AU2000251587A1 - Inspection machine for surface mount passive component - Google Patents

Inspection machine for surface mount passive component

Info

Publication number
AU2000251587A1
AU2000251587A1 AU2000251587A AU5158700A AU2000251587A1 AU 2000251587 A1 AU2000251587 A1 AU 2000251587A1 AU 2000251587 A AU2000251587 A AU 2000251587A AU 5158700 A AU5158700 A AU 5158700A AU 2000251587 A1 AU2000251587 A1 AU 2000251587A1
Authority
AU
Australia
Prior art keywords
wheel
inspection
cavity
chips
loader
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2000251587A
Other languages
English (en)
Inventor
Denver Braden
Romulo V. De Vera
Malcolm Vincent Hawkes
Donald Liu
Jose Villafranca Nebres
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Electro Scientific Industries Inc
Original Assignee
Electro Scientific Industries Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Electro Scientific Industries Inc filed Critical Electro Scientific Industries Inc
Publication of AU2000251587A1 publication Critical patent/AU2000251587A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/36—Sorting apparatus characterised by the means used for distribution
    • B07C5/363—Sorting apparatus characterised by the means used for distribution by means of air
    • B07C5/365—Sorting apparatus characterised by the means used for distribution by means of air using a single separation means
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S209/00—Classifying, separating, and assorting solids
    • Y10S209/919—Rotary feed conveyor

Landscapes

  • Specific Conveyance Elements (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Machine Tool Sensing Apparatuses (AREA)
  • Sorting Of Articles (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Details Of Resistors (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
AU2000251587A 2000-05-23 2000-05-23 Inspection machine for surface mount passive component Abandoned AU2000251587A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/578,787 US6294747B1 (en) 1999-06-02 2000-05-23 Inspection machine for surface mount passive component
US09578787 2000-05-23
PCT/US2000/014235 WO2001089725A1 (en) 2000-05-23 2000-05-23 Inspection machine for surface mount passive component

Publications (1)

Publication Number Publication Date
AU2000251587A1 true AU2000251587A1 (en) 2001-12-03

Family

ID=24314309

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2000251587A Abandoned AU2000251587A1 (en) 2000-05-23 2000-05-23 Inspection machine for surface mount passive component

Country Status (13)

Country Link
US (1) US6294747B1 (enExample)
EP (1) EP1283751B1 (enExample)
JP (1) JP3668192B2 (enExample)
KR (1) KR100478885B1 (enExample)
CN (1) CN1241689C (enExample)
AT (1) ATE361792T1 (enExample)
AU (1) AU2000251587A1 (enExample)
CZ (1) CZ2002662A3 (enExample)
DE (1) DE60034820T2 (enExample)
HU (1) HUP0203331A2 (enExample)
IL (1) IL147702A0 (enExample)
TW (1) TW571102B (enExample)
WO (1) WO2001089725A1 (enExample)

Families Citing this family (28)

