CZ2002662A3 - Zařízení pro vizuální kontrolu - Google Patents
Zařízení pro vizuální kontrolu Download PDFInfo
- Publication number
- CZ2002662A3 CZ2002662A3 CZ2002662A CZ2002662A CZ2002662A3 CZ 2002662 A3 CZ2002662 A3 CZ 2002662A3 CZ 2002662 A CZ2002662 A CZ 2002662A CZ 2002662 A CZ2002662 A CZ 2002662A CZ 2002662 A3 CZ2002662 A3 CZ 2002662A3
- Authority
- CZ
- Czechia
- Prior art keywords
- wheel
- chip
- visual inspection
- outer edge
- edge
- Prior art date
Links
- 238000011179 visual inspection Methods 0.000 title claims abstract description 60
- 238000012546 transfer Methods 0.000 claims abstract description 33
- 238000007689 inspection Methods 0.000 claims abstract description 25
- 230000005540 biological transmission Effects 0.000 claims description 66
- 239000003990 capacitor Substances 0.000 claims description 13
- 238000012544 monitoring process Methods 0.000 claims description 13
- 208000002925 dental caries Diseases 0.000 claims description 5
- 230000033001 locomotion Effects 0.000 claims description 5
- 230000002093 peripheral effect Effects 0.000 claims description 4
- 241001653154 Perigea Species 0.000 claims description 2
- 238000003780 insertion Methods 0.000 claims 3
- 230000037431 insertion Effects 0.000 claims 3
- 238000001514 detection method Methods 0.000 claims 2
- 239000012141 concentrate Substances 0.000 claims 1
- 230000002265 prevention Effects 0.000 claims 1
- 238000012360 testing method Methods 0.000 description 19
- 230000000007 visual effect Effects 0.000 description 6
- 239000000919 ceramic Substances 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 230000000903 blocking effect Effects 0.000 description 3
- 230000007547 defect Effects 0.000 description 3
- 230000002950 deficient Effects 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 239000004698 Polyethylene Substances 0.000 description 2
- 238000013459 approach Methods 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000001125 extrusion Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- -1 polyethylene Polymers 0.000 description 2
- 229920000573 polyethylene Polymers 0.000 description 2
- 240000007594 Oryza sativa Species 0.000 description 1
- 235000007164 Oryza sativa Nutrition 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 235000013339 cereals Nutrition 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229920002457 flexible plastic Polymers 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 229910052753 mercury Inorganic materials 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 1
- 235000009566 rice Nutrition 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 230000006403 short-term memory Effects 0.000 description 1
- 230000008685 targeting Effects 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 230000001960 triggered effect Effects 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
- B07C5/363—Sorting apparatus characterised by the means used for distribution by means of air
- B07C5/365—Sorting apparatus characterised by the means used for distribution by means of air using a single separation means
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S209/00—Classifying, separating, and assorting solids
- Y10S209/919—Rotary feed conveyor
Landscapes
- Specific Conveyance Elements (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- A Measuring Device Byusing Mechanical Method (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Machine Tool Sensing Apparatuses (AREA)
- Sorting Of Articles (AREA)
- Details Of Resistors (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Supply And Installment Of Electrical Components (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/578,787 US6294747B1 (en) | 1999-06-02 | 2000-05-23 | Inspection machine for surface mount passive component |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CZ2002662A3 true CZ2002662A3 (cs) | 2002-07-17 |
Family
ID=24314309
