JP2011232163A5 - - Google Patents

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Publication number
JP2011232163A5
JP2011232163A5 JP2010102527A JP2010102527A JP2011232163A5 JP 2011232163 A5 JP2011232163 A5 JP 2011232163A5 JP 2010102527 A JP2010102527 A JP 2010102527A JP 2010102527 A JP2010102527 A JP 2010102527A JP 2011232163 A5 JP2011232163 A5 JP 2011232163A5
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JP
Japan
Prior art keywords
ray
energy
detector
imaging apparatus
detection result
Prior art date
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Application number
JP2010102527A
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English (en)
Japanese (ja)
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JP2011232163A (ja
JP5733908B2 (ja
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Publication date
Application filed filed Critical
Priority to JP2010102527A priority Critical patent/JP5733908B2/ja
Priority claimed from JP2010102527A external-priority patent/JP5733908B2/ja
Priority to PCT/JP2011/060009 priority patent/WO2011136157A1/en
Priority to US13/643,260 priority patent/US9042517B2/en
Publication of JP2011232163A publication Critical patent/JP2011232163A/ja
Publication of JP2011232163A5 publication Critical patent/JP2011232163A5/ja
Application granted granted Critical
Publication of JP5733908B2 publication Critical patent/JP5733908B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2010102527A 2010-04-27 2010-04-27 Ｘ線撮像装置 Expired - Fee Related JP5733908B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2010102527A JP5733908B2 (ja) 2010-04-27 2010-04-27 Ｘ線撮像装置
PCT/JP2011/060009 WO2011136157A1 (en) 2010-04-27 2011-04-19 X-ray imaging apparatus
US13/643,260 US9042517B2 (en) 2010-04-27 2011-04-19 X-ray imaging apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010102527A JP5733908B2 (ja) 2010-04-27 2010-04-27 Ｘ線撮像装置

Publications (3)

Publication Number Publication Date
JP2011232163A JP2011232163A (ja) 2011-11-17
JP2011232163A5 true JP2011232163A5 (enExample) 2013-06-20
JP5733908B2 JP5733908B2 (ja) 2015-06-10

Family

ID=44861457

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010102527A Expired - Fee Related JP5733908B2 (ja) 2010-04-27 2010-04-27 Ｘ線撮像装置

Country Status (3)

Country Link
US (1) US9042517B2 (enExample)
JP (1) JP5733908B2 (enExample)
WO (1) WO2011136157A1 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10692184B2 (en) 2018-07-05 2020-06-23 SVXR, Inc. Super-resolution X-ray imaging method and apparatus
CN119688759B (zh) * 2025-02-21 2025-04-25 中国科学院上海高等研究院 一种软硬x射线共聚焦的宽能区光电子能谱系统

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5533084A (en) 1991-02-13 1996-07-02 Lunar Corporation Bone densitometer with improved vertebral characterization
JP2001099790A (ja) 1999-09-30 2001-04-13 Ishikawajima Harima Heavy Ind Co Ltd Ｘ線検査装置
JP2004008460A (ja) * 2002-06-06 2004-01-15 Kawasaki Heavy Ind Ltd Ｘ線エネルギー分析イメージング装置
JP2005278880A (ja) 2004-03-29 2005-10-13 Toshiba Corp Ｘ線コンピュータ断層撮像装置およびｘ線コンピュータ断層撮像方法
DE102004017149A1 (de) * 2004-04-02 2005-10-20 Fraunhofer Ges Forschung Verfahren und Vorrichtung zur Bestimmung eines Objektmaterials
JP2007271468A (ja) * 2006-03-31 2007-10-18 National Univ Corp Shizuoka Univ 低被爆ｘ線検査方法及び装置
GB2441578A (en) * 2006-09-08 2008-03-12 Ucl Business Plc Phase Contrast X-Ray Imaging
US8005284B2 (en) * 2006-12-07 2011-08-23 Kabushiki Kaisha Toshiba Three dimensional image processing apparatus and x-ray diagnosis apparatus
JP5297087B2 (ja) * 2008-01-17 2013-09-25 アンリツ産機システム株式会社 Ｘ線異物検出装置
JP4512660B2 (ja) * 2008-03-12 2010-07-28 キヤノン株式会社 Ｘ線撮像装置、ｘ線撮像方法、ｘ線撮像装置の制御方法
JP2009258102A (ja) * 2008-03-26 2009-11-05 Panasonic Electric Works Co Ltd Ｘ線強度調整体及びそれを用いたｘ線異物検査方法並びにｘ線異物検査装置
JP4847568B2 (ja) * 2008-10-24 2011-12-28 キヤノン株式会社 Ｘ線撮像装置およびｘ線撮像方法
GB2479329B (en) 2009-01-15 2013-08-14 Canon Kk X-ray imaging apparatus and method of X-ray imaging
WO2010082688A2 (en) 2009-01-15 2010-07-22 Canon Kabushiki Kaisha X-ray imaging apparatus and method of x-ray imaging
JP5675169B2 (ja) 2009-06-18 2015-02-25 キヤノン株式会社 Ｘ線撮像装置およびｘ線撮像方法
JP5697370B2 (ja) 2009-07-24 2015-04-08 キヤノン株式会社 Ｘ線撮像装置
JP5213923B2 (ja) * 2010-01-29 2013-06-19 キヤノン株式会社 Ｘ線撮像装置およびｘ線撮像方法

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