JP2014508927A5 - - Google Patents

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JP2014508927A5
JP2014508927A5 JP2013552527A JP2013552527A JP2014508927A5 JP 2014508927 A5 JP2014508927 A5 JP 2014508927A5 JP 2013552527 A JP2013552527 A JP 2013552527A JP 2013552527 A JP2013552527 A JP 2013552527A JP 2014508927 A5 JP2014508927 A5 JP 2014508927A5
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spectrometer
atmospheric pressure
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Claims (20)

  1. 分析物を分析するための方法であって、
    ソースと分光計の入口との間に配置された1つまたは複数のメッシュ上に、前記分析物を導入するステップと、
    前記ソースによって形成された複数のイオン化種を前記1つまたは複数のメッシュに送るステップと、
    前記1つまたは複数のメッシュの1つまたは複数を加熱するステップであって、前記1つまたは複数のメッシュから脱離された分析物分子は、前記イオン化種と相互作用して、1つまたは複数の分析物イオンを形成し、前記1つまたは複数の分析物イオンは、前記分光計の前記入口を通過し分析される、ステップとを含む方法。
  2. サンプリング効率を改善するために、前記1つまたは複数のメッシュと前記分光計の前記入口との間に配置されたガスイオン分離器を使用するステップをさらに含む、請求項1に記載の方法。
  3. 前記1つまたは複数の分析物イオンは、ほぼ大気圧で形成される、請求項1に記載の方法。
  4. 前記複数のイオン化種は、ほぼ大気圧で形成される、請求項1に記載の方法。
  5. 前記ソースは、実時間直接分析(DART)ソース、プラズマ支援脱離/イオン化(PADI)ソース、誘電体バリア放電イオン化(DBDIまたはDCBI)ソース、脱離大気圧化学イオン化(DAPCI)ソース、脱離ソニックスプレーイオン化(DeSSI)ソース、脱離大気圧光イオン化(DAPPI)ソース、および流動大気圧アフターグロー(FAPA)ソースおよび脱離エレクトロスプレーイオン化(DESI)ソース、大気レーザ脱離イオン化ソース、コロナ放電ソース、誘導結合プラズマ(ICP)ソース、およびグロー放電ソースからなる群から選択される、請求項1に記載の方法。
  6. 前記加熱するステップは、前記1つまたは複数のメッシュの少なくとも1つに
    約10−2ワットの下限と
    約10ワットの上限との間の
    電力を供給することを含む、請求項1に記載の方法。
  7. 前記分光計との間の領域は、ほぼ大気圧である、請求項1に記載の方法。
  8. 第1の電位が、前記分析物を含む第1のメッシュに印加される、請求項1に記載の方法。
  9. 前記第1の電位は、前記分光計の前記入口に印加される電位とほぼ同じである、請求項8に記載の方法。
  10. 第1のメッシュ上の第1の場所が、前記第1のメッシュ上の第2の場所と独立して加熱される、請求項1に記載の方法。
  11. 前記分析物は、前記メッシュ上にまたはその近くに溶液として送出される、請求項1に記載の方法。
  12. 分析物を分析するための方法であって、
    ソースと分光計の入口との間に配置されたメッシュ上に、前記分析物を連続して導入するステップと、
    前記ソースによって形成された複数のイオン化種を前記メッシュに送るステップと、
    前記メッシュを加熱するステップであって、前記メッシュから脱離された分析物分子は、前記イオン化種と相互作用して、1つまたは複数の分析物イオンを形成し、前記1つまたは複数の分析物イオンは、前記分光計の前記入口を通過し分析される、ステップとを含む方法。
  13. 前記1つまたは複数の分析物イオンは、ほぼ大気圧で形成される、請求項12に記載の方法。
  14. 前記複数のイオン化種は、ほぼ大気圧で形成される、請求項12に記載の方法。
  15. 前記ソースは、実時間直接分析(DART)ソース、プラズマ支援脱離/イオン化(PADI)ソース、誘電体バリア放電イオン化(DBDIまたはDCBI)ソース、脱離大気圧化学イオン化(DAPCI)ソース、脱離ソニックスプレーイオン化(DeSSI)ソース、脱離大気圧光イオン化(DAPPI)ソース、および流動大気圧アフターグロー(FAPA)ソースおよび脱離エレクトロスプレーイオン化(DESI)ソース、大気レーザ脱離イオン化ソース、コロナ放電ソース、誘導結合プラズマ(ICP)ソース、およびグロー放電ソースからなる群から選択される、請求項12に記載の方法。
  16. 前記複数のイオン化種は、キャリアガスから形成される、請求項12に記載の方法。
  17. 前記キャリアガスは、加熱されうる、請求項16に記載の方法。
  18. 分析物を分析するための方法であって、
    第1のメッシュ上に前記分析物を導入するステップであって、第1の電位が、前記第1のメッシュに印加されており、前記第1のメッシュは、ソースと分光計の入口との間に配置され、前記第1の電位は、前記分光計の前記入口に印加される電位とほぼ同じであり、第2の電位が、第2のメッシュに印加され、前記第2のメッシュが、前記第1のメッシュと前記分光計の前記入口との間に配置され、前記第2の電位が、前記第1の電位と異なるステップと、
    前記ソースによって形成された複数のイオン化種を前記第1のメッシュに送るステップと、
    前記第1のメッシュを加熱するステップであって、前記第1のメッシュから脱離された分析物分子は、前記イオン化種と相互作用して、1つまたは複数の分析物イオンを形成し、前記1つまたは複数の分析物イオンは、前記分光計の前記入口を通過し分析され、前記第1のメッシュから脱離された前記分析物イオンの運動エネルギーは、前記第2の電位を調整することによって調整されうる、ステップとを含む方法。
  19. 前記分光計は、ほぼ大気圧で動作するイオン移動度分光計である、請求項18に記載の方法。
  20. 前記第1のメッシュと前記第2のメッシュの少なくとも1つは、前記イオン移動度分光計に印加される電位と同じ電位を有する、請求項19に記載の方法。
JP2013552527A 2011-02-05 2012-02-06 熱支援脱離イオン化システムのための装置および方法 Pending JP2014508927A (ja)

Applications Claiming Priority (9)

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US201161439866P 2011-02-05 2011-02-05
US61/439,866 2011-02-05
US201161582204P 2011-12-30 2011-12-30
US61/582,204 2011-12-30
US13/364,322 2012-01-02
US201261587218P 2012-01-17 2012-01-17
US61/587,218 2012-01-17
US13/364,322 US8822949B2 (en) 2011-02-05 2012-02-02 Apparatus and method for thermal assisted desorption ionization systems
PCT/US2012/000061 WO2012106054A2 (en) 2011-02-05 2012-02-06 Apparatus and method for thermal assisted desorption ionization systems

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JP2014508927A5 true JP2014508927A5 (ja) 2015-04-23

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US (10) US8822949B2 (ja)
EP (1) EP2671244B1 (ja)
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KR (1) KR101979035B1 (ja)
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