WO2011010750A2 - X-ray imaging apparatus and x-ray imaging method - Google Patents
X-ray imaging apparatus and x-ray imaging method Download PDFInfo
- Publication number
- WO2011010750A2 WO2011010750A2 PCT/JP2010/062972 JP2010062972W WO2011010750A2 WO 2011010750 A2 WO2011010750 A2 WO 2011010750A2 JP 2010062972 W JP2010062972 W JP 2010062972W WO 2011010750 A2 WO2011010750 A2 WO 2011010750A2
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- ray
- scintillators
- scintillator
- fluorescence emission
- emission intensity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/161—Applications in the field of nuclear medicine, e.g. in vivo counting
- G01T1/164—Scintigraphy
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/161—Applications in the field of nuclear medicine, e.g. in vivo counting
- G01T1/164—Scintigraphy
- G01T1/1641—Static instruments for imaging the distribution of radioactivity in one or two dimensions using one or several scintillating elements; Radio-isotope cameras
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Definitions
- an X-ray phase imaging method in which changes in phase caused by a detection object is detected is advantageous.
- the present invention provides an x- ray imaging apparatus and an x-ray imaging method capable of solving the problem of a refraction contrast method.
- an x-ray imaging apparatus and an x-ray imaging method capable of solving the problem of a refraction contrast method can be provided.
- Fig. 4 is a schematic illustration of part of a scintillator array according to the second embodiment of the present invention.
- Fig. 7 illustrates computed tomography (CT)
- a scintillator having a different change in the fluorescence emission intensity or a different increasing and decreasing tendency of the fluorescence emission intensity in a movement direction of the incident X-ray may be used.
- Such scintillator is described in more detail below with reference to a sixth embodiment .
- Fig. 17 is a schematic illustration of the
- the present embodiment employs a scintillator having a fluorescence emission intensity
- a monochromating unit 102 may be disposed between the X-ray source 101 and the detection object 104.
- a monochromator combined with a slit or an X-ray multilayer mirror can be used as the monochromating unit 102.
- a computing unit 307 a computing unit 307
- the result is displayed on a display unit 308, such as a monitor.
- Fig. 4 illustrates a scintillator array according to the present embodiment.
- an optical path of a reference X-ray 401 an X-ray traveling when the detection object 304 is not set
- an optical path of an X-ray 402 refracted by the detection object 304 are shown.
- a fluorescence emission intensity gradient can be provided.
- the fluorescence emission intensity of the fluorescence 405 (J(X)) with respect to the incident position of the X-ray can be generated.
- Fig. 5 is a flowchart of the computation process.
- step SlOO the intensity information on the fluorescence emitted from the scintillator array 305 is acquired.
- step SlOl a change in the
- an amount of the differential phase and an amount of the phase can be quantified.
- a configuration in which the distance between the detection object 304 and the detector 306 is set to be large a change in the position of the X-ray caused by a much slighter refraction can be
- the scintillator 604 Since the scintillator 604 has a shape of a triangle pole, the fluorescence emission intensity changes in accordance with the incident position of the X-ray on the scintillator 604.
- the intensity J of the fluorescence 605 is expressed as follows:
- the CT apparatus includes an X- ray source 701, a separating element 703, a detection object 704, a scintillator array 705, a detector 706, a computing unit 707, and a display unit 708.
- Fig. 8 is a flowchart of the computation process.
- step S200 the fluorescence emission intensity information from the scintillator array 705 is acquired. Subsequently, in step S2
- the absorption information may be acquired from the fluorescence emission intensity obtained using the scintillator 905 and, subsequently, a change in position may be computed using this absorption information.
- the basic configuration of the X-ray- imaging apparatus is the same as that of the second
- the separating element 1403 is made of W and has a thickness of 100 ⁇ m.
- the separating element 1403 has slits, each having a slit width of 40 ⁇ m, arranged therein.
- the period of the slits is 150 ⁇ m on the scintillator array 1405, Note that Au, Pb, Ta, or Pt is used for the material in stead of W.
- the X-ray separated by the separating element 1403 is made incident upon the middle point of the triangle pole in the periodic direction. Note that in this example, for one X-ray separated by the separating element 1403, the fluorescence emission intensity values of six pixels in the periodic direction of the triangle pole are summed. The sum is defined as the fluorescence emission intensity of one scintillator.
- differential phase image or the phase image obtained by the computing unit 1407 is displayed on the display unit 1408 serving as a PC monitor.
- FIG. 15 illustrates an exemplary configuration of the present example.
- an X-ray source 1501 a detection object 1504, a scintillator array 1505, an X-ray detector 1506, and a display unit 1508 are shown.
- an MO-target rotating anode X-ray generator unit shown as the X-ray source 1501 is used as an X-ray generator unit.
- An X-ray generated by the X-ray source 1501 is radiated to the detection object 1504 set at a position remote from the X-ray source 1501 by 100 cm.
