WO2010059130A1 - An apparatus and method for inspecting an object - Google Patents

An apparatus and method for inspecting an object Download PDF

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Publication number
WO2010059130A1
WO2010059130A1 PCT/SG2009/000433 SG2009000433W WO2010059130A1 WO 2010059130 A1 WO2010059130 A1 WO 2010059130A1 SG 2009000433 W SG2009000433 W SG 2009000433W WO 2010059130 A1 WO2010059130 A1 WO 2010059130A1
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WO
WIPO (PCT)
Prior art keywords
capturing
inspection station
objects
images
station
Prior art date
Application number
PCT/SG2009/000433
Other languages
French (fr)
Inventor
Thomas Hei
Tan Meng Yeow
Shailesh Subanna
Desmond Toh
Wilson Chia
Eddie Chang
Aditya Singh
Original Assignee
Ust Technology Pte. Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ust Technology Pte. Ltd. filed Critical Ust Technology Pte. Ltd.
Publication of WO2010059130A1 publication Critical patent/WO2010059130A1/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/251—Colorimeters; Construction thereof
    • G01N21/253—Colorimeters; Construction thereof for batch operation, i.e. multisample apparatus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/13—Moving of cuvettes or solid samples to or from the investigating station
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/062—LED's
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0634—Diffuse illumination

