JP2011067555A5 - - Google Patents

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Publication number
JP2011067555A5
JP2011067555A5 JP2009223336A JP2009223336A JP2011067555A5 JP 2011067555 A5 JP2011067555 A5 JP 2011067555A5 JP 2009223336 A JP2009223336 A JP 2009223336A JP 2009223336 A JP2009223336 A JP 2009223336A JP 2011067555 A5 JP2011067555 A5 JP 2011067555A5
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JP
Japan
Prior art keywords
ray
detection unit
focal point
movement
detector
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Application number
JP2009223336A
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English (en)
Japanese (ja)
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JP2011067555A (ja
JP5134606B2 (ja
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Publication date
Application filed filed Critical
Priority to JP2009223336A priority Critical patent/JP5134606B2/ja
Priority claimed from JP2009223336A external-priority patent/JP5134606B2/ja
Priority to US13/391,074 priority patent/US8774350B2/en
Priority to PCT/JP2010/063988 priority patent/WO2011036968A1/ja
Publication of JP2011067555A publication Critical patent/JP2011067555A/ja
Publication of JP2011067555A5 publication Critical patent/JP2011067555A5/ja
Application granted granted Critical
Publication of JP5134606B2 publication Critical patent/JP5134606B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2009223336A 2009-09-28 2009-09-28 Ｘ線ｃｔ装置 Expired - Fee Related JP5134606B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2009223336A JP5134606B2 (ja) 2009-09-28 2009-09-28 Ｘ線ｃｔ装置
US13/391,074 US8774350B2 (en) 2009-09-28 2010-08-19 X-ray CT device
PCT/JP2010/063988 WO2011036968A1 (ja) 2009-09-28 2010-08-19 Ｘ線ｃｔ装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009223336A JP5134606B2 (ja) 2009-09-28 2009-09-28 Ｘ線ｃｔ装置

Publications (3)

Publication Number Publication Date
JP2011067555A JP2011067555A (ja) 2011-04-07
JP2011067555A5 true JP2011067555A5 (enExample) 2011-10-06
JP5134606B2 JP5134606B2 (ja) 2013-01-30

Family

ID=43795727

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009223336A Expired - Fee Related JP5134606B2 (ja) 2009-09-28 2009-09-28 Ｘ線ｃｔ装置

Country Status (3)

