PL2049888T3 - Badanie z wykorzystaniem promieniowania rentgenowskiego z równoczesną i proksymalną transmisją i obrazowanie rozpraszania wstecznego - Google Patents
Badanie z wykorzystaniem promieniowania rentgenowskiego z równoczesną i proksymalną transmisją i obrazowanie rozpraszania wstecznegoInfo
- Publication number
- PL2049888T3 PL2049888T3 PL07840728T PL07840728T PL2049888T3 PL 2049888 T3 PL2049888 T3 PL 2049888T3 PL 07840728 T PL07840728 T PL 07840728T PL 07840728 T PL07840728 T PL 07840728T PL 2049888 T3 PL2049888 T3 PL 2049888T3
- Authority
- PL
- Poland
- Prior art keywords
- contemporaneous
- ray inspection
- backscatter imaging
- proximal transmission
- proximal
- Prior art date
Links
- 230000005540 biological transmission Effects 0.000 title 1
- 238000003384 imaging method Methods 0.000 title 1
- 238000007689 inspection Methods 0.000 title 1
Classifications
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- G01V5/22—
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/203—Measuring back scattering
-
- G01V5/222—
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/419—Imaging computed tomograph
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US82216206P | 2006-08-11 | 2006-08-11 | |
PCT/US2007/075323 WO2008021807A2 (en) | 2006-08-11 | 2007-08-07 | X-ray inspection with contemporaneous and proximal transmission and backscatter imaging |
EP07840728.5A EP2049888B1 (en) | 2006-08-11 | 2007-08-07 | X-ray inspection with contemporaneous and proximal transmission and backscatter imaging |
Publications (1)
Publication Number | Publication Date |
---|---|
PL2049888T3 true PL2049888T3 (pl) | 2014-08-29 |
Family
ID=38920709
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PL07840728T PL2049888T3 (pl) | 2006-08-11 | 2007-08-07 | Badanie z wykorzystaniem promieniowania rentgenowskiego z równoczesną i proksymalną transmisją i obrazowanie rozpraszania wstecznego |
Country Status (13)
Country | Link |
---|---|
US (2) | US7555099B2 (pl) |
EP (1) | EP2049888B1 (pl) |
JP (2) | JP4688955B2 (pl) |
KR (2) | KR101034753B1 (pl) |
CN (1) | CN101501477B (pl) |
ES (1) | ES2474200T3 (pl) |
IL (2) | IL196967A (pl) |
MX (1) | MX2009001529A (pl) |
MY (2) | MY142674A (pl) |
PL (1) | PL2049888T3 (pl) |
RU (2) | RU2448342C2 (pl) |
SG (1) | SG165402A1 (pl) |
WO (1) | WO2008021807A2 (pl) |
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-
2007
- 2007-08-07 ES ES07840728.5T patent/ES2474200T3/es active Active
- 2007-08-07 KR KR1020097002704A patent/KR101034753B1/ko active IP Right Grant
- 2007-08-07 EP EP07840728.5A patent/EP2049888B1/en active Active
- 2007-08-07 RU RU2009108663/28A patent/RU2448342C2/ru active
- 2007-08-07 US US11/834,888 patent/US7555099B2/en active Active
- 2007-08-07 SG SG201006815-3A patent/SG165402A1/en unknown
- 2007-08-07 MY MYPI20090212A patent/MY142674A/en unknown
- 2007-08-07 RU RU2011148960/28A patent/RU2499251C2/ru active
- 2007-08-07 KR KR1020107004752A patent/KR101263067B1/ko active IP Right Grant
- 2007-08-07 PL PL07840728T patent/PL2049888T3/pl unknown
- 2007-08-07 CN CN200780029927.6A patent/CN101501477B/zh active Active
- 2007-08-07 MX MX2009001529A patent/MX2009001529A/es active IP Right Grant
- 2007-08-07 WO PCT/US2007/075323 patent/WO2008021807A2/en active Application Filing
- 2007-08-07 MY MYPI2010001073A patent/MY146301A/en unknown
- 2007-08-07 JP JP2009523942A patent/JP4688955B2/ja not_active Expired - Fee Related
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2009
- 2009-02-09 IL IL196967A patent/IL196967A/en active IP Right Grant
- 2009-06-22 US US12/488,635 patent/US7995707B2/en active Active
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2010
- 2010-05-28 JP JP2010123342A patent/JP5303508B2/ja not_active Expired - Fee Related
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Also Published As
Publication number | Publication date |
---|---|
SG165402A1 (en) | 2010-10-28 |
CN101501477A (zh) | 2009-08-05 |
KR20100044242A (ko) | 2010-04-29 |
IL196967A0 (en) | 2009-11-18 |
JP5303508B2 (ja) | 2013-10-02 |
IL221892A (en) | 2015-04-30 |
JP2010500576A (ja) | 2010-01-07 |
EP2049888A2 (en) | 2009-04-22 |
MX2009001529A (es) | 2009-02-18 |
MY146301A (en) | 2012-07-31 |
RU2009108663A (ru) | 2010-09-20 |
ES2474200T3 (es) | 2014-07-08 |
WO2008021807A2 (en) | 2008-02-21 |
KR20090046827A (ko) | 2009-05-11 |
RU2499251C2 (ru) | 2013-11-20 |
CN101501477B (zh) | 2014-07-02 |
EP2049888B1 (en) | 2014-05-14 |
RU2448342C2 (ru) | 2012-04-20 |
JP2010181424A (ja) | 2010-08-19 |
JP4688955B2 (ja) | 2011-05-25 |
US20080037707A1 (en) | 2008-02-14 |
US7995707B2 (en) | 2011-08-09 |
MY142674A (en) | 2010-12-15 |
US20090268871A1 (en) | 2009-10-29 |
WO2008021807A3 (en) | 2008-04-17 |
KR101034753B1 (ko) | 2011-05-17 |
RU2011148960A (ru) | 2013-06-10 |
KR101263067B1 (ko) | 2013-05-09 |
IL196967A (en) | 2012-10-31 |
US7555099B2 (en) | 2009-06-30 |
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