WO2009048739A3 - Chemical ionization reaction or proton transfer reaction mass spectrometry with a quadrupole or time-of-flight mass spectrometer - Google Patents

Chemical ionization reaction or proton transfer reaction mass spectrometry with a quadrupole or time-of-flight mass spectrometer Download PDF

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Publication number
WO2009048739A3
WO2009048739A3 PCT/US2008/077365 US2008077365W WO2009048739A3 WO 2009048739 A3 WO2009048739 A3 WO 2009048739A3 US 2008077365 W US2008077365 W US 2008077365W WO 2009048739 A3 WO2009048739 A3 WO 2009048739A3
Authority
WO
WIPO (PCT)
Prior art keywords
ions
reagent
reagent ions
quadrupole
reaction
Prior art date
Application number
PCT/US2008/077365
Other languages
French (fr)
Other versions
WO2009048739A2 (en
Inventor
Timothy Roger Robinson
Mark Attwood
Xing Chen
William M. Holber
Mark Philip Longson
Jonathan Henry Palk
Ali Shajii
John A. Smith
Original Assignee
Mks Instruments, Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US11/869,980 external-priority patent/US8003936B2/en
Priority claimed from US11/869,978 external-priority patent/US8003935B2/en
Priority claimed from US12/026,799 external-priority patent/US8334505B2/en
Application filed by Mks Instruments, Inc. filed Critical Mks Instruments, Inc.
Priority to EP08838087.8A priority Critical patent/EP2212903B1/en
Priority to CN2008801159342A priority patent/CN101855700B/en
Priority to KR1020127020925A priority patent/KR101260631B1/en
Priority to JP2010528930A priority patent/JP2011511929A/en
Publication of WO2009048739A2 publication Critical patent/WO2009048739A2/en
Publication of WO2009048739A3 publication Critical patent/WO2009048739A3/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/145—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using chemical ionisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

A system and methods are described for generating reagent ions and product ions for use in a mass spectrometry system. Applications for the system and method are also disclosed for detecting volatile organic compounds in trace concentrations. A microwave or high-frequency RF energy source ionizes particles of a reagent vapor to form reagent ions. The reagent ions enter a chamber, such as a drift chamber, to interact with a fluid sample. An electric field directs the reagent ions and facilitates an interaction with the fluid sample to form product ions. The reagent ions and product ions then exit the chamber under the influence of an electric field for detection by a mass spectrometer module. The system includes various control modules for setting values of system parameters and analysis modules for detection of mass and peak intensity values for ion species during spectrometry and faults within the system.
PCT/US2008/077365 2007-10-10 2008-09-23 Chemical ionization reaction or proton transfer reaction mass spectrometry with a quadrupole or time-of-flight mass spectrometer WO2009048739A2 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
EP08838087.8A EP2212903B1 (en) 2007-10-10 2008-09-23 Chemical ionization reaction or proton transfer reaction mass spectrometry with a quadrupole or time-of-flight mass spectrometer
CN2008801159342A CN101855700B (en) 2007-10-10 2008-09-23 Chemical ionization reaction or proton transfer reaction mass spectrometry with a quadrupole or time-of-flight mass spectrometer
KR1020127020925A KR101260631B1 (en) 2007-10-10 2008-09-23 Chemical ionization reaction or proton transfer reaction mass spectrometry with a quadrupole or time-of-flight mass spectrometer
JP2010528930A JP2011511929A (en) 2007-10-10 2008-09-23 Chemical ionization or proton transfer reaction mass spectrometry using a quadrupole or time-of-flight mass spectrometer

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
US11/869,980 2007-10-10
US11/869,978 2007-10-10
US11/869,980 US8003936B2 (en) 2007-10-10 2007-10-10 Chemical ionization reaction or proton transfer reaction mass spectrometry with a time-of-flight mass spectrometer
US11/869,978 US8003935B2 (en) 2007-10-10 2007-10-10 Chemical ionization reaction or proton transfer reaction mass spectrometry with a quadrupole mass spectrometer
US12/026,799 US8334505B2 (en) 2007-10-10 2008-02-06 Chemical ionization reaction or proton transfer reaction mass spectrometry
US12/026,799 2008-02-06

Publications (2)

Publication Number Publication Date
WO2009048739A2 WO2009048739A2 (en) 2009-04-16
WO2009048739A3 true WO2009048739A3 (en) 2009-11-26

Family

ID=40330703

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2008/077365 WO2009048739A2 (en) 2007-10-10 2008-09-23 Chemical ionization reaction or proton transfer reaction mass spectrometry with a quadrupole or time-of-flight mass spectrometer

Country Status (6)

Country Link
EP (1) EP2212903B1 (en)
JP (3) JP2011511929A (en)
KR (2) KR101260566B1 (en)
CN (1) CN101855700B (en)
TW (1) TWI368249B (en)
WO (1) WO2009048739A2 (en)

