JP4267614B2 - 積層型セラミック電子部品の製造方法 - Google Patents
積層型セラミック電子部品の製造方法 Download PDFInfo
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- JP4267614B2 JP4267614B2 JP2005288157A JP2005288157A JP4267614B2 JP 4267614 B2 JP4267614 B2 JP 4267614B2 JP 2005288157 A JP2005288157 A JP 2005288157A JP 2005288157 A JP2005288157 A JP 2005288157A JP 4267614 B2 JP4267614 B2 JP 4267614B2
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Description
誘電体層と、内部電極層と、を有する積層型セラミック電子部品を製造する方法であって、
焼成後に前記誘電体層となるグリーンシートを形成する工程と、
導電体ペーストを用いて、前記グリーンシート上に、焼成後に前記内部電極層となる焼成前電極層を所定パターンで形成する工程と、
前記グリーンシートと、前記焼成前電極層と、を次々に積層し、グリーンチップを形成する工程と、
前記グリーンチップを焼成する工程と、を有し、
前記焼成前電極層を形成するための導電体ペーストが、少なくとも導電体粒子と、セラミック粉末から構成される第1共材と、セラミック粉末から構成され、前記第1共材よりも大きな平均粒子径を有する第2共材と、を含み、
前記第1共材の平均粒子径が、前記導電体粒子の平均粒子径の1/20〜1/2の大きさであり、
前記第2共材の平均粒子径が、焼成後の前記内部電極層の平均厚みの1/10〜1/2の大きさであることを特徴とする。
図1は本発明の一実施形態に係る積層セラミックコンデンサの断面図、
図2は本発明の一実施形態に係る積層セラミックコンデンサの拡大断面図、
図3は本発明の一実施形態に係る内部電極層に突き出したセラミック粒子の微細構造を示す図である。
図1に示すように、本発明の一実施形態に係る積層セラミックコンデンサ1は、誘電体層2と内部電極層3とが交互に積層された構成のコンデンサ素体10を有する。このコンデンサ素体10の両側端部には、素体10の内部で交互に配置された内部電極層3と各々導通する一対の外部電極4,4が形成してある。内部電極層3は、各側端面がコンデンサ素体10の対向する2端部の表面に交互に露出するように積層してある。一対の外部電極4,4は、コンデンサ素体10の両端部に形成され、交互に配置された内部電極層3の露出端面に接続されて、コンデンサ回路を構成する。
外部電極の厚さは用途等に応じて適宜決定されればよいが、通常、10〜50μm程度であることが好ましい。
次に、積層セラミックコンデンサ1の製造方法を説明する。本実施形態では、ペーストを用いた通常の印刷法やシート法によりグリーンチップを作製し、これを焼成した後、外部電極を印刷または転写して焼成することにより製造される。以下、製造方法について具体的に説明する。
このようにして製造された本発明の積層セラミックコンデンサは、ハンダ付等によりプリント基板上などに実装され、各種電子機器等に使用される。
まず、誘電体原料を作製するための出発原料として、平均粒子径0.2μmの主成分原料(BaTiO3 )と、副成分原料としてのY2 O3 、V2 O5 、CrO、MgO、SiO2 およびCaOとを準備した。次いで、準備した出発原料をボールミルにより16時間湿式混合することにより、誘電体原料を調製した。
焼成は、昇温速度200℃/時間、保持温度1280〜1320℃、保持時間2時間、冷却速度300℃/時間、加湿したN2 +H2 混合ガス雰囲気(酸素分圧は10−9気圧)の条件で行った。
アニールは、保持温度900℃、温度保持時間9時間、冷却速度300℃/時間、加湿したN2 ガス雰囲気(酸素分圧は10−5気圧)の条件で行った。なお、焼成およびアニールの際の雰囲気ガスの加湿には、水温を35℃としたウェッターを用いた。
得られた各コンデンサ試料について、焼上げ素地を研磨し、積層状態を目視にて観察し、素地クラックの有無を確認した。素地クラックの有無の確認は、10000個のコンデンサ試料について行った。外観検査の結果、10000個のコンデンサ試料に対する、素地クラックが発生した試料の割合を算出することにより、クラック発生率を求めた。本実施例では、クラック発生率が1000ppm以下を良好とした。結果を表1に示す。
静電容量の測定は、デジタルLCRメータを使用して、基準温度25℃において、周波数1kHz、入力信号レベル1.0Vrmsの条件下にて行った。結果を表1に示す。なお、本実施例では、静電容量の測定結果を、導電体ペーストに第2共材を添加しなかった試料である試料番号1の静電容量に対する比率で評価し、−10%以内を良好とした。すなわち、静電容量が「−1%」である試料番号2は、試料番号1と比較して、静電容量が1%低い結果であった。結果を表1に示す。
ショート不良率は、100個のコンデンサ試料を準備し、ショート不良が発生した個数を調べることにより、測定した。具体的には、絶縁抵抗計(HEWLETT PACKARD社製E2377Aマルチメーター)を使用して、抵抗値を測定し、抵抗値が100kΩ以下となったサンプルをショート不良サンプルとし、全測定サンプルに対する、ショート不良サンプルの比率をショート不良率とした。本実施例では、50%以下を良好とした。結果を表1に示す。
