JP2018519866A5 - - Google Patents
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- Publication number
- JP2018519866A5 JP2018519866A5 JP2017557043A JP2017557043A JP2018519866A5 JP 2018519866 A5 JP2018519866 A5 JP 2018519866A5 JP 2017557043 A JP2017557043 A JP 2017557043A JP 2017557043 A JP2017557043 A JP 2017557043A JP 2018519866 A5 JP2018519866 A5 JP 2018519866A5
- Authority
- JP
- Japan
- Prior art keywords
- ray
- interference pattern
- signal
- measurement
- rays
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims 22
- 238000003384 imaging method Methods 0.000 claims 15
- 230000005855 radiation Effects 0.000 claims 10
- 230000001427 coherent effect Effects 0.000 claims 7
- 238000000034 method Methods 0.000 claims 7
- 230000003287 optical effect Effects 0.000 claims 4
- 230000001678 irradiating effect Effects 0.000 claims 3
- 239000002131 composite material Substances 0.000 claims 2
- 238000004590 computer program Methods 0.000 claims 2
- 230000003993 interaction Effects 0.000 claims 2
- 230000000704 physical effect Effects 0.000 claims 2
- FGUUSXIOTUKUDN-IBGZPJMESA-N C1(=CC=CC=C1)N1C2=C(NC([C@H](C1)NC=1OC(=NN=1)C1=CC=CC=C1)=O)C=CC=C2 Chemical compound C1(=CC=CC=C1)N1C2=C(NC([C@H](C1)NC=1OC(=NN=1)C1=CC=CC=C1)=O)C=CC=C2 FGUUSXIOTUKUDN-IBGZPJMESA-N 0.000 claims 1
- 238000009659 non-destructive testing Methods 0.000 claims 1
- 238000009420 retrofitting Methods 0.000 claims 1
- 230000035945 sensitivity Effects 0.000 claims 1
- 230000003068 static effect Effects 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP15166499.2 | 2015-05-06 | ||
| EP15166499 | 2015-05-06 | ||
| PCT/EP2016/060166 WO2016177875A1 (en) | 2015-05-06 | 2016-05-06 | X-ray imaging |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2018519866A JP2018519866A (ja) | 2018-07-26 |
| JP2018519866A5 true JP2018519866A5 (enExample) | 2019-06-06 |
Family
ID=53174813
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2017557043A Pending JP2018519866A (ja) | 2015-05-06 | 2016-05-06 | Ｘ線撮像 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20180140269A1 (enExample) |
| EP (1) | EP3291732A1 (enExample) |
| JP (1) | JP2018519866A (enExample) |
| CN (1) | CN107580473A (enExample) |
| WO (1) | WO2016177875A1 (enExample) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6613988B2 (ja) | 2016-03-30 | 2019-12-04 | コニカミノルタ株式会社 | 放射線撮影システム |
| US11350892B2 (en) * | 2016-12-16 | 2022-06-07 | General Electric Company | Collimator structure for an imaging system |
| JP6673188B2 (ja) * | 2016-12-26 | 2020-03-25 | 株式会社島津製作所 | Ｘ線位相撮影装置 |
| EP3378397A1 (en) * | 2017-03-24 | 2018-09-26 | Koninklijke Philips N.V. | Sensitivity optimized patient positioning system for dark-field x-ray imaging |
| EP3435325A1 (en) | 2017-07-26 | 2019-01-30 | Koninklijke Philips N.V. | Scatter correction for dark field imaging |
| EP3708083A1 (en) * | 2019-03-14 | 2020-09-16 | Koninklijke Philips N.V. | Device and method for evaluating dark field images |
| CN110133012B (zh) * | 2019-07-02 | 2022-01-18 | 合肥工业大学 | 基于三探测器光栅干涉仪的单次曝光多模式x射线成像方法 |
| EP3782552A1 (en) * | 2019-08-23 | 2021-02-24 | Koninklijke Philips N.V. | System and method for x-ray dark-field, phase contrast and attenuation image acquisition |
