JP2010117170A5 - - Google Patents

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Publication number
JP2010117170A5
JP2010117170A5 JP2008288917A JP2008288917A JP2010117170A5 JP 2010117170 A5 JP2010117170 A5 JP 2010117170A5 JP 2008288917 A JP2008288917 A JP 2008288917A JP 2008288917 A JP2008288917 A JP 2008288917A JP 2010117170 A5 JP2010117170 A5 JP 2010117170A5
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JP
Japan
Prior art keywords
detector
radiation
detection
image data
timing
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JP2008288917A
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English (en)
Japanese (ja)
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JP5559471B2 (ja
JP2010117170A (ja
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Priority claimed from JP2008288917A external-priority patent/JP5559471B2/ja
Priority to JP2008288917A priority Critical patent/JP5559471B2/ja
Priority to ES16189433T priority patent/ES2870993T3/es
Priority to EP16189433.2A priority patent/EP3128315B1/en
Priority to DK16189433.2T priority patent/DK3128315T3/da
Priority to PCT/JP2009/065726 priority patent/WO2010055727A1/ja
Priority to EP09825980A priority patent/EP2352014A4/en
Priority to TW098131071A priority patent/TW201018902A/zh
Priority to US12/615,305 priority patent/US8223922B2/en
Publication of JP2010117170A publication Critical patent/JP2010117170A/ja
Publication of JP2010117170A5 publication Critical patent/JP2010117170A5/ja
Priority to US13/534,426 priority patent/US8964939B2/en
Publication of JP5559471B2 publication Critical patent/JP5559471B2/ja
Application granted granted Critical
Priority to US14/603,761 priority patent/US9594031B2/en
Priority to US15/407,528 priority patent/US10393676B2/en
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JP2008288917A 2008-11-11 2008-11-11 放射線検出装置、放射線画像取得システム、放射線検査システム、及び放射線検出方法 Active JP5559471B2 (ja)

Priority Applications (11)

Application Number Priority Date Filing Date Title
JP2008288917A JP5559471B2 (ja) 2008-11-11 2008-11-11 放射線検出装置、放射線画像取得システム、放射線検査システム、及び放射線検出方法
ES16189433T ES2870993T3 (es) 2008-11-11 2009-09-09 Dispositivo de detección de radiación, sistema de adquisición de imágenes por radiación, sistema de inspección de radiación y método de detección de radiación
EP16189433.2A EP3128315B1 (en) 2008-11-11 2009-09-09 Radiation detection device, radiation image acquisition system, radiation inspection system, and radiation detection method
DK16189433.2T DK3128315T3 (da) 2008-11-11 2009-09-09 Detekteringsanordning, system til optagelse af stråling, strålingsinspektionssystem og fremgangsmåde til strålingsdetektering
PCT/JP2009/065726 WO2010055727A1 (ja) 2008-11-11 2009-09-09 放射線検出装置、放射線画像取得システム、放射線検査システム、及び放射線検出方法
EP09825980A EP2352014A4 (en) 2008-11-11 2009-09-09 RADIATION DETECTION DEVICE, RADIATION IMAGE ACQUISITION SYSTEM, RADIATION INSPECTION SYSTEM, AND RADIATION DETECTION METHOD
TW098131071A TW201018902A (en) 2008-11-11 2009-09-15 Radiation detection device, radiation image acquisition system, radiation inspection system, and radiation detection method
US12/615,305 US8223922B2 (en) 2008-11-11 2009-11-10 Radiation detection device, radiation image acquiring system, radiation inspection system, and radiation detection method
US13/534,426 US8964939B2 (en) 2008-11-11 2012-06-27 Radiation detection device, radiation image acquiring system, radiation inspection system, and radiation detection method
US14/603,761 US9594031B2 (en) 2008-11-11 2015-01-23 Radiation detection device, radiation image acquiring system, radiation inspection system, and radiation detection method
US15/407,528 US10393676B2 (en) 2008-11-11 2017-01-17 Radiation detection device, radiation image acquiring system, radiation inspection system, and radiation detection method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008288917A JP5559471B2 (ja) 2008-11-11 2008-11-11 放射線検出装置、放射線画像取得システム、放射線検査システム、及び放射線検出方法

