TWI440846B - An apparatus and method for inspecting an object - Google Patents
An apparatus and method for inspecting an object Download PDFInfo
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- TWI440846B TWI440846B TW98139265A TW98139265A TWI440846B TW I440846 B TWI440846 B TW I440846B TW 98139265 A TW98139265 A TW 98139265A TW 98139265 A TW98139265 A TW 98139265A TW I440846 B TWI440846 B TW I440846B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/251—Colorimeters; Construction thereof
- G01N21/253—Colorimeters; Construction thereof for batch operation, i.e. multisample apparatus
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/13—Moving of cuvettes or solid samples to or from the investigating station
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/062—LED's
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/063—Illuminating optical parts
- G01N2201/0634—Diffuse illumination
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Description
本發明特別係關於一種藉由捕捉物件之多個表面之影像而檢視物件的方法及裝置。 More particularly, the present invention relates to a method and apparatus for viewing an object by capturing images of a plurality of surfaces of the article.
在先前技術中,已知有一種裝置,欲被檢視的物件是以其頂表面固持在適當位置,且被轉送至檢視站。在此檢視站上,使用多個攝影機以捕捉此物件之底表面及側表面之影像以便檢視。在習知用於捕捉物件之多個表面之影像的裝置中,僅使用一個攝影機。為了使攝影機能夠捕捉到所有表面之清楚影像,在習知裝置中的不同表面影像之光學路徑被轉向至攝影機。一次僅能捕捉到一個影像。此外,從不同的表面影像到攝影機的光學路徑也有所不同;必須調整以補償不同的路徑,如此一來,方能使捕捉到的影像變得清楚。 In the prior art, there is known a device in which an object to be viewed is held in place by its top surface and transferred to an inspection station. On this viewing station, multiple cameras are used to capture images of the bottom and side surfaces of the object for viewing. In a conventional device for capturing images of multiple surfaces of an object, only one camera is used. In order for the camera to capture a clear image of all surfaces, the optical path of the different surface images in the conventional device is diverted to the camera. Only one image can be captured at a time. In addition, the optical path from the different surface images to the camera is different; it must be adjusted to compensate for the different paths, so that the captured image becomes clear.
為了捕捉物件之側表面及底表面之四個不同影像,設有四個鏡子或稜鏡,以便在物件每次處於檢視站時能夠捕捉五個影像。然而,如此一來,物件需要單一化(singulated),或一次只能檢視一個物件。因此,需要增進檢視過程的效率。 To capture four different images of the side and bottom surfaces of the object, four mirrors or cymbals are provided to capture five images each time the object is in the viewing station. However, in this case, the object needs to be singulated, or only one object can be viewed at a time. Therefore, there is a need to improve the efficiency of the viewing process.
PCT申請案PCT/CH2004/000074揭示一種裝置,其具有用於調整側面影像之光學路徑以使其等於底表面影像之光學路徑的稜鏡。美國專利公告US 2008/0246958揭示一種裝置,其具有用於調整側面影像之光學路徑以使其等於底表面 影像之光學路徑的稜鏡。然而,由於不同尺寸的物件之側面影像之光學路徑不同,所以,必須使用具有不同反射比的稜鏡,才能夠捕捉到不同尺寸的物件之影像。 PCT Application No. PCT/CH2004/000074 discloses a device having a meandering for adjusting the optical path of the side image to be equal to the optical path of the bottom surface image. US Patent Publication No. US 2008/0246958 discloses a device having an optical path for adjusting a side image to be equal to a bottom surface The optical path of the image. However, since the optical paths of the side images of different sized objects are different, it is necessary to use 稜鏡 with different reflectances to capture images of objects of different sizes.
因此,需要提出一種檢視物件的有效方法,且不必為了不同的物件而改變稜鏡。 Therefore, there is a need to provide an effective method of viewing an object without having to change the flaw for different items.
