JP2011041795A5 - - Google Patents

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Publication number
JP2011041795A5
JP2011041795A5 JP2010153078A JP2010153078A JP2011041795A5 JP 2011041795 A5 JP2011041795 A5 JP 2011041795A5 JP 2010153078 A JP2010153078 A JP 2010153078A JP 2010153078 A JP2010153078 A JP 2010153078A JP 2011041795 A5 JP2011041795 A5 JP 2011041795A5
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JP
Japan
Prior art keywords
phosphor
rays
ray imaging
imaging apparatus
ray
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JP2010153078A
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English (en)
Japanese (ja)
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JP2011041795A (ja
JP5697370B2 (ja
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Priority claimed from JP2010153078A external-priority patent/JP5697370B2/ja
Publication of JP2011041795A publication Critical patent/JP2011041795A/ja
Publication of JP2011041795A5 publication Critical patent/JP2011041795A5/ja
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Publication of JP5697370B2 publication Critical patent/JP5697370B2/ja
Expired - Fee Related legal-status Critical Current
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JP2010153078A 2009-07-24 2010-07-05 Ｘ線撮像装置 Expired - Fee Related JP5697370B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2010153078A JP5697370B2 (ja) 2009-07-24 2010-07-05 Ｘ線撮像装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2009173452 2009-07-24
JP2009173452 2009-07-24
JP2010153078A JP5697370B2 (ja) 2009-07-24 2010-07-05 Ｘ線撮像装置

Publications (3)

Publication Number Publication Date
JP2011041795A JP2011041795A (ja) 2011-03-03
JP2011041795A5 true JP2011041795A5 (enExample) 2013-08-22
JP5697370B2 JP5697370B2 (ja) 2015-04-08

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ID=43499491

Family Applications (1)

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JP2010153078A Expired - Fee Related JP5697370B2 (ja) 2009-07-24 2010-07-05 Ｘ線撮像装置

Country Status (8)

Country Link
US (1) US9103923B2 (enExample)
EP (1) EP2457112A2 (enExample)
JP (1) JP5697370B2 (enExample)
KR (1) KR101331542B1 (enExample)
CN (1) CN102472823A (enExample)
BR (1) BR112012000518A2 (enExample)
RU (1) RU2491578C1 (enExample)
WO (1) WO2011010750A2 (enExample)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4795472B2 (ja) * 2010-03-05 2011-10-19 キヤノン株式会社 Ｘ線撮像装置およびｘ線撮像方法
JP5733908B2 (ja) 2010-04-27 2015-06-10 キヤノン株式会社 Ｘ線撮像装置
JP5646906B2 (ja) 2010-08-06 2014-12-24 キヤノン株式会社 Ｘ線装置およびｘ線測定方法
GB201112506D0 (en) * 2011-07-21 2011-08-31 Ucl Business Plc Phase imaging
EP2761586B1 (en) * 2011-08-31 2022-10-12 Koninklijke Philips N.V. Differential phase contrast imaging with energy sensitive detection
US9423510B2 (en) * 2014-05-15 2016-08-23 Toshiba Medical Systems Corporation Scintillation detector for improved PET performance
KR101657870B1 (ko) * 2015-01-09 2016-09-30 연세대학교 원주산학협력단 자동초점조절된 이동형 그리드를 이용한 디지털 단층 영상합성방법 및 장치
US10034640B2 (en) * 2015-03-11 2018-07-31 David Byron Douglas Method and apparatus for improvement of spatial resolution in molecular and radiological imaging
JP2016176727A (ja) 2015-03-18 2016-10-06 株式会社東芝 計測装置
EP3163325B1 (en) 2015-10-28 2020-02-12 Nokia Technologies Oy An apparatus and associated methods for computed tomography
KR101974507B1 (ko) 2017-05-29 2019-05-03 디아이케이(주) 전기 자동차의 다상 무선 충전 시스템
CN113933888B (zh) * 2020-07-14 2024-12-06 中国科学技术大学 一种宇宙线缪子散射成像探测器
CN113655512B (zh) * 2021-06-29 2024-05-07 中国工程物理研究院激光聚变研究中心 一种测量黑腔m带x射线辐射对称性的方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU1519382C (ru) * 1988-03-09 1993-12-15 Предприятие П/Я Р-6496 Блок детектировани ионизирующего излучени
US6031892A (en) * 1989-12-05 2000-02-29 University Of Massachusetts Medical Center System for quantitative radiographic imaging
RU2103920C1 (ru) * 1995-08-02 1998-02-10 Валентин Романович Анпилогов Компьютерный томограф
AU766025B2 (en) * 1997-02-10 2003-10-09 Cti, Inc. Segmented scintillation detector for photon interaction coordinates
JPH11258349A (ja) 1998-03-13 1999-09-24 Fuji Photo Film Co Ltd 放射線エネルギー弁別方法、およびその方法に用いられる弁別用キット
JP2002102215A (ja) 2000-09-27 2002-04-09 Konica Corp 乳房ｘ画像撮影装置
JP2003010162A (ja) * 2001-07-04 2003-01-14 Nagata Seiki Co Ltd 位相コントラストｘ線撮像装置
JPWO2003067282A1 (ja) * 2002-02-08 2005-06-02 株式会社東芝 Ｘ線検出器およびｘ線検出器の製造方法
JP2004317299A (ja) 2003-04-16 2004-11-11 Univ Tokyo Ｘ線減衰部材、ｘ線減衰方法、ｘａｆｓ実験装置及びｘａｆｓ測定方法
JP4757440B2 (ja) * 2003-11-28 2011-08-24 Ｎｅｃディスプレイソリューションズ株式会社 画像表示装置
EP1764038A4 (en) * 2004-07-07 2010-03-24 Toshiba Kk X-RAY INSPECTION METHOD AND X-RAY INSPECTION DEVICE
DE102005010077B4 (de) * 2005-03-04 2007-09-20 Siemens Ag Detektor mit einem Szintillator und bildgebendes Gerät, aufweisend einen derartigen Detektor
GB2441578A (en) 2006-09-08 2008-03-12 Ucl Business Plc Phase Contrast X-Ray Imaging
JP2009156740A (ja) * 2007-12-27 2009-07-16 Horiba Ltd 放射線検出装置

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