TW571102B - Inspection machine for surface mount passive component - Google Patents

Inspection machine for surface mount passive component Download PDF

Info

Publication number
TW571102B
TW571102B TW089116901A TW89116901A TW571102B TW 571102 B TW571102 B TW 571102B TW 089116901 A TW089116901 A TW 089116901A TW 89116901 A TW89116901 A TW 89116901A TW 571102 B TW571102 B TW 571102B
Authority
TW
Taiwan
Prior art keywords
wheel
wafer
patent application
visual inspection
cavity
Prior art date
Application number
TW089116901A
Other languages
English (en)
Chinese (zh)
Inventor
Donald Liu
Denver Braden
Vera Romulo V De
Malcolm Vincent Hawkes
Jose Villafranca Nebres
Original Assignee
Electro Scient Ind Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Electro Scient Ind Inc filed Critical Electro Scient Ind Inc
Application granted granted Critical
Publication of TW571102B publication Critical patent/TW571102B/zh

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/36—Sorting apparatus characterised by the means used for distribution
    • B07C5/363—Sorting apparatus characterised by the means used for distribution by means of air
    • B07C5/365—Sorting apparatus characterised by the means used for distribution by means of air using a single separation means
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S209/00—Classifying, separating, and assorting solids
    • Y10S209/919—Rotary feed conveyor

Landscapes

  • Specific Conveyance Elements (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Machine Tool Sensing Apparatuses (AREA)
  • Sorting Of Articles (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Details Of Resistors (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
TW089116901A 2000-05-23 2000-08-21 Inspection machine for surface mount passive component TW571102B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/578,787 US6294747B1 (en) 1999-06-02 2000-05-23 Inspection machine for surface mount passive component

Publications (1)

Publication Number Publication Date
TW571102B true TW571102B (en) 2004-01-11

Family

ID=24314309

Family Applications (1)

Application Number Title Priority Date Filing Date
TW089116901A TW571102B (en) 2000-05-23 2000-08-21 Inspection machine for surface mount passive component

Country Status (13)

Country Link
US (1) US6294747B1 (enExample)
EP (1) EP1283751B1 (enExample)
JP (1) JP3668192B2 (enExample)
KR (1) KR100478885B1 (enExample)
CN (1) CN1241689C (enExample)
AT (1) ATE361792T1 (enExample)
AU (1) AU2000251587A1 (enExample)
CZ (1) CZ2002662A3 (enExample)
DE (1) DE60034820T2 (enExample)
HU (1) HUP0203331A2 (enExample)
IL (1) IL147702A0 (enExample)
TW (1) TW571102B (enExample)
WO (1) WO2001089725A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI643800B (zh) * 2018-06-01 2018-12-11 鴻勁精密股份有限公司 Electronic component image capturing device and job classification device thereof

