JP4801047B2 - 鏡群を有するカタジオプトリック投影対物レンズ - Google Patents
鏡群を有するカタジオプトリック投影対物レンズ Download PDFInfo
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- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
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- G02B17/06—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
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- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
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- G02B17/0808—Catadioptric systems using two curved mirrors on-axis systems with at least one of the mirrors having a central aperture
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- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/08—Catadioptric systems
- G02B17/0804—Catadioptric systems using two curved mirrors
- G02B17/0816—Catadioptric systems using two curved mirrors off-axis or unobscured systems in which not all of the mirrors share a common axis of rotational symmetry, e.g. at least one of the mirrors is warped, tilted or decentered with respect to the other elements
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- G—PHYSICS
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- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/08—Catadioptric systems
- G02B17/0836—Catadioptric systems using more than three curved mirrors
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/08—Catadioptric systems
- G02B17/0836—Catadioptric systems using more than three curved mirrors
- G02B17/0844—Catadioptric systems using more than three curved mirrors off-axis or unobscured systems in which all of the mirrors share a common axis of rotational symmetry
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/08—Catadioptric systems
- G02B17/0836—Catadioptric systems using more than three curved mirrors
- G02B17/0848—Catadioptric systems using more than three curved mirrors off-axis or unobscured systems in which not all of the mirrors share a common axis of rotational symmetry, e.g. at least one of the mirrors is warped, tilted or decentered with respect to the other elements
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/08—Catadioptric systems
- G02B17/0856—Catadioptric systems comprising a refractive element with a reflective surface, the reflection taking place inside the element, e.g. Mangin mirrors
- G02B17/086—Catadioptric systems comprising a refractive element with a reflective surface, the reflection taking place inside the element, e.g. Mangin mirrors wherein the system is made of a single block of optical material, e.g. solid catadioptric systems
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/08—Catadioptric systems
- G02B17/0892—Catadioptric systems specially adapted for the UV
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- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
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- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70225—Optical aspects of catadioptric systems, i.e. comprising reflective and refractive elements