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CZ2002662A CZ2002662A3 (cs) | 2000-05-23 | 2000-05-23 | Zařízení pro vizuální kontrolu |
Country Status (13)
| Country | Link |
|---|---|
| US (1) | US6294747B1 (enExample) |
| EP (1) | EP1283751B1 (enExample) |
| JP (1) | JP3668192B2 (enExample) |
| KR (1) | KR100478885B1 (enExample) |
| CN (1) | CN1241689C (enExample) |
| AT (1) | ATE361792T1 (enExample) |
| AU (1) | AU2000251587A1 (enExample) |
| CZ (1) | CZ2002662A3 (enExample) |
| DE (1) | DE60034820T2 (enExample) |
| HU (1) | HUP0203331A2 (enExample) |
| IL (1) | IL147702A0 (enExample) |
| TW (1) | TW571102B (enExample) |
| WO (1) | WO2001089725A1 (enExample) |
Families Citing this family (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100350855B1 (ko) * | 2000-12-29 | 2002-09-05 | 주식회사옌트 | 표면 실장용 칩 검사 장치에서의 칩 선별기 |
| TW577163B (en) * | 2001-11-27 | 2004-02-21 | Electro Scient Ind Inc | A shadow-creating apparatus |
| US6756798B2 (en) | 2002-03-14 | 2004-06-29 | Ceramic Component Technologies, Inc. | Contactor assembly for testing ceramic surface mount devices and other electronic components |
| US6710611B2 (en) | 2002-04-19 | 2004-03-23 | Ceramic Component Technologies, Inc. | Test plate for ceramic surface mount devices and other electronic components |
| JP4243960B2 (ja) * | 2003-02-25 | 2009-03-25 | ヤマハファインテック株式会社 | ワークの選別装置および選別方法 |
| US7221727B2 (en) * | 2003-04-01 | 2007-05-22 | Kingston Technology Corp. | All-digital phase modulator/demodulator using multi-phase clocks and digital PLL |
| US7364043B2 (en) * | 2003-12-30 | 2008-04-29 | Zen Voce Manufacturing Pte Ltd | Fastener inspection system |
| US20050139450A1 (en) * | 2003-12-30 | 2005-06-30 | International Product Technology, Inc. | Electrical part processing unit |
| US7161346B2 (en) * | 2005-05-23 | 2007-01-09 | Electro Scientific Industries, Inc. | Method of holding an electronic component in a controlled orientation during parametric testing |
| KR100713801B1 (ko) * | 2006-04-07 | 2007-05-04 | (주)알티에스 | 듀얼 전자부품 검사 방법 |
| KR100713799B1 (ko) * | 2006-04-07 | 2007-05-04 | (주)알티에스 | 듀얼 전자부품 검사장치 |
| KR100783595B1 (ko) * | 2006-04-14 | 2007-12-10 | (주)알티에스 | 듀얼 전자부품 검사장치에서의 전자부품 분류방법 |
| US7704033B2 (en) * | 2006-04-21 | 2010-04-27 | Electro Scientific Industries, Inc. | Long axis component loader |
| JP2009216698A (ja) * | 2008-02-07 | 2009-09-24 | Camtek Ltd | 対象物の複数の側面を画像化するための装置および方法 |
| TWI440846B (zh) * | 2008-11-19 | 2014-06-11 | Ust Technology Pte Ltd | 物件之檢視裝置及方法 |
| CN101750417B (zh) * | 2008-12-12 | 2012-03-14 | 鸿富锦精密工业（深圳）有限公司 | 检测装置 |
| KR101056105B1 (ko) * | 2009-01-20 | 2011-08-10 | (주)알티에스 | 전자부품 검사기의 분류장치 |
| KR101056107B1 (ko) * | 2009-01-21 | 2011-08-10 | (주)알티에스 | 전자부품 검사장치의 분류장치 |
| KR101112193B1 (ko) * | 2010-11-09 | 2012-02-27 | 박양수 | 회전형 엘이디 검사 장치 |
| TWI418811B (zh) * | 2011-02-14 | 2013-12-11 | Youngtek Electronics Corp | 封裝晶片檢測與分類裝置 |
| KR101284528B1 (ko) * | 2011-11-08 | 2013-07-16 | 대원강업주식회사 | 기어림 표면 흠 검사장치 및 검사방법 |
| DE102012216163B4 (de) * | 2012-01-11 | 2017-03-09 | Robert Bosch Gmbh | Vorrichtung zum Zuführen von Kappen mit Überwachungssystem |
| KR102015572B1 (ko) | 2013-10-02 | 2019-10-22 | 삼성전자주식회사 | 실장 장치 |
| CN104375022B (zh) * | 2014-10-10 | 2017-05-03 | 苏州杰锐思自动化设备有限公司 | 一种六面测试机台 |
| KR20160090553A (ko) | 2015-01-22 | 2016-08-01 | (주)프로옵틱스 | 다면 검사장치 |
| TWI643800B (zh) * | 2018-06-01 | 2018-12-11 | 鴻勁精密股份有限公司 | Electronic component image capturing device and job classification device thereof |
| KR20210061437A (ko) * | 2018-10-15 | 2021-05-27 | 일렉트로 싸이언티픽 인더스트리이즈 인코포레이티드 | 부품 취급에 사용되는 시스템 및 방법 |
| CN115372361B (zh) * | 2021-05-21 | 2025-11-25 | 泰科电子(上海)有限公司 | 工件多表面检测设备及检测方法 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2583447A (en) * | 1946-08-03 | 1952-01-22 | American Wheelabrator & Equipm | Classifier |
| US3750878A (en) * | 1971-11-15 | 1973-08-07 | Dixon K Corp | Electrical component testing apparatus |
| US4105122A (en) * | 1976-11-26 | 1978-08-08 | Borden, Inc. | Inspecting cans for openings with light |