Related Child Applications (1)

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JP2013232222A Division JP5726271B2 (ja) 2013-11-08 2013-11-08 放射線検出装置、放射線画像取得システム、放射線検査システム、及び放射線検出方法

Publications (3)

Publication Number Publication Date
JP2010117170A JP2010117170A (ja) 2010-05-27
JP2010117170A5 true JP2010117170A5 (enExample) 2011-11-04
JP5559471B2 JP5559471B2 (ja) 2014-07-23

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JP2008288917A Active JP5559471B2 (ja) 2008-11-11 2008-11-11 放射線検出装置、放射線画像取得システム、放射線検査システム、及び放射線検出方法

Country Status (7)

Country Link
US (4) US8223922B2 (enExample)
EP (2) EP2352014A4 (enExample)
JP (1) JP5559471B2 (enExample)
DK (1) DK3128315T3 (enExample)
ES (1) ES2870993T3 (enExample)
TW (1) TW201018902A (enExample)
WO (1) WO2010055727A1 (enExample)

Families Citing this family (45)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008104915A2 (en) * 2007-02-27 2008-09-04 Philips Intellectual Property & Standards Gmbh Simulation and visualization of scattered radiation
GB0803640D0 (en) * 2008-02-28 2008-04-02 Rapiscan Security Products Inc Scanning systems
JP5559471B2 (ja) 2008-11-11 2014-07-23 浜松ホトニクス株式会社 放射線検出装置、放射線画像取得システム、放射線検査システム、及び放射線検出方法
JP5368772B2 (ja) * 2008-11-11 2013-12-18 浜松ホトニクス株式会社 放射線検出装置、放射線画像取得システム及び放射線の検出方法
JP5467830B2 (ja) * 2009-09-18 2014-04-09 浜松ホトニクス株式会社 放射線検出装置
JP5295915B2 (ja) 2009-09-18 2013-09-18 浜松ホトニクス株式会社 放射線検出装置
JP5457118B2 (ja) 2009-09-18 2014-04-02 浜松ホトニクス株式会社 放射線検出装置
DE102011053971A1 (de) * 2011-09-27 2013-03-28 Wipotec Wiege- Und Positioniersysteme Gmbh Verfahren und Vorrichtung zum Erfassen der Struktur von bewegten Stückgütern, insbesondere zur Erfassung von Störpartikeln in flüssigen oder pastösen Produkten
CN103975233B (zh) * 2012-02-06 2017-01-04 株式会社日立高新技术 X射线检查装置、检查方法以及x射线检测器
JP5881159B2 (ja) * 2012-03-27 2016-03-09 株式会社リガク 異種物質の検査装置及び異種物質の検査方法
EP3055717A1 (en) * 2013-10-11 2016-08-17 Analogic Corporation Tomosynthesis imaging
CN104749198B (zh) * 2013-12-30 2019-08-06 同方威视技术股份有限公司 双通道高能x射线透视成像系统
CN104749199B (zh) * 2013-12-30 2019-02-19 同方威视技术股份有限公司 双能/双视角的高能x射线透视成像系统
RO130582B1 (ro) * 2014-01-23 2021-12-30 Mb Telecom Ltd. S.R.L. Sistem şi metodă pentru inspecţia completă şi neintruzivă a aeronavelor
JP6371572B2 (ja) * 2014-04-10 2018-08-08 アンリツインフィビス株式会社 Ｘ線検査装置
JP6442154B2 (ja) 2014-04-23 2018-12-19 浜松ホトニクス株式会社 画像取得装置及び画像取得方法
JP6397690B2 (ja) * 2014-08-11 2018-09-26 株式会社日立ハイテクノロジーズ Ｘ線透過検査装置及び異物検出方法
ES2686977T3 (es) * 2015-01-27 2018-10-23 Detection Technology Oy Corrección de datos de imagen de radiación ionizante
JP6072097B2 (ja) * 2015-01-30 2017-02-01 キヤノン株式会社 放射線撮影装置、制御装置、長尺撮影システム、制御方法、及びプログラム
DE102015114658A1 (de) * 2015-09-02 2017-03-02 Troester Gmbh & Co. Kg Vorrichtung und Verfahren zur radioskopischen Untersuchung eines streifenförmigen Materials mit einem wesentlichen Bestandteil aus Kautschuk oder Kunststoff