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70275—Multiple projection paths, e.g. array of projection systems, microlens projection systems or tandem projection systems
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70341—Details of immersion lithography aspects, e.g. exposure media or control of immersion liquid supply
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Description
オプトリックシステムが主として前記の種類の高解像度の投影対物レンズの形成に用いられる。
および像視野とを有するカタジオプトリック投影対物レンズが開示されている。前記凹面鏡は、物体を1個の凹面鏡に隣接して配置される中間像上に結像させる第1のカタジオプトリック対物レンズ部分の一部分である。これは、唯一の中間像であり、前記中間像は、第2の純屈折性対物レンズ部分により像面に結像せしめられる。前記物体とカタジオプトリック結像システムの前記像とは、互いに向き合う鏡によって形成される鏡間空間の外側に配置される。2個の凹面鏡と、共通の直線状光軸と、カタジオプトリック結像システムにより形成されるとともに1個の前記凹面鏡の横に配置される1個の中間像とを有する同様のシステムが、米国特許出願第2002/0024741A1号に開示されている。
前記物体面内に設けられる前記物体視野を第1の中間像として結像させる第1の結像サブシステムと;
前記第1の中間像を第2の中間像として結像させる第2の結像サブシステムと;
前記第2の中間像を第3の中間像として結像させる第3の結像サブシステムと;
前記第3の中間像を前記像面上に結像させる第4の結像サブシステムとを、光軸に沿って前記の順序で含み、 前記第2の結像サブシステムが、第1の連続的な鏡面を有する第1の凹面鏡と、前記第1の鏡面に対向する第2の連続的な鏡面を有する第2の凹面鏡とを有する鏡群を含み、
各凹面鏡は、投影ビームの主光線の高さが、投影ビームの周辺光線の高さよりも高くなる程度に、最も近くにある瞳面から投影ビームの伝播方向に遠くに配置されるカタジオプトリック投影対物レンズを提供するものである。
を鏡群入口における所望の角分布の放射に変換するとともに、放射が鏡群に入射して第1の鏡に衝突する入射角を調節することを可能にする。さらにまた、前側レンズ群の設計は、鏡群入口に入射する放射ビームが、隣接する鏡縁部に当たることなく鏡群出口内へと通ることを可能にする所望の断面形状を有するように選択されて、以ってビームの口径食が防がれる。
上に投影される。この軸外物体視野OFの外側視野点の主光線CRの光路は、図1において、ビーム路をたどりやすくするために太線で描かれている。
らして、該鏡群の上流および下流のレンズの正の屈折力の逆の効果を打ち消すように設計される。この目的のために、鏡群MGは、光軸に対して物体視野OFとは反対側に配置される第1の凹面鏡M1と、光軸に対して物体視野側に配置される第2の凹面鏡M2と、これもまた光軸に対して物体視野側に配置される第3の凹面鏡M3と、物体視野とは反対側に配置される第4の凹面鏡M4とによって構成される。有限の軸方向距離(頂点間距離)が、最も物体側の鏡(M4)と光軸の反対側の幾何学的に最も近い鏡(M2)との曲率面の交点間において存在する。鏡群入口MGIは、鏡M2およびM4の互いに向き合う縁部間において形成される。鏡の構成が、光軸に対して垂直な対称面(鏡群平面MGP)に対して鏡面対称であるため、鏡群出口MGOが物体により近い第3の鏡M3と像側により近い第1の鏡M1との間において形成される出口側において、対称条件が得られる。鏡群入口MGIと鏡群出口MGOとのいずれもが光軸を含む。
F)により接近していることを表す。主光線CRが、鏡を示す曲線と交差する位置は、放射ビームが鏡群に対して入射または出射する領域に対応する。光軸に近接する透光は、瞳付近におけるものであり、TPで示される一方で、視野面付近の透光は、TFで示される。
Claims (17)
- 投影対物レンズの物体面内に配置される軸外物体視野を投影対物レンズの像面内に配置される軸外像視野上に結像させる一方で、少なくとも1個の中間像を創出するカタジオプトリック投影対物レンズであって:
前記物体面内に設けられる前記物体視野を第1の中間像として結像させる第1の結像サブシステムと;
前記第1の中間像を第2の中間像として結像させる第2の結像サブシステムと;
前記第2の中間像を第3の中間像として結像させる第3の結像サブシステムと;
前記第3の中間像を前記像面上に結像させる第4の結像サブシステムとを、光軸に沿って前記の順序で含み、
前記第2の結像サブシステムが、第1の連続的な鏡面を有する第1の凹面鏡と、前記第1の鏡面に対向する第2の連続的な鏡面を有する第2の凹面鏡とを有する鏡群を含み、
各凹面鏡は、投影ビームの主光線の高さが、投影ビームの周辺光線の高さよりも高くなる程度に、最も近くにある瞳面から投影ビームの伝播方向に遠くに配置されるカタジオプトリック投影対物レンズ。 - 前記第2の結像サブシステムが、前記物体面に対向する第1の連続的な鏡面を有する前記第1の凹面鏡と、前記第1の鏡面に対向する第2の連続的な鏡面を有する前記第2の凹面鏡とによって構成されるカトプトリック鏡群である請求項1に記載の投影対物レンズ。
- 投影対物レンズの軸方向鏡群長さMGLと軌跡全長TTとの間における長さ比LRが、50%未満であり、ここで、前記鏡群長さが、前記物体面に最も近接する鏡の頂点と前記像面に最も近接する鏡の頂点との間における軸方向距離であり、前記軌跡全長が、物体面と前記像面との間における軸方向距離であり、LR=MGL/TT<30%の条件が満たされる請求項1又は2に記載の投影対物レンズ。
- 前記第2の凹面鏡によって定められる曲率面が光軸に交わる領域として定義される物体側鏡群入口において、前記光軸が前記物体視野から発する放射ビームの断面に含まれる程度に、前記物体側鏡群入口が、投影対物レンズの前記鏡群の直前の瞳面に幾何学的に接近して配置される請求項1〜3のいずれか1項に記載の投影対物レンズ。
- 前記物体面と前記物体側鏡群入口との間にあるレンズ群として定義される、正の屈折力を有する前側レンズ群が、前記物体視野から来る放射を前記鏡群の物体側鏡群入口に向けて収束させていて、前記前側レンズ群が、単一回のフーリエ変換又は奇数回の連続するフーリエ変換を前記物体面と前記物体側鏡群入口との間において行なうフーリエレンズ群として設計され、前記前側レンズ群が、屈折要素のみから構成され、単一回のフーリエ変換を行なう請求項1〜4のいずれか1項に記載の投影対物レンズ。
- 前記前側レンズ群が、投影対物レンズの軌跡全長の40%未満である軸方向長さを有して、軸方向にコンパクトである請求項5に記載の投影対物レンズ。
