WO2016177875A1 - X-ray imaging - Google Patents

X-ray imaging Download PDF

Info

Publication number
WO2016177875A1
WO2016177875A1 PCT/EP2016/060166 EP2016060166W WO2016177875A1 WO 2016177875 A1 WO2016177875 A1 WO 2016177875A1 EP 2016060166 W EP2016060166 W EP 2016060166W WO 2016177875 A1 WO2016177875 A1 WO 2016177875A1
Authority
WO
WIPO (PCT)
Prior art keywords
ray
rays
grating
detector
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/EP2016/060166
Other languages
English (en)
French (fr)
Inventor
Ewald Roessl
Heiner DAERR
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips NV filed Critical Koninklijke Philips NV
Priority to CN201680026177.6A priority Critical patent/CN107580473A/zh
Priority to EP16722619.0A priority patent/EP3291732A1/en
Priority to US15/569,832 priority patent/US20180140269A1/en
Priority to JP2017557043A priority patent/JP2018519866A/ja
Publication of WO2016177875A1 publication Critical patent/WO2016177875A1/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48Diagnostic techniques
    • A61B6/484Diagnostic techniques involving phase contrast X-ray imaging
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/02Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
    • A61B6/03Computed tomography [CT]
    • A61B6/032Transmission computed tomography [CT]
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/40Arrangements for generating radiation specially adapted for radiation diagnosis
    • A61B6/405Source units specially adapted to modify characteristics of the beam during the data acquisition process
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/42Arrangements for detecting radiation specially adapted for radiation diagnosis
    • A61B6/4208Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector
    • A61B6/4241Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector using energy resolving detectors, e.g. photon counting
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/42Arrangements for detecting radiation specially adapted for radiation diagnosis
    • A61B6/4291Arrangements for detecting radiation specially adapted for radiation diagnosis the detector being combined with a grid or grating
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48Diagnostic techniques
    • A61B6/482Diagnostic techniques involving multiple energy imaging
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
    • G21K2207/005Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast

Definitions

  • the invention concerns an X-ray imaging system for imaging an object of interest, a method for X-ray imaging, a computer program element, a computer-readable medium, and a kit of parts for retrofitting a legacy X-ray scanner.
  • an X-ray source illuminates a phase grating, which establishes an interferometric pattern of X-ray maxima and minima beyond the phase grating, detected at an X-ray detector.
  • a change in the phase in a portion of an X- ray beam incident on the phase grating will cause a related portion of an interferometric pattern to be displaced in the plane of the X-ray detector.
  • a resolution of an X-ray detector is often not good enough to sample the interference pattern directly. Therefore, a movable analyzer grating is provided.
  • a phase contrast imager samples the interference pattern by moving the analyzer grating a fixed number of steps across the plane of the X-ray detector, thus deriving information on the phase shift.
  • WO 2014/206841 concerns a phase-contrast imaging system. Such systems can, however, be further improved.
  • a first aspect of the invention provides an X-ray imaging system for imaging an object of interest.
  • the system comprises an X-ray source, a phase grating, an analyzer grating, an X-ray detector, and a processing unit.
  • the X-ray source, the phase grating, the analyzer grating, and the X-ray detector are arranged in an optical path.
  • the X-ray source is configured to apply X-rays to an object of interest positionable in the optical path.
  • the analyzer grating is provided in proximity to, or formed integrally with, the X-ray detector.
  • the phase grating is configured to generate an interference pattern in the X- ray radiation comprising an intensity profile having an intensity peak with a full-width half- maximum distance which is narrow in comparison to a width of a transparent section of the analyzer grating, wherein the intensity peak of the interference pattern is incident on the X- ray detector through the transparent section of the analyzer grating.
  • the X-ray detector is configured to generate a first X-ray signal by measuring a first interference pattern and a second X-ray signal by independently measuring a second interference pattern.
  • the interference patterns which are generated by means of the phase grating, are indicative of an interaction of the X-ray radiation with an object of interest in the optical path. In generating the first and second X-ray signals, a difference in physical characteristics of the X-ray radiation used is being exploited.
  • the processing unit is configured to calculate an attenuation component and a dark-field component of the first and second interference patterns using the first and second X-ray signals.
  • phase grating configured to generate an interference pattern in the X-ray radiation comprising an intensity profile having an intensity peak with a full- width half-maximum distance which is narrow in comparison to a width of a transparent section of the analyzer grating, wherein the intensity peak of the interference pattern is incident on the X-ray detector through the transparent section of the analyzer grating;
  • a computer program element for controlling a system as described above, which, when being executed by a processing unit, is adapted to perform the method steps as described above.
  • the kit of parts comprises an X-ray detector having an analyzer grating in proximity to, or formed integrally with, the X-ray detector, a phase grating configured to generate an interference pattern in X-ray radiation, comprising an intensity profile having an intensity peak with a full- width half-maximum distance which is narrow in comparison to a width of a transparent section of the analyzer grating, wherein the intensity peak of the interference pattern is incident on the installed X-ray detector through a transparent section of the analyzer grating, and a computer-readable medium according to the description above.
  • the present invention allows for useful application in a clinical environment such as a hospital. More specifically, the present invention is very suitable for application in imaging modalities such as mammography, diagnostic radiology, interventional radiology and computed tomography (CT) for the medical examination of patients.
  • CT computed tomography
  • the presentation invention allows for useful application in an industrial environment. More specifically, the present invention is very suitable for application in non-destructive testing (e.g. analysis as to composition, structure and/or qualities of biological as well non-biological samples) as well as security scanning (e.g. scanning of luggage on airports).
  • non-destructive testing e.g. analysis as to composition, structure and/or qualities of biological as well non-biological samples
  • security scanning e.g. scanning of luggage on airports.
  • the physical characteristic being different is an energy level of the X-ray radiation.
  • the X-ray detector may be an energy sensitive detector configured to generate the first X-ray signal by detecting a first photon energy, and to generate the second X-ray signal by detecting a second photon energy, wherein the first and second photon energies are mutually different.
  • use is made of a difference in a coherence of the X-ray radiation.
  • the X-ray imaging system is configured to generate each of the first X-ray signal and the second X-ray signal as composite signals, wherein with the first X-ray signal is based on a first measurement made with coherent X-rays, and a second measurement made with incoherent X-rays, and wherein the second X-ray signal is based on a third measurement made with coherent X-rays, and a fourth measurement made with incoherent X-rays.
  • the phase grating 14 is configured to generate an interference pattern in the X- ray radiation comprising an intensity profile having a maximum with a full-width half- maximum distance which is narrow in comparison to a width of a transparent section of the analyzer grating.