Country Link
US (1) US8774350B2 (enExample)
JP (1) JP5134606B2 (enExample)
WO (1) WO2011036968A1 (enExample)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5894371B2 (ja) * 2011-03-07 2016-03-30 キヤノン株式会社 放射線撮像装置及びその制御方法
WO2013190440A1 (en) * 2012-06-20 2013-12-27 Koninklijke Philips N.V. Image-based determination of source detector spatial relation
US9271683B2 (en) * 2012-11-30 2016-03-01 General Electric Company Radiation focal position detecting method, radiation detecting apparatus and radiation tomographic imaging apparatus
CN105073010B (zh) * 2013-04-04 2018-04-03 东芝医疗系统株式会社 X射线计算机断层摄影装置
JP2015092953A (ja) * 2013-11-11 2015-05-18 キヤノン株式会社 放射線撮影装置及び放射線撮影システム
US10117632B2 (en) * 2016-02-03 2018-11-06 Globus Medical, Inc. Portable medical imaging system with beam scanning collimator
US10433811B2 (en) 2016-12-23 2019-10-08 General Electric Company Self-calibrating CT detectors, systems and methods for self-calibration
CN108937976B (zh) * 2017-05-27 2024-06-21 上海西门子医疗器械有限公司 X射线系统、测量x射线管的焦点的偏移的方法、准直器
US10445886B2 (en) * 2017-05-30 2019-10-15 General Electric Company Motion-gated medical imaging
EP3420908A1 (en) * 2017-06-27 2019-01-02 Koninklijke Philips N.V. Scattered x-ray detection to detect misuse and prevent harm
CN107682452B (zh) * 2017-10-31 2020-12-29 东软医疗系统股份有限公司 一种数据处理方法、装置及系统
JP6987631B2 (ja) * 2017-12-19 2022-01-05 キヤノンメディカルシステムズ株式会社 Ｘ線ｃｔ装置及び画像生成方法
CN109431534B (zh) * 2018-11-30 2022-12-06 深圳安科高技术股份有限公司 一种射线准直器的自校准方法及其系统
WO2020112684A2 (en) * 2018-11-30 2020-06-04 Accuray Inc. Multi-pass computed tomography scans for improved workflow and performance
CN109730712B (zh) * 2018-12-28 2022-08-09 深圳安科高技术股份有限公司 一种ct球管焦点跟踪方法及其系统
CN113552640A (zh) * 2020-04-02 2021-10-26 同方威视技术股份有限公司 射线检查系统及散射校正方法
JP7534123B2 (ja) * 2020-05-12 2024-08-14 キヤノンメディカルシステムズ株式会社 Ｘ線検出器及びｘ線ｃｔ装置
CN111728632B (zh) * 2020-07-31 2023-08-15 上海联影医疗科技股份有限公司 射线探测装置、射线探测方法和ct图像重建方法
JP7619776B2 (ja) 2020-09-11 2025-01-22 キヤノンメディカルシステムズ株式会社 Ｘ線撮影制御装置
WO2023277900A1 (en) * 2021-06-30 2023-01-05 Accuray, Inc. Anchored kernel scatter estimate
US11794039B2 (en) 2021-07-13 2023-10-24 Accuray, Inc. Multimodal radiation apparatus and methods
US11854123B2 (en) 2021-07-23 2023-12-26 Accuray, Inc. Sparse background measurement and correction for improving imaging
US12257083B2 (en) 2022-02-07 2025-03-25 Accuray Inc. Methods for saturation correction and dynamic gain configuration and apparatuses for performing the same
JP2024048207A (ja) * 2022-09-27 2024-04-08 キヤノンメディカルシステムズ株式会社 Ｘ線ｃｔ装置
CN117462160A (zh) * 2023-11-29 2024-01-30 上海联影医疗科技股份有限公司 放射源的位置跟踪装置、方法和计算机断层成像设备

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0712948A (ja) * 1993-06-28 1995-01-17 Hitachi Medical Corp 散乱線検出器及び散乱線・線質検出装置
JP3408848B2 (ja) * 1993-11-02 2003-05-19 株式会社日立メディコ 散乱ｘ線補正法及びｘ線ｃｔ装置並びに多チャンネルｘ線検出器
JP2825450B2 (ja) 1994-12-06 1998-11-18 株式会社東芝 Ｃｔスキャナ
JP3532649B2 (ja) * 1995-03-16 2004-05-31 株式会社東芝 Ｘ線ｃｔ装置
JP3736820B2 (ja) * 1997-01-31 2006-01-18 株式会社東芝 Ｘ線ｃｔ装置
JPH1170103A (ja) * 1997-08-29 1999-03-16 Shimadzu Corp Ｘ線撮像装置
JPH1189826A (ja) * 1997-09-17 1999-04-06 Shimadzu Corp Ｘ線ｃｔ装置
JP4897151B2 (ja) 2001-04-26 2012-03-14 株式会社日立メディコ Ｘ線ｃｔ装置
JP2009507544A (ja) * 2005-09-13 2009-02-26 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ Ｃｔ用の直接の測定及び散乱補正
US8761342B2 (en) * 2008-12-08 2014-06-24 Koninklijke Philips N.V. Compensation of anode wobble for X-ray tubes of the rotary-anode type
US8262288B2 (en) * 2010-01-21 2012-09-11 Analogic Corporation Focal spot position determiner
US8891727B2 (en) * 2012-02-24 2014-11-18 General Electric Company Radiation imaging apparatus, radiation detecting apparatus and radiation focal-point movement detecting method

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