US10345479B2 (en) * 2015-09-16 2019-07-09 Rapiscan Systems, Inc. Portable X-ray scanner
JP6799917B2 (ja) * 2015-12-21 2020-12-16 浜松ホトニクス株式会社 放射線検出装置、放射線検査システム、及び、放射線検出装置の調整方法
JP6621657B2 (ja) 2015-12-21 2019-12-18 浜松ホトニクス株式会社 放射線検出装置、放射線検査システム、及び、放射線検出装置の調整方法
JP2017181402A (ja) * 2016-03-31 2017-10-05 住友ベークライト株式会社 検査装置
ITUA20163149A1 (it) * 2016-05-04 2017-11-04 Xnext S R L Rivelatore, apparecchiatura e metodo per l’esecuzione di un controllo radiografico non invasivo di oggetti
PL234550B1 (pl) 2016-06-03 2020-03-31 Int Tobacco Machinery Poland Spolka Z Ograniczona Odpowiedzialnoscia Urządzenie do identyfikacji parametrów fizycznych artykułów prętopodobnych przemysłu tytoniowego
PL233097B1 (pl) 2016-06-10 2019-09-30 Int Tobacco Machinery Poland Spolka Z Ograniczona Odpowiedzialnoscia Urządzenie do określania położenia wkładki w artykułach prętopodobnych przemysłu tytoniowego
US10094950B2 (en) * 2016-07-11 2018-10-09 Morpho Detection, Llc System and method for detecting and reconstructing objects in a non-continuous stream of items in an imaging system
US10006873B1 (en) 2016-12-14 2018-06-26 Battelle Memorial Institute Dual-energy microfocus radiographic imaging method for meat inspection
US10197512B2 (en) 2016-12-14 2019-02-05 Battelle Memorial Institute Dual-energy microfocus radiographic imaging method for meat inspection
JP6976699B2 (ja) * 2017-03-15 2021-12-08 キヤノンメディカルシステムズ株式会社 Ｘ線診断装置
GB2563006B (en) * 2017-05-23 2021-03-31 Cheyney Design & Dev Ltd Improvements in or relating to detectors
JP6717784B2 (ja) * 2017-06-30 2020-07-08 アンリツインフィビス株式会社 物品検査装置およびその校正方法
CN108398727B (zh) * 2018-05-30 2020-01-10 长春市泽安科技有限公司 一种基于图像反馈的x射线成像能量选择装置和选择方法
EP3716771B1 (en) * 2018-06-06 2020-12-30 Marel Iceland EHF A method of providing feedback data indicating quality of food processing performed by an operator
JP2020020730A (ja) * 2018-08-03 2020-02-06 株式会社日立ハイテクサイエンス Ｘ線透過検査装置及びｘ線透過検査方法
CN109239111A (zh) * 2018-08-17 2019-01-18 河北省特种设备监督检验研究院 一种管道焊缝无损探伤装置
EP3877780B1 (en) * 2018-11-06 2025-02-12 Shenzhen Xpectvision Technology Co., Ltd. Image sensors having radiation detectors and masks
DE102019111567A1 (de) * 2019-05-03 2020-11-05 Wipotec Gmbh Verfahren und Vorrichtung zur Röntgeninspektion von Produkten, insbesondere von Lebensmitteln
JP6781323B2 (ja) * 2019-11-20 2020-11-04 浜松ホトニクス株式会社 放射線検出装置、放射線検査システム、及び、放射線検出装置の調整方法
IT202000011950A1 (it) * 2020-05-21 2021-11-21 Sacmi Metodo e dispositivo per ispezionare un oggetto
EP4206745A4 (en) * 2020-11-25 2024-08-14 Hamamatsu Photonics K.K. IMAGING UNIT AND IMAGING SYSTEM
CN115335728A (zh) * 2021-03-05 2022-11-11 深圳帧观德芯科技有限公司 使用辐射检测器的成像方法
CN115835820A (zh) * 2021-04-23 2023-03-21 深圳帧观德芯科技有限公司 使用具有多个辐射检测器的图像传感器的成像方法
CN113759432A (zh) * 2021-07-20 2021-12-07 浙江华视智检科技有限公司 安检系统、数据采集速率调节方法和物品信息检测方法