Definitions

  • the invention relates to a method and apparatus for inspecting an object, in particular, by capturing images of multiple surfaces of the object.
  • an object to be inspected is held in position by its top surface and transferred to an inspection station.
  • cameras are used to capture images of the bottom surface and side surface of the object for inspection.
  • the prior art apparatuses for capturing the images of multiple surfaces of the object only one camera is used.
  • the optical path of the different surface images in the prior art apparatuses arediverted to the camera. Only one image can be captured at one time.
  • the optical paths from the various surface images to the camera are different; adjustments have to be made to compensate for the different paths so that the captured images are clear.
  • PCT application number PCT/CH2004/000074 discloses an apparatus having a prism for adjusting the optical path of a side image to be equal to that of the bottom surface image.
  • US patent publication number US 2008/0246958 discloses an apparatus having a prism for adjusting the optical path of a side image to be equal to that of the bottom surface image.
  • the optical path of side images for object of different sizes is different, so different prisms with different reflectivity must be used to capture images of objects of different sizes. There is a need to provide an improved way to inspect the objects without changing prisms for different objects.
  • the invention is an apparatus for capturing the bottom surface image and four different side images of an object.
  • the invention comprising an inspection station, a pick and place assembly for moving the object to the inspection station, one camera positioned at the inspection station for capturing the bottom surface image of the object, two cameras positioned at the inspection station for capturing two different side images of the object, two beamsplitters, each positioned at the inspection station for deflecting the optical path of the each side image of the object to the respective camera, and a lighting source.
  • the pick and place assembly comprises a picker for picking up the object, and an actuator coupled with the picker for rotating it laterally.
  • the coupling for the picker and the actuator is a rack and pinion arrangement.
  • an apparatus for capturing the bottom surface image and four different side images of a plurality of objects comprising an inspection station, a pick and place assembly for moving the object to the inspection station, one camera positioned at the inspection station for capturing the bottom surface image of the object, two cameras positioned at the inspection station for capturing two different side images of the object, two beam-splitters, each positioned at the inspection station for deflecting the optical path of the each side image of the object to the respective camera, and a lighting source.
  • the pick and place assembly comprises a plurality of pickers, each for picking up an object, and an actuator coupled with the pickers for rotating them laterally.
  • the coupling for pickers and actuator is a rack and pinion arrangement.
  • the pick and place pick assembly comprises a plurality of actuators, each coupled with each picker for rotating the pickers laterally.
  • the two cameras are positioned to capture two opposite side images.
  • the two cameras are positioned to capture two adjacent side images.
  • the lighting source is configurable.
  • a method for inspecting an object by capturing the bottom surface image and four different side images of a object at an inspection station comprising the steps of loading the object at an input station, picking the object from the input station, moving the object to the inspection station, capturing a first plurality of images of the object, rotating the object, capturing a second plurality of images, and transferring the inspected object back to the input station.
  • a method for inspecting an object by capturing the bottom surface image and four different side images of a plurality of objects comprising the steps of loading the plurality of objects at an input station, picking the plurality of objects from the input station, moving the objects to an inspection station, capturing a first plurality of images of each object, rotating the objects, capturing a second plurality of images, and transferring the inspected objects back to the input station.
  • Figure 1 is a schematic showing an object for inspection.
  • Figure 2 is a perspective view of one embodiment of the invention.
  • Figure 3 is a side view of the pick and place assembly.
  • Figure 3a is a bottom view of the pick and place assembly.
  • Figure 3b is a expanded view of the part A in Figure 3a.
  • Figure 4 is a side view of the pick and place assembly in combination with one embodiment of the camera assembly.
  • FIG. 5 is a process flowchart of one embodiment of the invention.
  • the invention is an apparatus for inspecting an object 8 as illustrated in Figure 1 by capturing five images.
  • the five images sides are the four different lateral sides 10, 12, 14, 16 and the bottom surface 18.
  • the four different lateral sides can be different parts of one continuous lateral side for an object having circular side.
  • the object is held in position for inspection by its top surface 19.
  • Figure 2 illustrates one preferred embodiment of the apparatus for inspecting a plurality of objects.
  • the apparatus 20 comprises a pick and place assembly 22 for moving the objects 8 arranged in a tray 21 at an input station 23 to an inspection station 24; a camera assembly 26 having three cameras 40, 42, 44 as shown in Figure 4 for capturing the bottom image and four different side images of each object 21.
  • the tray contains objects arranged in a matrix to be inspected and the trays are moved along tracks 28.
  • Figure 3 illustrates the pick and place assembly 22 which comprises an actuator 30 for rotating a plurality of pickers 34.
  • the actuator is a rotator 30 having a shaft with geared portion 32 and a plurality of pickers 34 having gears 38.
  • Each picker picks one object at a time.
  • the rotator and plurality of pickers are coupled in a rack and pinion arrangement.
  • the geared portion 38 is a primary pinion, the geared portion 38 secondary pinions and a rack 36.
  • the rack 36 extends from the primary pinion 32 to the secondary pinions 38. When the primary pinion 32 rotates, it moves the rack 36 which rotates the secondary pinions 34 and the plurality of objects carried by the plurality of pickers.
  • the motion of the rotator may be controlled by an electrical motor (not shown) or pneumatically.
  • the pickers use suction force or vacuum to pick up the objects.
  • a suction force is applied to the pickers to pick up the objects for transferring to and from the inspection station 24.
  • the suction force maintains the position of the objects when the images are being captured and when the pickers are rotated laterally at the inspection station.
  • the camera assembly 26 is illustrated in Figure 4.
  • the camera assembly 26 comprises one camera 40 which is positioned for capturing the bottom image and two cameras, 42, 44, positioned for capturing two side images of the object.
  • the two side cameras can be positioned to capture either opposite or adjacent sides each time. With the cameras fixed in position, no adjustment is required to accommodate different object sizes.
  • Each beam splitter acts as both a mirror and a plain glass simultaneously by reflecting a certain percentage of incident light and transmitting the rest.
  • the apparatus includes a lighting assembly.
  • Light from sources 4A and 4D are transmitted through the beam splitter to provide additional lighting on the side surfaces 10, 12, 14, 16 of the object while allowing the images of the side surface to be reflected to the cameras 42, 44.
  • an indirect light source 4B is provided.
  • the light is reflected by the internal surface 4C of the lighting assembly to the object.
  • sources 4E and 4F provide direct lighting for the side surfaces 10, 12, 14, 16.
  • the lighting sources are configurable to allow for inspection of all possible variations of the object and inspection criteria.
  • the lighting sources are Light Emitting Diode (LED) based diffused light sources.
  • FIG. 5 is a process flow 500 of an embodiment of the invention.
  • the objects are loaded at an input station.
  • the objects are arranged in a tray matrix on the tracks 28 at the input station.
  • the pick and place assembly 22 in Step 504 picks up a plurality of objects and Step 506 moves them to the inspection station 24.
  • Step 508 captures a first plurality of images. In the first set of images, preferably, two side images and the bottom surface image which correspond to the three cameras are captured for each object. Preferably, images for a few objects are captured, then the pick and place assembly moves the pickers for capturing the next few objects until the images of all the objects on the pickers are captured.
  • Step 510 the objects are rotated for the other two side images to be captured.
  • the images are captured in a similar manner as in Step 508.
  • Step 512 the inspected objects are transferred back to the tray matrix on the track at the input station.
  • the apparatus and method of the invention is advantageous over the prior art for not having to change the beam splitters, which are improved prisms, when inspecting different sizes of objects. This minimizes the downtime of the apparatus which is required to tune the optical paths after changing the beam splitters.
  • the throughput of the apparatus is improved by using a plurality of pickers.
  • the number of pickers can be configured to correspond to the number of objects in a row.
  • a row of objects is inspected for each pickup cycle to and from the inspection station.
  • the extra time incurred for turning the pickers using the rack and pinion arrangement is negligible compared to the time saved from inspecting a plurality of objects in each pickup cycle.

