザを光源とした波長405nmのDLP露光機(日立ビアメカニクス(株)製、製品名「DE−1AH」)を用いて、日立41段ステップタブレットの現像後の残存ステップ段数が17.0となる露光量で露光を行った。上記光感度の評価と同様の条件で現像処理を行った後、光学顕微鏡を用いてレジストパターンを観察し、未露光部が完全に除去された最も小さいスペース幅の値により解像度(μm)を評価した。この数値が小さいほど解像度が良好であることを示す。
上記ラミネート後の試験基板の感光性樹脂組成物層上に、日立41段ステップタブレットを置き、レジスト形状評価用パターンとしてライン幅/スペース幅が5/5〜47/47(単位:μm)の配線パターンを有する描画データを使用し、半導体レーザを光源とした波長405nmのDLP露光機(日立ビアメカニクス(株)製、製品名「DE−1AH」)を用いて、日立41段ステップタブレットの現像後の残存ステップ段数が17.0となる露光量で露光を行った。上記光感度の評価と同様の条件で現像処理を行った後、走査型電子顕微鏡((株)日立製作所製、型番「S−2100A」)を用いてレジスト形状を観察した。レジスト形状において、パターン断面が台形又は逆台形であると、エッチング又はめっき処理後に設計幅の配線パターンが得られない等の不都合が生じるため、パターン断面は矩形であることが好ましい。これらの結果を表3に示す。
上記ラミネート後の試験基板の感光性樹脂組成物層上に、日立41段ステップタブレットを置き、剥離時間測定用パターンとして60mm×45mmの露光パターンを有する描画データを使用し、半導体レーザを光源とした波長405nmのDLP露光機(日立ビアメカニクス(株)製、製品名「DE−1AH」)を用いて、日立41段ステップタブレットの現像後の残存ステップ段数が17.0となるエネルギー量で露光を行った。上記光感度の評価と同様の条件で現像処理を行った後、50℃の3質量%水酸化ナトリウム水溶液(剥離液)に浸漬し、撹拌子により撹拌した。撹拌開始から、硬化膜が基板から完全に剥離除去されるまでの時間(剥離時間)により剥離特性を評価した。剥離特性の評価は、剥離時間が短いほど良好である。
Claims (9)
- (A)バインダーポリマー、(B)分子内にエチレン性不飽和結合を有する光重合性化合物、(C)光重合開始剤、及び(D)重合禁止剤を含有し、
前記(B)光重合性化合物が、ビスフェノールA系(メタ)アクリレート化合物を含み、
前記(B)光重合性化合物が、さらに、エチレン基の平均数が2〜14であり、プロピレン基の平均数が2〜14であるポリエチレンポリプロピレングリコールジ(メタ)アクリレートを含み、
前記(D)重合禁止剤の含有量が組成物中の固形分全量を基準として20〜100質量ppmである、感光性樹脂組成物。 - 前記(C)光重合開始剤が、置換アントラセン類又はピラゾリン系化合物を含む、請求項1又は2に記載の感光性樹脂組成物。
- 前記(D)重合禁止剤が、フェノール系水酸基を有する化合物を含有する、請求項1〜3のいずれか一項に記載の感光性樹脂組成物。
- 支持体と、該支持体上に形成された請求項1〜4のいずれか一項に記載の感光性樹脂組成物からなる感光性樹脂組成物層と、を備える感光性エレメント。
- 基板上に、請求項1〜4のいずれか一項に記載の感光性樹脂組成物からなる感光性樹脂組成物層を積層する積層工程と、
前記感光性樹脂組成物層の所定部分に活性光線を照射して露光部を光硬化せしめる露光工程と、
前記基板から前記感光性樹脂組成物層の前記露光部以外の部分を除去してレジストパターンを形成する現像工程と、
を有するレジストパターンの形成方法。 - 基板上に、請求項5に記載の感光性エレメントの前記感光性樹脂組成物層を積層する積層工程と、
前記感光性樹脂組成物層の所定部分に活性光線を照射して露光部を光硬化せしめる露光工程と、
前記基板から前記感光性樹脂組成物層の前記露光部以外の部分を除去してレジストパターンを形成する現像工程と、
を有するレジストパターンの形成方法。 - 前記露光工程は、レーザ光により、前記感光性樹脂組成物層を直接描画露光して露光部を光硬化せしめる工程である、請求項6又は7記載のレジストパターンの形成方法。
- 請求項6〜8のいずれか一項に記載のレジストパターンの形成方法によりレジストパターンの形成された基板を、エッチング又はめっきする、プリント配線板の製造方法。
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MY152732A (en) | 2014-11-28 |
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CN103792788A (zh) | 2014-05-14 |
KR20100126779A (ko) | 2010-12-02 |
JP2013080259A (ja) | 2013-05-02 |
KR101310407B1 (ko) | 2013-09-23 |
WO2009133817A1 (ja) | 2009-11-05 |
CN105425544A (zh) | 2016-03-23 |
EP2278396A1 (en) | 2011-01-26 |
US8460852B2 (en) | 2013-06-11 |
CN102007451A (zh) | 2011-04-06 |
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JP5181224B2 (ja) | 2013-04-10 |
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