Family Cites Families (104)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6018298B2 (ja) 1978-10-27 1985-05-09 株式会社リコー 微小間隙維持装置
US4445226A (en) * 1981-05-05 1984-04-24 The Board Of Trustees Of The Leland Stanford Junior University Multiple-energy X-ray subtraction imaging system
DE3623053C2 (de) * 1986-07-09 1994-09-01 Siemens Ag Röntgenstereoeinrichtung
US5044002A (en) * 1986-07-14 1991-08-27 Hologic, Inc. Baggage inspection and the like
JPH042907A (ja) 1990-04-20 1992-01-07 Hitachi Medical Corp Ｘ線非破壊検査装置
US5117445A (en) 1990-07-02 1992-05-26 Varian Associates, Inc. Electronically enhanced x-ray detector apparatus
US5841832A (en) * 1991-02-13 1998-11-24 Lunar Corporation Dual-energy x-ray detector providing spatial and temporal interpolation
US5841833A (en) * 1991-02-13 1998-11-24 Lunar Corporation Dual-energy x-ray detector providing spatial and temporal interpolation
GB9200828D0 (en) * 1992-01-15 1992-03-11 Image Research Ltd Improvements in and relating to material identification using x-rays
US5237598A (en) * 1992-04-24 1993-08-17 Albert Richard D Multiple image scanning X-ray method and apparatus
JPH0627249A (ja) * 1992-07-13 1994-02-04 Toshiba Corp 放射線検査装置
JPH0688790A (ja) * 1992-09-07 1994-03-29 Toshiba Corp ラミノグラフィー装置
JP3449561B2 (ja) * 1993-04-19 2003-09-22 東芝医用システムエンジニアリング株式会社 Ｘ線ｃｔ装置
JPH07306165A (ja) * 1994-05-12 1995-11-21 Toshiba Corp Ｘ線検査装置およびｘ線検査補修装置
JPH0868768A (ja) * 1994-08-30 1996-03-12 Hitachi Medical Corp Ｘ線荷物検査装置
US5481584A (en) * 1994-11-23 1996-01-02 Tang; Jihong Device for material separation using nondestructive inspection imaging
US5583904A (en) * 1995-04-11 1996-12-10 Hewlett-Packard Co. Continuous linear scan laminography system and method
US5687209A (en) * 1995-04-11 1997-11-11 Hewlett-Packard Co. Automatic warp compensation for laminographic circuit board inspection
US6205199B1 (en) * 1995-06-23 2001-03-20 Science Applications International Corporation Pixel-correlated, digital X-ray imaging system
US6018562A (en) * 1995-11-13 2000-01-25 The United States Of America As Represented By The Secretary Of The Army Apparatus and method for automatic recognition of concealed objects using multiple energy computed tomography
US5825431A (en) * 1996-12-18 1998-10-20 Eastman Kodak Company H-sync to pixel clock phase detection circuit
US5805236A (en) * 1996-12-18 1998-09-08 Eastman Kodak Company High frequency image capturing device
JPH10318943A (ja) 1997-05-20 1998-12-04 Shimadzu Corp 異物検査装置
JP3854702B2 (ja) 1997-10-07 2006-12-06 浜松ホトニクス株式会社 Ｘ線検査システム
DE19802668B4 (de) * 1998-01-24 2013-10-17 Smiths Heimann Gmbh Röntgenstrahlungserzeuger
DE19812055C2 (de) * 1998-03-19 2002-08-08 Heimann Systems Gmbh & Co Bildverarbeitung zur Materialerkennung mittels Röntgenstrahlungen
