CN102472823A - X射线成像设备和x射线成像方法 - Google Patents

X射线成像设备和x射线成像方法 Download PDF

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Publication number
CN102472823A
CN102472823A CN2010800322880A CN201080032288A CN102472823A CN 102472823 A CN102472823 A CN 102472823A CN 2010800322880 A CN2010800322880 A CN 2010800322880A CN 201080032288 A CN201080032288 A CN 201080032288A CN 102472823 A CN102472823 A CN 102472823A
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CN
China
Prior art keywords
scintillator
rays
ray
emission intensity
ray imaging
Prior art date
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Pending
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CN2010800322880A
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English (en)
Chinese (zh)
Inventor
渡边壮俊
向出大平
高田一广
福田一德
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Canon Inc
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Canon Inc
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Publication date
Application filed by Canon Inc filed Critical Canon Inc
Publication of CN102472823A publication Critical patent/CN102472823A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/161—Applications in the field of nuclear medicine, e.g. in vivo counting
    • G01T1/164—Scintigraphy
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/161—Applications in the field of nuclear medicine, e.g. in vivo counting
    • G01T1/164—Scintigraphy
    • G01T1/1641—Static instruments for imaging the distribution of radioactivity in one or two dimensions using one or several scintillating elements; Radio-isotope cameras
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

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  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • General Health & Medical Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Medical Informatics (AREA)
  • Biomedical Technology (AREA)
  • Optics & Photonics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Radiology & Medical Imaging (AREA)
  • Biophysics (AREA)
  • Surgery (AREA)
  • Animal Behavior & Ethology (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Measurement Of Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
CN2010800322880A 2009-07-24 2010-07-23 X射线成像设备和x射线成像方法 Pending CN102472823A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2009-173452 2009-07-24
JP2009173452 2009-07-24
PCT/JP2010/062972 WO2011010750A2 (en) 2009-07-24 2010-07-23 X-ray imaging apparatus and x-ray imaging method

Publications (1)

Publication Number Publication Date
CN102472823A true CN102472823A (zh) 2012-05-23

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Family Applications (1)

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CN2010800322880A Pending CN102472823A (zh) 2009-07-24 2010-07-23 X射线成像设备和x射线成像方法

Country Status (8)

Country Link
US (1) US9103923B2 (enExample)
EP (1) EP2457112A2 (enExample)
JP (1) JP5697370B2 (enExample)
KR (1) KR101331542B1 (enExample)
CN (1) CN102472823A (enExample)
BR (1) BR112012000518A2 (enExample)
RU (1) RU2491578C1 (enExample)
WO (1) WO2011010750A2 (enExample)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4795472B2 (ja) * 2010-03-05 2011-10-19 キヤノン株式会社 Ｘ線撮像装置およびｘ線撮像方法
JP5733908B2 (ja) 2010-04-27 2015-06-10 キヤノン株式会社 Ｘ線撮像装置
JP5646906B2 (ja) 2010-08-06 2014-12-24 キヤノン株式会社 Ｘ線装置およびｘ線測定方法
GB201112506D0 (en) * 2011-07-21 2011-08-31 Ucl Business Plc Phase imaging
WO2013030698A1 (en) * 2011-08-31 2013-03-07 Koninklijke Philips Electronics N.V. Differential phase contrast imaging with energy sensitive detection
US9423510B2 (en) * 2014-05-15 2016-08-23 Toshiba Medical Systems Corporation Scintillation detector for improved PET performance
KR101657870B1 (ko) * 2015-01-09 2016-09-30 연세대학교 원주산학협력단 자동초점조절된 이동형 그리드를 이용한 디지털 단층 영상합성방법 및 장치
US10034640B2 (en) * 2015-03-11 2018-07-31 David Byron Douglas Method and apparatus for improvement of spatial resolution in molecular and radiological imaging
JP2016176727A (ja) 2015-03-18 2016-10-06 株式会社東芝 計測装置
EP3163325B1 (en) 2015-10-28 2020-02-12 Nokia Technologies Oy An apparatus and associated methods for computed tomography
KR101974507B1 (ko) 2017-05-29 2019-05-03 디아이케이(주) 전기 자동차의 다상 무선 충전 시스템
CN113933888B (zh) * 2020-07-14 2024-12-06 中国科学技术大学 一种宇宙线缪子散射成像探测器
CN113655512B (zh) * 2021-06-29 2024-05-07 中国工程物理研究院激光聚变研究中心 一种测量黑腔m带x射线辐射对称性的方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002102215A (ja) * 2000-09-27 2002-04-09 Konica Corp 乳房ｘ画像撮影装置
CN1937960A (zh) * 2004-07-07 2007-03-28 株式会社东芝 X－射线检查方法及x－射线检查装置
WO2008029107A2 (en) * 2006-09-08 2008-03-13 Ucl Business Plc Phase contrast imaging
JP2009156740A (ja) * 2007-12-27 2009-07-16 Horiba Ltd 放射線検出装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU1519382C (ru) * 1988-03-09 1993-12-15 Предприятие П/Я Р-6496 Блок детектировани ионизирующего излучени
US6031892A (en) * 1989-12-05 2000-02-29 University Of Massachusetts Medical Center System for quantitative radiographic imaging
RU2103920C1 (ru) * 1995-08-02 1998-02-10 Валентин Романович Анпилогов Компьютерный томограф
CA2279959C (en) * 1997-02-10 2008-01-29 The University Of Alberta, The University Of British Columbia, Carlton U Niversity, Simon Fraser University And The University Of Victoria Doing Segmented scintillation detector for photon interaction coordinates
JPH11258349A (ja) 1998-03-13 1999-09-24 Fuji Photo Film Co Ltd 放射線エネルギー弁別方法、およびその方法に用いられる弁別用キット
JP2003010162A (ja) * 2001-07-04 2003-01-14 Nagata Seiki Co Ltd 位相コントラストｘ線撮像装置
WO2003067282A1 (en) * 2002-02-08 2003-08-14 Kabushiki Kaisha Toshiba X-ray detector and method for producing x-ray detector
JP2004317299A (ja) 2003-04-16 2004-11-11 Univ Tokyo Ｘ線減衰部材、ｘ線減衰方法、ｘａｆｓ実験装置及びｘａｆｓ測定方法
JP4757440B2 (ja) * 2003-11-28 2011-08-24 Ｎｅｃディスプレイソリューションズ株式会社 画像表示装置
DE102005010077B4 (de) * 2005-03-04 2007-09-20 Siemens Ag Detektor mit einem Szintillator und bildgebendes Gerät, aufweisend einen derartigen Detektor

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002102215A (ja) * 2000-09-27 2002-04-09 Konica Corp 乳房ｘ画像撮影装置
CN1937960A (zh) * 2004-07-07 2007-03-28 株式会社东芝 X－射线检查方法及x－射线检查装置
WO2008029107A2 (en) * 2006-09-08 2008-03-13 Ucl Business Plc Phase contrast imaging
JP2009156740A (ja) * 2007-12-27 2009-07-16 Horiba Ltd 放射線検出装置

Also Published As

Publication number Publication date
US20110176662A1 (en) 2011-07-21
WO2011010750A2 (en) 2011-01-27
BR112012000518A2 (pt) 2016-02-16
EP2457112A2 (en) 2012-05-30
KR101331542B1 (ko) 2013-11-20
KR20120045009A (ko) 2012-05-08
JP2011041795A (ja) 2011-03-03
WO2011010750A3 (en) 2011-05-19
US9103923B2 (en) 2015-08-11
JP5697370B2 (ja) 2015-04-08
RU2491578C1 (ru) 2013-08-27

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