- 前記第1の凹面鏡によって定められる曲率面が光軸に交わる領域として定義される像側鏡群出口において、前記光軸が前記物体視野から発する放射ビームの断面に含まれる程度に、前記像側鏡群出口が、前記鏡群の直前にある前記瞳面と光学的に共役の前記鏡群の直後にある瞳面に幾何学的に接近して配置される請求項1〜6のいずれか1項に記載の投影対物レンズ。
- 2個および3個の中間像の1個が、前記鏡群内において形成される請求項1〜7のいずれか1項に記載の投影対物レンズ。
- 前記第1の凹面鏡によって定められる曲率面が光軸に交わる領域として定義される像側鏡群出口において、前記光軸が主前記物体視野から発する放射ビームの断面に含まれる程度に、前記像側鏡群出口が、前記鏡群の直後にある瞳面に幾何学的に接近して配置され、前記像側鏡群出口と前記像面との間にあるレンズ群として定義される後側レンズ群が、フーリエレンズ群を含んでいて、前記後側レンズ群の、極小ビーム直径を特徴とするくびれ領域に中間像を形成し、前記中間像の下流のレンズ群が、結像サブシステムとして設計されて前記フーリエレンズ群により形成された前記中間像を像面上に縮小スケールで結像する請求項1〜8のいずれか1項に記載の投影対物レンズ。
- 前記鏡群の前記鏡上の全ての反射部分が、前記光軸の外側に配置される請求項1〜9のいずれか1項に記載の投影対物レンズ。
- カタジオプトリック投影対物レンズが、NA>0.8の像側開口数を有する請求項1〜10のいずれか1項に記載の投影対物レンズ。
- 最後の光学素子と前記像面との間に、1より大きい屈折率を有する浸漬媒質を満たして、カタジオプトリック投影対物レンズが、収差に関して最適化された浸漬用対物レンズとして設計される請求項1〜11のいずれか1項に記載の投影対物レンズ。
- カタジオプトリック投影対物レンズが、浸漬媒質とともに用いられる場合に、NA>1.1の像側開口数を有する請求項1〜12のいずれか1項に記載の投影対物レンズ。
- カタジオプトリック投影対物レンズが、120nm〜260nmの波長範囲内に含まれる紫外光とともに用いられるように構成される請求項1〜13のいずれか1項に記載の投影対物レンズ。
- 投影対物レンズが1つの真っ直ぐな光軸を有するインラインシステムである請求項1〜14のいずれか1項に記載の投影対物レンズ。
- 照明システムとカタジオプトリック投影対物レンズとを有するマイクロリソグラフィーに用いられる投影露光システムであって、前記カタジオプトリック投影対物レンズは、請求項1〜15のいずれか1項に記載のカタジオプトリック投影対物レンズである投影露光システム。
- 半導体機器またはその他の種類の微細機器を製造する方法であって:
所定のパターンを有するマスクを用意する段階と;
所定の波長の紫外光を用いて前記マスクを照明する段階と;
請求項1〜15のいずれか1項に記載のカタジオプトリック投影対物レンズを用いて、投影対物レンズの像面に近接して配置される感光基材上に前記パターンの像を投影する段階とを含む方法。
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US56026704P | 2004-04-08 | 2004-04-08 | |
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PCT/EP2005/003645 WO2005098505A1 (en) | 2004-04-08 | 2005-04-07 | Catadioptric projection objective with mirror group |
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US10503084B2 (en) | 2002-11-12 | 2019-12-10 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
SG121819A1 (en) | 2002-11-12 | 2006-05-26 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
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- 2005-04-07 KR KR1020067023338A patent/KR100991584B1/ko active IP Right Grant
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- 2005-04-07 JP JP2007506724A patent/JP2007532938A/ja active Pending
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- 2005-04-07 US US11/578,101 patent/US8363315B2/en active Active
- 2005-04-07 WO PCT/EP2005/003645 patent/WO2005098505A1/en active Application Filing
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Also Published As
Publication number | Publication date |
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KR20070012460A (ko) | 2007-01-25 |
WO2005098506A1 (en) | 2005-10-20 |
US7446952B2 (en) | 2008-11-04 |
KR100991584B1 (ko) | 2010-11-04 |
JP2007532938A (ja) | 2007-11-15 |
WO2005098504A1 (en) | 2005-10-20 |
EP1733271A1 (en) | 2006-12-20 |
EP1733272A1 (en) | 2006-12-20 |
US20110261444A1 (en) | 2011-10-27 |
WO2005098505A1 (en) | 2005-10-20 |
CN1965259B (zh) | 2011-04-13 |
US7712905B2 (en) | 2010-05-11 |
JP2007532937A (ja) | 2007-11-15 |
US8363315B2 (en) | 2013-01-29 |
US20080002265A1 (en) | 2008-01-03 |
US20080213703A1 (en) | 2008-09-04 |
US20130120728A1 (en) | 2013-05-16 |
CN1965259A (zh) | 2007-05-16 |
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