| US12379331B2 (en) * | 2019-09-06 | 2025-08-05 | The Board Of Trustees Of The Leland Stanford Junior University | Single shot analyzer grating for differential phase contrast X-ray imaging and computed tomography |
| EP4101388A1 (en) | 2021-06-08 | 2022-12-14 | Universiteit Antwerpen | A phase-contrast x-ray imaging system for obtaining a dark-field image and a method therefor |
| JP7662452B2 (ja) * | 2021-08-17 | 2025-04-15 | キヤノンメディカルシステムズ株式会社 | Ｘ線診断装置およびトモシンセシス画像生成方法 |
| CN116297578A (zh) * | 2021-12-20 | 2023-06-23 | 中国科学院深圳先进技术研究院 | X射线相位定量成像技术与测量方法 |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7412026B2 (en) * | 2004-07-02 | 2008-08-12 | The Board Of Regents Of The University Of Oklahoma | Phase-contrast x-ray imaging systems and methods |
| DE102006015356B4 (de) * | 2006-02-01 | 2016-09-22 | Siemens Healthcare Gmbh | Verfahren zur Erzeugung projektiver und tomographischer Phasenkontrastaufnahmen mit einem Röntgen-System |
| EP2168488B1 (de) * | 2008-09-30 | 2013-02-13 | Siemens Aktiengesellschaft | Röntgen-CT-System zur Röntgen-Phasenkontrast-und/oder Röntgen-Dunkelfeld-Bildgebung |
| JP5428355B2 (ja) * | 2009-01-26 | 2014-02-26 | 富士通株式会社 | Ｘ線回折方法およびｘ線回折装置 |
| JP2011200532A (ja) * | 2010-03-26 | 2011-10-13 | Fujifilm Corp | 放射線撮影システムの制御装置及び制御方法 |
| JP2012125423A (ja) * | 2010-12-15 | 2012-07-05 | Fujifilm Corp | 放射線画像検出装置、放射線撮影装置、放射線撮影システム |
| CN103460301B (zh) * | 2011-02-01 | 2017-08-11 | 皇家飞利浦电子股份有限公司 | 具有聚焦偏转结构板的微分相位对比成像 |
| US9597050B2 (en) * | 2012-01-24 | 2017-03-21 | Koninklijke Philips N.V. | Multi-directional phase contrast X-ray imaging |
| US20130259194A1 (en) * | 2012-03-30 | 2013-10-03 | Kwok L. Yip | Hybrid slot-scanning grating-based differential phase contrast imaging system for medical radiographic imaging |
| WO2013183469A1 (en) * | 2012-06-07 | 2013-12-12 | Canon Kabushiki Kaisha | X-ray device and x-ray measurement method |
| WO2014027333A1 (en) * | 2012-08-17 | 2014-02-20 | Koninklijke Philips N.V. | Correction in x-ray imaging systems for differential phase contrast imaging |
| JP6079204B2 (ja) * | 2012-12-18 | 2017-02-15 | コニカミノルタ株式会社 | 医用画像システム |
| DE102013204604A1 (de) * | 2013-03-15 | 2014-09-18 | Siemens Aktiengesellschaft | Röntgenaufnahmesystem zur differentiellen Phasenkontrast-Bildgebung eines Untersuchungsobjekts mit Phase-Stepping |
| DE102013205406A1 (de) * | 2013-03-27 | 2014-10-16 | Siemens Aktiengesellschaft | Röntgenaufnahmesystem zur Röntgenbildgebung bei hohen Bildfrequenzen eines Untersuchungsobjekts mittels direkter Messung des Interferenzmusters |
| WO2014206841A1 (en) | 2013-06-28 | 2014-12-31 | Koninklijke Philips N.V. | Correction in phase contrast imaging |
| DE102013214388B4 (de) * | 2013-07-23 | 2023-04-20 | Siemens Healthcare Gmbh | Medizinisches Instrument zur Verwendung mit einer Phasenkontrastbildgebung und Röntgenaufnahmesystem mit Phasenkontrastbildgebung |
-
2016
- 2016-05-06 US US15/569,832 patent/US20180140269A1/en not_active Abandoned
- 2016-05-06 WO PCT/EP2016/060166 patent/WO2016177875A1/en not_active Ceased
- 2016-05-06 JP JP2017557043A patent/JP2018519866A/ja active Pending
- 2016-05-06 CN CN201680026177.6A patent/CN107580473A/zh active Pending
- 2016-05-06 EP EP16722619.0A patent/EP3291732A1/en not_active Withdrawn
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