KR100478885B1 - 다면 전자부품 검사용 시각적 검사장치 - Google Patents

다면 전자부품 검사용 시각적 검사장치 Download PDF

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Publication number
KR100478885B1
KR100478885B1 KR10-2002-7000911A KR20027000911A KR100478885B1 KR 100478885 B1 KR100478885 B1 KR 100478885B1 KR 20027000911 A KR20027000911 A KR 20027000911A KR 100478885 B1 KR100478885 B1 KR 100478885B1
Authority
KR
South Korea
Prior art keywords
wheel
electronic component
cavity
loader
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR10-2002-7000911A
Other languages
English (en)
Korean (ko)
Other versions
KR20020019556A (ko
Inventor
류도날드
브레이든덴버
드베라로물로브이.
호키스말콤빈센트
네브리스죠세빌라프랑카
Original Assignee
일렉트로 사이언티픽 인더스트리즈, 아이엔씨
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by 일렉트로 사이언티픽 인더스트리즈, 아이엔씨 filed Critical 일렉트로 사이언티픽 인더스트리즈, 아이엔씨
Publication of KR20020019556A publication Critical patent/KR20020019556A/ko
Application granted granted Critical
Publication of KR100478885B1 publication Critical patent/KR100478885B1/ko
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/36—Sorting apparatus characterised by the means used for distribution
    • B07C5/363—Sorting apparatus characterised by the means used for distribution by means of air
    • B07C5/365—Sorting apparatus characterised by the means used for distribution by means of air using a single separation means
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S209/00—Classifying, separating, and assorting solids
    • Y10S209/919—Rotary feed conveyor

Landscapes

  • Specific Conveyance Elements (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Machine Tool Sensing Apparatuses (AREA)
  • Sorting Of Articles (AREA)
  • Details Of Resistors (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
KR10-2002-7000911A 2000-05-23 2000-05-23 다면 전자부품 검사용 시각적 검사장치 Expired - Fee Related KR100478885B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/578,787 2000-05-23
US09/578,787 US6294747B1 (en) 1999-06-02 2000-05-23 Inspection machine for surface mount passive component

Publications (2)

Publication Number Publication Date
KR20020019556A KR20020019556A (ko) 2002-03-12
KR100478885B1 true KR100478885B1 (ko) 2005-03-28

Family

ID=24314309

Family Applications (1)

Application Number Title Priority Date Filing Date
KR10-2002-7000911A Expired - Fee Related KR100478885B1 (ko) 2000-05-23 2000-05-23 다면 전자부품 검사용 시각적 검사장치

Country Status (13)

Country Link
US (1) US6294747B1 (enExample)
EP (1) EP1283751B1 (enExample)
JP (1) JP3668192B2 (enExample)
KR (1) KR100478885B1 (enExample)
CN (1) CN1241689C (enExample)
AT (1) ATE361792T1 (enExample)
AU (1) AU2000251587A1 (enExample)
CZ (1) CZ2002662A3 (enExample)
DE (1) DE60034820T2 (enExample)
HU (1) HUP0203331A2 (enExample)
IL (1) IL147702A0 (enExample)
TW (1) TW571102B (enExample)
WO (1) WO2001089725A1 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101112193B1 (ko) * 2010-11-09 2012-02-27 박양수 회전형 엘이디 검사 장치
KR101284528B1 (ko) * 2011-11-08 2013-07-16 대원강업주식회사 기어림 표면 흠 검사장치 및 검사방법