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Publication number Priority date Publication date Assignee Title
KR100350855B1 (ko) * 2000-12-29 2002-09-05 주식회사옌트 표면 실장용 칩 검사 장치에서의 칩 선별기
TW577163B (en) * 2001-11-27 2004-02-21 Electro Scient Ind Inc A shadow-creating apparatus
US6756798B2 (en) 2002-03-14 2004-06-29 Ceramic Component Technologies, Inc. Contactor assembly for testing ceramic surface mount devices and other electronic components
US6710611B2 (en) 2002-04-19 2004-03-23 Ceramic Component Technologies, Inc. Test plate for ceramic surface mount devices and other electronic components
JP4243960B2 (ja) * 2003-02-25 2009-03-25 ヤマハファインテック株式会社 ワークの選別装置および選別方法
US7221727B2 (en) * 2003-04-01 2007-05-22 Kingston Technology Corp. All-digital phase modulator/demodulator using multi-phase clocks and digital PLL
US7364043B2 (en) * 2003-12-30 2008-04-29 Zen Voce Manufacturing Pte Ltd Fastener inspection system
US20050139450A1 (en) * 2003-12-30 2005-06-30 International Product Technology, Inc. Electrical part processing unit
US7161346B2 (en) * 2005-05-23 2007-01-09 Electro Scientific Industries, Inc. Method of holding an electronic component in a controlled orientation during parametric testing
KR100713799B1 (ko) * 2006-04-07 2007-05-04 (주)알티에스 듀얼 전자부품 검사장치
KR100713801B1 (ko) * 2006-04-07 2007-05-04 (주)알티에스 듀얼 전자부품 검사 방법
KR100783595B1 (ko) * 2006-04-14 2007-12-10 (주)알티에스 듀얼 전자부품 검사장치에서의 전자부품 분류방법
US7704033B2 (en) * 2006-04-21 2010-04-27 Electro Scientific Industries, Inc. Long axis component loader
JP2009216698A (ja) * 2008-02-07 2009-09-24 Camtek Ltd 対象物の複数の側面を画像化するための装置および方法
TWI440846B (zh) * 2008-11-19 2014-06-11 Ust Technology Pte Ltd 物件之檢視裝置及方法
CN101750417B (zh) * 2008-12-12 2012-03-14 鸿富锦精密工业（深圳）有限公司 检测装置
KR101056105B1 (ko) * 2009-01-20 2011-08-10 (주)알티에스 전자부품 검사기의 분류장치
KR101056107B1 (ko) * 2009-01-21 2011-08-10 (주)알티에스 전자부품 검사장치의 분류장치
KR101112193B1 (ko) * 2010-11-09 2012-02-27 박양수 회전형 엘이디 검사 장치
TWI418811B (zh) * 2011-02-14 2013-12-11 Youngtek Electronics Corp 封裝晶片檢測與分類裝置
KR101284528B1 (ko) * 2011-11-08 2013-07-16 대원강업주식회사 기어림 표면 흠 검사장치 및 검사방법
DE102012216163B4 (de) * 2012-01-11 2017-03-09 Robert Bosch Gmbh Vorrichtung zum Zuführen von Kappen mit Überwachungssystem
KR102015572B1 (ko) 2013-10-02 2019-10-22 삼성전자주식회사 실장 장치
CN104375022B (zh) * 2014-10-10 2017-05-03 苏州杰锐思自动化设备有限公司 一种六面测试机台
KR20160090553A (ko) 2015-01-22 2016-08-01 (주)프로옵틱스 다면 검사장치
TWI643800B (zh) * 2018-06-01 2018-12-11 鴻勁精密股份有限公司 Electronic component image capturing device and job classification device thereof
WO2020081462A1 (en) * 2018-10-15 2020-04-23 Electro Scientific Industries, Inc. Systems and methods for use in handling components
CN115372361B (zh) * 2021-05-21 2025-11-25 泰科电子(上海)有限公司 工件多表面检测设备及检测方法

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US2583447A (en) * 1946-08-03 1952-01-22 American Wheelabrator & Equipm Classifier
US3750878A (en) * 1971-11-15 1973-08-07 Dixon K Corp Electrical component testing apparatus
US4105122A (en) * 1976-11-26 1978-08-08 Borden, Inc. Inspecting cans for openings with light
IT1203231B (it) * 1978-03-17 1989-02-15 Fuji Electric Co Ltd Apparecchio per ispezionare l'aseptto esterno di medicine solide
SU1219172A1 (ru) * 1984-08-20 1986-03-23 Производственно-Экспериментальный Завод "Санитас" Научно-Исследовательского Института По Биологическим Испытаниям Химических Соединений Устройство дл размерной сортировки деталей
FR2590811B1 (fr) * 1985-12-03 1989-08-25 Pont A Mousson Machine automatique de controle et de tri de pieces, en particulier cylindriques
JPH0654226B2 (ja) * 1988-03-31 1994-07-20 ティーディーケイ株式会社 チップ状部品の自動外観検査機
JPH02193813A (ja) * 1989-01-20 1990-07-31 Murata Mfg Co Ltd 電子部品の整列・反転方法
FR2654549A1 (fr) * 1989-11-10 1991-05-17 Europ Composants Electron Dispositif de controle et de tri de condensateurs chips.
US6025567A (en) * 1997-11-10 2000-02-15 Brooks; David M. Binning wheel for testing and sorting capacitor chips
JP4039505B2 (ja) * 1999-03-16 2008-01-30 オカノ電機株式会社 外観検査装置

Also Published As

Publication number Publication date
DE60034820T2 (de) 2008-01-17
IL147702A0 (en) 2002-08-14
EP1283751A4 (en) 2004-08-11
CZ2002662A3 (cs) 2002-07-17
EP1283751A1 (en) 2003-02-19
CN1362896A (zh) 2002-08-07
EP1283751B1 (en) 2007-05-09
WO2001089725A1 (en) 2001-11-29
JP3668192B2 (ja) 2005-07-06
KR20020019556A (ko) 2002-03-12
US6294747B1 (en) 2001-09-25
HUP0203331A2 (en) 2003-02-28
ATE361792T1 (de) 2007-06-15
JP2003534122A (ja) 2003-11-18
DE60034820D1 (de) 2007-06-21
TW571102B (en) 2004-01-11
KR100478885B1 (ko) 2005-03-28
CN1241689C (zh) 2006-02-15

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