- the X-ray is transmitted through the detection object 1504 and is made incident on the scintillator array 1505 disposed at a position remote from the detection object 1504 by 65 cm.
- the scintillator array 1405 of Example 3 is produced by processing CsI (Tl doped) formed on an optical fiber plate so that, as shown in Fig. 16, a rod having a shape of a triangle pole and a rod having a shape of a square pole are alternately arranged therein.
- the period of a scintillator 1604 having a shape of a triangle pole and a scintillator 1605 having a shape of a square pole is 150 ⁇ m.
- the vertex angle of the triangle pole of the scintillator 1604 is about 80°.
- the maximum thickness of the triangle pole is about 13 ⁇ m.
Landscapes
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- Molecular Biology (AREA)
- High Energy & Nuclear Physics (AREA)
- General Health & Medical Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Medical Informatics (AREA)
- Optics & Photonics (AREA)
- Biomedical Technology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Pathology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Immunology (AREA)
- Biochemistry (AREA)
- Analytical Chemistry (AREA)
- Heart & Thoracic Surgery (AREA)
- Veterinary Medicine (AREA)
- Public Health (AREA)
- Animal Behavior & Ethology (AREA)
- Surgery (AREA)
- Radiology & Medical Imaging (AREA)
- Biophysics (AREA)
- Measurement Of Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP10749921A EP2457112A2 (en) | 2009-07-24 | 2010-07-23 | X-ray imaging apparatus and x-ray imaging method |
| KR1020127003272A KR101331542B1 (ko) | 2009-07-24 | 2010-07-23 | X선 촬상장치 및 x선 촬상방법 |
| BR112012000518A BR112012000518A2 (pt) | 2009-07-24 | 2010-07-23 | aparelho e método de formação de imagem de raio-x |
| CN2010800322880A CN102472823A (zh) | 2009-07-24 | 2010-07-23 | X射线成像设备和x射线成像方法 |
| RU2012106612/28A RU2491578C1 (ru) | 2009-07-24 | 2010-07-23 | Устройство рентгеновской визуализации и способ рентгеновской визуализации |
| US13/121,776 US9103923B2 (en) | 2009-07-24 | 2010-07-23 | X-ray imaging apparatus and X-ray imaging method |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009173452 | 2009-07-24 | ||
| JP2009-173452 | 2009-07-24 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO2011010750A2 true WO2011010750A2 (en) | 2011-01-27 |
| WO2011010750A3 WO2011010750A3 (en) | 2011-05-19 |
Family
ID=43499491
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2010/062972 Ceased WO2011010750A2 (en) | 2009-07-24 | 2010-07-23 | X-ray imaging apparatus and x-ray imaging method |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US9103923B2 (enExample) |
| EP (1) | EP2457112A2 (enExample) |
| JP (1) | JP5697370B2 (enExample) |
| KR (1) | KR101331542B1 (enExample) |
| CN (1) | CN102472823A (enExample) |
| BR (1) | BR112012000518A2 (enExample) |
| RU (1) | RU2491578C1 (enExample) |
| WO (1) | WO2011010750A2 (enExample) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| RU2598310C2 (ru) * | 2011-08-31 | 2016-09-20 | Конинклейке Филипс Н.В. | Формирование дифференциальных фазовых контрастных изображений с помощью чувствительного к энергии обнаружения |
| CN113655512A (zh) * | 2021-06-29 | 2021-11-16 | 中国工程物理研究院激光聚变研究中心 | 一种测量黑腔m带x射线辐射对称性的方法 |
| CN113933888A (zh) * | 2020-07-14 | 2022-01-14 | 中国科学技术大学 | 一种宇宙线缪子散射成像探测器 |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4795472B2 (ja) * | 2010-03-05 | 2011-10-19 | キヤノン株式会社 | X線撮像装置およびx線撮像方法 |
| JP5733908B2 (ja) * | 2010-04-27 | 2015-06-10 | キヤノン株式会社 | X線撮像装置 |
| JP5646906B2 (ja) | 2010-08-06 | 2014-12-24 | キヤノン株式会社 | X線装置およびx線測定方法 |
| GB201112506D0 (en) * | 2011-07-21 | 2011-08-31 | Ucl Business Plc | Phase imaging |
| US9423510B2 (en) * | 2014-05-15 | 2016-08-23 | Toshiba Medical Systems Corporation | Scintillation detector for improved PET performance |
