HUP0203331A2 - Visual inspection machine for surface mount passive component - Google Patents

Visual inspection machine for surface mount passive component Download PDF

Info

Publication number
HUP0203331A2
HUP0203331A2 HU0203331A HUP0203331A HUP0203331A2 HU P0203331 A2 HUP0203331 A2 HU P0203331A2 HU 0203331 A HU0203331 A HU 0203331A HU P0203331 A HUP0203331 A HU P0203331A HU P0203331 A2 HUP0203331 A2 HU P0203331A2
Authority
HU
Hungary
Prior art keywords
wheel
chip
loading
visual inspection
chips
Prior art date
Application number
HU0203331A
Other languages
English (en)
Hungarian (hu)
Inventor
Denver Braden
Vera Romulo V De
Malcolm Vincent Hawkes
Donald Liu
Jose Villafranca Nebres
Original Assignee
Electro Scient Ind
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Electro Scient Ind filed Critical Electro Scient Ind
Publication of HUP0203331A2 publication Critical patent/HUP0203331A2/hu

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B07SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07CPOSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/36Sorting apparatus characterised by the means used for distribution
    • B07C5/363Sorting apparatus characterised by the means used for distribution by means of air
    • B07C5/365Sorting apparatus characterised by the means used for distribution by means of air using a single separation means
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B07SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07CPOSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34Sorting according to other particular properties
    • B07C5/344Sorting according to other particular properties according to electric or electromagnetic properties
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S209/00Classifying, separating, and assorting solids
    • Y10S209/919Rotary feed conveyor

Landscapes

  • Specific Conveyance Elements (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Machine Tool Sensing Apparatuses (AREA)
  • Sorting Of Articles (AREA)
  • Details Of Resistors (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
HU0203331A 2000-05-23 2000-05-23 Visual inspection machine for surface mount passive component HUP0203331A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/578,787 US6294747B1 (en) 1999-06-02 2000-05-23 Inspection machine for surface mount passive component
PCT/US2000/014235 WO2001089725A1 (en) 2000-05-23 2000-05-23 Inspection machine for surface mount passive component

Publications (1)

Publication Number Publication Date
HUP0203331A2 true HUP0203331A2 (en) 2003-02-28

Family

ID=24314309

Family Applications (1)

Application Number Title Priority Date Filing Date
HU0203331A HUP0203331A2 (en) 2000-05-23 2000-05-23 Visual inspection machine for surface mount passive component

Country Status (13)

Country Link
US (1) US6294747B1 (enExample)
EP (1) EP1283751B1 (enExample)
JP (1) JP3668192B2 (enExample)
KR (1) KR100478885B1 (enExample)
CN (1) CN1241689C (enExample)
AT (1) ATE361792T1 (enExample)
AU (1) AU2000251587A1 (enExample)
CZ (1) CZ2002662A3 (enExample)
DE (1) DE60034820T2 (enExample)
HU (1) HUP0203331A2 (enExample)
IL (1) IL147702A0 (enExample)
TW (1) TW571102B (enExample)
WO (1) WO2001089725A1 (enExample)

