JP5562712B2 - 半導体製造装置用のガス供給装置 - Google Patents
半導体製造装置用のガス供給装置 Download PDFInfo
- Publication number
- JP5562712B2 JP5562712B2 JP2010105611A JP2010105611A JP5562712B2 JP 5562712 B2 JP5562712 B2 JP 5562712B2 JP 2010105611 A JP2010105611 A JP 2010105611A JP 2010105611 A JP2010105611 A JP 2010105611A JP 5562712 B2 JP5562712 B2 JP 5562712B2
- Authority
- JP
- Japan
- Prior art keywords
- flow rate
- gas
- pressure
- gas supply
- pipe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/52—Controlling or regulating the coating process
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45561—Gas plumbing upstream of the reaction chamber
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D7/00—Control of flow
- G05D7/06—Control of flow characterised by the use of electric means
- G05D7/0617—Control of flow characterised by the use of electric means specially adapted for fluid materials
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T137/00—Fluid handling
- Y10T137/7722—Line condition change responsive valves
- Y10T137/7758—Pilot or servo controlled
- Y10T137/7759—Responsive to change in rate of fluid flow
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T137/00—Fluid handling
- Y10T137/7722—Line condition change responsive valves
- Y10T137/7758—Pilot or servo controlled
- Y10T137/7761—Electrically actuated valve
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T137/00—Fluid handling
- Y10T137/8593—Systems
- Y10T137/85938—Non-valved flow dividers
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T137/00—Fluid handling
- Y10T137/8593—Systems
- Y10T137/87249—Multiple inlet with multiple outlet
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Metallurgy (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Automation & Control Theory (AREA)
- Drying Of Semiconductors (AREA)
- Flow Control (AREA)
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010105611A JP5562712B2 (ja) | 2010-04-30 | 2010-04-30 | 半導体製造装置用のガス供給装置 |
| TW100113913A TWI517280B (zh) | 2010-04-30 | 2011-04-21 | 半導體製造設備用之氣體供應設備 |
| US13/094,202 US8944095B2 (en) | 2010-04-30 | 2011-04-26 | Gas supply apparatus for semiconductor manufacturing apparatus |
| KR1020110039862A KR101565437B1 (ko) | 2010-04-30 | 2011-04-28 | 반도체 제조 장치용의 가스 공급 장치 |
| CN201110109144.7A CN102235573B (zh) | 2010-04-30 | 2011-04-28 | 半导体制造装置用的气体供给装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010105611A JP5562712B2 (ja) | 2010-04-30 | 2010-04-30 | 半導体製造装置用のガス供給装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2011233841A JP2011233841A (ja) | 2011-11-17 |
| JP2011233841A5 JP2011233841A5 (https=) | 2013-01-17 |
| JP5562712B2 true JP5562712B2 (ja) | 2014-07-30 |
Family
ID=44857322
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010105611A Active JP5562712B2 (ja) | 2010-04-30 | 2010-04-30 | 半導体製造装置用のガス供給装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8944095B2 (https=) |
| JP (1) | JP5562712B2 (https=) |
