IL175455A0 - A system and a method for imaging, automatic and at once, objects' six-faces - Google Patents

A system and a method for imaging, automatic and at once, objects' six-faces

Info

Publication number
IL175455A0
IL175455A0 IL175455A IL17545506A IL175455A0 IL 175455 A0 IL175455 A0 IL 175455A0 IL 175455 A IL175455 A IL 175455A IL 17545506 A IL17545506 A IL 17545506A IL 175455 A0 IL175455 A0 IL 175455A0
Authority
IL
Israel
Prior art keywords
imaging
faces
objects
automatic
once
Prior art date
Application number
IL175455A
Original Assignee
Penta I Ltd
Shy Cohen
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Penta I Ltd, Shy Cohen filed Critical Penta I Ltd
Priority to IL175455A priority Critical patent/IL175455A0/en
Priority to KR1020087029800A priority patent/KR100990728B1/en
Priority to TW096116201A priority patent/TWI454690B/en
Priority to CN200780023926.0A priority patent/CN101529444B/en
Priority to PCT/IL2007/000554 priority patent/WO2007129322A2/en
Publication of IL175455A0 publication Critical patent/IL175455A0/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N1/00—Scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission; Details thereof
    • H04N1/04—Scanning arrangements, i.e. arrangements for the displacement of active reading or reproducing elements relative to the original or reproducing medium, or vice versa
    • H04N1/113—Scanning arrangements, i.e. arrangements for the displacement of active reading or reproducing elements relative to the original or reproducing medium, or vice versa using oscillating or rotating mirrors

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Studio Devices (AREA)
  • Sorting Of Articles (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Medicines Containing Plant Substances (AREA)
IL175455A 2006-05-07 2006-05-07 A system and a method for imaging, automatic and at once, objects' six-faces IL175455A0 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
IL175455A IL175455A0 (en) 2006-05-07 2006-05-07 A system and a method for imaging, automatic and at once, objects' six-faces
KR1020087029800A KR100990728B1 (en) 2006-05-07 2007-05-07 System and method for imaging objects
TW096116201A TWI454690B (en) 2006-05-07 2007-05-07 System and method for imaging objects
CN200780023926.0A CN101529444B (en) 2006-05-07 2007-05-07 System and method for imaging objects
PCT/IL2007/000554 WO2007129322A2 (en) 2006-05-07 2007-05-07 System and method for imaging objects

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IL175455A IL175455A0 (en) 2006-05-07 2006-05-07 A system and a method for imaging, automatic and at once, objects' six-faces

Publications (1)

Publication Number Publication Date
IL175455A0 true IL175455A0 (en) 2007-08-19

Family

ID=38668172

Family Applications (1)

Application Number Title Priority Date Filing Date
IL175455A IL175455A0 (en) 2006-05-07 2006-05-07 A system and a method for imaging, automatic and at once, objects' six-faces

Country Status (5)

Country Link
KR (1) KR100990728B1 (en)
CN (1) CN101529444B (en)
IL (1) IL175455A0 (en)
TW (1) TWI454690B (en)
WO (1) WO2007129322A2 (en)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009216698A (en) * 2008-02-07 2009-09-24 Camtek Ltd Apparatus and method for imaging multiple sides of object
TWI440846B (en) * 2008-11-19 2014-06-11 Ust Technology Pte Ltd An apparatus and method for inspecting an object
WO2010061388A1 (en) * 2008-11-27 2010-06-03 Camtek Ltd. Method and system for imaging multiple sides of objects
US9004284B2 (en) 2009-10-01 2015-04-14 Vitrinite Services, Llc Mineral slurry drying method and system
JP2012040466A (en) * 2010-08-13 2012-03-01 Camtek Ltd System and method of imaging two or more objective side surfaces
US20140010604A1 (en) * 2011-01-10 2014-01-09 Shy Cohen Syetem and method for receiving and sorting objects
US9885671B2 (en) 2014-06-09 2018-02-06 Kla-Tencor Corporation Miniaturized imaging apparatus for wafer edge
US9645097B2 (en) 2014-06-20 2017-05-09 Kla-Tencor Corporation In-line wafer edge inspection, wafer pre-alignment, and wafer cleaning
CN105157601A (en) * 2015-06-10 2015-12-16 北京领邦仪器技术有限公司 Single-camera three-dimensional image measuring instrument
CN108351200B (en) * 2015-12-21 2020-09-22 菲利普莫里斯生产公司 Apparatus and method for acquiring data relating to the dimensions of an elongated object
KR102002683B1 (en) 2017-07-19 2019-10-21 최기원 Glasses Holder
GB2591792A (en) * 2020-02-07 2021-08-11 Blaylock John A device for holding spectacles

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4414749A (en) * 1979-07-02 1983-11-15 Optimetrix Corporation Alignment and exposure system with an indicium of an axis of motion of the system
JPH0587744A (en) * 1991-03-01 1993-04-06 Fujisawa Pharmaceut Co Ltd Method for inspecting surface of article and device used therefor
KR0162331B1 (en) * 1995-02-09 1998-12-15 구자홍 Optical pick-up
JP3647146B2 (en) * 1996-06-20 2005-05-11 松下電器産業株式会社 Electronic component mounting apparatus and electronic component mounting method
JPH10170446A (en) * 1996-12-13 1998-06-26 Nippon Eranko Kk Mechanism for changing attitude of tablet and visual inspection apparatus for tablet
GB0016976D0 (en) * 2000-07-12 2000-08-30 Renishaw Plc Aligning optical components
JP2002202220A (en) * 2000-12-27 2002-07-19 Nikon Corp Position detection method, position detector, optical characteristic measuring method, optical characteristic measuring device, exposure device, and device manufacturing method
US7123765B2 (en) * 2002-07-31 2006-10-17 Kimberly-Clark Worldwide, Inc. Apparatus and method for inspecting articles

Also Published As

Publication number Publication date
TW200804799A (en) 2008-01-16
KR20090008463A (en) 2009-01-21
KR100990728B1 (en) 2010-10-29
WO2007129322A3 (en) 2009-04-30
TWI454690B (en) 2014-10-01
WO2007129322A2 (en) 2007-11-15
CN101529444B (en) 2014-03-12
CN101529444A (en) 2009-09-09

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