JP2010500576A5 - - Google Patents

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JP2010500576A5
JP2010500576A5 JP2009523942A JP2009523942A JP2010500576A5 JP 2010500576 A5 JP2010500576 A5 JP 2010500576A5 JP 2009523942 A JP2009523942 A JP 2009523942A JP 2009523942 A JP2009523942 A JP 2009523942A JP 2010500576 A5 JP2010500576 A5 JP 2010500576A5
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radiation
measured
elements
detector
display
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JP4688955B2 (ja
JP2010500576A (ja
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Priority claimed from PCT/US2007/075323 external-priority patent/WO2008021807A2/en
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JP2009523942A 2006-08-11 2007-08-07 同時かつ近位の透過イメージングおよび後方散乱イメージングによるｘ線検査 Expired - Fee Related JP4688955B2 (ja)

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Application Number Priority Date Filing Date Title
US82216206P 2006-08-11 2006-08-11
US60/822,162 2006-08-11
PCT/US2007/075323 WO2008021807A2 (en) 2006-08-11 2007-08-07 X-ray inspection with contemporaneous and proximal transmission and backscatter imaging

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JP2010123342A Division JP5303508B2 (ja) 2006-08-11 2010-05-28 同時かつ近位の透過イメージングおよび後方散乱イメージングによるｘ線検査

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JP2010500576A JP2010500576A (ja) 2010-01-07
JP2010500576A5 true JP2010500576A5 (enExample) 2010-04-08
JP4688955B2 JP4688955B2 (ja) 2011-05-25

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JP2010123342A Expired - Fee Related JP5303508B2 (ja) 2006-08-11 2010-05-28 同時かつ近位の透過イメージングおよび後方散乱イメージングによるｘ線検査

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US (2) US7555099B2 (enExample)
EP (1) EP2049888B1 (enExample)
JP (2) JP4688955B2 (enExample)
KR (2) KR101034753B1 (enExample)
CN (1) CN101501477B (enExample)
ES (1) ES2474200T3 (enExample)
IL (2) IL196967A (enExample)
MX (1) MX2009001529A (enExample)
MY (2) MY142674A (enExample)
PL (1) PL2049888T3 (enExample)
RU (2) RU2499251C2 (enExample)
SG (1) SG165402A1 (enExample)
WO (1) WO2008021807A2 (enExample)

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