| KR (1) | KR101565437B1 (https=) |
| CN (1) | CN102235573B (https=) |
| TW (1) | TWI517280B (https=) |
Families Citing this family (44)
| Publication number | Priority date | Publication date | Assignee | Title |
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| US9921089B2 (en) | 2005-06-27 | 2018-03-20 | Fujikin Incorporated | Flow rate range variable type flow rate control apparatus |
| US9383758B2 (en) * | 2005-06-27 | 2016-07-05 | Fujikin Incorporated | Flow rate range variable type flow rate control apparatus |
| JP5703114B2 (ja) * | 2011-04-28 | 2015-04-15 | 株式会社フジキン | 原料の気化供給装置 |
| WO2012153454A1 (ja) * | 2011-05-10 | 2012-11-15 | 株式会社フジキン | 流量モニタ付圧力式流量制御装置と、これを用いた流体供給系の異常検出方法並びにモニタ流量異常時の処置方法 |
| JP5755958B2 (ja) | 2011-07-08 | 2015-07-29 | 株式会社フジキン | 半導体製造装置の原料ガス供給装置 |
| JP5652960B2 (ja) * | 2011-08-01 | 2015-01-14 | 株式会社フジキン | 原料気化供給装置 |
| JP5430621B2 (ja) * | 2011-08-10 | 2014-03-05 | Ckd株式会社 | ガス流量検定システム及びガス流量検定ユニット |
| JP5647083B2 (ja) | 2011-09-06 | 2014-12-24 | 株式会社フジキン | 原料濃度検出機構を備えた原料気化供給装置 |
| US9557744B2 (en) | 2012-01-20 | 2017-01-31 | Mks Instruments, Inc. | System for and method of monitoring flow through mass flow controllers in real time |
| JP5754853B2 (ja) * | 2012-01-30 | 2015-07-29 | 株式会社フジキン | 半導体製造装置のガス分流供給装置 |
| JP5665793B2 (ja) * | 2012-04-26 | 2015-02-04 | 株式会社フジキン | 可変オリフィス型圧力制御式流量制御器 |
| JP5665794B2 (ja) * | 2012-04-27 | 2015-02-04 | 株式会社フジキン | 半導体製造装置のガス分流供給装置 |
| US9443230B2 (en) * | 2012-04-30 | 2016-09-13 | At&T Intellectual Property I, L.P. | Point-to point data synchronization |
| US9243325B2 (en) | 2012-07-18 | 2016-01-26 | Rohm And Haas Electronic Materials Llc | Vapor delivery device, methods of manufacture and methods of use thereof |
| US8925588B2 (en) * | 2012-08-17 | 2015-01-06 | Novellus Systems, Inc. | Flow balancing in gas distribution networks |
| CN103928284B (zh) * | 2013-01-15 | 2016-04-06 | 中微半导体设备(上海)有限公司 | 气体传输装置及其气体分流装置的测试方法 |
| CN104150431A (zh) * | 2013-05-14 | 2014-11-19 | 北京北方微电子基地设备工艺研究中心有限责任公司 | 进气系统及基片处理设备 |
| CN106104402B (zh) * | 2014-02-13 | 2020-03-24 | Mks 仪器公司 | 提供压力不敏感自我验证的质量流量控制器的系统和方法 |
| US20150283523A1 (en) * | 2014-04-03 | 2015-10-08 | Waterous Company | Compressed air foam generation |
| JP6370630B2 (ja) * | 2014-07-31 | 2018-08-08 | 株式会社ニューフレアテクノロジー | 気相成長装置および気相成長方法 |
| JP6370198B2 (ja) * | 2014-11-07 | 2018-08-08 | 株式会社ニューフレアテクノロジー | 気相成長装置および気相成長方法 |
| US9904299B2 (en) * | 2015-04-08 | 2018-02-27 | Tokyo Electron Limited | Gas supply control method |
| JP6748586B2 (ja) * | 2016-07-11 | 2020-09-02 | 東京エレクトロン株式会社 | ガス供給システム、基板処理システム及びガス供給方法 |
| US20180046206A1 (en) * | 2016-08-13 | 2018-02-15 | Applied Materials, Inc. | Method and apparatus for controlling gas flow to a process chamber |
| JP6811146B2 (ja) * | 2017-06-23 | 2021-01-13 | 東京エレクトロン株式会社 | ガス供給系を検査する方法 |
| WO2019083761A1 (en) * | 2017-10-23 | 2019-05-02 | Applied Materials, Inc. | LIQUID PRECURSOR FEEDING SYSTEM |