Abstract

The invention is an apparatus for capturing the bottom and four different side images of a object at an inspection station comprising a pick and place assembly for moving the object to an inspection station, one camera positioned for capturing the bottom image of the object, two cameras positioned for capturing two side images of the object, two beam-splitters, each positioned for deflecting the optical path of the each side image of the object to the respective camera, and a configurable lighting source.

Description

AN APPARATUS AND METHOD FOR INSPECTING AN OBJECT
FIELD OF THE INVENTION
The invention relates to a method and apparatus for inspecting an object, in particular, by capturing images of multiple surfaces of the object.
BACKGROUND OF THE INVENTION
It is known in the prior art apparatus that an object to be inspected is held in position by its top surface and transferred to an inspection station. At the inspection station, cameras are used to capture images of the bottom surface and side surface of the object for inspection. In the prior art apparatuses for capturing the images of multiple surfaces of the object, only one camera is used. For the camera to capture a clear image of all the surfaces, the optical path of the different surface images in the prior art apparatuses arediverted to the camera. Only one image can be captured at one time. In addition, the optical paths from the various surface images to the camera are different; adjustments have to be made to compensate for the different paths so that the captured images are clear.
In order to capture four different images of a side surface and the bottom surface of an object, four mirrors or prisms are provided to capture the five images each time the object is at the inspection station. However, this requires the object to be singulated or inspected one at a time. There is a need to improve the efficiency of the inspection process.
PCT application number PCT/CH2004/000074 discloses an apparatus having a prism for adjusting the optical path of a side image to be equal to that of the bottom surface image. US patent publication number US 2008/0246958 discloses an apparatus having a prism for adjusting the optical path of a side image to be equal to that of the bottom surface image. However, the optical path of side images for object of different sizes is different, so different prisms with different reflectivity must be used to capture images of objects of different sizes. There is a need to provide an improved way to inspect the objects without changing prisms for different objects.
SUMMARY OF THE INVENTION
According to one embodiment of the invention, the invention is an apparatus for capturing the bottom surface image and four different side images of an object. The invention comprising an inspection station, a pick and place assembly for moving the object to the inspection station, one camera positioned at the inspection station for capturing the bottom surface image of the object, two cameras positioned at the inspection station for capturing two different side images of the object, two beamsplitters, each positioned at the inspection station for deflecting the optical path of the each side image of the object to the respective camera, and a lighting source.
Preferably, the pick and place assembly comprises a picker for picking up the object, and an actuator coupled with the picker for rotating it laterally.
Preferably, the coupling for the picker and the actuator is a rack and pinion arrangement.
In another embodiment, an apparatus for capturing the bottom surface image and four different side images of a plurality of objects. The apparatus comprising an inspection station, a pick and place assembly for moving the object to the inspection station, one camera positioned at the inspection station for capturing the bottom surface image of the object, two cameras positioned at the inspection station for capturing two different side images of the object, two beam-splitters, each positioned at the inspection station for deflecting the optical path of the each side image of the object to the respective camera, and a lighting source.
Preferably, the pick and place assembly comprises a plurality of pickers, each for picking up an object, and an actuator coupled with the pickers for rotating them laterally.
Preferably, the coupling for pickers and actuator is a rack and pinion arrangement. Alternatively, the pick and place pick assembly comprises a plurality of actuators, each coupled with each picker for rotating the pickers laterally.
Preferably, the two cameras are positioned to capture two opposite side images.
Alternatively, the two cameras are positioned to capture two adjacent side images.
Preferably, the lighting source is configurable.
A method for inspecting an object by capturing the bottom surface image and four different side images of a object at an inspection station comprising the steps of loading the object at an input station, picking the object from the input station, moving the object to the inspection station, capturing a first plurality of images of the object, rotating the object, capturing a second plurality of images, and transferring the inspected object back to the input station.
A method for inspecting an object by capturing the bottom surface image and four different side images of a plurality of objects comprising the steps of loading the plurality of objects at an input station, picking the plurality of objects from the input station, moving the objects to an inspection station, capturing a first plurality of images of each object, rotating the objects, capturing a second plurality of images, and transferring the inspected objects back to the input station.
BRIEF DESCRIPTION OF THE DRAWINGS
In order that the present invention might be more fully understood, embodiments of the invention will be described, by way of example only, with reference to the accompanying drawings, in which:
Figure 1 is a schematic showing an object for inspection.
Figure 2 is a perspective view of one embodiment of the invention. Figure 3 is a side view of the pick and place assembly.