根據本發明的實施例,本發明是一種用於捕捉物件之底表面影像及四個不同側面影像的裝置。本發明包含:檢視站;拾取及放置組件,用於將物件移動至檢視站;一個攝影機,位於檢視站,以捕捉物件之底表面影像;二個攝影機,位於檢視站,以捕捉物件之兩個不同側面影像;二個分光器,各自位於檢視站,以便將物件之每個側面影像之光學路徑轉向至各別的攝影機;以及,光源。 In accordance with an embodiment of the present invention, the present invention is an apparatus for capturing a bottom surface image of an article and four different side images. The invention comprises: an inspection station; a picking and placing component for moving the object to the inspection station; a camera located at the inspection station to capture the bottom surface image of the object; and two cameras located at the inspection station to capture the object Different side images; two beamsplitters, each located at the inspection station, to divert the optical path of each side of the object to a separate camera; and, the light source.
較佳地,拾取及放置組件包含用於拾取物件的拾取器、及聯接至拾取器而側向旋轉該拾取器的致動器。 Preferably, the pick and place assembly includes a picker for picking up the item, and an actuator coupled to the picker to laterally rotate the picker.
較佳地,拾取器與致動器的聯接是齒條與小齒輪配置。 Preferably, the coupling of the picker to the actuator is a rack and pinion arrangement.
在另一實施例中,提出一種用於捕捉多個物件之底表面影像及四個不同側面影像的裝置。此裝置包含:檢視站;拾取及放置組件,用於將物件移動至檢視站;一個攝影機,位於檢視站,以捕捉物件之底表面影像;二個攝影機,位於檢視站,以捕捉物件之兩個不同側面影像;二個分光器,各自位於檢視站,以便將物件之每個側面影像之光學路徑轉向至各 別的攝影機;以及,光源。 In another embodiment, an apparatus for capturing a bottom surface image of four objects and four different side images is presented. The device comprises: an inspection station; a picking and placing component for moving the object to the inspection station; a camera located at the inspection station to capture the bottom surface image of the object; and two cameras located at the inspection station to capture the object Different side images; two beamsplitters, each located at the inspection station, to steer the optical path of each side of the object to each Other cameras; and, light sources.
較佳地,拾取及放置組件包含各自用於拾取物件的多個拾取器、及聯接至該等拾取器以側向旋轉該等拾取器的致動器。 Preferably, the pick and place assembly includes a plurality of pickers each for picking up the item, and an actuator coupled to the pickers to laterally rotate the pickers.
較佳地,諸拾取器與致動器的聯接是齒條與小齒輪配置。 Preferably, the coupling of the pickers to the actuator is a rack and pinion arrangement.
作為另一替代方式,拾取及放置組件包含多個致動器,而各致動器分別聯接各自的拾取器,以便側向旋轉該等拾取器。 As a further alternative, the pick and place assembly includes a plurality of actuators, and each actuator is coupled to a respective picker to laterally rotate the pickers.
較佳地,二個攝影機被定位成用以捕捉兩個相反的側面影像。 Preferably, the two cameras are positioned to capture two opposite side images.
作為另一替代方式,二個攝影機被定位成捕捉兩個相鄰的側面影像。 As a further alternative, the two cameras are positioned to capture two adjacent side images.
較佳地,該光源是可構形的(configurable)。 Preferably, the light source is configurable.
一種藉由捕捉在檢視站的物件之底表面影像及四個不同側面影像而檢視物件的方法,包含以下步驟:將物件裝載在輸入站;從輸入站拾起物件;移動物件進入檢視站;捕捉物件之第一多數影像;旋轉物件;捕捉第二多數影像;以及,將檢視過的物件轉送回輸入站。 A method for viewing an object by capturing a bottom surface image of the object at the inspection station and four different side images, comprising the steps of: loading the object at the input station; picking up the object from the input station; moving the object into the inspection station; capturing The first majority of the image of the object; rotating the object; capturing the second majority of the image; and forwarding the inspected object back to the input station.
