JP2019531120A5 - - Google Patents
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- JP2019531120A5 JP2019531120A5 JP2019512893A JP2019512893A JP2019531120A5 JP 2019531120 A5 JP2019531120 A5 JP 2019531120A5 JP 2019512893 A JP2019512893 A JP 2019512893A JP 2019512893 A JP2019512893 A JP 2019512893A JP 2019531120 A5 JP2019531120 A5 JP 2019531120A5
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- Japan
- Prior art keywords
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- imaging system
- Prior art date
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Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP16187753.5 | 2016-09-08 | ||
| EP16187753 | 2016-09-08 | ||
| PCT/EP2017/071806 WO2018046377A1 (en) | 2016-09-08 | 2017-08-30 | Source grating for x-ray imaging |
Publications (4)
| Publication Number | Publication Date |
|---|---|
| JP2019531120A JP2019531120A (ja) | 2019-10-31 |
| JP2019531120A5 true JP2019531120A5 (enExample) | 2020-10-08 |
| JP7044764B2 JP7044764B2 (ja) | 2022-03-30 |
| JP7044764B6 JP7044764B6 (ja) | 2022-05-31 |
Family
ID=56888983
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2019512893A Expired - Fee Related JP7044764B6 (ja) | 2016-09-08 | 2017-08-30 | Ｘ線撮像のための線源格子 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US10835193B2 (enExample) |
| EP (1) | EP3509492B1 (enExample) |
| JP (1) | JP7044764B6 (enExample) |
| CN (1) | CN109688930A (enExample) |
| WO (1) | WO2018046377A1 (enExample) |
Families Citing this family (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20150117599A1 (en) | 2013-10-31 | 2015-04-30 | Sigray, Inc. | X-ray interferometric imaging system |
| US10295485B2 (en) | 2013-12-05 | 2019-05-21 | Sigray, Inc. | X-ray transmission spectrometer system |
| USRE48612E1 (en) | 2013-10-31 | 2021-06-29 | Sigray, Inc. | X-ray interferometric imaging system |
| WO2019236384A1 (en) | 2018-06-04 | 2019-12-12 | Sigray, Inc. | Wavelength dispersive x-ray spectrometer |
| DE112019003777B4 (de) | 2018-07-26 | 2025-09-11 | Sigray, Inc. | Röntgenreflexionsquelle mit hoher helligkeit |
| EP3603515A1 (en) | 2018-08-01 | 2020-02-05 | Koninklijke Philips N.V. | Apparatus for generating x-ray imaging data |
| US10656105B2 (en) | 2018-08-06 | 2020-05-19 | Sigray, Inc. | Talbot-lau x-ray source and interferometric system |
| CN112638261B (zh) | 2018-09-04 | 2025-06-27 | 斯格瑞公司 | 利用滤波的x射线荧光的系统和方法 |
| US11056308B2 (en) | 2018-09-07 | 2021-07-06 | Sigray, Inc. | System and method for depth-selectable x-ray analysis |
| CN114729907B (zh) | 2019-09-03 | 2023-05-23 | 斯格瑞公司 | 用于计算机层析x射线荧光成像的系统和方法 |
| US11175243B1 (en) | 2020-02-06 | 2021-11-16 | Sigray, Inc. | X-ray dark-field in-line inspection for semiconductor samples |
| WO2021162947A1 (en) | 2020-02-10 | 2021-08-19 | Sigray, Inc. | X-ray mirror optics with multiple hyperboloidal / hyperbolic surface profiles |
| WO2021237237A1 (en) | 2020-05-18 | 2021-11-25 | Sigray, Inc. | System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements |
| CN111839579B (zh) * | 2020-09-02 | 2025-06-27 | 上海联影医疗科技股份有限公司 | 一种x射线成像设备的限束器及x射线成像设备 |
| JP7640682B2 (ja) | 2020-09-17 | 2025-03-05 | シグレイ、インコーポレイテッド | Ｘ線を用いた深さ分解計測および分析のためのシステムおよび方法 |
| WO2022126071A1 (en) | 2020-12-07 | 2022-06-16 | Sigray, Inc. | High throughput 3d x-ray imaging system using a transmission x-ray source |
| US12480892B2 (en) | 2020-12-07 | 2025-11-25 | Sigray, Inc. | High throughput 3D x-ray imaging system using a transmission x-ray source |
| US12360067B2 (en) | 2022-03-02 | 2025-07-15 | Sigray, Inc. | X-ray fluorescence system and x-ray source with electrically insulative target material |
| DE112023001408T5 (de) | 2022-03-15 | 2025-02-13 | Sigray, Inc. | System und verfahren für die kompakte laminographie unter verwendung einer mikrofokus-transmissionsröntgenquelle und eines röntgendetektors mit variabler vergrösserung |
| CN119173759A (zh) | 2022-05-02 | 2024-12-20 | 斯格瑞公司 | X射线顺序阵列波长色散光谱仪 |
| WO2024173256A1 (en) | 2023-02-16 | 2024-08-22 | Sigray, Inc. | X-ray detector system with at least two stacked flat bragg diffractors |