  • the intensity maximum is incident on the X-ray detector 18 through the transparent section of the analyzer grating.
  • a Talbot interferometer is applied, using a special grating capable of generating suitable X-ray interferometric patterns with a plurality of fine interference maxima.
  • the analyzer grating is provided in proximity to, or formed integrally with, the X-ray detector 18 (fabricated in the silicon wafer 52). Therefore, in the embodiment illustrated in Fig. 3, the analyzer grating line 54 is attached directly to the silicon wafer 52, for example, because it has been deposited in a deposition process. Alternatively, the analyzer grating line 54 may be arranged on another X-ray transparent material, and held proximately to the silicon wafer 52.
  • the X-ray imaging system 10 is provided as described previously, wherein the phase grating 14 is configured to provide the interference pattern with a full- width at half-maximum distance smaller than any value selected from the list of 0.7, 0.65, 0.60, 0.55, 0.50, 0.45, 0.4, 0.35, 0.3, 0.25, 0.2, 0.15, 0.1, 0.05, 0.04, 0.03, 0.02, or 0.01 of the period of the analyzer grating.
  • an intensity peak which is narrow in comparison to a width of a transparent section of the analyzer grating may be one with dimensions selected according at least to the above definitions.
  • the duty cycle of the analyzer grating and/or the phase grating is more than a value selected from the list: 0.5, 0.51, 0.52, 0.53, 0.54, 0.55, 0.56, 0.57, 0.58, 0.59, 0.6, 0.61, 0.62, 0.63, 0.64, 0.65, 0.66, 0.67, 0.68, 0.69, 0.70, 0.71, 0.72, 0.73, 0.74, 0.75, 0.76, 0.77, 0.78, 0.79, 0.8, 0.81, 0.82, 0.83, 0.84, 0.85, 0.86, 0.87, 0.88, 0.89, 0.90, 0.91, 0.92, 0.93, 0.94, 0.95.
  • the X-ray detector 18 may be an energy-resolving detector, such as a photon counter employing multiple energy bins.
  • the X-ray source emits polychromatic radiation.
  • the energy resolving detector is used to detect the attenuation or small angle scatter of incident X-rays for different energy ranges. Therefore, two independent intensity profiles may be detected by using an energy resolving detector.
  • the X-ray imaging system 10 as discussed above is provided, wherein the X-ray detector 18 is an energy sensitive detector configured to generate the first X-ray signal by detecting a first detected photon energy, and to generate the second X-ray signal by detecting a second detected photon energy, wherein the first and second detected photon energies are mutually different.
  • the X-ray detector 18 is an energy sensitive detector configured to generate the first X-ray signal by detecting a first detected photon energy, and to generate the second X-ray signal by detecting a second detected photon energy, wherein the first and second detected photon energies are mutually different.
  • first and second photon energy ranges are applicable, for example, to a mammography system:
  • the first detected photon energy is in the range 5-15 keV and the second detected photon energy is in the range 15-40 keV.
  • the first detected photon energy is in the range 5-25 keV and the second detected photon energy is in the range 25-40 keV. According to an embodiment of the invention, the first detected photon energy is in the range 5-30 keV and the second detected photon energy is in the range 30-40 keV.
  • Such an approach is implemented by providing a model for the energy dependent attenuation, and visibility, and spectral response of the detector.
  • the model will depend on the specific form of the intensity profile, for example.
  • a lookup table derived by measurement of a phantom comprising different materials.
  • TM Delrin
  • TM a phantom made of Delrin (TM) (being a material having a water-equivalent spectral attenuation) and a strong scattering material with negligible attenuation
  • the photon-counting results are mapped to the effective Delrin (TM) length, and scatter material length, which are then translated into the attenuation and dark- field signal.
  • an equivalent approach would be to remove the source-grating 26 from an output port of the X-ray source 12 to enable the incoherent light from the X-ray tube 24 to be applied directly to the object of interest 28. Therefore, according to the above-described embodiments, an intensity measurement is made using the X-ray detector 18 using coherent X-rays, and then incoherent X-rays being applied.
  • the X-ray imaging system 10 is configured to generate the first X-ray signal by measuring the second interference pattern when an object of interest is present in the optical path 22.
  • the four measured signals per detector pixel can be provided as: siglo, siglVo, sigl and siglV.
  • a first set of coherent and incoherent measurements are taken by the CT scanner's detector when no object of interest is present in the optical path
  • a second set of coherent and incoherent measurements are taken by the CT scanner's detector when the object of interest is positioned in the optical path.
  • a computer program element for controlling a system according to one of the previous descriptions of the X-ray system which, when being executed by a processing unit, is adapted to perform the method steps according to one of the previous methods.
  • a computer program element might be stored on a computer unit which could also be an embodiment of the invention.
  • the computing unit may be adapted to perform or induce performance of the steps of the method described above. Moreover, it may be adapted to operate the components of the above-described apparatus.
  • a medium for making a computer program element available for downloading is provided, which computer program element is arranged to perform a method according to one of the previously described embodiments of the invention.