一種藉由捕捉多個物件之底表面影像及四個不同側面影像而檢視物件的方法,包含以下步驟:將多個物件裝載在輸入站;從輸入站拾起多個物件;移動多個物件進入檢視站;捕捉每一物件之第一多數影像;旋轉多個物件;捕捉第二多 數影像;以及,將檢視過的多個物件轉送回輸入站。 A method for viewing an object by capturing a bottom surface image of a plurality of objects and four different side images, comprising the steps of: loading a plurality of objects at an input station; picking up a plurality of objects from the input station; moving the plurality of objects into the object View station; capture the first majority of each object; rotate multiple objects; capture the second most The number of images; and, the plurality of objects that have been inspected are forwarded back to the input station.
為了能夠更清楚理解本發明,以下,將參考附圖以範例方式說明本發明的實施例。 In order to more clearly understand the present invention, the embodiments of the present invention will be described by way of example.
本發明是一種藉由捕捉五個影像而檢視如圖1所示的物件8之裝置。此五個影像面為四個不同的側向面10、12、14、16及底表面18。四個不同的側向面可以是一個具有圓形側面的物件之一個連續側向面之不同部位。此物件以其頂表面19被固持在適當位置,以供檢視。圖2顯示用於檢視多個物件的裝置之較佳實施例。此裝置20包含:拾取及放置組件22,用於將配置在輸入站23之托盤21中的多個物件8移動至檢視站24;攝影機組件26,其具有如圖4所示的三個攝影機40、42、44,以捕捉每個物件8之底面影像及四個不同側面影像。托盤21上含有呈矩陣配置而欲被檢視的多個物件,而且,托盤是沿著軌道28移動。 The present invention is a device for viewing an object 8 as shown in Figure 1 by capturing five images. The five image faces are four different lateral faces 10, 12, 14, 16 and a bottom surface 18. The four different lateral faces may be different portions of a continuous lateral face of an article having a rounded side. This item is held in place by its top surface 19 for inspection. Figure 2 shows a preferred embodiment of an apparatus for viewing a plurality of items. The apparatus 20 includes a pick and place assembly 22 for moving a plurality of items 8 disposed in the tray 21 of the input station 23 to the inspection station 24; a camera assembly 26 having three cameras 40 as shown in FIG. 42, 42 to capture the bottom image of each object 8 and four different side images. The tray 21 has a plurality of articles arranged in a matrix and to be viewed, and the tray is moved along the rails 28.
圖3顯示拾取及放置組件22,其包含一個用於旋轉多個拾取器34的致動器30。在此較佳實施例中,致動器是一個旋轉器30,其具有一個設有齒輪部32的轉軸22a、及具有數個齒輪38的多個拾取器34。每個拾取器一次拾取一個物件。旋轉器及多個拾取器被以齒條及小齒輪配置而聯接。齒輪部32是一個主要小齒輪,而齒輪部38具有次要小齒輪及齒條36。齒條36從主要小齒輪32延伸到次要小齒輪38。 當主要小齒輪32旋轉時,它會使齒條36產生移動,藉此旋轉次要小齒輪38及由多個拾取器所攜帶的多個物件。 FIG. 3 shows a pick and place assembly 22 that includes an actuator 30 for rotating a plurality of pickers 34. In the preferred embodiment, the actuator is a rotator 30 having a shaft 22a provided with a gear portion 32 and a plurality of pickers 34 having a plurality of gears 38. Each picker picks up an object at a time. The rotator and the plurality of pickers are coupled in a rack and pinion configuration. Gear portion 32 is a primary pinion and gear portion 38 has a secondary pinion and rack 36. The rack 36 extends from the primary pinion 32 to the secondary pinion 38. As the primary pinion 32 rotates, it causes the rack 36 to move, thereby rotating the secondary pinion 38 and the plurality of items carried by the plurality of pickers.
旋轉器的動作也可以由電動馬達(未顯示)或氣動方式加以控制。 The action of the rotator can also be controlled by an electric motor (not shown) or pneumatically.