Figure 3a is a bottom view of the pick and place assembly.
Figure 3b is a expanded view of the part A in Figure 3a.
Figure 4 is a side view of the pick and place assembly in combination with one embodiment of the camera assembly.
Figure 5 is a process flowchart of one embodiment of the invention.
DETAILED DESCRIPTION OF THE INVENTION
The invention is an apparatus for inspecting an object 8 as illustrated in Figure 1 by capturing five images. The five images sides are the four different lateral sides 10, 12, 14, 16 and the bottom surface 18. The four different lateral sides can be different parts of one continuous lateral side for an object having circular side. The object is held in position for inspection by its top surface 19. Figure 2 illustrates one preferred embodiment of the apparatus for inspecting a plurality of objects. The apparatus 20 comprises a pick and place assembly 22 for moving the objects 8 arranged in a tray 21 at an input station 23 to an inspection station 24; a camera assembly 26 having three cameras 40, 42, 44 as shown in Figure 4 for capturing the bottom image and four different side images of each object 21. The tray contains objects arranged in a matrix to be inspected and the trays are moved along tracks 28.
Figure 3 illustrates the pick and place assembly 22 which comprises an actuator 30 for rotating a plurality of pickers 34. In the preferred embodiment, the actuator is a rotator 30 having a shaft with geared portion 32 and a plurality of pickers 34 having gears 38. Each picker picks one object at a time. The rotator and plurality of pickers are coupled in a rack and pinion arrangement. The geared portion 38 is a primary pinion, the geared portion 38 secondary pinions and a rack 36. The rack 36 extends from the primary pinion 32 to the secondary pinions 38. When the primary pinion 32 rotates, it moves the rack 36 which rotates the secondary pinions 34 and the plurality of objects carried by the plurality of pickers.
The motion of the rotator may be controlled by an electrical motor (not shown) or pneumatically.
Preferably, the pickers use suction force or vacuum to pick up the objects. In a pickup position, a suction force is applied to the pickers to pick up the objects for transferring to and from the inspection station 24. The suction force maintains the position of the objects when the images are being captured and when the pickers are rotated laterally at the inspection station.
The camera assembly 26 is illustrated in Figure 4. The camera assembly 26 comprises one camera 40 which is positioned for capturing the bottom image and two cameras, 42, 44, positioned for capturing two side images of the object. The two side cameras can be positioned to capture either opposite or adjacent sides each time. With the cameras fixed in position, no adjustment is required to accommodate different object sizes.
There are two beam-splitters, 46, 48, each positioned for deflecting the optical path of the each side image of the object to the respective camera. Each beam splitter acts as both a mirror and a plain glass simultaneously by reflecting a certain percentage of incident light and transmitting the rest.
In the preferred embodiment, the apparatus includes a lighting assembly. Light from sources 4A and 4D are transmitted through the beam splitter to provide additional lighting on the side surfaces 10, 12, 14, 16 of the object while allowing the images of the side surface to be reflected to the cameras 42, 44.
Preferably, an indirect light source 4B is provided. The light is reflected by the internal surface 4C of the lighting assembly to the object. In addition, sources 4E and 4F provide direct lighting for the side surfaces 10, 12, 14, 16.
The lighting sources are configurable to allow for inspection of all possible variations of the object and inspection criteria. The lighting sources are Light Emitting Diode (LED) based diffused light sources.
Figure 5 is a process flow 500 of an embodiment of the invention. In Step 502, the objects are loaded at an input station. Preferably, the objects are arranged in a tray matrix on the tracks 28 at the input station. The pick and place assembly 22 in Step 504 picks up a plurality of objects and Step 506 moves them to the inspection station 24. Step 508 captures a first plurality of images. In the first set of images, preferably, two side images and the bottom surface image which correspond to the three cameras are captured for each object. Preferably, images for a few objects are captured, then the pick and place assembly moves the pickers for capturing the next few objects until the images of all the objects on the pickers are captured.
In Step 510, the objects are rotated for the other two side images to be captured. The images are captured in a similar manner as in Step 508. In Step 512, the inspected objects are transferred back to the tray matrix on the track at the input station.
The apparatus and method of the invention is advantageous over the prior art for not having to change the beam splitters, which are improved prisms, when inspecting different sizes of objects. This minimizes the downtime of the apparatus which is required to tune the optical paths after changing the beam splitters.
In addition, the throughput of the apparatus is improved by using a plurality of pickers. For a tray of objects arranged in rows, the number of pickers can be configured to correspond to the number of objects in a row. A row of objects is inspected for each pickup cycle to and from the inspection station. The extra time incurred for turning the pickers using the rack and pinion arrangement is negligible compared to the time saved from inspecting a plurality of objects in each pickup cycle.
It is to be understood that the foregoing description of several preferred embodiments is intended to be purely illustrative of the principles of the invention, rather than exhaustive thereof, and that changes and variations will be apparent to those skilled in the art, and that the present invention is not intended to be limited other than expressly set forth in the following claims.