| US12181423B1 (en) | 2023-09-07 | 2024-12-31 | Sigray, Inc. | Secondary image removal using high resolution x-ray transmission sources |
| WO2025101530A1 (en) | 2023-11-07 | 2025-05-15 | Sigray, Inc. | System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes |
| US12429436B2 (en) | 2024-01-08 | 2025-09-30 | Sigray, Inc. | X-ray analysis system with focused x-ray beam and non-x-ray microscope |
| WO2025155719A1 (en) | 2024-01-18 | 2025-07-24 | Sigray, Inc. | Sequential array of x-ray imaging detectors |
| US12431256B2 (en) | 2024-02-15 | 2025-09-30 | Sigray, Inc. | System and method for generating a focused x-ray beam |
Family Cites Families (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SE347859B (enExample) * | 1970-11-30 | 1972-08-14 | Medinova Ab | |
| US4672648A (en) * | 1985-10-25 | 1987-06-09 | Picker International, Inc. | Apparatus and method for radiation attenuation |
| US5812629A (en) * | 1997-04-30 | 1998-09-22 | Clauser; John F. | Ultrahigh resolution interferometric x-ray imaging |
| US7965444B2 (en) | 2006-08-31 | 2011-06-21 | Micron Technology, Inc. | Method and apparatus to improve filter characteristics of optical filters |
| JP5355413B2 (ja) * | 2006-12-04 | 2013-11-27 | コーニンクレッカ フィリップス エヌ ヴェ | Ｘ線用のビームフィルタ及びビームフィルタを有するｘ線装置 |
| JP4911373B2 (ja) * | 2009-11-26 | 2012-04-04 | 横河電機株式会社 | Ｘ線測定装置 |
| JP5536426B2 (ja) | 2009-11-27 | 2014-07-02 | ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー | ビーム形成ｘ線フィルタおよびこれを使ったｘ線ｃｔ装置 |
| US9529128B2 (en) * | 2010-04-26 | 2016-12-27 | Hewlett Packard Enterprise Development Lp | Non-uniform grating |
| JP2012024339A (ja) | 2010-07-23 | 2012-02-09 | Fujifilm Corp | 放射線画像撮影システム及びコリメータユニット |
| JP6126535B2 (ja) | 2011-02-01 | 2017-05-10 | コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． | 集束偏向構造板を用いた微分位相コントラスト撮像法 |
| CN103348415B (zh) | 2011-02-07 | 2016-05-25 | 皇家飞利浦有限公司 | 具有增大的动态范围的微分相衬成像 |
| US9066704B2 (en) | 2011-03-14 | 2015-06-30 | Canon Kabushiki Kaisha | X-ray imaging apparatus |
| US9357973B2 (en) * | 2011-06-30 | 2016-06-07 | Koninklijke Philips N.V. | X-ray beam transmission profile shaper |
| KR20140063841A (ko) | 2011-10-21 | 2014-05-27 | 휴렛-팩커드 디벨롭먼트 컴퍼니, 엘.피. | 깊은 홈을 갖는 불균일 격자를 구비한 격자 커플러 |
| US20130164457A1 (en) | 2011-12-27 | 2013-06-27 | Rigaku Innovative Technologies, Inc. | Method of manufacturing patterned x-ray optical elements |
| EP2850595B1 (en) | 2012-05-14 | 2016-04-06 | Koninklijke Philips N.V. | Dark field computed tomography imaging |
| RU2014154006A (ru) | 2012-06-05 | 2016-08-10 | Конинклейке Филипс Н.В. | Калибровка с декомпозицией на слои движения рентгеновских ст-томографов |
| EP2925230B1 (en) * | 2012-12-03 | 2020-05-20 | Koninklijke Philips N.V. | Translating x-ray beam transmission profile shaper |
| CN105393331B (zh) * | 2013-07-23 | 2017-03-22 | 皇家飞利浦有限公司 | 用于差分相衬成像装置的x射线管的阳极 |
| JP2015078976A (ja) | 2013-09-11 | 2015-04-23 | キヤノン株式会社 | Ｘ線撮像システム |
| EP3094254B1 (en) * | 2014-01-14 | 2017-11-15 | Koninklijke Philips N.V. | X-ray emitting device with an attenuating element for an x-ray imaging apparatus |
| US9726794B2 (en) | 2014-06-13 | 2017-08-08 | The Regents Of The University Of California | High index contrast grating structure for light manipulation and related method |
| EP3217879B1 (en) | 2014-11-11 | 2020-01-08 | Koninklijke Philips N.V. | Source-detector arrangement |
| KR20160089647A (ko) | 2015-01-20 | 2016-07-28 | 삼성전자주식회사 | 엑스선 영상장치 및 그 제어방법 |
| US11051772B2 (en) * | 2016-04-08 | 2021-07-06 | Rensselaer Polytechnic Institute | Filtration methods for dual-energy X-ray CT |
-
2017
- 2017-08-30 JP JP2019512893A patent/JP7044764B6/ja not_active Expired - Fee Related
- 2017-08-30 US US16/329,807 patent/US10835193B2/en not_active Expired - Fee Related
- 2017-08-30 WO PCT/EP2017/071806 patent/WO2018046377A1/en not_active Ceased
- 2017-08-30 EP EP17758190.7A patent/EP3509492B1/en not_active Not-in-force
- 2017-08-30 CN CN201780055442.8A patent/CN109688930A/zh active Pending
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