| KR101657870B1 (ko) * | 2015-01-09 | 2016-09-30 | 연세대학교 원주산학협력단 | 자동초점조절된 이동형 그리드를 이용한 디지털 단층 영상합성방법 및 장치 |
| US10034640B2 (en) * | 2015-03-11 | 2018-07-31 | David Byron Douglas | Method and apparatus for improvement of spatial resolution in molecular and radiological imaging |
| JP2016176727A (ja) | 2015-03-18 | 2016-10-06 | 株式会社東芝 | 計測装置 |
| ES2778676T3 (es) | 2015-10-28 | 2020-08-11 | Nokia Technologies Oy | Un aparato y métodos asociados para tomografía computarizada |
| KR101974507B1 (ko) | 2017-05-29 | 2019-05-03 | 디아이케이(주) | 전기 자동차의 다상 무선 충전 시스템 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002102215A (ja) | 2000-09-27 | 2002-04-09 | Konica Corp | 乳房x画像撮影装置 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| RU1519382C (ru) * | 1988-03-09 | 1993-12-15 | Предприятие П/Я Р-6496 | Блок детектировани ионизирующего излучени |
| US6031892A (en) * | 1989-12-05 | 2000-02-29 | University Of Massachusetts Medical Center | System for quantitative radiographic imaging |
| RU2103920C1 (ru) * | 1995-08-02 | 1998-02-10 | Валентин Романович Анпилогов | Компьютерный томограф |
| US6087663A (en) * | 1997-02-10 | 2000-07-11 | Triumf | Segmented scintillation detector for encoding the coordinates of photon interactions |
| JPH11258349A (ja) | 1998-03-13 | 1999-09-24 | Fuji Photo Film Co Ltd | 放射線エネルギー弁別方法、およびその方法に用いられる弁別用キット |
| JP2003010162A (ja) * | 2001-07-04 | 2003-01-14 | Nagata Seiki Co Ltd | 位相コントラストx線撮像装置 |
| CN100335914C (zh) * | 2002-02-08 | 2007-09-05 | 株式会社东芝 | X射线检测器及x射线检测器的制造方法 |
| JP2004317299A (ja) | 2003-04-16 | 2004-11-11 | Univ Tokyo | X線減衰部材、x線減衰方法、xafs実験装置及びxafs測定方法 |
| JP4757440B2 (ja) * | 2003-11-28 | 2011-08-24 | Necディスプレイソリューションズ株式会社 | 画像表示装置 |
| CN1937960A (zh) | 2004-07-07 | 2007-03-28 | 株式会社东芝 | X-射线检查方法及x-射线检查装置 |
| DE102005010077B4 (de) * | 2005-03-04 | 2007-09-20 | Siemens Ag | Detektor mit einem Szintillator und bildgebendes Gerät, aufweisend einen derartigen Detektor |
| GB2441578A (en) * | 2006-09-08 | 2008-03-12 | Ucl Business Plc | Phase Contrast X-Ray Imaging |
| JP2009156740A (ja) | 2007-12-27 | 2009-07-16 | Horiba Ltd | 放射線検出装置 |
-
2010
- 2010-07-05 JP JP2010153078A patent/JP5697370B2/ja not_active Expired - Fee Related
- 2010-07-23 WO PCT/JP2010/062972 patent/WO2011010750A2/en not_active Ceased
- 2010-07-23 RU RU2012106612/28A patent/RU2491578C1/ru not_active IP Right Cessation
- 2010-07-23 US US13/121,776 patent/US9103923B2/en not_active Expired - Fee Related
- 2010-07-23 BR BR112012000518A patent/BR112012000518A2/pt not_active Application Discontinuation
- 2010-07-23 CN CN2010800322880A patent/CN102472823A/zh active Pending
- 2010-07-23 KR KR1020127003272A patent/KR101331542B1/ko not_active Expired - Fee Related
- 2010-07-23 EP EP10749921A patent/EP2457112A2/en not_active Withdrawn
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002102215A (ja) | 2000-09-27 | 2002-04-09 | Konica Corp | 乳房x画像撮影装置 |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| RU2598310C2 (ru) * | 2011-08-31 | 2016-09-20 | Конинклейке Филипс Н.В. | Формирование дифференциальных фазовых контрастных изображений с помощью чувствительного к энергии обнаружения |
| CN113933888A (zh) * | 2020-07-14 | 2022-01-14 | 中国科学技术大学 | 一种宇宙线缪子散射成像探测器 |
| CN113655512A (zh) * | 2021-06-29 | 2021-11-16 | 中国工程物理研究院激光聚变研究中心 | 一种测量黑腔m带x射线辐射对称性的方法 |
| CN113655512B (zh) * | 2021-06-29 | 2024-05-07 | 中国工程物理研究院激光聚变研究中心 | 一种测量黑腔m带x射线辐射对称性的方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| US9103923B2 (en) | 2015-08-11 |
| US20110176662A1 (en) | 2011-07-21 |
| JP2011041795A (ja) | 2011-03-03 |
| RU2491578C1 (ru) | 2013-08-27 |
| JP5697370B2 (ja) | 2015-04-08 |
| BR112012000518A2 (pt) | 2016-02-16 |
| KR20120045009A (ko) | 2012-05-08 |
| KR101331542B1 (ko) | 2013-11-20 |
| EP2457112A2 (en) | 2012-05-30 |
| WO2011010750A3 (en) | 2011-05-19 |
| CN102472823A (zh) | 2012-05-23 |
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