US6236709B1 (en) * 1998-05-04 2001-05-22 Ensco, Inc. Continuous high speed tomographic imaging system and method
JPH11316198A (ja) * 1998-05-06 1999-11-16 Shimadzu Corp 放射線検出装置
US6088423A (en) * 1998-06-05 2000-07-11 Vivid Technologies, Inc. Multiview x-ray based system for detecting contraband such as in baggage
US6324253B1 (en) * 1998-08-26 2001-11-27 Yuyama Mfg. Co., Ltd. Tablet inspection apparatus
US6269142B1 (en) * 1999-08-11 2001-07-31 Steven W. Smith Interrupted-fan-beam imaging
JP2001099790A (ja) * 1999-09-30 2001-04-13 Ishikawajima Harima Heavy Ind Co Ltd Ｘ線検査装置
US6567496B1 (en) * 1999-10-14 2003-05-20 Sychev Boris S Cargo inspection apparatus and process
DE60010499T2 (de) * 1999-10-21 2005-05-19 Foss Analytical A/S Verfahren und vorrichtung zur bestimmung der eigenschaften von lebensmitteln oder tierfutter
JP3643745B2 (ja) * 2000-02-21 2005-04-27 株式会社モリタ製作所 Ｘ線撮影用検出器及びｘ線撮影装置
IT1320201B1 (it) * 2000-06-09 2003-11-26 Dylog Italia Spa Dispositivo di ispezione a raggi x per prodotti alimentari.
US6628745B1 (en) * 2000-07-01 2003-09-30 Martin Annis Imaging with digital tomography and a rapidly moving x-ray source
JP2002168803A (ja) * 2000-11-30 2002-06-14 Anritsu Corp Ｘ線異物検出装置
DE10062214B4 (de) * 2000-12-13 2013-01-24 Smiths Heimann Gmbh Vorrichtungen zur Durchleuchtung von Objekten
ATE344929T1 (de) * 2001-04-03 2006-11-15 L 3 Comm Security & Detection Röntgenuntersuchungssystem
US6580299B2 (en) * 2001-04-05 2003-06-17 Parthus Ireland Limited Digital circuit for, and a method of, synthesizing an input signal
US6370223B1 (en) * 2001-04-06 2002-04-09 Ut-Battelle, Llc Automatic detection of bone fragments in poultry using multi-energy x-rays
US6597760B2 (en) * 2001-05-23 2003-07-22 Heimann Systems Gmbh Inspection device
US6580778B2 (en) * 2001-05-23 2003-06-17 Heimann Systems Gmbh Inspection device
JP2002365368A (ja) * 2001-06-04 2002-12-18 Anritsu Corp Ｘ線検出器及び該検出器を用いたｘ線異物検出装置
DE10149254B4 (de) * 2001-10-05 2006-04-20 Smiths Heimann Gmbh Verfahren und Vorrichtung zur Detektion eines bestimmten Materials in einem Objekt mittels elektromagnetischer Strahlen
JP2003279503A (ja) * 2002-03-22 2003-10-02 Shimadzu Corp Ｘ線検査装置
JP4184694B2 (ja) * 2002-04-05 2008-11-19 株式会社ブリヂストン タイヤのｘ線検査方法及びその装置
US7486768B2 (en) * 2002-07-23 2009-02-03 Rapiscan Security Products, Inc. Self-contained mobile inspection system and method
US6924486B2 (en) * 2002-10-03 2005-08-02 Schick Technologies, Inc. Intraoral sensor having power conservation features
US6972411B2 (en) * 2002-10-03 2005-12-06 Schick Technologies, Inc. Method of event detection for intraoral image sensor
US7072443B2 (en) * 2002-10-03 2006-07-04 Schick Technologies, Inc. Intraoral image sensor