耐電圧不良率は、コンデンサ試料の200個について、定格電圧(4.0V)の12倍の直流電圧を3秒印加し、抵抗が104 Ω未満の試料を耐電圧不良と判断し、測定試料に対する、耐電圧不良となった試料の割合を求めることにより、評価した。本実施例では、50%以下を良好とした。結果を表1に示す。
上述の突き出し部分の存在率の測定の場合と同様の方法により、素子本体の切断面について、SEM観察を行った。そして、得られたSEM写真から内部電極層の被覆率を求めた。具体的には、内部電極層に電極途切れ部が全く無いとして仮定した場合に、内部電極層が誘電体層を被覆する理想面積を100%とし、内部電極層が誘電体層を実際に被覆している面積の比率を計算することにより求めた。なお、被覆率は、視野50μm×60μmについて測定したSEM写真10枚を使用して求めた。その結果、試料番号3〜10は、いずれも内部電極層の被覆率が80%以上であった。
表1より、内部電極層用の導電体ペーストとして、第2共材(粒径0.5μmのBaTiO3 )を、Ni粉末100重量部に対して、1.2〜13重量部の範囲で含有させた試料番号3〜10は、いずれもクラック発生率、静電容量、ショート不良率および耐電圧不良率に優れる結果となった。なお、これらの試料について、焼結体の切断面をSEMにより観察したところ、図2に示すような、内部電極層3に突き出したセラミック粒子20が良好に形成されていることが確認できた。
導電体ペースト中に含有させるNi粉末として、平均粒子径が0.1μmのNi粉末を使用するとともに、第2共材の含有量を表2に示すように変化させた以外は、実施例1と同様にして積層セラミックコンデンサ試料を作製し、実施例1と同様にして評価を行った。結果を表2に示す。
導電体ペーストに含有させる第1共材の比率を、表3に示すように変化させた以外は、実施例1の試料番号6と同様にして積層セラミックコンデンサ試料を作製し、実施例1と同様にして評価を行った。結果を表3に示す。
内部電極層用の導電体ペーストの印刷厚みを変化させて、焼成後の内部電極層厚みを表4に示すように変化させた以外は、実施例1の試料番号6と同様にして積層セラミックコンデンサ試料を作製し、実施例1と同様にして評価を行った。結果を表4に示す。
内部電極層用の導電体ペーストに含有させる第2共材として、平均粒子径が0.25μmのBaTiO3 を使用するとともに、内部電極層用の導電体ペーストの印刷厚みを変化させて、焼成後の内部電極層厚みを表5に示すように変化させた以外は、実施例1の試料番号6と同様にして積層セラミックコンデンサ試料を作製し、実施例1と同様にして評価を行った。結果を表5に示す。
10… コンデンサ素体
2… 誘電体層
20… 内部電極層に突き出したセラミック粒子
3… 内部電極層
4… 外部電極
Claims (3)
- 誘電体層と、内部電極層と、を有する積層型セラミック電子部品を製造する方法であって、
焼成後に前記誘電体層となるグリーンシートを形成する工程と、
導電体ペーストを用いて、前記グリーンシート上に、焼成後に前記内部電極層となる焼成前電極層を所定パターンで形成する工程と、
前記グリーンシートと、前記焼成前電極層と、を次々に積層し、グリーンチップを形成する工程と、
前記グリーンチップを焼成する工程と、を有し、
前記焼成前電極層を形成するための導電体ペーストが、少なくとも導電体粒子と、セラミック粉末から構成される第1共材と、セラミック粉末から構成され、前記第1共材よりも大きな平均粒子径を有する第2共材と、を含み、
前記第1共材の平均粒子径が、前記導電体粒子の平均粒子径の1/20〜1/2の大きさであり、
前記第2共材の平均粒子径が、焼成後の前記内部電極層の平均厚みの1/10〜1/2の大きさであり、
焼成後の内部電極層に向けて、突き出たセラミック粒子が存在し、
前記セラミック粒子が前記内部電極層に向けて突き出ている深さが前記内部電極層の厚みに対して10%以上の深さであり、
前記導電体ペースト中における、前記第1共材の含有量が、前記導電体粒子100重量部に対して、20〜25重量部であり、
前記導電体ペースト中における、前記第2共材の含有量が、前記導電体粒子100重量部に対して、1重量部より多く、15重量部未満であることを特徴とする積層型セラミック電子部品の製造方法。 - 前記第2共材の平均粒子径が、0.2〜0.5μmである請求項1に記載の積層型セラミック電子部品の製造方法。
- 前記導電体ペースト中における、前記第1共材の含有量が、前記導電体粒子100重量部に対して、20重量部である請求項1または2に記載の積層型セラミック電子部品の製造方法。
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JP2005288157A JP4267614B2 (ja) | 2005-09-30 | 2005-09-30 | 積層型セラミック電子部品の製造方法 |
US11/527,574 US20070074806A1 (en) | 2005-09-30 | 2006-09-27 | Production method of multilayer ceramic electronic device |
TW095135736A TWI333664B (en) | 2005-09-30 | 2006-09-27 | Production method of multilayer ceramic electronic device |
KR1020060094525A KR100800220B1 (ko) | 2005-09-30 | 2006-09-28 | 적층형 세라믹 전자 부품의 제조 방법 |
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US20110052473A1 (en) * | 2009-08-25 | 2011-03-03 | Tdk Corporation | Method of manufacturing active material |
