JP2016535617A5 - - Google Patents

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JP2016535617A5
JP2016535617A5 JP2016525532A JP2016525532A JP2016535617A5 JP 2016535617 A5 JP2016535617 A5 JP 2016535617A5 JP 2016525532 A JP2016525532 A JP 2016525532A JP 2016525532 A JP2016525532 A JP 2016525532A JP 2016535617 A5 JP2016535617 A5 JP 2016535617A5
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data
correction method
beam hardening
hardening correction
image data
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JP2016525532A
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JP6554096B2 (ja
JP2016535617A (ja
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Priority claimed from PCT/EP2014/073269 external-priority patent/WO2015067511A1/en
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Publication of JP2016535617A5 publication Critical patent/JP2016535617A5/ja
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JP2016525532A 2013-11-08 2014-10-30 微分位相コントラストctのための経験的ビームハードニング補正 Expired - Fee Related JP6554096B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP13192149.6 2013-11-08
EP13192149 2013-11-08
PCT/EP2014/073269 WO2015067511A1 (en) 2013-11-08 2014-10-30 Empirical beam hardening correction for differential phase contrast ct

Publications (3)

Publication Number Publication Date
JP2016535617A JP2016535617A (ja) 2016-11-17
JP2016535617A5 true JP2016535617A5 (enExample) 2017-10-19
JP6554096B2 JP6554096B2 (ja) 2019-07-31

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JP2016525532A Expired - Fee Related JP6554096B2 (ja) 2013-11-08 2014-10-30 微分位相コントラストctのための経験的ビームハードニング補正

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US (1) US10779789B2 (enExample)
EP (1) EP3065642B1 (enExample)
JP (1) JP6554096B2 (enExample)
CN (1) CN105705097B (enExample)
WO (1) WO2015067511A1 (enExample)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106413556A (zh) * 2014-05-27 2017-02-15 皇家飞利浦有限公司 用于差分相位对比成像的校准硬件体模
JP2016106721A (ja) * 2014-12-03 2016-06-20 キヤノン株式会社 画像処理装置および画像処理方法
CN104605880B (zh) * 2014-12-30 2017-06-16 沈阳东软医疗系统有限公司 一种硬化效应数据的生成方法和装置
CN107567640B (zh) * 2015-05-07 2022-04-05 皇家飞利浦有限公司 用于扫描暗场和相位对比成像的射束硬化校正
WO2017055383A1 (en) * 2015-09-30 2017-04-06 Koninklijke Philips N.V. X-ray imaging of an object with three-dimensional localization of an interventional device
JP6816144B2 (ja) * 2015-12-01 2021-01-20 コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. 被検体をx線撮像する装置
CN109310383A (zh) * 2016-06-08 2019-02-05 皇家飞利浦有限公司 用于对x射线成像设备进行校准的测试对象
CN106442584A (zh) * 2016-08-31 2017-02-22 上海交通大学 一种可视化动态小角散射实验数据处理系统
EP3552045A1 (en) * 2016-12-08 2019-10-16 Koninklijke Philips N.V. Light guiding in an x-ray detector
EP3554369A1 (en) * 2016-12-19 2019-10-23 Koninklijke Philips N.V. System and method for dark-field-imaging
JP6753342B2 (ja) * 2017-03-15 2020-09-09 株式会社島津製作所 放射線格子検出器およびx線検査装置
EP3378396A1 (en) * 2017-03-23 2018-09-26 Koninklijke Philips N.V. X-ray imaging data processing device and method
EP3391819A1 (en) * 2017-04-20 2018-10-24 Koninklijke Philips N.V. Beam hardening correction in x-ray dark-field imaging
EP3435325A1 (en) 2017-07-26 2019-01-30 Koninklijke Philips N.V. Scatter correction for dark field imaging
US11382574B2 (en) 2017-11-06 2022-07-12 Rensselaer Polytechnic Institute Stationary in-vivo grating-enabled micro-CT architecture (sigma)
EP3494885A1 (en) * 2017-12-07 2019-06-12 Koninklijke Philips N.V. Apparatus for presentation of dark field x-ray image information
US11051782B1 (en) * 2018-02-23 2021-07-06 Robert Edwin Douglas Image quality by incorporating data unit assurance markers
CN108596993B (zh) * 2018-02-26 2022-07-12 上海奕瑞光电子科技股份有限公司 校正图像不饱和伪影的系统及校正方法
CN110428384B (zh) * 2019-08-08 2021-11-16 江苏赛诺格兰医疗科技有限公司 对呼吸或心脏的pet图像进行衰减校正的校正信息获取方法
JP7317651B2 (ja) * 2019-09-24 2023-07-31 富士フイルムヘルスケア株式会社 医用画像処理装置および医用画像処理方法
US11653892B2 (en) 2021-01-22 2023-05-23 Canon Medical Systems Corporation Counting response and beam hardening calibration method for a full size photon-counting CT system
CN114469151B (zh) * 2021-12-23 2024-12-24 武汉联影生命科学仪器有限公司 数据校正方法、装置、计算机设备、存储介质和程序产品
CN117796827A (zh) * 2022-09-26 2024-04-02 同方威视技术股份有限公司 用于成像设备的标定方法、装置、成像设备
US20240102947A1 (en) * 2022-09-27 2024-03-28 Baker Hughes Holdings Llc High resolution computed tomography object scanning