較佳地,拾取器利用吸力或真空方式拾取物件。在拾取位置上,施加吸力到拾取器上以拾取物件,以便將物件來回轉送於檢視站24。當正在捕捉影像且當拾取器在檢視站側向旋轉時,吸引力能夠保持物件的位置。 Preferably, the picker picks up the object by suction or vacuum. In the pick-up position, suction is applied to the picker to pick up the item to rotate the item to the inspection station 24. The attraction can maintain the position of the object while the image is being captured and when the pickup is rotated laterally at the inspection station.
攝影機組件26係顯示於圖4中。攝影機組件26包含一個用以捕捉底面影像的攝影機40、及二個用以捕捉物件之兩側面影像的攝影機42、44。此兩個側面攝影機可以被定位成每次捕捉相反或相鄰的二側面。藉由固定於適當位置的攝影機,則不需要進行調整以適應不同的物件尺寸。 Camera assembly 26 is shown in FIG. The camera assembly 26 includes a camera 40 for capturing images of the bottom surface and two cameras 42, 44 for capturing both side images of the object. The two side cameras can be positioned to capture opposite or adjacent sides each time. With the camera fixed in place, no adjustments are needed to accommodate different object sizes.
設有兩個分光器46、48,每個分光器被定位成將物件之各個側面影像之光學路徑轉向至各別的攝影機。藉由使一定比率的入射光反射回去且使剩餘的入射光穿透過去,每個分光器可同時作為鏡子與平光玻璃。 Two beamsplitters 46, 48 are provided, each of which is positioned to divert the optical path of each side image of the object to a respective camera. Each spectroscope can act as both a mirror and a flat glass by reflecting a certain ratio of incident light back and passing the remaining incident light through.
在此較佳實施例中,此種裝置包括一個發光組件。來自光源4A與4D的光線穿透分光器,以便對物件之側表面10、12、14、16提供額外的光線,同時,允許側表面之影像被反射至攝影機42、44上。 In the preferred embodiment, such a device includes a lighting assembly. Light from sources 4A and 4D penetrates the beam splitter to provide additional light to the side surfaces 10, 12, 14, 16 of the object while allowing images of the side surfaces to be reflected onto the cameras 42, 44.
較佳地,設有一個間接光源4B。光線被發光組件之內表 面4C反射至物件上。此外,光源4E和4F對側表面10、12、14、16提供直接照明。 Preferably, an indirect light source 4B is provided. The light is illuminated by the internal components of the component The face 4C is reflected onto the object. In addition, light sources 4E and 4F provide direct illumination to side surfaces 10, 12, 14, 16.
光源可以被構形成允許檢視物件之所有可能變化、及檢視準則。 The light source can be configured to allow for all possible variations of the viewing object and viewing criteria.
光源為運用擴散光源的發光二極體(LED)。 The light source is a light emitting diode (LED) that uses a diffused light source.
圖5是本發明的實施例之方法的流程圖500。在步驟502中,物件被裝載在輸入站上。較佳地,多個物件排列在輸入站之軌道28上的托盤矩陣上。在步驟504中,拾取及放置組件22拾取多個物件,而在步驟506中,將這些物件移動至檢視站24。在步驟508中,捕捉第一多數影像。在第一組影像中,較佳地,對每個物件均捕捉到對應於三個攝影機的兩個側面影像及底表面影像。較佳地,捕捉到幾個物件之影像,然後,拾取及放置組件移動拾取器,以捕捉接下來的幾個物件,直到捕捉完拾取器上的所有物件之影像為止。 FIG. 5 is a flow chart 500 of a method of an embodiment of the present invention. In step 502, the object is loaded on the input station. Preferably, a plurality of objects are arranged on a tray matrix on the track 28 of the input station. In step 504, the pick and place assembly 22 picks up a plurality of items, and in step 506, moves the items to the viewing station 24. In step 508, the first majority of images are captured. Preferably, in the first set of images, two side images and bottom surface images corresponding to the three cameras are captured for each object. Preferably, an image of several objects is captured, and then the pick and place assembly moves the picker to capture the next few objects until the image of all objects on the picker is captured.