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Medical Informatics (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Molecular Biology (AREA)
  • Biophysics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Optics & Photonics (AREA)
  • Pathology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Biomedical Technology (AREA)
  • Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Surgery (AREA)
  • Animal Behavior & Ethology (AREA)
  • General Health & Medical Sciences (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Pulmonology (AREA)
  • Theoretical Computer Science (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
PCT/EP2016/060166 2015-05-06 2016-05-06 X-ray imaging Ceased WO2016177875A1 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
CN201680026177.6A CN107580473A (zh) 2015-05-06 2016-05-06 X射线成像
EP16722619.0A EP3291732A1 (en) 2015-05-06 2016-05-06 X-ray imaging
US15/569,832 US20180140269A1 (en) 2015-05-06 2016-05-06 X-ray imaging
JP2017557043A JP2018519866A (ja) 2015-05-06 2016-05-06 X線撮像

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP15166499.2 2015-05-06
EP15166499 2015-05-06

Publications (1)

Publication Number Publication Date
WO2016177875A1 true WO2016177875A1 (en) 2016-11-10

Family

ID=53174813

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2016/060166 Ceased WO2016177875A1 (en) 2015-05-06 2016-05-06 X-ray imaging

Country Status (5)

Country Link
US (1) US20180140269A1 (enExample)
EP (1) EP3291732A1 (enExample)
JP (1) JP2018519866A (enExample)
CN (1) CN107580473A (enExample)
WO (1) WO2016177875A1 (enExample)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017176399A (ja) * 2016-03-30 2017-10-05 コニカミノルタ株式会社 放射線撮影システム
CN108236473A (zh) * 2016-12-26 2018-07-03 株式会社岛津制作所 X射线相位摄影装置
CN110520049A (zh) * 2017-03-24 2019-11-29 皇家飞利浦有限公司 用于暗场x射线成像的灵敏度优化患者定位系统
US10912532B2 (en) 2017-07-26 2021-02-09 Koninklijke Philips N.V. Scatter correction for dark field imaging
EP3782552A1 (en) * 2019-08-23 2021-02-24 Koninklijke Philips N.V. System and method for x-ray dark-field, phase contrast and attenuation image acquisition

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11350892B2 (en) * 2016-12-16 2022-06-07 General Electric Company Collimator structure for an imaging system
EP3708083A1 (en) * 2019-03-14 2020-09-16 Koninklijke Philips N.V. Device and method for evaluating dark field images
CN110133012B (zh) * 2019-07-02 2022-01-18 合肥工业大学 基于三探测器光栅干涉仪的单次曝光多模式x射线成像方法
US12379331B2 (en) * 2019-09-06 2025-08-05 The Board Of Trustees Of The Leland Stanford Junior University Single shot analyzer grating for differential phase contrast X-ray imaging and computed tomography
EP4101388A1 (en) 2021-06-08 2022-12-14 Universiteit Antwerpen A phase-contrast x-ray imaging system for obtaining a dark-field image and a method therefor
JP7662452B2 (ja) * 2021-08-17 2025-04-15 キヤノンメディカルシステムズ株式会社 X線診断装置およびトモシンセシス画像生成方法
CN116297578A (zh) * 2021-12-20 2023-06-23 中国科学院深圳先进技术研究院 X射线相位定量成像技术与测量方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012104770A2 (en) 2011-02-01 2012-08-09 Koninklijke Philips Electronics N.V. Differential phase-contrast imaging with focussing deflection structure plates
WO2014027333A1 (en) * 2012-08-17 2014-02-20 Koninklijke Philips N.V. Correction in x-ray imaging systems for differential phase contrast imaging
WO2014206841A1 (en) 2013-06-28 2014-12-31 Koninklijke Philips N.V. Correction in phase contrast imaging

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7412026B2 (en) * 2004-07-02 2008-08-12 The Board Of Regents Of The University Of Oklahoma Phase-contrast x-ray imaging systems and methods
DE102006015356B4 (de) * 2006-02-01 2016-09-22 Siemens Healthcare Gmbh Verfahren zur Erzeugung projektiver und tomographischer Phasenkontrastaufnahmen mit einem Röntgen-System
EP2168488B1 (de) * 2008-09-30 2013-02-13 Siemens Aktiengesellschaft Röntgen-CT-System zur Röntgen-Phasenkontrast-und/oder Röntgen-Dunkelfeld-Bildgebung
JP5428355B2 (ja) * 2009-01-26 2014-02-26 富士通株式会社 X線回折方法およびx線回折装置
JP2011200532A (ja) * 2010-03-26 2011-10-13 Fujifilm Corp 放射線撮影システムの制御装置及び制御方法
JP2012125423A (ja) * 2010-12-15 2012-07-05 Fujifilm Corp 放射線画像検出装置、放射線撮影装置、放射線撮影システム
CN104066375B (zh) * 2012-01-24 2017-08-11 皇家飞利浦有限公司 多方向相衬x射线成像
US20130259194A1 (en) * 2012-03-30 2013-10-03 Kwok L. Yip Hybrid slot-scanning grating-based differential phase contrast imaging system for medical radiographic imaging
US20150179293A1 (en) * 2012-06-07 2015-06-25 Canon Kabushiki Kaisha X-ray device and x-ray measurement method
JP6079204B2 (ja) * 2012-12-18 2017-02-15 コニカミノルタ株式会社 医用画像システム
DE102013204604A1 (de) * 2013-03-15 2014-09-18 Siemens Aktiengesellschaft Röntgenaufnahmesystem zur differentiellen Phasenkontrast-Bildgebung eines Untersuchungsobjekts mit Phase-Stepping
DE102013205406A1 (de) * 2013-03-27 2014-10-16 Siemens Aktiengesellschaft Röntgenaufnahmesystem zur Röntgenbildgebung bei hohen Bildfrequenzen eines Untersuchungsobjekts mittels direkter Messung des Interferenzmusters
DE102013214388B4 (de) * 2013-07-23 2023-04-20 Siemens Healthcare Gmbh Medizinisches Instrument zur Verwendung mit einer Phasenkontrastbildgebung und Röntgenaufnahmesystem mit Phasenkontrastbildgebung