AU2003240919A1 (en) * 2003-06-16 2005-01-04 Instrumentarium Corporation Identification of detector units in x-ray imaging
JP4457613B2 (ja) * 2003-09-04 2010-04-28 ソニー株式会社 固体撮像装置
US7060981B2 (en) * 2003-09-05 2006-06-13 Facet Technology Corp. System for automated detection of embedded objects
EP1532927B1 (fr) * 2003-11-21 2007-12-19 Eastman Kodak Company Appareil de radiologie dentaire
US7868949B2 (en) * 2003-12-15 2011-01-11 Trident Microsystems (Far East) Ltd. Circuit arrangement and method for locking onto and/or processing data, in particular audio, T[ele]v[ision] and/or video data
US7099433B2 (en) * 2004-03-01 2006-08-29 Spectramet, Llc Method and apparatus for sorting materials according to relative composition
DE102004017149A1 (de) * 2004-04-02 2005-10-20 Fraunhofer Ges Forschung Verfahren und Vorrichtung zur Bestimmung eines Objektmaterials
JP4655500B2 (ja) * 2004-04-12 2011-03-23 ソニー株式会社 Ａｄ変換装置並びに物理量分布検知の半導体装置および電子機器
JP4565896B2 (ja) * 2004-06-11 2010-10-20 株式会社イシダ Ｘ線検査装置
WO2006001107A1 (ja) * 2004-06-24 2006-01-05 Ishida Co., Ltd. Ｘ線検査装置およびｘ線検査装置の画像処理手順の生成方法
JP2006126154A (ja) 2004-10-27 2006-05-18 Takashima Giken Kk Ｘ線異物検出装置
EP2392947A3 (en) * 2005-07-05 2014-02-12 L-3 Communications Security and Detection Systems, Inc. Methods and apparatus for e-beam scanning
EP1950527B1 (en) * 2005-11-16 2017-01-04 ISHIDA CO., Ltd. X-ray inspection device
US7606348B2 (en) * 2006-02-09 2009-10-20 L-3 Communications Security and Detection Systems Inc. Tomographic imaging systems and methods
US7831012B2 (en) * 2006-02-09 2010-11-09 L-3 Communications Security and Detection Systems Inc. Radiation scanning systems and methods
JP5340524B2 (ja) * 2006-03-23 2013-11-13 浜松ホトニクス株式会社 放射線検出器及び放射線検出方法
US7319737B2 (en) * 2006-04-07 2008-01-15 Satpal Singh Laminographic system for 3D imaging and inspection
JP4819561B2 (ja) * 2006-04-24 2011-11-24 浜松ホトニクス株式会社 固体撮像装置
JP4737427B2 (ja) 2006-05-09 2011-08-03 株式会社島津製作所 インラインｘ線透視装置
CN101074935B (zh) * 2006-05-19 2011-03-23 清华大学 探测器阵列及设备
JP5041751B2 (ja) * 2006-07-24 2012-10-03 株式会社イシダ Ｘ線検査装置およびｘ線検査プログラム
FR2906911B1 (fr) * 2006-10-06 2009-05-01 Visiodent Sa Systeme de prise de vues et de numerotation automatique d'im ages dentaires
KR20080114695A (ko) 2006-12-27 2008-12-31 가부시끼가이샤 도시바 방사선 검출기
US7813478B2 (en) * 2007-02-08 2010-10-12 Varian Medical Systems, Inc. Method and apparatus to facilitate provision and use of multiple X-ray sources
JP5131730B2 (ja) * 2007-03-12 2013-01-30 株式会社イシダ Ｘ線検査装置および生産システム
GB0706088D0 (en) * 2007-03-29 2007-05-09 Durham Scient Crystals Ltd X-ray imaging of materials
GB0706089D0 (en) * 2007-03-29 2007-10-31 Durham Scient Crystals Ltd X-ray imaging of materials
TWI333060B (en) 2007-04-14 2010-11-11 Univ Ching Yun Detection method using radiation and detection device using radiation