在步驟510中,物件被旋轉,以便捕捉另外兩個側面影像。在步驟512中,這些影像是以類似於步驟508中的方式捕捉。在步驟514中,檢視過的物件被轉送回輸入站之軌道上的托盤矩陣。 In step 510, the object is rotated to capture the other two side images. In step 512, the images are captured in a manner similar to that in step 508. In step 514, the inspected object is forwarded back to the tray matrix on the track of the input station.
與先前技術相比,本發明的裝置與方法之優點在於:當檢視不同尺寸的物件時,並不需要改變分光器(這些分光器是改良的稜鏡)。如此可縮小裝置在改變分光器之後調整光學路徑所需的停工時間。 An advantage of the apparatus and method of the present invention over prior art is that there is no need to change the beamsplitters when viewing objects of different sizes (these beamsplitters are modified crucibles). This reduces the downtime required for the device to adjust the optical path after changing the beam splitter.
此外,藉由使用多個拾取器,可以增進裝置的生產量。對於一盤配置成列的物件來說,拾取器的數量可以被建構成對應於一整列物件的數量。每一次在檢視站來回進行的拾取週期中,可檢測一列物件。相較於在每次拾取週期中檢視多個物件所節省下來的時間,利用齒條與小齒輪配置以轉動拾取器所導致的額外時間,可以忽略不計。 In addition, by using a plurality of pickups, the throughput of the apparatus can be increased. For an array of items arranged in columns, the number of pickers can be constructed to correspond to the number of items in a column. Each time an inspection cycle is performed back and forth between the inspection stations, a list of objects can be detected. The extra time caused by the rack and pinion configuration to rotate the picker can be neglected compared to the time saved by viewing multiple objects in each pick cycle.
要知道的是,上述幾個較佳實施例的說明僅用以描述本發明的原理而已,並非徹底詳細地揭露,而且,對於熟習此項技術者來說,仍可以構思出其他變化與修改。因此,本發明並非侷限於上述說明,而應該由申請專利範圍加以界定。 It is to be understood that the foregoing description of the preferred embodiments of the invention may be Therefore, the present invention is not limited to the above description, but should be defined by the scope of the patent application.
4A‧‧‧光源 4A‧‧‧Light source
4B‧‧‧間接光源 4B‧‧‧Indirect light source
4C‧‧‧內表面 4C‧‧‧ inner surface
4D‧‧‧光源 4D‧‧‧Light source
4E‧‧‧光源 4E‧‧‧Light source
4F‧‧‧光源 4F‧‧‧Light source
8‧‧‧物件 8‧‧‧ objects
10‧‧‧側向面;側表面 10‧‧‧ lateral surface; side surface
12‧‧‧側向面;側表面 12‧‧‧ lateral side; side surface
14‧‧‧側向面;側表面 14‧‧‧ lateral side; side surface
16‧‧‧側向面;側表面 16‧‧‧ lateral side; side surface
18‧‧‧底表面 18‧‧‧ bottom surface
19‧‧‧頂表面 19‧‧‧ top surface
20‧‧‧(檢視)裝置 20‧‧‧ (viewing) device
21‧‧‧托盤 21‧‧‧Tray
22‧‧‧拾取及放置組件 22‧‧‧ Pick and place components
22a‧‧‧轉軸 22a‧‧‧ reel
23‧‧‧輸入站 23‧‧‧ Input station
24‧‧‧檢視站 24‧‧‧ inspection station
26‧‧‧攝影機組件 26‧‧‧ camera components
28‧‧‧軌道 28‧‧‧ Track
30‧‧‧致動器;旋轉器 30‧‧‧Actuator; rotator
32‧‧‧齒輪部;(主要)小齒輪 32‧‧‧ Gears; (mainly) pinion
34‧‧‧拾取器 34‧‧‧ Picker
36‧‧‧齒條 36‧‧‧Racks
38‧‧‧齒輪(部);(次要)小齒輪 38‧‧‧ Gears (parts); (minor) pinions
40‧‧‧攝影機 40‧‧‧ camera
42‧‧‧攝影機 42‧‧‧ camera
44‧‧‧攝影機 44‧‧‧ camera
46‧‧‧分光器 46‧‧‧ Spectroscope
48‧‧‧分光器 48‧‧‧ Spectroscope
圖1是顯示欲檢視的物件的示意圖。 Figure 1 is a schematic view showing an object to be inspected.
