JP5395370B2 - 半導体装置製造用基板の作製方法 - Google Patents
半導体装置製造用基板の作製方法 Download PDFInfo
- Publication number
- JP5395370B2 JP5395370B2 JP2008148061A JP2008148061A JP5395370B2 JP 5395370 B2 JP5395370 B2 JP 5395370B2 JP 2008148061 A JP2008148061 A JP 2008148061A JP 2008148061 A JP2008148061 A JP 2008148061A JP 5395370 B2 JP5395370 B2 JP 5395370B2
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- substrate
- insulating film
- semiconductor
- silicon
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/01—Manufacture or treatment
- H10D86/021—Manufacture or treatment of multiple TFTs
- H10D86/0214—Manufacture or treatment of multiple TFTs using temporary substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B20/00—Read-only memory [ROM] devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B20/00—Read-only memory [ROM] devices
- H10B20/27—ROM only
- H10B20/30—ROM only having the source region and the drain region on the same level, e.g. lateral transistors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/60—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
- H10D30/021—Manufacture or treatment of FETs having insulated gates [IGFET]
- H10D30/031—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT]
- H10D30/0321—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT] comprising silicon, e.g. amorphous silicon or polysilicon
- H10D30/0323—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT] comprising silicon, e.g. amorphous silicon or polysilicon comprising monocrystalline silicon
Landscapes
- Thin Film Transistor (AREA)
- Recrystallisation Techniques (AREA)
- Liquid Crystal (AREA)
- Electroluminescent Light Sources (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008148061A JP5395370B2 (ja) | 2007-06-20 | 2008-06-05 | 半導体装置製造用基板の作製方法 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007162106 | 2007-06-20 | ||
| JP2007162106 | 2007-06-20 | ||
| JP2008148061A JP5395370B2 (ja) | 2007-06-20 | 2008-06-05 | 半導体装置製造用基板の作製方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2009027150A JP2009027150A (ja) | 2009-02-05 |
| JP2009027150A5 JP2009027150A5 (enExample) | 2011-06-02 |
| JP5395370B2 true JP5395370B2 (ja) | 2014-01-22 |
Family
ID=40135601
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008148061A Expired - Fee Related JP5395370B2 (ja) | 2007-06-20 | 2008-06-05 | 半導体装置製造用基板の作製方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (2) | US7781306B2 (enExample) |
| JP (1) | JP5395370B2 (enExample) |
| CN (2) | CN101329999B (enExample) |
| TW (1) | TWI514520B (enExample) |
Families Citing this family (265)
| Publication number | Priority date | Publication date | Assignee | Title |
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| US20100237458A1 (en) | 2010-09-23 |
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| US8912624B2 (en) | 2014-12-16 |
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| US7781306B2 (en) | 2010-08-24 |
| CN101329999B (zh) | 2011-09-07 |
| US20080315351A1 (en) | 2008-12-25 |
| CN101329999A (zh) | 2008-12-24 |
| CN102324398A (zh) | 2012-01-18 |
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