| JP7216425B2 (ja) * | 2017-11-30 | 2023-02-01 | 株式会社フジキン | 流量制御装置 |
| JP7044629B2 (ja) * | 2018-05-18 | 2022-03-30 | 株式会社堀場エステック | 流体制御装置、及び、流量比率制御装置 |
| JP7068062B2 (ja) * | 2018-06-18 | 2022-05-16 | 株式会社堀場製作所 | 流体制御装置、及び、流量比率制御装置 |
| JP7144283B2 (ja) | 2018-11-09 | 2022-09-29 | 株式会社ニューフレアテクノロジー | 気相成長装置 |
| JP7495742B2 (ja) | 2019-04-25 | 2024-06-05 | 株式会社フジキン | 流量制御装置および流量制御方法 |
| DE102019117543A1 (de) * | 2019-06-28 | 2020-12-31 | Aixtron Se | Verfahren zum Kalibrieren/Verifizieren von Massenfluss-Mess/Steuer-Geräten eines Gasmischsystems und Vorrichtung zur Durchführung des Verfahrens |
| CN110410672B (zh) * | 2019-07-05 | 2021-08-10 | 中国科学院空间应用工程与技术中心 | 一种氮气供应方法及装置 |
| IL269235A (en) * | 2019-09-09 | 2021-03-25 | Sherlock Leaks & Floods Ltd | Multi-range flowmeter |
| CN111059469A (zh) * | 2019-12-31 | 2020-04-24 | 中国科学院空间应用工程与技术中心 | 一种集成式空间应用氮气供应分配控制装置 |
| CN111520613B (zh) * | 2020-04-26 | 2022-01-11 | 北京北方华创微电子装备有限公司 | 集成供气系统及其气路切换机构、半导体外延设备 |
| WO2022004349A1 (ja) * | 2020-06-29 | 2022-01-06 | 株式会社フジキン | 流体制御装置、流体供給システムおよび流体供給方法 |
| JPWO2022025017A1 (https=) * | 2020-07-30 | 2022-02-03 | ||
| KR20220108374A (ko) * | 2021-01-27 | 2022-08-03 | 주성엔지니어링(주) | 기판처리장치용 가스공급장치 |
| KR20220117150A (ko) * | 2021-02-16 | 2022-08-23 | 에이에스엠 아이피 홀딩 비.브이. | 기판 처리 장치 |
| JP7665482B2 (ja) * | 2021-09-24 | 2025-04-21 | 株式会社Screenホールディングス | 基板処理システム、及び群管理装置 |
| KR20240010410A (ko) * | 2022-07-15 | 2024-01-23 | 에이에스엠 아이피 홀딩 비.브이. | 비접촉식 흐름 스위치 및 격리 밸브를 갖는 흐름 제어 장치, 흐름 제어 장치를 갖는 반도체 처리 시스템, 및 흐름 제어 방법 |
| JP2024055475A (ja) * | 2022-10-07 | 2024-04-18 | 愛三工業株式会社 | 弁システム |
| DE102023107631B3 (de) * | 2023-03-27 | 2024-08-01 | IB-FT GmbH | Porometer mit einer Regelvorrichtung zur Regelung eines Drucks eines Fluids |
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| JP5461786B2 (ja) * | 2008-04-01 | 2014-04-02 | 株式会社フジキン | 気化器を備えたガス供給装置 |
| JP5216632B2 (ja) * | 2009-03-03 | 2013-06-19 | 東京エレクトロン株式会社 | 流体制御装置 |
| US9127361B2 (en) * | 2009-12-07 | 2015-09-08 | Mks Instruments, Inc. | Methods of and apparatus for controlling pressure in multiple zones of a process tool |
-
2010
- 2010-04-30 JP JP2010105611A patent/JP5562712B2/ja active Active
-
2011
- 2011-04-21 TW TW100113913A patent/TWI517280B/zh not_active IP Right Cessation
- 2011-04-26 US US13/094,202 patent/US8944095B2/en active Active
- 2011-04-28 CN CN201110109144.7A patent/CN102235573B/zh active Active
- 2011-04-28 KR KR1020110039862A patent/KR101565437B1/ko active Active
Also Published As
| Publication number | Publication date |
|---|---|
| TW201214600A (en) | 2012-04-01 |
| TWI517280B (zh) | 2016-01-11 |
| JP2011233841A (ja) | 2011-11-17 |
| CN102235573A (zh) | 2011-11-09 |
| CN102235573B (zh) | 2015-03-18 |
| US20110265895A1 (en) | 2011-11-03 |
| KR20110121560A (ko) | 2011-11-07 |
| KR101565437B1 (ko) | 2015-11-03 |
| US8944095B2 (en) | 2015-02-03 |
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