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100350855B1 (ko) * 2000-12-29 2002-09-05 주식회사옌트 표면 실장용 칩 검사 장치에서의 칩 선별기
TW577163B (en) * 2001-11-27 2004-02-21 Electro Scient Ind Inc A shadow-creating apparatus
US6756798B2 (en) 2002-03-14 2004-06-29 Ceramic Component Technologies, Inc. Contactor assembly for testing ceramic surface mount devices and other electronic components
US6710611B2 (en) 2002-04-19 2004-03-23 Ceramic Component Technologies, Inc. Test plate for ceramic surface mount devices and other electronic components
JP4243960B2 (ja) * 2003-02-25 2009-03-25 ヤマハファインテック株式会社 ワークの選別装置および選別方法
US7221727B2 (en) * 2003-04-01 2007-05-22 Kingston Technology Corp. All-digital phase modulator/demodulator using multi-phase clocks and digital PLL
US20050139450A1 (en) * 2003-12-30 2005-06-30 International Product Technology, Inc. Electrical part processing unit
US7364043B2 (en) * 2003-12-30 2008-04-29 Zen Voce Manufacturing Pte Ltd Fastener inspection system
US7161346B2 (en) * 2005-05-23 2007-01-09 Electro Scientific Industries, Inc. Method of holding an electronic component in a controlled orientation during parametric testing
KR100713801B1 (ko) * 2006-04-07 2007-05-04 (주)알티에스 듀얼 전자부품 검사 방법
KR100713799B1 (ko) * 2006-04-07 2007-05-04 (주)알티에스 듀얼 전자부품 검사장치
KR100783595B1 (ko) * 2006-04-14 2007-12-10 (주)알티에스 듀얼 전자부품 검사장치에서의 전자부품 분류방법
US7704033B2 (en) * 2006-04-21 2010-04-27 Electro Scientific Industries, Inc. Long axis component loader
JP2009216698A (ja) * 2008-02-07 2009-09-24 Camtek Ltd 対象物の複数の側面を画像化するための装置および方法
WO2010059130A1 (en) * 2008-11-19 2010-05-27 Ust Technology Pte. Ltd. An apparatus and method for inspecting an object
CN101750417B (zh) * 2008-12-12 2012-03-14 鸿富锦精密工业（深圳）有限公司 检测装置
KR101056105B1 (ko) * 2009-01-20 2011-08-10 (주)알티에스 전자부품 검사기의 분류장치
KR101056107B1 (ko) * 2009-01-21 2011-08-10 (주)알티에스 전자부품 검사장치의 분류장치
KR101112193B1 (ko) * 2010-11-09 2012-02-27 박양수 회전형 엘이디 검사 장치
TWI418811B (zh) * 2011-02-14 2013-12-11 Youngtek Electronics Corp 封裝晶片檢測與分類裝置
KR101284528B1 (ko) * 2011-11-08 2013-07-16 대원강업주식회사 기어림 표면 흠 검사장치 및 검사방법
DE102012216163B4 (de) * 2012-01-11 2017-03-09 Robert Bosch Gmbh Vorrichtung zum Zuführen von Kappen mit Überwachungssystem
KR102015572B1 (ko) 2013-10-02 2019-10-22 삼성전자주식회사 실장 장치
CN104375022B (zh) * 2014-10-10 2017-05-03 苏州杰锐思自动化设备有限公司 一种六面测试机台
KR20160090553A (ko) 2015-01-22 2016-08-01 (주)프로옵틱스 다면 검사장치
CN112714874A (zh) * 2018-10-15 2021-04-27 伊雷克托科学工业股份有限公司 用于处理组件的系统和方法
CN115372361B (zh) * 2021-05-21 2025-11-25 泰科电子(上海)有限公司 工件多表面检测设备及检测方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2583447A (en) * 1946-08-03 1952-01-22 American Wheelabrator & Equipm Classifier
US3750878A (en) * 1971-11-15 1973-08-07 Dixon K Corp Electrical component testing apparatus
US4105122A (en) * 1976-11-26 1978-08-08 Borden, Inc. Inspecting cans for openings with light
IT1203231B (it) * 1978-03-17 1989-02-15 Fuji Electric Co Ltd Apparecchio per ispezionare l'aseptto esterno di medicine solide
SU1219172A1 (ru) * 1984-08-20 1986-03-23 Производственно-Экспериментальный Завод "Санитас" Научно-Исследовательского Института По Биологическим Испытаниям Химических Соединений Устройство дл размерной сортировки деталей
FR2590811B1 (fr) * 1985-12-03 1989-08-25 Pont A Mousson Machine automatique de controle et de tri de pieces, en particulier cylindriques
JPH0654226B2 (ja) * 1988-03-31 1994-07-20 ティーディーケイ株式会社 チップ状部品の自動外観検査機
JPH02193813A (ja) * 1989-01-20 1990-07-31 Murata Mfg Co Ltd 電子部品の整列・反転方法
FR2654549A1 (fr) * 1989-11-10 1991-05-17 Europ Composants Electron Dispositif de controle et de tri de condensateurs chips.
US6025567A (en) * 1997-11-10 2000-02-15 Brooks; David M. Binning wheel for testing and sorting capacitor chips
JP4039505B2 (ja) * 1999-03-16 2008-01-30 オカノ電機株式会社 外観検査装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI643800B (zh) * 2018-06-01 2018-12-11 鴻勁精密股份有限公司 Electronic component image capturing device and job classification device thereof

Also Published As

Publication number Publication date
KR100478885B1 (ko) 2005-03-28
WO2001089725A1 (en) 2001-11-29
KR20020019556A (ko) 2002-03-12
DE60034820D1 (de) 2007-06-21
EP1283751B1 (en) 2007-05-09
AU2000251587A1 (en) 2001-12-03
CZ2002662A3 (cs) 2002-07-17
EP1283751A4 (en) 2004-08-11
IL147702A0 (en) 2002-08-14
DE60034820T2 (de) 2008-01-17
JP3668192B2 (ja) 2005-07-06
US6294747B1 (en) 2001-09-25
CN1241689C (zh) 2006-02-15
CN1362896A (zh) 2002-08-07
HUP0203331A2 (en) 2003-02-28
EP1283751A1 (en) 2003-02-19
ATE361792T1 (de) 2007-06-15
JP2003534122A (ja) 2003-11-18

Similar Documents

Publication Publication Date Title
TW571102B (en) Inspection machine for surface mount passive component
TW513900B (en) Electronic component handler
JP5268071B2 (ja) 部品の外観検査装置
CN1968876B (zh) 片式部件搬送装置以及外观检查装置
TWI646339B (zh) 具備有三個以上電極的晶片電子零件之檢查分類裝置
TWI260755B (en) System for processing electronic devices
CN202049116U (zh) 封装芯片检测与分类装置
CN111415895A (zh) 一种取片和装片装置以及装片机
TW405198B (en) Probe device and probe needle-grinding process
TWI724410B (zh) 用於分類基板的設備，及用於操作此設備的方法
TWI513521B (zh) Chip - type electronic parts - Characteristic inspection and sorting device
CN102683166B (zh) 封装芯片检测与分类装置
JP5835244B2 (ja) ワーク搬送装置
WO2010071609A2 (en) System and processing of a substrate
KR102124131B1 (ko) Led 모듈 분류 및 포장 시스템
CN101339146B (zh) 自动光学检测装置
JP6182996B2 (ja) 搬送装置及び搬送ローター
KR102132013B1 (ko) 패키지 언로딩 장치
CN217069704U (zh) 一种六面外观分选机
KR100763956B1 (ko) 미세한 전자부품의 외관 검사장치
TW202320202A (zh) 使用斜角晶圓工作台及斜角轉台從晶圓挑揀晶粒之系統和過程
CN101567327B (zh) 裸晶测试机台用缓冲分类装置及该机台
KR102124318B1 (ko) Led 모듈 분류 시스템
CN222507576U (zh) 硅片输送装置
CN221790168U (zh) 一种晶片分选机

Legal Events

Date Code Title Description
GD4A Issue of patent certificate for granted invention patent
MM4A Annulment or lapse of patent due to non-payment of fees