JP5444944B2 (ja) * | 2009-08-25 | 2014-03-19 | Tdk株式会社 | 活物質及び活物質の製造方法 |
JP5482062B2 (ja) * | 2009-09-29 | 2014-04-23 | Tdk株式会社 | 薄膜コンデンサ及び薄膜コンデンサの製造方法 |
JP5141708B2 (ja) * | 2010-03-29 | 2013-02-13 | Tdk株式会社 | 電子部品および電子部品の製造方法 |
KR101577395B1 (ko) * | 2010-11-24 | 2015-12-16 | 가부시키가이샤 무라타 세이사쿠쇼 | 적층 세라믹 전자부품 및 그 제조방법 |
KR101275426B1 (ko) * | 2010-12-24 | 2013-06-14 | 삼성전기주식회사 | 내부전극용 도전성 페이스트 조성물, 이를 포함하는 적층 세라믹 커패시터 및 이의 제조방법 |
JP5870625B2 (ja) * | 2011-02-28 | 2016-03-01 | Tdk株式会社 | 電極焼結体、積層電子部品、内部電極ペースト、電極焼結体の製造方法、積層電子部品の製造方法 |
KR101275446B1 (ko) * | 2011-12-19 | 2013-06-17 | 삼성전기주식회사 | 내부 전극용 도전성 페이스트 조성물 및 이를 이용한 적층 세라믹 전자 부품의 제조 방법 |
US9076600B2 (en) | 2012-03-27 | 2015-07-07 | Tdk Corporation | Thin film capacitor |
US9030800B2 (en) | 2012-03-29 | 2015-05-12 | Tdk Corporation | Thin film capacitor |
JP5892252B2 (ja) * | 2012-08-07 | 2016-03-23 | 株式会社村田製作所 | 積層セラミックコンデンサおよび積層セラミックコンデンサの製造方法 |
JP5441020B1 (ja) * | 2012-08-29 | 2014-03-12 | Toto株式会社 | 静電チャック |
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KR102041629B1 (ko) * | 2013-02-28 | 2019-11-06 | 삼성전기주식회사 | 적층 세라믹 전자부품 및 이의 제조방법 |
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JP6344184B2 (ja) | 2014-09-30 | 2018-06-20 | 株式会社村田製作所 | セラミック電子部品及びその製造方法 |
JP6520085B2 (ja) | 2014-12-05 | 2019-05-29 | Tdk株式会社 | 薄膜キャパシタ |
US10483038B2 (en) * | 2017-05-16 | 2019-11-19 | Taiyo Yuden Co., Ltd. | Multilayer ceramic capacitor and manufacturing method of multilayer ceramic capacitor |
JP6996867B2 (ja) * | 2017-05-16 | 2022-01-17 | 太陽誘電株式会社 | 積層セラミックコンデンサおよびその製造方法 |
JP7069935B2 (ja) * | 2018-03-27 | 2022-05-18 | Tdk株式会社 | 積層セラミック電子部品 |
JP2019192862A (ja) * | 2018-04-27 | 2019-10-31 | 株式会社村田製作所 | 積層セラミックコンデンサおよびその製造方法 |
KR102107750B1 (ko) | 2018-08-03 | 2020-05-07 | 삼성전기주식회사 | 커패시터 부품 |
JP7493322B2 (ja) * | 2019-11-13 | 2024-05-31 | 株式会社村田製作所 | 積層セラミックコンデンサ |
US11776744B2 (en) * | 2020-05-19 | 2023-10-03 | Samhwa Capacitor Co., Ltd. | Multilayer ceramic capacitor and manufacturing method thereof |
KR102466461B1 (ko) | 2021-04-28 | 2022-11-11 | 삼화콘덴서공업 주식회사 | 적층 세라믹 커패시터의 제조방법 |
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US6855222B2 (en) * | 2002-06-19 | 2005-02-15 | Murata Manufacturing Co., Ltd. | Method for manufacturing laminated multilayer electronic components |
JP4407299B2 (ja) * | 2004-01-30 | 2010-02-03 | Tdk株式会社 | 積層セラミックコンデンサ |
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CN1941233B (zh) | 2010-06-16 |
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