PL2049888T3 - Badanie z wykorzystaniem promieniowania rentgenowskiego z równoczesną i proksymalną transmisją i obrazowanie rozpraszania wstecznego - Google Patents

Badanie z wykorzystaniem promieniowania rentgenowskiego z równoczesną i proksymalną transmisją i obrazowanie rozpraszania wstecznego

Info

Publication number
PL2049888T3
PL2049888T3 PL07840728T PL07840728T PL2049888T3 PL 2049888 T3 PL2049888 T3 PL 2049888T3 PL 07840728 T PL07840728 T PL 07840728T PL 07840728 T PL07840728 T PL 07840728T PL 2049888 T3 PL2049888 T3 PL 2049888T3
Authority
PL
Poland
Prior art keywords
contemporaneous
ray inspection
backscatter imaging
proximal transmission
proximal
Prior art date
Application number
PL07840728T
Other languages
English (en)
Inventor
Peter J Rothschild
Jeffrey R Schubert
Aaron D Pailes
Original Assignee
American Science & Eng Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by American Science & Eng Inc filed Critical American Science & Eng Inc
Publication of PL2049888T3 publication Critical patent/PL2049888T3/pl

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Classifications

    • G01V5/22
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20083Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203Measuring back scattering
    • G01V5/222
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/40Imaging
    • G01N2223/419Imaging computed tomograph
PL07840728T 2006-08-11 2007-08-07 Badanie z wykorzystaniem promieniowania rentgenowskiego z równoczesną i proksymalną transmisją i obrazowanie rozpraszania wstecznego PL2049888T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US82216206P 2006-08-11 2006-08-11
PCT/US2007/075323 WO2008021807A2 (en) 2006-08-11 2007-08-07 X-ray inspection with contemporaneous and proximal transmission and backscatter imaging
EP07840728.5A EP2049888B1 (en) 2006-08-11 2007-08-07 X-ray inspection with contemporaneous and proximal transmission and backscatter imaging

Publications (1)

Publication Number Publication Date
PL2049888T3 true PL2049888T3 (pl) 2014-08-29

Family

ID=38920709

Family Applications (1)

Application Number Title Priority Date Filing Date
PL07840728T PL2049888T3 (pl) 2006-08-11 2007-08-07 Badanie z wykorzystaniem promieniowania rentgenowskiego z równoczesną i proksymalną transmisją i obrazowanie rozpraszania wstecznego

Country Status (13)

Country Link
US (2) US7555099B2 (pl)
EP (1) EP2049888B1 (pl)
JP (2) JP4688955B2 (pl)
KR (2) KR101034753B1 (pl)
CN (1) CN101501477B (pl)
ES (1) ES2474200T3 (pl)
IL (2) IL196967A (pl)
MX (1) MX2009001529A (pl)
MY (2) MY142674A (pl)
PL (1) PL2049888T3 (pl)
RU (2) RU2448342C2 (pl)
SG (1) SG165402A1 (pl)
WO (1) WO2008021807A2 (pl)

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CN101501477A (zh) 2009-08-05
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IL196967A0 (en) 2009-11-18
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IL221892A (en) 2015-04-30
JP2010500576A (ja) 2010-01-07
EP2049888A2 (en) 2009-04-22
MX2009001529A (es) 2009-02-18
MY146301A (en) 2012-07-31
RU2009108663A (ru) 2010-09-20
ES2474200T3 (es) 2014-07-08
WO2008021807A2 (en) 2008-02-21
KR20090046827A (ko) 2009-05-11
RU2499251C2 (ru) 2013-11-20
CN101501477B (zh) 2014-07-02
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US7995707B2 (en) 2011-08-09
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US20090268871A1 (en) 2009-10-29
WO2008021807A3 (en) 2008-04-17
KR101034753B1 (ko) 2011-05-17
RU2011148960A (ru) 2013-06-10
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