| CH642174A5 (de) * | 1978-03-17 | 1984-03-30 | Fuji Electric Co Ltd | Einrichtung zur kontrolle des aussehens von festkoerpermedikamenten. |
| SU1219172A1 (ru) * | 1984-08-20 | 1986-03-23 | Производственно-Экспериментальный Завод "Санитас" Научно-Исследовательского Института По Биологическим Испытаниям Химических Соединений | Устройство дл размерной сортировки деталей |
| FR2590811B1 (fr) * | 1985-12-03 | 1989-08-25 | Pont A Mousson | Machine automatique de controle et de tri de pieces, en particulier cylindriques |
| JPH0654226B2 (ja) * | 1988-03-31 | 1994-07-20 | ティーディーケイ株式会社 | チップ状部品の自動外観検査機 |
| JPH02193813A (ja) * | 1989-01-20 | 1990-07-31 | Murata Mfg Co Ltd | 電子部品の整列・反転方法 |
| FR2654549A1 (fr) * | 1989-11-10 | 1991-05-17 | Europ Composants Electron | Dispositif de controle et de tri de condensateurs chips. |
| US6025567A (en) * | 1997-11-10 | 2000-02-15 | Brooks; David M. | Binning wheel for testing and sorting capacitor chips |
| JP4039505B2 (ja) * | 1999-03-16 | 2008-01-30 | オカノ電機株式会社 | 外観検査装置 |
-
2000
- 2000-05-23 US US09/578,787 patent/US6294747B1/en not_active Expired - Lifetime
- 2000-05-23 CN CNB008106959A patent/CN1241689C/zh not_active Expired - Fee Related
- 2000-05-23 CZ CZ2002662A patent/CZ2002662A3/cs unknown
- 2000-05-23 KR KR10-2002-7000911A patent/KR100478885B1/ko not_active Expired - Fee Related
- 2000-05-23 IL IL14770200A patent/IL147702A0/xx unknown
- 2000-05-23 EP EP00936241A patent/EP1283751B1/en not_active Expired - Lifetime
- 2000-05-23 JP JP2001585954A patent/JP3668192B2/ja not_active Expired - Fee Related
- 2000-05-23 AT AT00936241T patent/ATE361792T1/de not_active IP Right Cessation
- 2000-05-23 DE DE60034820T patent/DE60034820T2/de not_active Expired - Lifetime
- 2000-05-23 WO PCT/US2000/014235 patent/WO2001089725A1/en not_active Ceased
- 2000-05-23 HU HU0203331A patent/HUP0203331A2/hu unknown
- 2000-05-23 AU AU2000251587A patent/AU2000251587A1/en not_active Abandoned
- 2000-08-21 TW TW089116901A patent/TW571102B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| EP1283751B1 (en) | 2007-05-09 |
| HUP0203331A2 (en) | 2003-02-28 |
| KR20020019556A (ko) | 2002-03-12 |
| DE60034820D1 (de) | 2007-06-21 |
| DE60034820T2 (de) | 2008-01-17 |
| CN1241689C (zh) | 2006-02-15 |
| EP1283751A1 (en) | 2003-02-19 |
| KR100478885B1 (ko) | 2005-03-28 |
| AU2000251587A1 (en) | 2001-12-03 |
| JP2003534122A (ja) | 2003-11-18 |
| EP1283751A4 (en) | 2004-08-11 |
| ATE361792T1 (de) | 2007-06-15 |
| JP3668192B2 (ja) | 2005-07-06 |
| CN1362896A (zh) | 2002-08-07 |
| WO2001089725A1 (en) | 2001-11-29 |
| IL147702A0 (en) | 2002-08-14 |
| US6294747B1 (en) | 2001-09-25 |
| TW571102B (en) | 2004-01-11 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CZ2002662A3 (cs) | Zařízení pro vizuální kontrolu | |
| KR100849003B1 (ko) | 칩 부품 반송 방법 및 장치, 및 외관 검사 방법 및 장치 | |
| JP4388286B2 (ja) | 微小物体検査装置 | |
| CN111263976B (zh) | 用于对准和光学检查半导体组件的装置 | |
| KR102046031B1 (ko) | 부품 핸들링 시스템 | |
| KR20180046549A (ko) | 렌즈유닛 분류장치 및 이를 구비하는 렌즈유닛 분류 시스템 | |
| JP4297350B2 (ja) | チップ部品搬送方法及び装置、並びに外観検査方法及び装置 | |
| CN1364134A (zh) | 工件检查装置和检查方法 | |
| KR102405604B1 (ko) | 렌즈 어셈블리 검사 장치 | |
| JP5835244B2 (ja) | ワーク搬送装置 | |
| CN112005356A (zh) | 高速旋转分类器中的基板倾斜控制 | |
| JP3464990B2 (ja) | 微小物体検査装置 | |
| JP4264155B2 (ja) | 微小物体の外観検査装置 | |
| JP7115905B2 (ja) | 小型物品の処理システム | |
| WO2010071609A2 (en) | System and processing of a substrate | |
| US20220330465A1 (en) | Component handling | |
| US20240068955A1 (en) | Component inspection | |
| JP2004010301A (ja) | ワーク搬送装置およびワーク搬送方法 | |
| KR20070018524A (ko) | 웨이퍼 레벨 반도체 소자용 외관 검사 및 분류 설비 | |
| TWI232297B (en) | Apparatus and method for screening of works in response to inspection results | |
| JP6182996B2 (ja) | 搬送装置及び搬送ローター | |
| KR102132013B1 (ko) | 패키지 언로딩 장치 | |
| US12392729B2 (en) | Optical inspection of a component | |
| KR20160069749A (ko) | 반도체 패키지 몰딩 시스템 | |
| JP2011079590A (ja) | 物品検査装置 |