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* Cited by examiner, † Cited by third party
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KR100350855B1 (ko) * 2000-12-29 2002-09-05 주식회사옌트 표면 실장용 칩 검사 장치에서의 칩 선별기
TW577163B (en) * 2001-11-27 2004-02-21 Electro Scient Ind Inc A shadow-creating apparatus
US6756798B2 (en) 2002-03-14 2004-06-29 Ceramic Component Technologies, Inc. Contactor assembly for testing ceramic surface mount devices and other electronic components
US6710611B2 (en) 2002-04-19 2004-03-23 Ceramic Component Technologies, Inc. Test plate for ceramic surface mount devices and other electronic components
JP4243960B2 (ja) * 2003-02-25 2009-03-25 ヤマハファインテック株式会社 ワークの選別装置および選別方法
US7221727B2 (en) * 2003-04-01 2007-05-22 Kingston Technology Corp. All-digital phase modulator/demodulator using multi-phase clocks and digital PLL
US7364043B2 (en) * 2003-12-30 2008-04-29 Zen Voce Manufacturing Pte Ltd Fastener inspection system
US20050139450A1 (en) * 2003-12-30 2005-06-30 International Product Technology, Inc. Electrical part processing unit
US7161346B2 (en) * 2005-05-23 2007-01-09 Electro Scientific Industries, Inc. Method of holding an electronic component in a controlled orientation during parametric testing
KR100713801B1 (ko) * 2006-04-07 2007-05-04 (주)알티에스 듀얼 전자부품 검사 방법
KR100713799B1 (ko) * 2006-04-07 2007-05-04 (주)알티에스 듀얼 전자부품 검사장치
KR100783595B1 (ko) * 2006-04-14 2007-12-10 (주)알티에스 듀얼 전자부품 검사장치에서의 전자부품 분류방법
US7704033B2 (en) * 2006-04-21 2010-04-27 Electro Scientific Industries, Inc. Long axis component loader
JP2009216698A (ja) * 2008-02-07 2009-09-24 Camtek Ltd 対象物の複数の側面を画像化するための装置および方法
TWI440846B (zh) * 2008-11-19 2014-06-11 Ust Technology Pte Ltd 物件之檢視裝置及方法
CN101750417B (zh) * 2008-12-12 2012-03-14 鸿富锦精密工业（深圳）有限公司 检测装置
KR101056105B1 (ko) * 2009-01-20 2011-08-10 (주)알티에스 전자부품 검사기의 분류장치
KR101056107B1 (ko) * 2009-01-21 2011-08-10 (주)알티에스 전자부품 검사장치의 분류장치
TWI418811B (zh) * 2011-02-14 2013-12-11 Youngtek Electronics Corp 封裝晶片檢測與分類裝置
DE102012216163B4 (de) * 2012-01-11 2017-03-09 Robert Bosch Gmbh Vorrichtung zum Zuführen von Kappen mit Überwachungssystem
KR102015572B1 (ko) 2013-10-02 2019-10-22 삼성전자주식회사 실장 장치
CN104375022B (zh) * 2014-10-10 2017-05-03 苏州杰锐思自动化设备有限公司 一种六面测试机台
KR20160090553A (ko) 2015-01-22 2016-08-01 (주)프로옵틱스 다면 검사장치
TWI643800B (zh) * 2018-06-01 2018-12-11 鴻勁精密股份有限公司 Electronic component image capturing device and job classification device thereof
KR20210061437A (ko) * 2018-10-15 2021-05-27 일렉트로 싸이언티픽 인더스트리이즈 인코포레이티드 부품 취급에 사용되는 시스템 및 방법
CN115372361B (zh) * 2021-05-21 2025-11-25 泰科电子(上海)有限公司 工件多表面检测设备及检测方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2583447A (en) * 1946-08-03 1952-01-22 American Wheelabrator & Equipm Classifier
US3750878A (en) * 1971-11-15 1973-08-07 Dixon K Corp Electrical component testing apparatus
US4105122A (en) * 1976-11-26 1978-08-08 Borden, Inc. Inspecting cans for openings with light
CH642174A5 (de) * 1978-03-17 1984-03-30 Fuji Electric Co Ltd Einrichtung zur kontrolle des aussehens von festkoerpermedikamenten.
SU1219172A1 (ru) * 1984-08-20 1986-03-23 Производственно-Экспериментальный Завод "Санитас" Научно-Исследовательского Института По Биологическим Испытаниям Химических Соединений Устройство дл размерной сортировки деталей
FR2590811B1 (fr) * 1985-12-03 1989-08-25 Pont A Mousson Machine automatique de controle et de tri de pieces, en particulier cylindriques
JPH0654226B2 (ja) * 1988-03-31 1994-07-20 ティーディーケイ株式会社 チップ状部品の自動外観検査機
JPH02193813A (ja) * 1989-01-20 1990-07-31 Murata Mfg Co Ltd 電子部品の整列・反転方法
FR2654549A1 (fr) * 1989-11-10 1991-05-17 Europ Composants Electron Dispositif de controle et de tri de condensateurs chips.
US6025567A (en) * 1997-11-10 2000-02-15 Brooks; David M. Binning wheel for testing and sorting capacitor chips
JP4039505B2 (ja) * 1999-03-16 2008-01-30 オカノ電機株式会社 外観検査装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101112193B1 (ko) * 2010-11-09 2012-02-27 박양수 회전형 엘이디 검사 장치
KR101284528B1 (ko) * 2011-11-08 2013-07-16 대원강업주식회사 기어림 표면 흠 검사장치 및 검사방법

Also Published As

Publication number Publication date
EP1283751B1 (en) 2007-05-09
HUP0203331A2 (en) 2003-02-28
KR20020019556A (ko) 2002-03-12
DE60034820D1 (de) 2007-06-21
DE60034820T2 (de) 2008-01-17
CN1241689C (zh) 2006-02-15
EP1283751A1 (en) 2003-02-19
AU2000251587A1 (en) 2001-12-03
JP2003534122A (ja) 2003-11-18
EP1283751A4 (en) 2004-08-11
ATE361792T1 (de) 2007-06-15
JP3668192B2 (ja) 2005-07-06
CN1362896A (zh) 2002-08-07
WO2001089725A1 (en) 2001-11-29
IL147702A0 (en) 2002-08-14
CZ2002662A3 (cs) 2002-07-17
US6294747B1 (en) 2001-09-25
TW571102B (en) 2004-01-11

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