JP3668192B2 - 受動部品の視覚的検査器 - Google Patents

受動部品の視覚的検査器 Download PDF

Info

Publication number
JP3668192B2
JP3668192B2 JP2001585954A JP2001585954A JP3668192B2 JP 3668192 B2 JP3668192 B2 JP 3668192B2 JP 2001585954 A JP2001585954 A JP 2001585954A JP 2001585954 A JP2001585954 A JP 2001585954A JP 3668192 B2 JP3668192 B2 JP 3668192B2
Authority
JP
Japan
Prior art keywords
visual inspection
inspection machine
electronic component
transport vehicle
vehicle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2001585954A
Other languages
English (en)
Japanese (ja)
Other versions
JP2003534122A5 (enExample
JP2003534122A (ja
Inventor
リウ、ドナルド
ブラデン、デンバー
ベラ、ロムロ、ヴィ． ドゥ
ホークス、マルコム、ヴィンセント
ネブレス、ホセ、ヴィラフランカ
Original Assignee
エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド filed Critical エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド
Publication of JP2003534122A publication Critical patent/JP2003534122A/ja
Application granted granted Critical
Publication of JP3668192B2 publication Critical patent/JP3668192B2/ja
Publication of JP2003534122A5 publication Critical patent/JP2003534122A5/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/36—Sorting apparatus characterised by the means used for distribution
    • B07C5/363—Sorting apparatus characterised by the means used for distribution by means of air
    • B07C5/365—Sorting apparatus characterised by the means used for distribution by means of air using a single separation means
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S209/00—Classifying, separating, and assorting solids
    • Y10S209/919—Rotary feed conveyor

Landscapes

  • Specific Conveyance Elements (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Machine Tool Sensing Apparatuses (AREA)
  • Sorting Of Articles (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Details Of Resistors (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
JP2001585954A 2000-05-23 2000-05-23 受動部品の視覚的検査器 Expired - Fee Related JP3668192B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
PCT/US2000/014235 WO2001089725A1 (en) 2000-05-23 2000-05-23 Inspection machine for surface mount passive component
US09/578,787 2000-05-23
US09/578,787 US6294747B1 (en) 1999-06-02 2000-05-23 Inspection machine for surface mount passive component

Publications (3)

Publication Number Publication Date
JP2003534122A JP2003534122A (ja) 2003-11-18
JP3668192B2 true JP3668192B2 (ja) 2005-07-06
JP2003534122A5 JP2003534122A5 (enExample) 2005-12-22

Family

ID=24314309

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001585954A Expired - Fee Related JP3668192B2 (ja) 2000-05-23 2000-05-23 受動部品の視覚的検査器

Country Status (13)