US7693261B2 (en) * 2007-05-17 2010-04-06 Durham Scientific Crystals Limited Method and apparatus for inspection of materials
GB0716045D0 (en) * 2007-08-17 2007-09-26 Durham Scient Crystals Ltd Method and apparatus for inspection of materials
US7529336B2 (en) * 2007-05-31 2009-05-05 Test Research, Inc. System and method for laminography inspection
US7742568B2 (en) * 2007-06-09 2010-06-22 Spectrum San Diego, Inc. Automobile scanning system
EP2194374B1 (en) * 2007-09-26 2016-01-13 Ishida Co., Ltd. Examination apparatus
US7760123B2 (en) * 2007-10-08 2010-07-20 General Electric Company Data acquisition system for photon counting and energy discriminating detectors
US8044681B2 (en) * 2007-10-08 2011-10-25 General Electric Company Apparatus and method for channel-specific configuration in a readout ASIC
US8159286B2 (en) * 2007-10-08 2012-04-17 General Electric Company System and method for time-to-voltage conversion with lock-out logic
GB0803640D0 (en) * 2008-02-28 2008-04-02 Rapiscan Security Products Inc Scanning systems
JP5123702B2 (ja) * 2008-03-17 2013-01-23 富士フイルム株式会社 放射線ｃｔ装置
US7684541B2 (en) * 2008-03-20 2010-03-23 Nuctech Company Limited System and method capable of simultaneous radiographic examination and radioactive material inspection
GB0807473D0 (en) * 2008-04-24 2008-12-03 Durham Scient Crystals Ltd Method and Apparatus for Inspection of Materials
CN102187206B (zh) * 2008-09-08 2015-10-14 技术资源有限公司 用于分析材料的方法和设备
JP5165520B2 (ja) * 2008-10-01 2013-03-21 ソニー株式会社 固体撮像装置、撮像装置、および固体撮像装置のａｄ変換方法
JP5368772B2 (ja) * 2008-11-11 2013-12-18 浜松ホトニクス株式会社 放射線検出装置、放射線画像取得システム及び放射線の検出方法
JP5559471B2 (ja) * 2008-11-11 2014-07-23 浜松ホトニクス株式会社 放射線検出装置、放射線画像取得システム、放射線検査システム、及び放射線検出方法
US8135205B2 (en) * 2008-12-20 2012-03-13 Varian Medical Systems, Inc. Rapid matching of noisy spectra or other signal patterns
US8184769B2 (en) * 2009-06-05 2012-05-22 Varian Medical Systems, Inc. Method and apparatus to facilitate using multiple radiation-detection views to differentiate one material from another
US8416919B2 (en) * 2009-08-20 2013-04-09 Varian Medical Systems, Inc. Apparatus to facilitate capturing samples as pertain to an object to be imaged and corresponding method
US8098794B1 (en) * 2009-09-11 2012-01-17 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Moving-article X-ray imaging system and method for 3-D image generation
JP5457118B2 (ja) * 2009-09-18 2014-04-02 浜松ホトニクス株式会社 放射線検出装置
JP5295915B2 (ja) * 2009-09-18 2013-09-18 浜松ホトニクス株式会社 放射線検出装置
JP5467830B2 (ja) * 2009-09-18 2014-04-09 浜松ホトニクス株式会社 放射線検出装置
US8284896B2 (en) * 2009-10-26 2012-10-09 Satpal Singh Multiview x-ray inspection system

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