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012104770A2 (en) 2011-02-01 2012-08-09 Koninklijke Philips Electronics N.V. Differential phase-contrast imaging with focussing deflection structure plates
US20130315373A1 (en) * 2011-02-01 2013-11-28 Koninklijke Philips N.V. Differential phase-contrast imaging with focussing deflection structure plates
WO2014027333A1 (en) * 2012-08-17 2014-02-20 Koninklijke Philips N.V. Correction in x-ray imaging systems for differential phase contrast imaging
WO2014206841A1 (en) 2013-06-28 2014-12-31 Koninklijke Philips N.V. Correction in phase contrast imaging

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
GEORG PELZER ET AL: "Energy weighted x-ray dark-field imaging", OPTICS EXPRESS, vol. 22, no. 20, 30 September 2014 (2014-09-30), pages 24507, XP055219950, DOI: 10.1364/OE.22.024507 *
MARTIN BECH ET AL: "Hard X-ray phase-contrast imaging with the Compact Light Source based on inverse Compton X-rays", JOURNAL OF SYNCHROTRON RADIATION, vol. 16, no. 1, 27 November 2008 (2008-11-27), pages 43 - 47, XP055100380, ISSN: 0909-0495, DOI: 10.1107/S090904950803464X *

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017176399A (ja) * 2016-03-30 2017-10-05 コニカミノルタ株式会社 放射線撮影システム
US11221303B2 (en) 2016-03-30 2022-01-11 Konica Minolta, Inc. Radiation capturing system
CN108236473A (zh) * 2016-12-26 2018-07-03 株式会社岛津制作所 X射线相位摄影装置
CN110520049A (zh) * 2017-03-24 2019-11-29 皇家飞利浦有限公司 用于暗场x射线成像的灵敏度优化患者定位系统
CN110520049B (zh) * 2017-03-24 2023-09-12 皇家飞利浦有限公司 用于暗场x射线成像的灵敏度优化患者定位系统
US10912532B2 (en) 2017-07-26 2021-02-09 Koninklijke Philips N.V. Scatter correction for dark field imaging
EP3782552A1 (en) * 2019-08-23 2021-02-24 Koninklijke Philips N.V. System and method for x-ray dark-field, phase contrast and attenuation image acquisition
WO2021037706A1 (en) 2019-08-23 2021-03-04 Koninklijke Philips N.V. System and method for x-ray dark-field, phase contrast and attenuation image acquisition
US12004896B2 (en) 2019-08-23 2024-06-11 Koninklijke Philips N.V. System and method for X-ray dark-field, phase contrast and attenuation image acquisition

Also Published As

Publication number Publication date
EP3291732A1 (en) 2018-03-14
JP2018519866A (ja) 2018-07-26
CN107580473A (zh) 2018-01-12
US20180140269A1 (en) 2018-05-24

Similar Documents

Publication Publication Date Title
EP3291732A1 (en) X-ray imaging
US8855265B2 (en) Correction method for differential phase contrast imaging
JP5438022B2 (ja) X線位相コントラストイメージングの検出セットアップ
US10420521B2 (en) Grating device for an X-ray imaging device
JP5462408B2 (ja) X線源回折格子のステップ撮像システムおよび撮像方法
US20100322380A1 (en) X-ray detector for phase contrast imaging
US10660595B2 (en) Apparatus for x-ray imaging an object
CN107850680A (zh) 用于相位对比和/或暗场成像的x射线探测器
EP3383273B1 (en) Apparatus for x-ray imaging an object
JP6475315B2 (ja) X線イメージング装置
EP3452982A1 (en) Feature suppression in dark field or phase contrast x-ray imaging
JP7167201B2 (ja) X線位相差検出器
EP3541285B1 (en) Apparatus for generating multi energy data from phase contrast imaging data
EP3344979B1 (en) Dual phase grating interferometer for x-ray phase contrast imaging

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 16722619

Country of ref document: EP

Kind code of ref document: A1

WWE Wipo information: entry into national phase

Ref document number: 15569832

Country of ref document: US

ENP Entry into the national phase

Ref document number: 2017557043

Country of ref document: JP

Kind code of ref document: A

NENP Non-entry into the national phase

Ref country code: DE