WO2008090600A1 - 質量分析装置 - Google Patents

質量分析装置 Download PDF

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Publication number
WO2008090600A1
WO2008090600A1 PCT/JP2007/050939 JP2007050939W WO2008090600A1 WO 2008090600 A1 WO2008090600 A1 WO 2008090600A1 JP 2007050939 W JP2007050939 W JP 2007050939W WO 2008090600 A1 WO2008090600 A1 WO 2008090600A1
Authority
WO
WIPO (PCT)
Prior art keywords
mass analyzer
ion
electrodes
optical system
fragment ions
Prior art date
Application number
PCT/JP2007/050939
Other languages
English (en)
French (fr)
Inventor
Kazuo Mukaibatake
Original Assignee
Shimadzu Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corporation filed Critical Shimadzu Corporation
Priority to US12/522,841 priority Critical patent/US8299427B2/en
Priority to PCT/JP2007/050939 priority patent/WO2008090600A1/ja
Priority to JP2008554924A priority patent/JP4947061B2/ja
Publication of WO2008090600A1 publication Critical patent/WO2008090600A1/ja

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/062—Ion guides
    • H01J49/065—Ion guides having stacked electrodes, e.g. ring stack, plate stack

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

　本発明の課題は、フラグメントイオンの発生効率や収束効率を上げ、発生したフラグメントイオンを効率よく後段へと輸送することができるイオン輸送光学系を具備する質量分析装置を提供することである。 その解決手段は、イオン化室（１０）で試料をイオン化し、イオン化された試料を質量分析室（１８）に引き込む質量分析装置であって、イオン光軸を取り囲むように、配設された電極（１７、２００－１、２００－２）を備えるイオン輸送光学系を具備し、前記電極（１７、２００－１、２００－２）は、前記イオン光軸の進行方向に対して広がるように傾斜する傾斜面を有することを特徴とすることである。
PCT/JP2007/050939 2007-01-23 2007-01-23 質量分析装置 WO2008090600A1 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
US12/522,841 US8299427B2 (en) 2007-01-23 2007-01-23 Mass spectrometer
PCT/JP2007/050939 WO2008090600A1 (ja) 2007-01-23 2007-01-23 質量分析装置
JP2008554924A JP4947061B2 (ja) 2007-01-23 2007-01-23 質量分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/050939 WO2008090600A1 (ja) 2007-01-23 2007-01-23 質量分析装置

Publications (1)

Publication Number Publication Date
WO2008090600A1 true WO2008090600A1 (ja) 2008-07-31

Family

ID=39644182

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/050939 WO2008090600A1 (ja) 2007-01-23 2007-01-23 質量分析装置

Country Status (3)

Country Link
US (1) US8299427B2 (ja)
JP (1) JP4947061B2 (ja)
WO (1) WO2008090600A1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012043672A (ja) * 2010-08-20 2012-03-01 Shimadzu Corp 質量分析装置
US8987664B2 (en) 2013-02-07 2015-03-24 Shimadzu Corporation Mass spectrometry device

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9048079B2 (en) * 2013-02-01 2015-06-02 The Rockefeller University Method and apparatus for improving ion transmission into a mass spectrometer
US8907272B1 (en) * 2013-10-04 2014-12-09 Thermo Finnigan Llc Radio frequency device to separate ions from gas stream and method thereof
US10229821B2 (en) * 2015-01-15 2019-03-12 Hitachi High-Technologies Corporation Mass spectrometry device
EP3561853A1 (en) * 2018-04-26 2019-10-30 Tofwerk AG Ion guide assembly
KR102132977B1 (ko) * 2020-02-25 2020-07-14 영인에이스 주식회사 질량분석기
KR102133334B1 (ko) * 2020-02-25 2020-07-14 영인에이스 주식회사 질량분석기
KR102132992B1 (ko) * 2020-02-25 2020-07-14 영인에이스 주식회사 질량분석기

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000513494A (ja) * 1998-01-23 2000-10-10 マイクロマス・リミテッド 飛行時間質量分析計における質量誤差を修正する方法及び装置
JP2006521006A (ja) * 2003-03-03 2006-09-14 ブリガム・ヤング・ユニバーシティ 直交加速飛行時間型質量分析のための新規な電子イオン化源

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05205695A (ja) * 1992-01-28 1993-08-13 Hitachi Ltd 多段多重電極及び質量分析装置
EP0843887A1 (en) * 1995-08-11 1998-05-27 Mds Health Group Limited Spectrometer with axial field
GB2389452B (en) * 2001-12-06 2006-05-10 Bruker Daltonik Gmbh Ion-guide
US7141785B2 (en) * 2003-02-13 2006-11-28 Micromass Uk Limited Ion detector
US20040195503A1 (en) * 2003-04-04 2004-10-07 Taeman Kim Ion guide for mass spectrometers
GB0514964D0 (en) * 2005-07-21 2005-08-24 Ms Horizons Ltd Mass spectrometer devices & methods of performing mass spectrometry
JP4883174B2 (ja) * 2007-03-23 2012-02-22 株式会社島津製作所 質量分析装置
US7868289B2 (en) * 2007-04-30 2011-01-11 Ionics Mass Spectrometry Group Inc. Mass spectrometer ion guide providing axial field, and method
JP4877327B2 (ja) * 2007-12-20 2012-02-15 株式会社島津製作所 質量分析装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000513494A (ja) * 1998-01-23 2000-10-10 マイクロマス・リミテッド 飛行時間質量分析計における質量誤差を修正する方法及び装置
JP2006521006A (ja) * 2003-03-03 2006-09-14 ブリガム・ヤング・ユニバーシティ 直交加速飛行時間型質量分析のための新規な電子イオン化源

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012043672A (ja) * 2010-08-20 2012-03-01 Shimadzu Corp 質量分析装置
US8987664B2 (en) 2013-02-07 2015-03-24 Shimadzu Corporation Mass spectrometry device

Also Published As

Publication number Publication date
JPWO2008090600A1 (ja) 2010-05-13
JP4947061B2 (ja) 2012-06-06
US20100059675A1 (en) 2010-03-11
US8299427B2 (en) 2012-10-30

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