IL147702A0 - Inspection machine for surface mount passive component - Google Patents

Inspection machine for surface mount passive component

Info

Publication number
IL147702A0
IL147702A0 IL14770200A IL14770200A IL147702A0 IL 147702 A0 IL147702 A0 IL 147702A0 IL 14770200 A IL14770200 A IL 14770200A IL 14770200 A IL14770200 A IL 14770200A IL 147702 A0 IL147702 A0 IL 147702A0
Authority
IL
Israel
Prior art keywords
wheel
inspection
cavity
chips
loader
Prior art date
Application number
IL14770200A
Other languages
English (en)
Original Assignee
Electro Scient Ind Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Electro Scient Ind Inc filed Critical Electro Scient Ind Inc
Publication of IL147702A0 publication Critical patent/IL147702A0/xx

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/36—Sorting apparatus characterised by the means used for distribution
    • B07C5/363—Sorting apparatus characterised by the means used for distribution by means of air
    • B07C5/365—Sorting apparatus characterised by the means used for distribution by means of air using a single separation means
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S209/00—Classifying, separating, and assorting solids
    • Y10S209/919—Rotary feed conveyor
IL14770200A 2000-05-23 2000-05-23 Inspection machine for surface mount passive component IL147702A0 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
PCT/US2000/014235 WO2001089725A1 (en) 2000-05-23 2000-05-23 Inspection machine for surface mount passive component
US09/578,787 US6294747B1 (en) 1999-06-02 2000-05-23 Inspection machine for surface mount passive component

Publications (1)

Publication Number Publication Date
IL147702A0 true IL147702A0 (en) 2002-08-14

Family

ID=24314309

Family Applications (1)

Application Number Title Priority Date Filing Date
IL14770200A IL147702A0 (en) 2000-05-23 2000-05-23 Inspection machine for surface mount passive component

Country Status (13)

Country Link
US (1) US6294747B1 (xx)
EP (1) EP1283751B1 (xx)
JP (1) JP3668192B2 (xx)
KR (1) KR100478885B1 (xx)
CN (1) CN1241689C (xx)
AT (1) ATE361792T1 (xx)
AU (1) AU2000251587A1 (xx)
CZ (1) CZ2002662A3 (xx)
DE (1) DE60034820T2 (xx)
HU (1) HUP0203331A2 (xx)
IL (1) IL147702A0 (xx)
TW (1) TW571102B (xx)
WO (1) WO2001089725A1 (xx)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100350855B1 (ko) * 2000-12-29 2002-09-05 주식회사옌트 표면 실장용 칩 검사 장치에서의 칩 선별기
TW577163B (en) * 2001-11-27 2004-02-21 Electro Scient Ind Inc A shadow-creating apparatus
US6756798B2 (en) 2002-03-14 2004-06-29 Ceramic Component Technologies, Inc. Contactor assembly for testing ceramic surface mount devices and other electronic components
US6710611B2 (en) 2002-04-19 2004-03-23 Ceramic Component Technologies, Inc. Test plate for ceramic surface mount devices and other electronic components
JP4243960B2 (ja) * 2003-02-25 2009-03-25 ヤマハファインテック株式会社 ワークの選別装置および選別方法
US7221727B2 (en) * 2003-04-01 2007-05-22 Kingston Technology Corp. All-digital phase modulator/demodulator using multi-phase clocks and digital PLL
US20050139450A1 (en) * 2003-12-30 2005-06-30 International Product Technology, Inc. Electrical part processing unit
US7364043B2 (en) * 2003-12-30 2008-04-29 Zen Voce Manufacturing Pte Ltd Fastener inspection system
US7161346B2 (en) * 2005-05-23 2007-01-09 Electro Scientific Industries, Inc. Method of holding an electronic component in a controlled orientation during parametric testing
KR100713801B1 (ko) * 2006-04-07 2007-05-04 (주)알티에스 듀얼 전자부품 검사 방법
KR100713799B1 (ko) * 2006-04-07 2007-05-04 (주)알티에스 듀얼 전자부품 검사장치
KR100783595B1 (ko) * 2006-04-14 2007-12-10 (주)알티에스 듀얼 전자부품 검사장치에서의 전자부품 분류방법
US7704033B2 (en) * 2006-04-21 2010-04-27 Electro Scientific Industries, Inc. Long axis component loader
JP2009216698A (ja) * 2008-02-07 2009-09-24 Camtek Ltd 対象物の複数の側面を画像化するための装置および方法
WO2010059130A1 (en) * 2008-11-19 2010-05-27 Ust Technology Pte. Ltd. An apparatus and method for inspecting an object
CN101750417B (zh) * 2008-12-12 2012-03-14 鸿富锦精密工业（深圳）有限公司 检测装置
KR101056105B1 (ko) * 2009-01-20 2011-08-10 (주)알티에스 전자부품 검사기의 분류장치
KR101056107B1 (ko) * 2009-01-21 2011-08-10 (주)알티에스 전자부품 검사장치의 분류장치
KR101112193B1 (ko) * 2010-11-09 2012-02-27 박양수 회전형 엘이디 검사 장치
TWI418811B (zh) * 2011-02-14 2013-12-11 Youngtek Electronics Corp 封裝晶片檢測與分類裝置
KR101284528B1 (ko) * 2011-11-08 2013-07-16 대원강업주식회사 기어림 표면 흠 검사장치 및 검사방법
DE102012216163B4 (de) * 2012-01-11 2017-03-09 Robert Bosch Gmbh Vorrichtung zum Zuführen von Kappen mit Überwachungssystem
KR102015572B1 (ko) 2013-10-02 2019-10-22 삼성전자주식회사 실장 장치
CN104375022B (zh) * 2014-10-10 2017-05-03 苏州杰锐思自动化设备有限公司 一种六面测试机台
KR20160090553A (ko) 2015-01-22 2016-08-01 (주)프로옵틱스 다면 검사장치
TWI643800B (zh) * 2018-06-01 2018-12-11 鴻勁精密股份有限公司 Electronic component image capturing device and job classification device thereof
JP2022508708A (ja) * 2018-10-15 2022-01-19 エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド 部品を取り扱う際に使用されるシステム及び方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2583447A (en) * 1946-08-03 1952-01-22 American Wheelabrator & Equipm Classifier
US3750878A (en) * 1971-11-15 1973-08-07 Dixon K Corp Electrical component testing apparatus
US4105122A (en) * 1976-11-26 1978-08-08 Borden, Inc. Inspecting cans for openings with light
DE2910494A1 (de) * 1978-03-17 1979-10-11 Fuji Electric Co Ltd Vorrichtung zur pruefung des aussehens bzw. zustands von festen medikamenten
SU1219172A1 (ru) * 1984-08-20 1986-03-23 Производственно-Экспериментальный Завод "Санитас" Научно-Исследовательского Института По Биологическим Испытаниям Химических Соединений Устройство дл размерной сортировки деталей
FR2590811B1 (fr) * 1985-12-03 1989-08-25 Pont A Mousson Machine automatique de controle et de tri de pieces, en particulier cylindriques
JPH0654226B2 (ja) * 1988-03-31 1994-07-20 ティーディーケイ株式会社 チップ状部品の自動外観検査機
JPH02193813A (ja) * 1989-01-20 1990-07-31 Murata Mfg Co Ltd 電子部品の整列・反転方法
FR2654549A1 (fr) * 1989-11-10 1991-05-17 Europ Composants Electron Dispositif de controle et de tri de condensateurs chips.
US6025567A (en) * 1997-11-10 2000-02-15 Brooks; David M. Binning wheel for testing and sorting capacitor chips
JP4039505B2 (ja) * 1999-03-16 2008-01-30 オカノ電機株式会社 外観検査装置