Country Link
US (1) US6294747B1 (enExample)
EP (1) EP1283751B1 (enExample)
JP (1) JP3668192B2 (enExample)
KR (1) KR100478885B1 (enExample)
CN (1) CN1241689C (enExample)
AT (1) ATE361792T1 (enExample)
AU (1) AU2000251587A1 (enExample)
CZ (1) CZ2002662A3 (enExample)
DE (1) DE60034820T2 (enExample)
HU (1) HUP0203331A2 (enExample)
IL (1) IL147702A0 (enExample)
TW (1) TW571102B (enExample)
WO (1) WO2001089725A1 (enExample)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100350855B1 (ko) * 2000-12-29 2002-09-05 주식회사옌트 표면 실장용 칩 검사 장치에서의 칩 선별기
TW577163B (en) * 2001-11-27 2004-02-21 Electro Scient Ind Inc A shadow-creating apparatus
US6756798B2 (en) 2002-03-14 2004-06-29 Ceramic Component Technologies, Inc. Contactor assembly for testing ceramic surface mount devices and other electronic components
US6710611B2 (en) 2002-04-19 2004-03-23 Ceramic Component Technologies, Inc. Test plate for ceramic surface mount devices and other electronic components
JP4243960B2 (ja) * 2003-02-25 2009-03-25 ヤマハファインテック株式会社 ワークの選別装置および選別方法
US7221727B2 (en) * 2003-04-01 2007-05-22 Kingston Technology Corp. All-digital phase modulator/demodulator using multi-phase clocks and digital PLL
US20050139450A1 (en) * 2003-12-30 2005-06-30 International Product Technology, Inc. Electrical part processing unit
US7364043B2 (en) * 2003-12-30 2008-04-29 Zen Voce Manufacturing Pte Ltd Fastener inspection system
US7161346B2 (en) * 2005-05-23 2007-01-09 Electro Scientific Industries, Inc. Method of holding an electronic component in a controlled orientation during parametric testing
KR100713801B1 (ko) * 2006-04-07 2007-05-04 (주)알티에스 듀얼 전자부품 검사 방법
KR100713799B1 (ko) * 2006-04-07 2007-05-04 (주)알티에스 듀얼 전자부품 검사장치
KR100783595B1 (ko) * 2006-04-14 2007-12-10 (주)알티에스 듀얼 전자부품 검사장치에서의 전자부품 분류방법
US7704033B2 (en) * 2006-04-21 2010-04-27 Electro Scientific Industries, Inc. Long axis component loader
JP2009216698A (ja) * 2008-02-07 2009-09-24 Camtek Ltd 対象物の複数の側面を画像化するための装置および方法
WO2010059130A1 (en) * 2008-11-19 2010-05-27 Ust Technology Pte. Ltd. An apparatus and method for inspecting an object
CN101750417B (zh) * 2008-12-12 2012-03-14 鸿富锦精密工业（深圳）有限公司 检测装置
KR101056105B1 (ko) * 2009-01-20 2011-08-10 (주)알티에스 전자부품 검사기의 분류장치
KR101056107B1 (ko) * 2009-01-21 2011-08-10 (주)알티에스 전자부품 검사장치의 분류장치
KR101112193B1 (ko) * 2010-11-09 2012-02-27 박양수 회전형 엘이디 검사 장치
TWI418811B (zh) * 2011-02-14 2013-12-11 Youngtek Electronics Corp 封裝晶片檢測與分類裝置
KR101284528B1 (ko) * 2011-11-08 2013-07-16 대원강업주식회사 기어림 표면 흠 검사장치 및 검사방법
DE102012216163B4 (de) * 2012-01-11 2017-03-09 Robert Bosch Gmbh Vorrichtung zum Zuführen von Kappen mit Überwachungssystem
KR102015572B1 (ko) 2013-10-02 2019-10-22 삼성전자주식회사 실장 장치
CN104375022B (zh) * 2014-10-10 2017-05-03 苏州杰锐思自动化设备有限公司 一种六面测试机台
KR20160090553A (ko) 2015-01-22 2016-08-01 (주)프로옵틱스 다면 검사장치
TWI643800B (zh) * 2018-06-01 2018-12-11 鴻勁精密股份有限公司 Electronic component image capturing device and job classification device thereof
CN112714874A (zh) * 2018-10-15 2021-04-27 伊雷克托科学工业股份有限公司 用于处理组件的系统和方法
CN115372361B (zh) * 2021-05-21 2025-11-25 泰科电子(上海)有限公司 工件多表面检测设备及检测方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2583447A (en) * 1946-08-03 1952-01-22 American Wheelabrator & Equipm Classifier
US3750878A (en) * 1971-11-15 1973-08-07 Dixon K Corp Electrical component testing apparatus
US4105122A (en) * 1976-11-26 1978-08-08 Borden, Inc. Inspecting cans for openings with light
IT1203231B (it) * 1978-03-17 1989-02-15 Fuji Electric Co Ltd Apparecchio per ispezionare l'aseptto esterno di medicine solide
SU1219172A1 (ru) * 1984-08-20 1986-03-23 Производственно-Экспериментальный Завод "Санитас" Научно-Исследовательского Института По Биологическим Испытаниям Химических Соединений Устройство дл размерной сортировки деталей
FR2590811B1 (fr) * 1985-12-03 1989-08-25 Pont A Mousson Machine automatique de controle et de tri de pieces, en particulier cylindriques
JPH0654226B2 (ja) * 1988-03-31 1994-07-20 ティーディーケイ株式会社 チップ状部品の自動外観検査機
JPH02193813A (ja) * 1989-01-20 1990-07-31 Murata Mfg Co Ltd 電子部品の整列・反転方法
FR2654549A1 (fr) * 1989-11-10 1991-05-17 Europ Composants Electron Dispositif de controle et de tri de condensateurs chips.
US6025567A (en) * 1997-11-10 2000-02-15 Brooks; David M. Binning wheel for testing and sorting capacitor chips
JP4039505B2 (ja) * 1999-03-16 2008-01-30 オカノ電機株式会社 外観検査装置