Family Cites Families (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4233507A (en) * 1979-05-07 1980-11-11 General Electric Company Computer tomography table containing calibration and correlation samples
US6636622B2 (en) * 1997-10-15 2003-10-21 Wisconsin Alumni Research Foundation Method and apparatus for calibration of radiation therapy equipment and verification of radiation treatment
US5953444A (en) * 1997-10-22 1999-09-14 University Of Pennsylvania Method for improved correction of spectrum hardening artifacts in computed tomography images
US6324240B1 (en) * 1998-11-12 2001-11-27 The Board Of Trustees Of The Leland Stanford Junior University Method for beam hardening correction in quantitative computed X-ray tomography
US6490476B1 (en) * 1999-10-14 2002-12-03 Cti Pet Systems, Inc. Combined PET and X-ray CT tomograph and method for using same
DE10035984C1 (de) * 2000-07-24 2002-01-31 Siemens Ag Röntgen-Computertomographieeinrichtung
DE10051462A1 (de) * 2000-10-17 2002-04-25 Siemens Ag Verfahren zur Strahlaufhärtungskorrektur für ein mittels eines CT-Geräts aufgenommenes Ausgangsbild
CN1296011C (zh) * 2003-07-16 2007-01-24 东软飞利浦医疗设备系统有限责任公司 一种ct机射束硬化的校正方法
JP4509507B2 (ja) 2003-08-20 2010-07-21 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー 放射線計算断層画像装置および断層画像生成方法
ATE385595T1 (de) * 2004-03-17 2008-02-15 Koninkl Philips Electronics Nv Korrektur der strahlungsaufhärtung und der dämpfung in der coherent scatter computed tomography (csct)
JP2008220653A (ja) * 2007-03-13 2008-09-25 Toshiba Corp X線ct装置、被検体外形推定方法、画像再構成方法
JP5171215B2 (ja) * 2007-11-08 2013-03-27 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー X線ct装置
CN101226642A (zh) * 2008-01-25 2008-07-23 西安交通大学 基于ct数据一致性的投影射束硬化校正方法
US8023767B1 (en) * 2008-03-10 2011-09-20 University Of Rochester Method and apparatus for 3D metal and high-density artifact correction for cone-beam and fan-beam CT imaging
WO2010061810A1 (ja) * 2008-11-27 2010-06-03 株式会社 日立メディコ 放射線撮像装置
US8873705B2 (en) * 2009-06-23 2014-10-28 Hitachi Medical Corporation X-ray CT apparatus
DE102009051384A1 (de) * 2009-10-30 2011-05-12 Friedrich-Alexander-Universität Erlangen-Nürnberg Strahlaufhärtungskorrektur für CT-Perfusionsmessungen
DE102009053664A1 (de) * 2009-11-17 2011-05-19 Ziehm Imaging Gmbh Verfahren zur empirischen Bestimmung einer Korrekturfunktion zur Korrektur von Strahlungsaufhärtungs- und Streustrahleneffekten in der Projektionsradiografie und in der Computertomografie
WO2012029039A1 (en) 2010-09-03 2012-03-08 Koninklijke Philips Electronics N.V. Beam hardening correction for phase-contrast imaging
CN103648392B (zh) * 2011-07-12 2016-01-13 株式会社日立医疗器械 X射线ct装置、计算装置以及x射线ct装置的维护方法
US20130026353A1 (en) * 2011-07-27 2013-01-31 Siemens Medical Solutions Usa, Inc. Conical Water-Equivalent Phantom Design for Beam Hardening Correction in Preclinical Micro-CT
CN103733222B (zh) * 2011-08-19 2017-07-04 皇家飞利浦有限公司 不同x射线图像信息类型的频率相关组合
US9086366B2 (en) * 2012-02-15 2015-07-21 L-3 Communications Security And Detection Systems, Inc. Determining a material property based on scattered radiation
CN104582578B (zh) * 2012-06-07 2017-11-10 约翰霍普金斯大学 定量校准系统在计算机断层成像扫描仪中的集成
JP6197790B2 (ja) * 2012-06-11 2017-09-20 コニカミノルタ株式会社 医用画像システム及び医用画像処理装置
JP5963217B2 (ja) * 2012-06-20 2016-08-03 株式会社日立製作所 X線ct装置
WO2014034618A1 (ja) * 2012-08-30 2014-03-06 株式会社東芝 医用画像処理装置及びx線コンピュータ断層撮影装置
US8855395B2 (en) * 2013-01-02 2014-10-07 Carestream Health, Inc. Conditional likelihood material decomposition and methods of using the same
EP2994049A1 (en) * 2013-05-10 2016-03-16 Paul Scherrer Institut Quantitative x-ray radiology using the absorption and scattering information
WO2015014677A1 (en) 2013-07-30 2015-02-05 Koninklijke Philips N.V. Monochromatic attenuation contrast image generation by using phase contrast ct
WO2015020072A1 (ja) * 2013-08-08 2015-02-12 株式会社 日立メディコ X線ct装置および補正処理装置
US9683948B2 (en) * 2013-11-01 2017-06-20 General Electric Company Systems and methods for iterative multi-material correction of image data
US9934597B2 (en) * 2014-09-11 2018-04-03 Carestream Health, Inc. Metal artifacts reduction in cone beam reconstruction

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