圖2是本發明實施例的立體圖。 Figure 2 is a perspective view of an embodiment of the present invention.
圖3是拾取及放置組件的側視圖。 Figure 3 is a side elevational view of the pick and place assembly.
圖3a是拾取及放置組件的仰視圖。 Figure 3a is a bottom plan view of the pick and place assembly.
圖3b是圖3a中之部位A之放大圖。 Figure 3b is an enlarged view of a portion A in Figure 3a.
圖4是拾取及放置組件與攝影機組件之實施例相互組合之側視圖。 4 is a side elevational view of the combination of the pick and place assembly and the camera assembly.
圖5是本發明實施例的方法流程圖。 Figure 5 is a flow chart of a method in accordance with an embodiment of the present invention.
8‧‧‧物件 8‧‧‧ objects
20‧‧‧(檢視)裝置 20‧‧‧ (viewing) device
21‧‧‧托盤 21‧‧‧Tray
22‧‧‧拾取及放置組件 22‧‧‧ Pick and place components
22a‧‧‧轉軸 22a‧‧‧ reel
23‧‧‧輸入站 23‧‧‧ Input station
24‧‧‧檢視站 24‧‧‧ inspection station
26‧‧‧攝影機組件 26‧‧‧ camera components
28‧‧‧軌道 28‧‧‧ Track
Claims (15)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SG200808585 | 2008-11-19 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201027068A TW201027068A (en) | 2010-07-16 |
TWI440846B true TWI440846B (en) | 2014-06-11 |
Family
ID=42198373
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW98139265A TWI440846B (en) | 2008-11-19 | 2009-11-19 | An apparatus and method for inspecting an object |
Country Status (2)
Country | Link |
---|---|
TW (1) | TWI440846B (en) |
WO (1) | WO2010059130A1 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
MY176794A (en) * | 2013-11-20 | 2020-08-21 | Semiconductor Tech & Instruments Pte Ltd | Apparatus and method for selectively inspecting component sidewalls |
TWI544951B (en) * | 2014-06-13 | 2016-08-11 | 財團法人紡織產業綜合研究所 | Acoustic energy inductive device, equipment and method using the same |
CN104677912B (en) * | 2015-01-08 | 2017-09-26 | 北京凌云光技术有限责任公司 | Product appearance detecting system and detection method |
TWI623998B (en) * | 2017-05-05 | 2018-05-11 | Electronic component transfer device and its operation classification device |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
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JPH0799326B2 (en) * | 1986-08-30 | 1995-10-25 | 株式会社マキ製作所 | Appearance inspection method and apparatus for spherical articles |
JPH08285791A (en) * | 1995-04-19 | 1996-11-01 | Ikegami Tsushinki Co Ltd | Visual inspection apparatus for inner surface of deep object |
US6519356B1 (en) * | 1999-08-03 | 2003-02-11 | Intelligent Machine Concepts, L.L.C. | System and method for inspecting cans |
IL147702A0 (en) * | 2000-05-23 | 2002-08-14 | Electro Scient Ind Inc | Inspection machine for surface mount passive component |
JP2004012257A (en) * | 2002-06-06 | 2004-01-15 | Yamaha Fine Technologies Co Ltd | Appearance inspection device and appearance inspection method for work |
IL175455A0 (en) * | 2006-05-07 | 2007-08-19 | Penta I Ltd | A system and a method for imaging, automatic and at once, objects' six-faces |
-
2009
- 2009-11-19 WO PCT/SG2009/000433 patent/WO2010059130A1/en active Application Filing
- 2009-11-19 TW TW98139265A patent/TWI440846B/en active
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WO2010059130A1 (en) | 2010-05-27 |
TW201027068A (en) | 2010-07-16 |
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