Also Published As

Publication number Publication date
CZ2002662A3 (cs) 2002-07-17
EP1283751A1 (en) 2003-02-19
DE60034820T2 (de) 2008-01-17
US6294747B1 (en) 2001-09-25
DE60034820D1 (de) 2007-06-21
EP1283751B1 (en) 2007-05-09
EP1283751A4 (en) 2004-08-11
ATE361792T1 (de) 2007-06-15
WO2001089725A1 (en) 2001-11-29
KR100478885B1 (ko) 2005-03-28
JP3668192B2 (ja) 2005-07-06
CN1241689C (zh) 2006-02-15
JP2003534122A (ja) 2003-11-18
HUP0203331A2 (en) 2003-02-28
KR20020019556A (ko) 2002-03-12
CN1362896A (zh) 2002-08-07
TW571102B (en) 2004-01-11
AU2000251587A1 (en) 2001-12-03

Similar Documents

Publication Publication Date Title
IL147702A0 (en) Inspection machine for surface mount passive component
TWI246981B (en) Tray for electronic components
WO2007087247A3 (en) Wafer level chip packaging
US20060054532A1 (en) Storing tray and storing device
CN103038872A (zh) 用于电子器件的可剥离混合托盘系统
KR20180048922A (ko) 캐리어 테이프
CN211782299U (zh) 一种冻干托盘
JP3247662B2 (ja) キャリアテープ
KR101935408B1 (ko) 듀얼 방식 칩 정렬 장치
JP2004345667A (ja) 電子部品搬送用キャリアテープ
JP2005014937A (ja) 半導体チップトレイ
JPH0539104Y2 (xx)
JP2005212797A (ja) 半導体チップ搬送用トレイ
JPH08244877A (ja) 半導体素子の搬送及び保管用トレイ
CN210311274U (zh) 一种预防擦花板损的线路板转运盘
JPH11198988A (ja) 収納具
US6844617B2 (en) Packaging mold with electrostatic discharge protection
JP2009094538A (ja) 半導体装置の搬送方法および半導体装置の製造方法
KR101812192B1 (ko) 반도체 패키지 적재 장치
JP6575925B2 (ja) ガラス板トレイ
US20030230512A1 (en) Chip tray
JP2780210B2 (ja) 集積回路の保持治具
JPH0722547U (ja) チップトレー
JP2016134525A (ja) 移載装置および移載方法
JP2000040736A (ja) ウェハ収納装置