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CN103337445B (en) * 2013-06-15 2015-10-28 中国科学院合肥物质科学研究院 A kind of anion proton reversion moves the mass spectrographic organic substance checkout gear of reaction and detection method
DE102013213501A1 (en) * 2013-07-10 2015-01-15 Carl Zeiss Microscopy Gmbh Mass spectrometer, its use, and method for mass spectrometric analysis of a gas mixture
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CN104538275B (en) * 2014-12-25 2016-11-30 华南师范大学 A kind of laser assisted glow discharge ionization device
CN106158574A (en) * 2015-04-09 2016-11-23 中国科学院生态环境研究中心 Photoinduction ion source Proton transfer reaction mass spectrometry instrument
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CN105548341B (en) * 2015-12-15 2018-11-09 南京信息工程大学 A kind of foul gas monitoring method and monitor
CN106024572B (en) * 2016-07-22 2017-09-19 中国科学院合肥物质科学研究院 The organic matter detection means and detection method of a kind of bipolarity Proton transfer reaction mass spectrometry
CN106546656A (en) * 2016-10-09 2017-03-29 中国科学院化学研究所 A kind of method of chemi-ionization linear paraffin
EP3586352B1 (en) * 2017-02-21 2021-04-07 Leybold GmbH Method for real-time monitoring of a process and mass spectrometer
GB2560160B (en) * 2017-02-23 2021-08-18 Thermo Fisher Scient Bremen Gmbh Methods in mass spectrometry using collision gas as ion source
CN109243960B (en) 2017-07-10 2020-11-17 株式会社岛津制作所 Proton transfer reaction mass spectrometer
US10217621B2 (en) * 2017-07-18 2019-02-26 Applied Materials Israel Ltd. Cleanliness monitor and a method for monitoring a cleanliness of a vacuum chamber
EP3474311A1 (en) * 2017-10-20 2019-04-24 Tofwerk AG Ion molecule reactor
GB201808892D0 (en) * 2018-05-31 2018-07-18 Micromass Ltd Mass spectrometer
GB201808912D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808932D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808893D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
EP3629365A1 (en) * 2018-09-28 2020-04-01 Ionicon Analytik Gesellschaft m.b.H. Imr-ms reaction chamber
CN110110743B (en) * 2019-03-26 2019-12-31 中国检验检疫科学研究院 Automatic recognition system and method for seven-class mass spectrum
DE102019215319A1 (en) * 2019-10-07 2021-04-08 Leybold Gmbh Inlet system for a mass spectrometer
EP3819611B1 (en) * 2019-11-05 2024-03-27 Hitachi High-Tech Analytical Science GmbH An easily adjustable optical emission spectrometer
CN111220697A (en) * 2020-01-21 2020-06-02 北京雪迪龙科技股份有限公司 Detection method, detection system and detection equipment for gas in atmosphere
WO2021173853A1 (en) * 2020-02-28 2021-09-02 Kaveh Jorabchi Apparatus and methods for detection and quantification of elements in molecules
CN112347155B (en) * 2020-10-29 2023-11-21 南京大学 Site pollution characteristic factor identification and monitoring index optimization method based on data mining
CN112229893B (en) * 2020-11-04 2024-07-16 肖洋 On-line monitoring system and method for high-resolution high-sensitivity rapid determination of volatile organic compounds
WO2022173451A1 (en) * 2021-02-15 2022-08-18 Boronse Adrien A device for detecting explosive materials, or weapons or firearms, or knives or substances
CN113192818B (en) * 2021-03-26 2022-07-08 广东省科学院测试分析研究所(中国广州分析测试中心) Microwave plasma torch-solid phase micro extraction-flight time mass spectrum combined system
CN113447618B (en) * 2021-06-29 2023-11-03 重庆大学 Stepped air chamber of multi-sensor electronic nose, double-sample-injection detection system and method
CN117795644A (en) * 2021-08-02 2024-03-29 株式会社岛津制作所 Mass spectrometry device and mass spectrometry method

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Also Published As

Publication number Publication date
KR20120107010A (en) 2012-09-27
WO2009048739A2 (en) 2009-04-16
KR101260631B1 (en) 2013-05-06
JP2011511929A (en) 2011-04-14
TWI368249B (en) 2012-07-11
CN101855700A (en) 2010-10-06
KR101260566B1 (en) 2013-05-06
EP2212903B1 (en) 2014-08-27
JP2012054239A (en) 2012-03-15
CN101855700B (en) 2012-12-05
EP2212903A2 (en) 2010-08-04
TW200937487A (en) 2009-09-01
JP2012037529A (en) 2012-02-23
KR20100083785A (en) 2010-07-22

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