Also Published As

Publication number Publication date
TW571102B (en) 2004-01-11
KR100478885B1 (ko) 2005-03-28
WO2001089725A1 (en) 2001-11-29
KR20020019556A (ko) 2002-03-12
DE60034820D1 (de) 2007-06-21
EP1283751B1 (en) 2007-05-09
AU2000251587A1 (en) 2001-12-03
CZ2002662A3 (cs) 2002-07-17
EP1283751A4 (en) 2004-08-11
IL147702A0 (en) 2002-08-14
DE60034820T2 (de) 2008-01-17
US6294747B1 (en) 2001-09-25
CN1241689C (zh) 2006-02-15
CN1362896A (zh) 2002-08-07
HUP0203331A2 (en) 2003-02-28
EP1283751A1 (en) 2003-02-19
ATE361792T1 (de) 2007-06-15
JP2003534122A (ja) 2003-11-18

Similar Documents

Publication Publication Date Title
JP3668192B2 (ja) 受動部品の視覚的検査器
JP4388286B2 (ja) 微小物体検査装置
TWI402108B (zh) 用於測試和分類電子元件的系統
CN104115004B (zh) 太阳能电池单体的检查装置以及太阳能电池单体的处理装置
KR20060111590A (ko) 패스너 검사 시스템
CN106211737B (zh) 电子零件搬运装置
JP4121319B2 (ja) 多面体検査用フィーダー
JP2008105811A (ja) ワークの外観検査装置
TWI724410B (zh) 用於分類基板的設備，及用於操作此設備的方法
JP5835244B2 (ja) ワーク搬送装置
CN104517877A (zh) 组件装载设备和方法
CN102683166A (zh) 封装芯片检测与分类装置
JP3464990B2 (ja) 微小物体検査装置
JP4264155B2 (ja) 微小物体の外観検査装置
JP6182996B2 (ja) 搬送装置及び搬送ローター
TWI232297B (en) Apparatus and method for screening of works in response to inspection results
CN215785043U (zh) 一种分选合金贴片电阻外观的设备
CN204102921U (zh) Led封装芯片检测装置
CN118077043A (zh) 使用成角度的晶圆工作台和成角度的转台从晶圆分拣晶粒的系统和方法
JP3973116B2 (ja) チップの４面検査装置
CN204102864U (zh) Ic封装芯片检测装置
JPH0623328A (ja) 部品仕分装置
JP4621478B2 (ja) 半導体パッケージの外観検査装置及びその方法
JPH1194763A (ja) 画像処理による欠陥検出方法および装置
CN118385156A (zh) 密封金属垫片全检光学影像筛选机

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20040818

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20041130

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20050214

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20050322

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20050407

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20080415

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20090415

Year of fee payment: 4

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100415

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110415

Year of fee payment: 6

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120415

Year of fee payment: 7

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120415

Year of fee payment: 7

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130415

Year of fee payment: 8

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130415

Year of fee payment: 8

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20140415

Year of fee payment: 9

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees