JP2015528331A - 多数開口超音波プローブの校正 - Google Patents
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Abstract
Description
本出願は、引用により本明細書中に組み込まれている2012年8月10日出願の米国仮特許出願第61/681,986号(名称:「多数開口超音波プローブの校正(Calibration of Multiple Aperture Ultrasound Probes)」)の利益を請求するものである。
本明細書で言及される全ての刊行物及び特許出願は、それぞれの刊行物又は特許出願が引用により明確かつ個別に本明細書中に組み込まれると示されたかのように、引用により本明細書中に組み込まれるものとする。
本開示は、一般に、超音波イメージングシステムに関し、より詳細には、多数開口超音波プローブを校正するためシステム及び方法に関する。
従来の超音波イメージングでは、超音波エネルギーの集束ビームを検査するべき体組織に送信し、戻されたエコーを検出してプロットし、これにより画像を形成する。超音波は、診断目的で広く使用されているが、従来の超音波は、スキャニングの深度、スペックルノイズ、低い方位分解能、隠れた組織、及び他のこのような問題によって大きく制限される。
本発明の新規な特徴は、特に添付の特許請求の範囲で説明する。本発明の特徴及び利点は、本発明の原理が利用されている例示的な実施態様を説明する以下の詳細な説明、及び添付の図面を参照すればより良く理解できるであろう。
様々な実施態様を、添付の図面を参照して詳細に説明する。特定の例及び実施についての言及は、例示目的であり、本発明の範囲又は特許請求の範囲を限定することを意図とするものではない。
様々な実施態様が、様々な解剖学的構造の超音波イメージングに関連付けて本明細書で説明されるが、本明細書に図示され、説明される多くの方法及び装置を、他の用途、例えば、非解剖学的構造及び物体のイメージング及び評価にも使用することができることを理解されたい。例えば、本明細書で説明されるプローブ、システム、及び方法は、様々な機械的物体、構造的物体、又は材料、例えば、接合部、管、梁、板材、圧力容器などの非破壊試験又は評価に使用することができる。
ファントムを用いる超音波プローブ校正法の一部の実施態様は、一般に、いくつかの既知のベースライン基準データを用いてファントムを特徴付けるステップ、次に、校正されるべきプローブを用いてファントムを画像化するステップを含む。次いで、既知の基準データと形成される画像から得られるデータとの間の誤差を定量化することができ、反復最適化ルーチンを使用して、改善されたトランスデューサ素子の位置情報を得ることができる。次いで、このような改善されたトランスデューサ素子の位置変数を、校正されたプローブを用いる後のイメージングで使用するために保存することができる。
Claims (44)
- 超音波プローブを校正する方法であって:
該超音波プローブの第1のアレイ及び第2のアレイを所定の位置に配置してファントムを画像化するステップであって、該第1及び該第2のアレイの各々が、複数のトランスデューサ素子を有する、該ステップ;
該第1のアレイを用いて該ファントムを画像化して基準画像を得るステップであって、該画像化が、該第1のアレイの各トランスデューサ素子の位置を表すデータに依存する、該ステップ;
該第2のアレイを用いて該ファントムを画像化して試験画像を得るステップであって、該画像化が、該第2のアレイの各トランスデューサ素子の位置を表すデータに依存する、該ステップ;
該基準画像と該試験画像との間の第1の誤差を定量化するステップ;
該第1の誤差が最小となるまで、該第2のアレイの該各トランスデューサ素子の位置を表す該データを反復的に最適化するステップ;を含む、前記方法。 - 前記超音波プローブの、複数のトランスデューサ素子を有する第3のアレイを用いて前記ファントムを画像化して第2の試験画像を得ること、前記基準画像と該第2の試験画像との間の第2の誤差を定量化すること、及び該第2の誤差が最小となるまで、該第3のアレイの各素子の位置を表すデータを反復的に最適化すること、をさらに含む、請求項1記載の方法。
- 前記ファントムを前記第2のアレイを用いて画像化している間に、受信した生エコーデータを保存することをさらに含む、請求項1記載の方法。
- 前記反復的に最適化するステップが:
前記第2のアレイの前記トランスデューサ素子の前記位置を表す前記データを調整して第1の調整された位置データを生成すること;
該第1の調整された位置データを用いて前記保存されたエコーデータを再ビーム形成して反射体の第2の試験画像を形成すること;
該第2の試験画像と前記基準画像との間の第2の誤差を定量化すること;及び
該第2の誤差が前記第1の誤差よりも小さいか否かを決定すること;を含む、請求項3記載の方法。 - 前記第2のアレイの前記トランスデューサ素子の前記位置を表す前記データを調整することが、前記アレイの基準点の位置及び該アレイの表面の角度を調整することを含むが、該第2のアレイの該素子間の間隔を調整することを含まない、請求項4記載の方法。
- 第1の反復的に最適化するステップの後に、第2の反復的に最適化するステップを行うことをさらに含み、該第2の反復的に最適化するステップが:
前記第2のアレイの少なくとも2つのトランスデューサ素子間の間隔を調整して第2の調整された位置データを生成することを含む、前記第1の調整された位置データを調整すること;
該第2の調整された位置データを用いて前記保存されたエコーデータを再ビーム形成して前記反射体の第3の試験画像を形成すること;
該第3の試験画像と前記基準画像との間の第3の誤差を定量化すること;及び
該第3の誤差が前記第2の誤差よりも小さいか否かを決定すること;を含む、請求項5記載の方法。 - 前記トランスデューサ素子の位置データを反復的に最適化するステップが、最小二乗最適化プロセスを用いて最適化することを含む、請求項1記載の方法。
- 前記第1の誤差を定量化するステップが、前記基準画像の反射体の位置と前記試験画像の同じ反射体の位置との間の距離を定量化することを含む、請求項1記載の方法。
- 前記第1の誤差を定量化するステップが、前記基準画像の反射体と前記試験画像の反射体との間の輝度の差異を定量化することを含む、請求項1記載の方法。
- 前記第1の誤差を定量化するステップが、前記基準画像の反射体及び孔のパターンと前記試験画像の孔及び反射体のパターンとの間の差異を定量化することを含む、請求項1記載の方法。
- 前記基準画像及び前記試験画像が、反射体、孔、又は該反射体と該孔の両方の3次元パターンの3次元ボリューム画像である、請求項1記載の方法。
- 前記ファントムが生きた組織を含む、請求項1記載の方法。
- 前記ファントムの反射体の位置を特定するステップ、及び数学的に画定された曲線を反射体の検出されたパターンに適合させるステップをさらに含む、請求項1記載の方法。
- 前記曲線が直線である、請求項13記載の方法。
- 前記第1の誤差を定量化するステップが、反射体のパターンに対する曲線の適合の程度を定量化する決定係数を計算することを含む、請求項12記載の方法。
- 超音波プローブを校正する方法であって:
ファントムの複数の反射体を該超音波プローブを用いて超音波照射するステップ;
該超音波プローブでエコーデータを受信するステップ;
該エコーデータを保存するステップ;
第1のトランスデューサ素子の位置データを用いて該保存されたエコーデータをビーム形成して該反射体の画像を形成するステップ;
該反射体を表す基準データを得るステップ;
該画像と該基準データとの間の誤差を定量化するステップ;及び
該定量化された誤差に基づいて該トランスデューサ素子の位置データを反復的に最適化するステップ;を含む、前記方法。 - 前記反復的に最適化するステップが、前記トランスデューサ素子の位置データを最小二乗最適化プロセスで反復的に最適化することを含む、請求項16記載の方法。
- 前記反復的に最適化するステップが:
前記トランスデューサ素子の位置データを調整すること;
該調整されたトランスデューサ素子の位置データを用いて前記保存されたエコーデータを再ビーム形成して前記反射体の第2の画像を形成すること;
該第2の画像に基づいて第2の誤差を定量化すること;及び
該第2の誤差を評価して、該調整されたトランスデューサ素子の位置データが該画像を改善するか否かを決定すること;を含む、請求項16記載の方法。 - 前記トランスデューサ素子の位置データを調整することが、アレイの水平位置変数、アレイの垂直位置変数、及びアレイの角度変数を調整することを含む、請求項18記載の方法。
- 前記トランスデューサ素子の位置データを調整することが、共通アレイ上の隣接するトランスデューサ素子間の間隔を調整することを含まない、請求項19記載の方法。
- 前記基準データが、前記ファントムの物理的測定に基づいている、請求項16記載の方法。
- 前記ファントムの基準画像から前記基準データを導出することをさらに含む、請求項16記載の方法。
- 前記基準画像が、前記超音波を照射するステップ及び前記受信するステップに使用されたトランスデューサ素子の群とは異なる前記プローブのトランスデューサ素子の群を用いて得られる、請求項22記載の方法。
- 前記トランスデューサ素子の位置データを反復的に最適化するステップが、最小二乗最適化プロセスを用いることを含む、請求項16記載の方法。
- 前記ファントムの反射体の位置を特定すること、及び数学的に画定された曲線を反射体の検出されたパターンに適合させることをさらに含む、請求項16記載の方法。
- 前記曲線が直線である、請求項25記載の方法。
- 前記第1の誤差を定量化するステップが、前記反射体のパターンに対する前記曲線の適合の程度を定量化する決定係数を計算することを含む、請求項25記載の方法。
- 超音波イメージングデータを校正する方法であって:
生エコーデータをメモリ装置から取り出すステップであって、該生エコーデータが複数のエコーストリングを含み、該各エコーストリングが、1つの送信開口から送信されて1つの受信素子で受信される1つの超音波ピングのエコーに対応するエコー記録の集合体を含む、ステップ;
該各エコーストリングに対応する各受信トランスデューサ素子の位置を表す第1の校正データを取り出すステップ;
該各エコーストリングに関連した送信ピングに対応する少なくとも1つのトランスデューサ素子の位置を表す第2の校正データを取り出すステップ;
受信トランスデューサ素子の第1の群に対応するエコーストリングの第1の集合体をビーム形成することによって基準画像を形成するステップであって、ビーム形成することが、該第1及び該第2の校正データに基づいて反射体の位置を三角測量することを含む、該ステップ;
該トランスデューサ素子の第1の群と同一ではないトランスデューサ素子の第2の群に対応するエコーストリングの第2の集合体をビーム形成することによって試験画像を形成するステップ;
該基準画像と該試験画像との間の第1の誤差を定量化するステップ;
該第1の校正データを調整して、該第2の群の素子の調整された位置を表すステップ;
該第2の群の素子の調整された位置を用いて該試験画像を再ビーム形成して、第2の試験画像を得るステップ;
該第2の試験画像と該基準画像との間の第2の誤差を定量化するステップ;及び
新しい誤差を評価して、該第2の誤差が該第1の誤差よりも小さいか否かを決定するステップ;を含む、前記方法。 - 前記生エコーデータを生成するために使用されるプローブに対する物理的又は電子的な接続を一切用いずに行われる、請求項28記載の方法。
- 超音波プローブ校正システムであって、
複数の送信トランスデューサ素子及び複数の受信トランスデューサ素子を有する超音波プローブ;
反射体のパターンを有するファントム;
該ファントムの反射体のパターンを表す基準データを含む第1のメモリ装置;
該各送信トランスデューサ素子及び該各受信トランスデューサ素子の共通座標系に対する位置を表すトランスデューサ素子の位置データを含む第2のメモリ装置;及び
校正プログラムコードを含むイメージング制御システムを含み、該イメージング制御システムが:
該送信トランスデューサ素子を用いて該ファントムを超音波照射し、該受信トランスデューサ素子でエコーデータを受信し、そして第3のメモリ装置にエコーデータを保存し、
該トランスデューサ素子の位置データを用いて該保存されたエコーデータをビーム形成することによって該反射体のパターンの第1の画像を形成し、
該第1の画像によって示される該反射体のパターンの位置を表す測定データを決定し、
該測定データと該基準データとの間の誤差を定量化し、かつ
該定量化された誤差に基づいて該トランスデューサ素子の位置データを反復的に最適化するように、該校正プログラムコードが構成されている、前記システム。 - 前記イメージング制御システムが:
前記トランスデューサ素子の位置データを調整すること;
前記調整されたトランスデューサ素子の位置データを用いて前記保存されたエコーデータを再ビーム形成することによって前記反射体のパターンの第2の画像を形成すること;
前記第2の画像に基づいて第2の誤差を定量化すること;及び
該第2の誤差を評価して、該調整されたトランスデューサ素子の位置データが該画像を改善するか否かを決定することによって、前記ファントムを反復的に最適化するように構成されている、請求項30記載のシステム。 - 前記基準データが、前記ファントムの物理的測定に基づいている、請求項30記載のシステム。
- 前記基準データが基準画像に基づいている、請求項30記載のシステム。
- 前記イメージング制御システムが、最小二乗最適化プロセスを用いて前記トランスデューサ素子の位置データを反復的に最適化するように構成されている、請求項30記載のシステム。
- 前記ファントムが、超音波信号を吸収する少なくとも1つの領域をさらに含む、請求項30記載のシステム。
- 前記超音波プローブが、複数のトランスデューサアレイを備える、請求項30記載のシステム。
- 前記超音波プローブが、1つの連続トランスデューサアレイを備える、請求項30記載のシステム。
- 前記超音波プローブが、凹状湾曲を有するトランスデューサアレイを備える、請求項30記載のシステム。
- 前記ファントムがピンのパターンを含む、請求項30記載のシステム。
- 前記ファントムが生きた組織を含む、請求項30記載のシステム。
- 前記校正プログラムコードが、反射体の検出されたパターンに曲線を適合させることによって測定データを決定するように構成されている、請求項30記載のシステム。
- 前記校正プログラムコードが、前記曲線の適合の程度を定量化する決定係数を決定することによって誤差を定量化するように構成されている、請求項41記載のシステム。
- 前記第1のメモリ装置、前記第2のメモリ装置、及び前記第3のメモリ装置の少なくとも2つが、1つの物理的メモリ装置の論理部分である、請求項30記載のシステム。
- 前記メモリ装置に接続された超音波プローブが存在しない、請求項28記載の方法。
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US10064605B2 (en) | 2018-09-04 |
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US9572549B2 (en) | 2017-02-21 |
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