Claims

We claim
1. An apparatus for capturing the bottom surface image and four different side images of at least one object, comprising :-
(a) an inspection station;
(b) a pick and place assembly for moving the object to the inspection station;
(c) one camera positioned at the inspection station for capturing the bottom image of the object;
(d) two cameras positioned at the inspection station for capturing two side images of the object;
(e) two beam-splitters at the inspection station, each positioned for deflecting the optical path of the each side image of the object to the respective camera; and
(f) a lighting source.
2. An apparatus as claimed in claim 1 wherein the pick and place assembly comprises a picker for picking up an object, and an actuator coupled with the picker for rotating it laterally.
3. An apparatus as claimed in claim 2 wherein the coupling for the picker and the actuator is a rack and pinion arrangement.
4. An apparatus for capturing a bottom surface image and four different side images of a plurality of objects, comprising :-
(a) an inspection station;
(b) a pick and place assembly for moving the object to an inspection station;
(c) one camera positioned at the inspection station for capturing the bottom image of the object;
(d) two cameras positioned at the inspection station for capturing two side images of the object;
(e) two beam-splitters, each positioned at the inspection station for deflecting the optical path of the each side image of the object to the respective camera; and
(f) a lighting source.
5. An apparatus as claimed in claim 4 wherein the pick and place assembly comprises a plurality of pickers, each for picking up an object; and an actuator coupled with the pickers for rotating them laterally.
6. An apparatus as claimed in claim 5 wherein the coupling for pickers and actuator is a rack and pinion arrangement.
7. An apparatus as claimed in any of the preceding claims 4 to 6 wherein the pick and place pick assembly comprises a plurality of actuators, each coupled with each picker for rotating the pickers.
8. An apparatus as claimed in any of the preceding claims wherein the two cameras are positioned to capture two adjacent sides.
9. An apparatus as claimed in any of the preceding claims 1 to 7 wherein the two cameras are positioned to capture two opposite sides.
10. An apparatus as claimed in any of the preceding claims wherein the lighting source is configurable.
11. A method for inspecting the bottom surface image and four different side images of at least one object at an inspection station comprising the steps of :-
(a) loading the object at an input station;
(b) picking the object from the input station;
(c) moving the object to the inspection station;
(d) capturing a first plurality of images of the object,
(d) rotating the object;
(e) capturing a second plurality of images; and
(f) transferring the inspected object back to the input station.
12. A method for inspecting the bottom surface image and four different side images of a plurality of objects comprising the steps of :-
(a) loading the plurality of objects at an input station; (b) picking the plurality of objects from the input station;
(c) moving the objects to an inspection station;
(d) capturing a first plurality of images of multiple objects;
(e) rotating the objects;
(f) capturing a second plurality of images of multiple objects; and
(g) transferring the inspected objects back to the input station.
PCT/SG2009/000433 2008-11-19 2009-11-19 An apparatus and method for inspecting an object WO2010059130A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SG200808585-4 2008-11-19
SG200808585 2008-11-19

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TW201027068A (en) 2010-07-16

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