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KR100350855B1 (ko) * 2000-12-29 2002-09-05 주식회사옌트 표면 실장용 칩 검사 장치에서의 칩 선별기
TW577163B (en) * 2001-11-27 2004-02-21 Electro Scient Ind Inc A shadow-creating apparatus
US6756798B2 (en) 2002-03-14 2004-06-29 Ceramic Component Technologies, Inc. Contactor assembly for testing ceramic surface mount devices and other electronic components
US6710611B2 (en) 2002-04-19 2004-03-23 Ceramic Component Technologies, Inc. Test plate for ceramic surface mount devices and other electronic components
JP4243960B2 (ja) * 2003-02-25 2009-03-25 ヤマハファインテック株式会社 ワークの選別装置および選別方法
US7221727B2 (en) * 2003-04-01 2007-05-22 Kingston Technology Corp. All-digital phase modulator/demodulator using multi-phase clocks and digital PLL
US7364043B2 (en) * 2003-12-30 2008-04-29 Zen Voce Manufacturing Pte Ltd Fastener inspection system
US20050139450A1 (en) * 2003-12-30 2005-06-30 International Product Technology, Inc. Electrical part processing unit
US7161346B2 (en) * 2005-05-23 2007-01-09 Electro Scientific Industries, Inc. Method of holding an electronic component in a controlled orientation during parametric testing
KR100713801B1 (ko) * 2006-04-07 2007-05-04 (주)알티에스 듀얼 전자부품 검사 방법
KR100713799B1 (ko) * 2006-04-07 2007-05-04 (주)알티에스 듀얼 전자부품 검사장치
KR100783595B1 (ko) * 2006-04-14 2007-12-10 (주)알티에스 듀얼 전자부품 검사장치에서의 전자부품 분류방법
US7704033B2 (en) * 2006-04-21 2010-04-27 Electro Scientific Industries, Inc. Long axis component loader
JP2009216698A (ja) * 2008-02-07 2009-09-24 Camtek Ltd 対象物の複数の側面を画像化するための装置および方法
TWI440846B (zh) * 2008-11-19 2014-06-11 Ust Technology Pte Ltd 物件之檢視裝置及方法
CN101750417B (zh) * 2008-12-12 2012-03-14 鸿富锦精密工业(深圳)有限公司 检测装置
KR101056105B1 (ko) * 2009-01-20 2011-08-10 (주)알티에스 전자부품 검사기의 분류장치
KR101056107B1 (ko) * 2009-01-21 2011-08-10 (주)알티에스 전자부품 검사장치의 분류장치
KR101112193B1 (ko) * 2010-11-09 2012-02-27 박양수 회전형 엘이디 검사 장치
TWI418811B (zh) * 2011-02-14 2013-12-11 Youngtek Electronics Corp 封裝晶片檢測與分類裝置
KR101284528B1 (ko) * 2011-11-08 2013-07-16 대원강업주식회사 기어림 표면 흠 검사장치 및 검사방법
DE102012216163B4 (de) * 2012-01-11 2017-03-09 Robert Bosch Gmbh Vorrichtung zum Zuführen von Kappen mit Überwachungssystem
KR102015572B1 (ko) 2013-10-02 2019-10-22 삼성전자주식회사 실장 장치
CN104375022B (zh) * 2014-10-10 2017-05-03 苏州杰锐思自动化设备有限公司 一种六面测试机台
KR20160090553A (ko) 2015-01-22 2016-08-01 (주)프로옵틱스 다면 검사장치
TWI643800B (zh) * 2018-06-01 2018-12-11 鴻勁精密股份有限公司 Electronic component image capturing device and job classification device thereof
KR20210061437A (ko) * 2018-10-15 2021-05-27 일렉트로 싸이언티픽 인더스트리이즈 인코포레이티드 부품 취급에 사용되는 시스템 및 방법
CN115372361B (zh) * 2021-05-21 2025-11-25 泰科电子(上海)有限公司 工件多表面检测设备及检测方法

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US3750878A (en) * 1971-11-15 1973-08-07 Dixon K Corp Electrical component testing apparatus
US4105122A (en) * 1976-11-26 1978-08-08 Borden, Inc. Inspecting cans for openings with light
CH642174A5 (de) * 1978-03-17 1984-03-30 Fuji Electric Co Ltd Einrichtung zur kontrolle des aussehens von festkoerpermedikamenten.
SU1219172A1 (ru) * 1984-08-20 1986-03-23 Производственно-Экспериментальный Завод "Санитас" Научно-Исследовательского Института По Биологическим Испытаниям Химических Соединений Устройство дл размерной сортировки деталей
FR2590811B1 (fr) * 1985-12-03 1989-08-25 Pont A Mousson Machine automatique de controle et de tri de pieces, en particulier cylindriques
JPH0654226B2 (ja) * 1988-03-31 1994-07-20 ティーディーケイ株式会社 チップ状部品の自動外観検査機
JPH02193813A (ja) * 1989-01-20 1990-07-31 Murata Mfg Co Ltd 電子部品の整列・反転方法
FR2654549A1 (fr) * 1989-11-10 1991-05-17 Europ Composants Electron Dispositif de controle et de tri de condensateurs chips.
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JP4039505B2 (ja) * 1999-03-16 2008-01-30 オカノ電機株式会社 外観検査装置

Also Published As

Publication number Publication date
EP1283751B1 (en) 2007-05-09
KR20020019556A (ko) 2002-03-12
DE60034820D1 (de) 2007-06-21
DE60034820T2 (de) 2008-01-17
CN1241689C (zh) 2006-02-15
EP1283751A1 (en) 2003-02-19
KR100478885B1 (ko) 2005-03-28
AU2000251587A1 (en) 2001-12-03
JP2003534122A (ja) 2003-11-18
EP1283751A4 (en) 2004-08-11
ATE361792T1 (de) 2007-06-15
JP3668192B2 (ja) 2005-07-06
CN1362896A (zh) 2002-08-07
WO2001089725A1 (en) 2001-11-29
IL147702A0 (en) 2002-08-14
CZ2002662A3 (cs) 2002-07-17
US6294747B1 (en) 2001-09-25
TW571102B (en) 2004-01-11

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